CA2083037A1 - Methode et appareil pour determiner la clarte de l'image d'une surface - Google Patents

Methode et appareil pour determiner la clarte de l'image d'une surface

Info

Publication number
CA2083037A1
CA2083037A1 CA2083037A CA2083037A CA2083037A1 CA 2083037 A1 CA2083037 A1 CA 2083037A1 CA 2083037 A CA2083037 A CA 2083037A CA 2083037 A CA2083037 A CA 2083037A CA 2083037 A1 CA2083037 A1 CA 2083037A1
Authority
CA
Canada
Prior art keywords
image
determining
image clarity
clarity
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA2083037A
Other languages
English (en)
Other versions
CA2083037C (fr
Inventor
Christiaan Theodorus Wilhelmus Lahaije
Wilhelmus Jacobus Van Der Meer
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tata Steel Ijmuiden BV
Original Assignee
Christiaan Theodorus Wilhelmus Lahaije
Wilhelmus Jacobus Van Der Meer
Hoogovens Groep Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Christiaan Theodorus Wilhelmus Lahaije, Wilhelmus Jacobus Van Der Meer, Hoogovens Groep Bv filed Critical Christiaan Theodorus Wilhelmus Lahaije
Publication of CA2083037A1 publication Critical patent/CA2083037A1/fr
Application granted granted Critical
Publication of CA2083037C publication Critical patent/CA2083037C/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/57—Measuring gloss
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/063—Illuminating optical parts
    • G01N2201/0635—Structured illumination, e.g. with grating

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Image Processing (AREA)
CA002083037A 1990-05-18 1991-05-17 Methode et appareil pour determiner la clarte de l'image d'une surface Expired - Fee Related CA2083037C (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NL9001164 1990-05-18
NL9001164A NL9001164A (nl) 1990-05-18 1990-05-18 Werkwijze en inrichting ter bepaling van de beeldhelderheid van een oppervlak.

Publications (2)

Publication Number Publication Date
CA2083037A1 true CA2083037A1 (fr) 1991-11-19
CA2083037C CA2083037C (fr) 1995-05-30

Family

ID=19857117

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002083037A Expired - Fee Related CA2083037C (fr) 1990-05-18 1991-05-17 Methode et appareil pour determiner la clarte de l'image d'une surface

Country Status (9)

Country Link
US (1) US5359668A (fr)
EP (1) EP0528915B1 (fr)
JP (1) JPH05505677A (fr)
AT (1) ATE99802T1 (fr)
CA (1) CA2083037C (fr)
DE (1) DE69100947T2 (fr)
DK (1) DK0528915T3 (fr)
NL (1) NL9001164A (fr)
WO (1) WO1991018278A1 (fr)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2737294B1 (fr) * 1995-07-26 1997-09-05 Satimage Procede et dispositif de detection de l'etat de surface de pieces a surface reflechissante, applicables au controle de rugosite de pieces polies
DE19758466B4 (de) * 1997-03-11 2007-10-04 Betriebsforschungsinstitut VDEh - Institut für angewandte Forschung GmbH Planheits-Regelungssystem für Metallband
US20050008198A1 (en) * 2001-09-14 2005-01-13 Guo Chun Biao Apparatus and method for selecting key frames of clear faces through a sequence of images
ES2526825T3 (es) * 2007-07-09 2015-01-15 Vdeh-Betriebsforschungsinstitut Gmbh Procedimiento de inspección de superficies para la detección de defectos de la superficie y/o medir la topografía de la superficie
CN104251687B (zh) * 2014-10-11 2017-05-03 盐城工学院 一种基于镜面图像处理的零件表面平整度检测方法
JP7272124B2 (ja) * 2019-06-11 2023-05-12 コニカミノルタ株式会社 評価装置および評価方法

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5271289A (en) * 1975-12-11 1977-06-14 Mitsubishi Electric Corp Surface inspection device
JPS56122906A (en) * 1980-03-01 1981-09-26 Hitachi Maxell Ltd Measuring method for surface flatness of magnetic recording medium
US4629319A (en) * 1984-02-14 1986-12-16 Diffracto Ltd. Panel surface flaw inspection
US4863268A (en) * 1984-02-14 1989-09-05 Diffracto Ltd. Diffractosight improvements
JPS6175236A (ja) * 1984-09-20 1986-04-17 Nippon Soken Inc 塗装面測定装置
JPS6260075A (ja) * 1985-09-10 1987-03-16 Hitachi Ltd 形状認識装置
DE3919893A1 (de) * 1988-06-22 1989-12-28 Innovat Ges Fuer Sondermaschin Verfahren und vorrichtung zur beruehrungslosen messung von gestaltsabweichungen an oberflaechen
FR2634551B1 (fr) * 1988-07-20 1990-11-02 Siderurgie Fse Inst Rech Procede et dispositif d'identification du fini d'une surface metallique
US4975972A (en) * 1988-10-18 1990-12-04 At&T Bell Laboratories Method and apparatus for surface inspection
US5130555A (en) * 1988-11-28 1992-07-14 Matsushita Electric Industrial Co., Ltd. Tape crease inspecting method and apparatus having a stripe shaped pattern reflection plate
IT1224030B (it) * 1988-12-23 1990-09-26 Fiat Ricerche Metodo e dispositivo per il rilievo e la classivicazione della raggrinzatura di trattamenti superficiali
US5142648A (en) * 1990-08-02 1992-08-25 General Motors Corporation Method and apparatus for paint inspection
USH999H (en) * 1990-09-13 1991-12-03 The United States Of America As Represented By The Secretary Of The Air Force Transparency distortion measurement process
US5155558A (en) * 1990-09-19 1992-10-13 E. I. Du Pont De Nemours And Company Method and apparatus for analyzing the appearance features of a surface
US5208766A (en) * 1990-11-13 1993-05-04 Hughes Aircraft Company Automated evaluation of painted surface quality

Also Published As

Publication number Publication date
ATE99802T1 (de) 1994-01-15
US5359668A (en) 1994-10-25
CA2083037C (fr) 1995-05-30
EP0528915A1 (fr) 1993-03-03
WO1991018278A1 (fr) 1991-11-28
EP0528915B1 (fr) 1994-01-05
DK0528915T3 (da) 1994-05-09
DE69100947T2 (de) 1994-05-05
DE69100947D1 (de) 1994-02-17
JPH05505677A (ja) 1993-08-19
NL9001164A (nl) 1991-12-16

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Legal Events

Date Code Title Description
EEER Examination request
MKLA Lapsed