CA1281576C - Auxiliary light projecting apparatus for a focus detecting system - Google Patents
Auxiliary light projecting apparatus for a focus detecting systemInfo
- Publication number
- CA1281576C CA1281576C CA000532929A CA532929A CA1281576C CA 1281576 C CA1281576 C CA 1281576C CA 000532929 A CA000532929 A CA 000532929A CA 532929 A CA532929 A CA 532929A CA 1281576 C CA1281576 C CA 1281576C
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- CA
- Canada
- Prior art keywords
- light
- recited
- patterned
- patterned surface
- projection lens
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B13/00—Viewfinders; Focusing aids for cameras; Means for focusing for cameras; Autofocus systems for cameras
- G03B13/18—Focusing aids
- G03B13/30—Focusing aids indicating depth of field
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
- G02B7/28—Systems for automatic generation of focusing signals
- G02B7/30—Systems for automatic generation of focusing signals using parallactic triangle with a base line
- G02B7/32—Systems for automatic generation of focusing signals using parallactic triangle with a base line using active means, e.g. light emitter
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B3/00—Focusing arrangements of general interest for cameras, projectors or printers
- G03B3/02—Focusing arrangements of general interest for cameras, projectors or printers moving lens along baseboard
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Automatic Focus Adjustment (AREA)
- Focusing (AREA)
Abstract
ABSTRACT OF THE DISCLOSURE
An auxiliary light source for a passive focus detector, such as would be used for automatic focusing. A
projection lens is inclined with respect to the imaging lens and projects a patterned image from a surface inclined with respect to the projection lens. preferably the patterned image is projected to lie along the axis of the imaging lens so that a sharp illumination pattern is formed at all distances along that axis. Preferably the pattern is such that a higher intensity portion is imaged at a far distance and a lower intensity portion is imaged at a near distance.
An auxiliary light source for a passive focus detector, such as would be used for automatic focusing. A
projection lens is inclined with respect to the imaging lens and projects a patterned image from a surface inclined with respect to the projection lens. preferably the patterned image is projected to lie along the axis of the imaging lens so that a sharp illumination pattern is formed at all distances along that axis. Preferably the pattern is such that a higher intensity portion is imaged at a far distance and a lower intensity portion is imaged at a near distance.
Description
815~76 AUXILIARY LIGHT PROJECTING APPARATUS
FOR A FOCUS DETECTING SYSTEM
Field of the Invention The present invention relates to a focus detecting (auto-focus) auxiliary or supplementary light projecting device in a passive automatic focusing apparatus which is used with still cameras, movie cameras and other photographic equipment.
RIEF DESCRIPTION OF THE DRAWINGS
Figs. 1 to 5 are diagrams showing three examples of the prior art focus detecting auxiliary light projecting apparatus; Fig. 1 is a side view of the optical system used in the first example; Fig. 2 is a perspective view of the ~ame optical system; Fig. 3 i9 a ~ide view of the optical system used in the second example; Fig. 4 i9 a 1~ perspective view of the same optical system; and Fig. 5 is a perspective view of the optlcal system used ln the th~rd example.
Figs. 6 to 11 show one embodiment of the focus detecting auxiliary light projecting apparatus according to the first aspect of the present invention; Fig. 6 is a side view showing the configuration of the optical system 4 ~
~l , 1~8~576 1 used in the apparatus; Fig. 7 is a perspective view of the same optical system; Fig. 8 is a block diagram showing the essential features of an auto-focusing system; Fig. 9 is an enlarged view illustrating the basic pattern to be formed on the patterned surface shown in Fig. 6; Fig. 10 is a side view showing various design parameters of the optical system shown in Fig. 6, the parameters assuming the numerical values specified herein; and Fig. 11 is a perspective view showing a modification of the layout of the optical system shown in Fig. 6; and Figs. 12 to 14 show one embodiment of the focus detecting auxiliary light projecting apparatus according to the second aspect of the present invention; Fig. 12 is a side view showing the configuration of the optical system used in the apparatus; Fig. 13 is a perspective view of the light-emitting device shown in Fig. 12; and Fig. 14 is plan view of the radiating surface of the same light-emitting device.
