CA2353014A1 - Methode et appareil permettant de determiner le profil de concentrations par spectroscopie en plasma induit par laser - Google Patents

Methode et appareil permettant de determiner le profil de concentrations par spectroscopie en plasma induit par laser Download PDF

Info

Publication number
CA2353014A1
CA2353014A1 CA 2353014 CA2353014A CA2353014A1 CA 2353014 A1 CA2353014 A1 CA 2353014A1 CA 2353014 CA2353014 CA 2353014 CA 2353014 A CA2353014 A CA 2353014A CA 2353014 A1 CA2353014 A1 CA 2353014A1
Authority
CA
Canada
Prior art keywords
laser
depth
crater
diaphragm
beams
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
CA 2353014
Other languages
English (en)
Inventor
Vincent Detalle
Mohammad Sabsabi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Research Council of Canada
Original Assignee
National Research Council of Canada
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by National Research Council of Canada filed Critical National Research Council of Canada
Priority to CA 2353014 priority Critical patent/CA2353014A1/fr
Priority to PCT/CA2002/001064 priority patent/WO2003006967A1/fr
Publication of CA2353014A1 publication Critical patent/CA2353014A1/fr
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718—Laser microanalysis, i.e. with formation of sample plasma

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Plasma & Fusion (AREA)
  • Optics & Photonics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
CA 2353014 2001-07-12 2001-07-12 Methode et appareil permettant de determiner le profil de concentrations par spectroscopie en plasma induit par laser Abandoned CA2353014A1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
CA 2353014 CA2353014A1 (fr) 2001-07-12 2001-07-12 Methode et appareil permettant de determiner le profil de concentrations par spectroscopie en plasma induit par laser
PCT/CA2002/001064 WO2003006967A1 (fr) 2001-07-12 2002-07-12 Procede et appareil d'analyse de profils en profondeur par spectroscopie de plasma produit par laser

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CA 2353014 CA2353014A1 (fr) 2001-07-12 2001-07-12 Methode et appareil permettant de determiner le profil de concentrations par spectroscopie en plasma induit par laser

Publications (1)

Publication Number Publication Date
CA2353014A1 true CA2353014A1 (fr) 2003-01-12

Family

ID=4169457

Family Applications (1)

Application Number Title Priority Date Filing Date
CA 2353014 Abandoned CA2353014A1 (fr) 2001-07-12 2001-07-12 Methode et appareil permettant de determiner le profil de concentrations par spectroscopie en plasma induit par laser

Country Status (2)

Country Link
CA (1) CA2353014A1 (fr)
WO (1) WO2003006967A1 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10126459B2 (en) 2015-03-12 2018-11-13 Raytheon Company System and method for depth profiling by temporal and spatial range gating based on penetrating electromagnetic radiation

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AT413244B (de) * 2004-03-30 2005-12-15 Innsitec Laser Technologies Gm Verfahren zur ermittlung und korrektur bzw. regelung des verlaufs eines laserlichtstrahls in einem hohlkörper
DE102004052039B4 (de) * 2004-10-26 2014-07-10 Infineon Technologies Ag Verfahren zum Bestimmen der Aufschmelztiefe während des Aufschmelzens einer Metallschicht und Substrat zur Verwendung in einem derartigen Verfahren
EP2479533A1 (fr) * 2011-01-24 2012-07-25 Universita' Degli Studi di Bari Système laser pour la surveillance de l'ablation
US9506869B2 (en) * 2013-10-16 2016-11-29 Tsi, Incorporated Handheld laser induced breakdown spectroscopy device
CN109030463B (zh) * 2018-09-21 2024-01-30 中国工程物理研究院流体物理研究所 单次多点同时测量的激光诱导击穿光谱系统及测量方法
WO2023176939A1 (fr) * 2022-03-16 2023-09-21 日本製鉄株式会社 Dispositif optique de spectrophotométrie d'émission laser, spectrophotomètre d'émission laser, procédé de spectrophotométrie d'émission laser et installation de placage de métal en fusion
JP7440820B1 (ja) 2022-06-21 2024-02-29 日本製鉄株式会社 溶融金属浴の成分分析システム、溶融金属浴の成分分析方法、溶融亜鉛めっき浴の管理方法、および溶融亜鉛めっき鋼板の製造方法
FR3143736A1 (fr) * 2022-12-20 2024-06-21 Fariaut Instruments Dispositif d’analyse d’un échantillon métallique par faisceau laser, comprenant des moyens de mise en forme du faisceau laser

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1988001379A1 (fr) * 1986-08-15 1988-02-25 Cra Services Limited Controle par ablation au laser
US5751416A (en) * 1996-08-29 1998-05-12 Mississippi State University Analytical method using laser-induced breakdown spectroscopy
GB2340598A (en) * 1998-08-07 2000-02-23 British Steel Plc Determining composition of galvanised metal coating

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10126459B2 (en) 2015-03-12 2018-11-13 Raytheon Company System and method for depth profiling by temporal and spatial range gating based on penetrating electromagnetic radiation

Also Published As

Publication number Publication date
WO2003006967A1 (fr) 2003-01-23

Similar Documents

Publication Publication Date Title
US6532068B2 (en) Method and apparatus for depth profile analysis by laser induced plasma spectros copy
US6873419B2 (en) Method and apparatus for three-dimensional compositional mapping of heterogeneous materials
US6381303B1 (en) X-ray microanalyzer for thin films
RU2249813C2 (ru) Устройство для элементного анализа путем спектрометрии оптической эмиссии на плазме, полученной с помощью лазера
US20140085631A1 (en) Device for the high-resolution mapping and analysis of elements in solids
KR20190083455A (ko) 레이저유도 플라즈마 분광 분석기에서 시료 표면의 높이 최적화 및 변화를 모니터링하는 장치 및 방법
Lednev et al. Laser beam profile influence on LIBS analytical capabilities: single vs. multimode beam
CA2353014A1 (fr) Methode et appareil permettant de determiner le profil de concentrations par spectroscopie en plasma induit par laser
US6784989B2 (en) Process and apparatus for real-time determination of a solid sample composition as a function of the depth within the sample
JPH0694605A (ja) パルス電磁波源および干渉計を用いた分光撮影装置
CN109358036B (zh) 激光诱导击穿光谱信号误差校正系统和方法
JP2004309458A (ja) 時間分解蛍光顕微鏡
Talmi et al. Laser-microprobe elemental determinations with an optical multichannel detection system
JPH01321340A (ja) レーザ二段励起発光分析法及び装置
JP2006337284A (ja) 回折格子の迷光測定方法および装置
JP3160622B2 (ja) プラズマ温度分布測定方法および装置
JP2006300808A (ja) ラマン分光測定装置
JP2000055809A (ja) 顕微ラマン分光装置及び顕微ラマン分光測定方法
GB2598779A (en) Kinematics path method for laser-induced breakdown spectroscopy
US4983041A (en) Spectroscopic apparatus for extremely faint light
US20210396679A1 (en) Apparatus and method for element analysis of materials by means of optical emission spectroscopy
JP4595571B2 (ja) 顕微ラマン分光装置及び顕微ラマン分光測定方法
RU2303255C1 (ru) Лазерный атомный эмиссионный спектрометр "лаэс"
DE19948264C2 (de) Anordnung und Verfahren zur Reflektometrie
JP2000352556A (ja) 分光分析装置

Legal Events

Date Code Title Description
EEER Examination request
FZDE Dead