CA2055852A1 - Methode de detection de pente et appareil de detection et d'enregistrement de l'information utilisant cette methode - Google Patents

Methode de detection de pente et appareil de detection et d'enregistrement de l'information utilisant cette methode

Info

Publication number
CA2055852A1
CA2055852A1 CA2055852A CA2055852A CA2055852A1 CA 2055852 A1 CA2055852 A1 CA 2055852A1 CA 2055852 A CA2055852 A CA 2055852A CA 2055852 A CA2055852 A CA 2055852A CA 2055852 A1 CA2055852 A1 CA 2055852A1
Authority
CA
Canada
Prior art keywords
information
slope
detection
record medium
writing apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA2055852A
Other languages
English (en)
Other versions
CA2055852C (fr
Inventor
Toshihiko Miyazaki
Hiroshi Matsuda
Hisaaki Kawade
Ken Eguchi
Haruki Kawada
Hideyuki Kawagishi
Yoshihiro Yanagisawa
Keisuke Yamamoto
Toshimitsu Kawase
Takahiro Oguchi
Toshihiko Takeda
Masahiro Tagawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2317030A external-priority patent/JP2821511B2/ja
Priority claimed from JP3201151A external-priority patent/JP2981788B2/ja
Application filed by Individual filed Critical Individual
Publication of CA2055852A1 publication Critical patent/CA2055852A1/fr
Application granted granted Critical
Publication of CA2055852C publication Critical patent/CA2055852C/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
    • G11B9/12—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
    • G11B9/14—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
    • G11B9/1418—Disposition or mounting of heads or record carriers
    • G11B9/1427—Disposition or mounting of heads or record carriers with provision for moving the heads or record carriers relatively to each other or for access to indexed parts without effectively imparting a relative movement
    • G11B9/1436—Disposition or mounting of heads or record carriers with provision for moving the heads or record carriers relatively to each other or for access to indexed parts without effectively imparting a relative movement with provision for moving the heads or record carriers relatively to each other
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B17/00—Guiding record carriers not specifically of filamentary or web form, or of supports therefor
    • G11B17/32—Maintaining desired spacing between record carrier and head, e.g. by fluid-dynamic spacing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B21/00—Head arrangements not specific to the method of recording or reproducing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B21/00—Head arrangements not specific to the method of recording or reproducing
    • G11B21/16—Supporting the heads; Supporting the sockets for plug-in heads
    • G11B21/20—Supporting the heads; Supporting the sockets for plug-in heads while the head is in operative position but stationary or permitting minor movements to follow irregularities in surface of record carrier
    • G11B21/21—Supporting the heads; Supporting the sockets for plug-in heads while the head is in operative position but stationary or permitting minor movements to follow irregularities in surface of record carrier with provision for maintaining desired spacing of head from record carrier, e.g. fluid-dynamic spacing, slider
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/852—Manufacture, treatment, or detection of nanostructure with scanning probe for detection of specific nanostructure sample or nanostructure-related property

Landscapes

  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Holo Graphy (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Electrophonic Musical Instruments (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Photoreceptors In Electrophotography (AREA)
  • Indexing, Searching, Synchronizing, And The Amount Of Synchronization Travel Of Record Carriers (AREA)
CA002055852A 1990-11-20 1991-11-19 Methode de detection de pente et appareil de detection et d'enregistrement de l'information utilisant cette methode Expired - Fee Related CA2055852C (fr)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2-317030 1990-11-20
JP2317030A JP2821511B2 (ja) 1990-11-20 1990-11-20 傾き調整方法
JP3-201151 1991-07-17
JP3201151A JP2981788B2 (ja) 1991-07-17 1991-07-17 走査型プローブ顕微鏡を用いた情報処理装置、情報処理方法及び面合わせ方法

Publications (2)

Publication Number Publication Date
CA2055852A1 true CA2055852A1 (fr) 1992-05-21
CA2055852C CA2055852C (fr) 1998-09-22

Family

ID=26512602

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002055852A Expired - Fee Related CA2055852C (fr) 1990-11-20 1991-11-19 Methode de detection de pente et appareil de detection et d'enregistrement de l'information utilisant cette methode

Country Status (5)

Country Link
US (1) US5412597A (fr)
EP (1) EP0487003B1 (fr)
AT (1) ATE155237T1 (fr)
CA (1) CA2055852C (fr)
DE (1) DE69126765T2 (fr)