Backaround of the Invention There are two principal approaches to automatic focusing used in present-generation photographic e~uipment. The methods can be categorized as active or passive. In the active system, a beam of infrared light or ultrasonic waves is projected onto the scene or object to be imaged and the resulting reflected light or echo is received and used to calculate the distance to the object.
One problem with this approach is that the range over _ 3 _ ~81S76 lwhich distance measurement can be achieved i~
substantially limited by the maximum distance that can be covered by infrared light or ultrasonic waves. Therefore, automatic focusing of single-lens reflex cameras and other photographic equipment that employs lenses of long focal distance as well as these of short focal distance i5 chiefly accomplished by the passive method which utilizes available ambient light to directly effect image detection.
10Passive automatic focus detection with cameras is most commonly achieved by what is generally referred to as the correlation method. According to this method, a pair of light-receiving devices (e.g. CCDs,i.e. charge coupled device each having a plurality of light-receiving areas are used. By comparing the photoelectric output of a light-receiving area in one device with the output from the corresponding light-receiving area in the other device, the point where closest matching between the two outputs occurs is detected and used as the proper focused point. This correlation method, however, is not highly suitable for focus detection in a dark scene because a relatively small amount of light will be emitted from the scene for reception by the light-receiving devices. This approach requires good lighting and contract conditions and sometimes fails if the scene is dark or has a low contrast.
1 This problem could be solved by flooding the object with auxiliary light from the direction of the camera. However, if auxiliary illuminating light is simply projected from a location in the neighborhood of S the optical axis of imaging lenses in the camera, the illumination falls perpendicularly on the object and is reflected from the object to produce a strong specular or skin reflection component, which will return to the camera so as to reduce the contrast of the object.
The auxiliary light should not cause glare to the person in the scene and, to this end, it generally has a relatively long wavelength ~e.g. 700nm) in the low luminosity range where the human eye is practically insensitive. However, the low-contrast phenomenon described in the preceding paragraph becomes pronounced if the object i6 illuminated with auxiliary light of long wavelength. With a view to avoiding this problem, it has been proposed that a pattern of alternating light and dark vertical lines be projected for providing a contract for the object. Therefore, the auxiliary light projecting devices in current use are designed to deliberately provide contrast for the object by projecting as striped pattern onto the object.
An example of the system that operates on this principle is shown schematically in Figs. 1 and 2. The 1 system illustrated in these drawings is intended to be used for a camera equipped with a through-the-lens (TTL)-type auto-focusing (AF) mechanism and an imaging lens 10 also serves as a lens in the focus detecting system.
The imaging lens 10 and a projection lens 11 are arranged in such a manner that the optical axis Ll-L2 of the imaging lens is parallel to the optical axis ~ 2 f the projection lens 11. A patterned surface 12 that is disposed in a direction perpendicular to the optical axi~
~ 2 iS offset upwardly by a predetermined amount with respect to the axis ~ 2-A light source (not shown)is disposed in the back of the patterned surface 12 and light coming from this source passes through the patterned surface 12 and the projection lens 11 to form a patterned image 13 at point Cl on the optical axis Ll-L2 of the imaging lens 10. In Fig. 1, a film surface 14 is located behind the imaging lens 10.
The system shown in Figs. 1 and 2 produces a focused patterned image 13 if the object is within a very small distance range including point Cl. However, if the object is outside of this range, only a blurred patterned image 13 is produced and the necessary contrast cannot be imparted to the object. Nith a view to expanding the focusing range of patterned image 13, the F number of the projection lens 11 may be increased so as to provide a greater depth of focus but then, the amount of light available for the patterned image 13 is excessively 1 decreased to put constrains on the range over which proper focus detection can be achieved.
Another problem with the system depicted in Figs. 1 and 2 is that the gap between the optical axes ~1-5 ~2 and Ll-L2 causes parallax on account of the distance from the object. As a result, the actual focusing range of this system is limited by whichever is the smaller of the range limited by the pattern dimensions and the range limited by the depth of focus.
Another system that embodies the idea of projecting a striped pattern is shown in Figs. 3 and 4.
In this system, the projection lens 11 and imaging lens 10 are so positioned that the optical axis ~ 2 of the projection lens 11 will cross the optical axis Ll-L2 of lS the imaging at a point Cl on the imaging optical axis Ll-L2. The patterned surface 12 is disposed to cross the projecting optical axis ~ 2 at a right angle so that a patterned image 13 inclined to the imaging optical axis Ll-L2 will be formed at point Cl. This system provides a somewhat broader focusing range than the system shown in Figs. 1 and 2 but it still has the disadvantage that a blurred image of the patterned image 13 will be formed outside of this focusing range.
Therefore, in the actual system available commercially today, two units of the auxiliary light 1'~8~576 1 projecting system shown in Fig. 1 are together provided as shown in Fig. 5. In this arrangement, light issuing from a light source (not shown) passes through the patterned surface 12 and projection lens 11 to form a patterned image 13 at point Cl on the imaging optical axis Ll-L2, while light comin~ from another light source (not shown) passes through another patterned surface 12' and projection lens 11' to form a second patterned image 13' at another point C2 on the imaging optical axis Ll-L2.
This commercial system has the advantage that the focusing range can be expanded to a certain extent while effectively compensating for parallax. However, even this system does not offer a complete solution to the aforementioned problems and the focusing range that can be attained is limited to be within the depths of focus of Cl and C2. In addition, a compact system cannot be fabricated because it i5 necessary to install two projector units in, for example, an accessory strobe apparatus rather than in the camera body itself.
A TTL-type active AF system adapted to a TV zoom lens is shown on page 457 (47) of Xogaku (Optics), 10, 6 published by the Meeting on Optics, the Society of Applied Physics of Japan, December 1981. This system projects auxiliary light through an imaging lens and provides a wide focusing range. However, it requires that an image-1;~8~S76 1 focusing lens which matches the imaging lens be provided in front of both the light-emitting and the light-receiving devices. Therefore, the system cannot be readily adapted to a single-reflex lens camera which requires easy lens changing in its operation.
SUMMARY OF THE INVENTION
The present invention has been accomplished in order to solve the aforementioned problems of the prior art.
0 Accordingly, an object of the present invention is to provide an auto-focus auxiliary light projecting apparatus in which the focusing range of patterned image to be projected on the object i9 expanded to enable the object to be provided with an adequate contrast over a wide range of distance.
Another object of the invention is to provide such a device which, in addition, can be fabricated in a sufficiently small size to be incorporated in the body of photograhic equipment such as a camera.
According to one aspect of the present invention, a patterned surface for forming a patterned image is inclined with respect to a plane that extends through a projection lens at a right angle with respect to its optical axis so that a patterned image plane is conjugate 1'~8~576 1 to the patterned surface will be formed in a spatially inclined manner with respect to the patterned surface.
According to another aspect of the present invention, a patterned surface for forming a patterned image is provided as an integral part of the radiating surface of a light-emitting device that has a gradient of radiation intensity across its radiating surface. This radiating surface is inclined with respect to a plane that extends through a projection lens at a right angle with respect to its optical axis so that a patterned image plane conjugate to the radiating surface will be formed in a spatially inclined manner with respect to the radiating surface. The light-emitting devlce is so positioned that its high-intensity area will illuminate an object at a far distance and its low-intensity area will illuminate an object at a near distance.
57~i 1 DETAILED DESCRIPTION OF THE PREFERRED EMBODIMEN~S
Embodiments of the present invention are hereinafter described with reference to accompanying FigsO 6 to 140 Inclined Patterned Surface Figs. 6 and 7 show in a side and a perspective view, respectivelyF the configuration of an optical system in a focus detecting auxiliary light projecting apparatus according to one embodiment of the first aspect of the present invention~ It is intended that the apparatus is applied to a camera equipped with a TTL-type AF system.