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DE69232806T2 (de) * 1991-07-17 2003-02-20 Canon Kk Informationsaufzeichnungs-/-wiedergabegerät oder -verfahren zur Informationsaufzeichnung/- wiedergabe auf/von einem Informationsaufzeichnungsmedium unter Verwendung einer Vielzahl von Sondenelektroden
JP3184619B2 (ja) * 1991-09-24 2001-07-09 キヤノン株式会社 平行平面保持機構及びそれを用いたメモリ装置及びｓｔｍ装置
US5744799A (en) * 1996-05-20 1998-04-28 Ohara; Tetsuo Apparatus for and method of real-time nanometer-scale position measurement of the sensor of a scanning tunneling microscope or other sensor scanning atomic or other undulating surfaces
US7260051B1 (en) * 1998-12-18 2007-08-21 Nanochip, Inc. Molecular memory medium and molecular memory integrated circuit
US6233206B1 (en) * 1999-10-26 2001-05-15 International Business Machines Corporation High density magnetic thermal recording and reproducing assembly
US6702186B1 (en) * 2000-02-24 2004-03-09 Hitachi Global Storage Technologies, Netherlands B.V. Assembly comprising a plurality of media probes for writing/reading high density magnetic data
JP4695325B2 (ja) * 2001-09-17 2011-06-08 キヤノン電子株式会社 磁気検出素子とその製造方法及び該素子を用いた携帯機器
US6982898B2 (en) * 2002-10-15 2006-01-03 Nanochip, Inc. Molecular memory integrated circuit utilizing non-vibrating cantilevers
US7233517B2 (en) * 2002-10-15 2007-06-19 Nanochip, Inc. Atomic probes and media for high density data storage
US20040150472A1 (en) * 2002-10-15 2004-08-05 Rust Thomas F. Fault tolerant micro-electro mechanical actuators
US6985377B2 (en) * 2002-10-15 2006-01-10 Nanochip, Inc. Phase change media for high density data storage
US7315505B2 (en) * 2003-07-14 2008-01-01 Hewlett-Packard Development Company, L.P. Storage device having a probe with plural tips
FR2869027B1 (fr) * 2004-04-15 2006-07-14 Commissariat Energie Atomique Systeme d'enregistrement comportant une couche memoire et un reseau de micro-pointes
US7301887B2 (en) * 2004-04-16 2007-11-27 Nanochip, Inc. Methods for erasing bit cells in a high density data storage device
US20050232061A1 (en) * 2004-04-16 2005-10-20 Rust Thomas F Systems for writing and reading highly resolved domains for high density data storage
US7379412B2 (en) 2004-04-16 2008-05-27 Nanochip, Inc. Methods for writing and reading highly resolved domains for high density data storage
US7420106B2 (en) * 2005-03-18 2008-09-02 The University Of Utah Research Foundation Scanning probe characterization of surfaces
US7367119B2 (en) * 2005-06-24 2008-05-06 Nanochip, Inc. Method for forming a reinforced tip for a probe storage device
US7463573B2 (en) 2005-06-24 2008-12-09 Nanochip, Inc. Patterned media for a high density data storage device
US7309630B2 (en) * 2005-07-08 2007-12-18 Nanochip, Inc. Method for forming patterned media for a high density data storage device
KR100745756B1 (ko) * 2006-01-04 2007-08-02 삼성전자주식회사 마이크로 액츄에이터 및 이를 채용한 정보저장장치
AU2008225175A1 (en) * 2007-03-13 2008-09-18 Nanoink, Inc. Nanolithography with use of viewports
US7903533B2 (en) * 2007-04-23 2011-03-08 Seagate Technology Llc Probe head with narrow read element
US8264941B2 (en) * 2007-12-26 2012-09-11 Intel Corporation Arrangement and method to perform scanning readout of ferroelectric bit charges
JP5207990B2 (ja) * 2009-01-08 2013-06-12 キヤノン株式会社 画像形成装置、画像形成方法およびプログラム
GB201005252D0 (fr) * 2010-03-29 2010-05-12 Infinitesima Ltd
JP5789055B2 (ja) 2011-09-28 2015-10-07 ハイジトロン, インク.Hysitron, Inc. 複数自由度ステージを含むテストアセンブリ

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US3903735A (en) * 1974-01-25 1975-09-09 Gould Inc Slope error compensating apparatus for use with profile measuring equipment
US4575822A (en) * 1983-02-15 1986-03-11 The Board Of Trustees Of The Leland Stanford Junior University Method and means for data storage using tunnel current data readout
JPS6180536A (ja) * 1984-09-14 1986-04-24 ゼロツクス　コーポレーシヨン 原子規模密度情報記緑および読出し装置並びに方法
US4829507A (en) * 1984-09-14 1989-05-09 Xerox Corporation Method of and system for atomic scale readout of recorded information
DE3769350D1 (de) * 1986-03-04 1991-05-23 Rank Taylor Hobson Ltd Positionskontrolle eines zu bearbeitenden werkstuecks.
JP2556492B2 (ja) * 1986-12-24 1996-11-20 キヤノン株式会社 再生装置及び再生法
JPS63204531A (ja) * 1987-02-19 1988-08-24 Canon Inc 再生装置
JP2556491B2 (ja) * 1986-12-24 1996-11-20 キヤノン株式会社 記録装置及び記録法
JPH0419461Y2 (fr) * 1987-04-06 1992-05-01
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EP0338083B1 (fr) * 1987-10-09 1995-02-22 Hitachi, Ltd. Microscope du type STM avec moyen pour corriger les informations du surface
US4965736A (en) * 1988-06-15 1990-10-23 Measurex Corporation Cross-directional control of sheetmaking systems
JP2547869B2 (ja) * 1988-11-09 1996-10-23 キヤノン株式会社 プローブユニット，該プローブの駆動方法及び該プローブユニットを備えた走査型トンネル電流検知装置
JPH02147803A (ja) * 1988-11-29 1990-06-06 Nippon Telegr & Teleph Corp <Ntt> 走査型トンネル顕微鏡装置
US5229606A (en) * 1989-06-05 1993-07-20 Digital Instruments, Inc. Jumping probe microscope
US5059793A (en) * 1989-10-04 1991-10-22 Olympus Optical Co., Ltd. Scanning tunneling microscope having proper servo control function

Also Published As

Publication number Publication date
EP0487003B1 (fr) 1997-07-09
DE69126765T2 (de) 1998-01-02
DE69126765D1 (de) 1997-08-14
ATE155237T1 (de) 1997-07-15
EP0487003A3 (en) 1992-10-14
US5412597A (en) 1995-05-02
CA2055852C (fr) 1998-09-22
EP0487003A2 (fr) 1992-05-27

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