! In these figures, an imaging lens l is included in the camera. In order for the image of an object ~not shown) to be formed in focus on a film surface 2, the imaging lens 1 is adapted to be driven ~rom the position indicated by the solid line to the positlon indicated by either the one-long-and-two-short dashed line or the dashed line in response to the result of focus detection.
The imaging lens l also serves as a lens in the focus detecting system such that part of the light emanating from the object passing the l~ns l is reflected by a movable mirror 20, shown in Fig. 8r into a focus detecting apparatus 22 which may operate on a variety ~f principles of focus detecting such as by detection of contrast or by detection of phase difference~ One example .
81',76 1 was described in more detail in the backgorund section.
The output of the focus detecting apparatus 22 is used by a lens drive circuit 24 to translate the imaging lens 1 along the imaging optical axis Ll-L2 to bring the imaging lens 1 into focus with the object.
Above the imaging lens 1 is disposed, as shown in Fig. 6f a projection optical unit 3 which makes up a focus detecting auxiliary light projecting apparatus. The optical unit 3 is an integral assembly of a projection lens 4, a patterned surface 5 and a light source 6.
The layout and configurations of the individual components of the optical unit 3 are described below. First, the projection lens 4 is so positioned that its optical axis ~ 2 is inclined to the optical axis Ll-L2 of the imaging lens 1, with the two optical axes intersecting each other at a point Cl. The patterned surface 5, the light transmitting parts of which dif~usely pass the light from the light source 6, is inclined to a plane 4a which passes through the projection lens 4 and which intersects its optical axis ~ 2 at a right angle. The projection optical unit 3 taken generally forms a tilting optical systemr It is generally known that when an object plane is inclined with respect to a plane through a lens that intersects its optical axis, the resulting image plane is spatially inclined with respect to the object plane in , ~ 81 5 l accordance with the law of Schib-Lief~ Therefore, in the light projecting optical unit 3, too, a patterned image plane 5' which is a conjugate surface with respect to the patterned surface 5 will form (i.eO, will be focused) in a spatially inclined manner with respect to the patterned surface 5, as shown in FigO 7.
In the embodiment shown, the imaging lens 1 is so positioned that its optical axis Ll-L2 will partially lie in the patterned image plane 5'~ Consequently, the extension of the plane 4a which crosses the projection optical axis ~ 2 at a right angle ~ill intersect the extension of the patterned surface 5 at; a point CO which is located on the optical axis Ll-L2 oi. the imaging lens 1~
The patterned surface 5 i8 provided with a pattern of alternating transparent or translucent and opaque lines that extend longitudinally with respect to the optical axes across its surface. The pattern has an irregular or non-periodic pitches. Part of this patterned surface 5 is shown at an enlarged scale in Fig. g together with the dimensions of several transparent ~unhatched) and opaque (cross-hatched) lines.
Light issuing from the light source 6 disposed in the back of the patterned surface 5 passes through the patterned surface and the images of points Pl to P4 on the patterned surface 5 are formed at respective points Pl' to 1 P4 ~ on the patterned image plane 5 J t in such a manner that the pattern of alternating clear and opaque lines in the ~urface 5 will align on the plane 5' in a direction parallel to the imaging optical axis Ll-L2~ In the embodiment shown, the light source will project light, for exarnple~ red light which is in the wavelength region of low luminoslty where ~he human eye is prac~ically insensitive.
Three design dimensions Sl, S2 and S3 t and two angles ~1 and ~2 for the components of the projecting optical unit 3 are indicated in Fig. 9.
The angle ~1 is the relative inclination of the ~wo optical axes ~ 2 and Ll-L2 and the angle ~;! iS the inclination of the patterned surface 5 with respect to the pro~ection lens 4. The design dimension Sl is t~e location of the intersection of the two optical axes ~ 2 and Ll-L2 and S2 and S3 define the longitudinal limits of the patterned image plane 5 and thus the limits of the AF
mechanism of the invention. The design dimensîons and the angles mày have the following values assuming ~ mm for the focal length (fj of the projection lens 4:
Table Sl = 1~668 m ~1 = 2~2 S2 = 1 m ~2 = 7-3 S3 = 5 m 12~76 1 In the embodiment described above, if the object is situated on the patterned image plane 5', a sharp patterned image of good contrast can always be projected irrespective of the distance to the object.
The patterned image plane 5' can be enlarged by increasing the size of the patterned surface 5 and i its Rize is increased and a brighter illumination provided by the light source 6, the range of focus detection can be extended to the farthest point that is permissible by the detection capacity of the optical unit 3.
Focus detection, whether it is achieved by the active or passive method, is directed to only part: of the imaging range, which is generally referred to as the di6tance measuring zone. In the embodiment being considered, this distance measuring zone is set tc- lle in the neighborhood of the optical axis Ll-L2 of the imaging lens. Therefore, in the embodiment described above, the optical axis Ll-L2 of the imaging lens 1 is situated on the patterned image plane 5' in order to enable precise focus detection and focus adjustment.
The apparatus according to the embodiment described above can be fabricated in a compact size because the single light projecting optical unit 3 is capable of covering any of the objects that are within the distance metering zone, which if fairly large. As a 1 further advantage, this unit which is an integral combination of the projection lens 4, patterned surface 5 and ~hc light source can be readily assembled into the camera body such as to satisfy the requirements for the layout specified by the present inventionO
In the embodiment described above, the pro~ectîng optical unit 3 is disposed above the imaging lens 1 but thi.s is no~ ~he only layout ~ha~ can be employed to allow the optical axis Ll-L2 of the lens 1 to be situated on the patterned image plane 5'. Equally good resul~s are attained even when this unit is disposed exactly on ~he side of the imaging lens 1, as shown in Fig. 10. In other words, the optical unit 3 may be disposed at any location around the imagin~ lens 1.
As ~ust mentioned in the preceding paragraph, the optical axis ~l-L2 Of the imaging lens 1 does not necessarily have to be included in the patterned image plane 5'. If the object within the distance metering zone can be provided with a detectable contrast r the patterned image plane 5' may be positioned in other attitudes such as to cross the imaging optical axis Ll-L2 at a single point or to lie parallel to the axi~ the imagîng optical~
Even in these cases, results which are comparable to those attained in the embodiment described above can b~
obtained. The position of the patterned image plane 5' 157~;
1 can be changed by any appropriate method such as alteringthe position at which the light projecting optical unit 3 is disposed or the angle at which the projection lens 4 is inclined with respect to the patterned surface 5 as long s as the patterned image plane 5' lies within the field of view of the imaging lens 1.
The embodiment described above concerns the case in which the distance metering zone is set in the neighborhood of the optical axis Ll-L2 of the imaging lens 1. Even if the metering zone is set to lie in other regions, equally good results can be att:ained by positioning the patterned image plane 5' to be situated in Rubstantial agreement with this zone.
~n the first embodiment, the extensio:ns of the patterned Rurface 5 and the plane 4a though the proiection lens 4 that crosses itR optical axis ~ 2 at a right angle intersect each other at the point Co on the imaging optical axis Ll-L2. ~owever, substantially equal results are attained if the crossing point CO is located slightly away from the optical axis Ll-h2 because what occurs in this case is simply that the patterned image rotates slightly about the point Cl.
The foregoing embodiment assumes the case in which the present invention is applied to an automat7c focus detecting apparatus that is intended to be used in a still .
~81~76 1 camera equipped with a TTL-type AF system. It should, however, be noted that the concept of the present invention is also applicable to a movie camera (TV camera) and to a camera that employs a focus detecting optical system which is ;ndependent of an imaging optical system.
In the embodiment described above~ the pattexned surface 5 is disposed separately from the light: source butr needless to say, the patterned surface may be formed as an integral part of the radiating surface of the light source.
Varied IntensitY Pattern One embodiment of the present invention according to its second aspect i9 hereunder described with reference to Figs. 12 to 14 in which the components which are the same as those employed in the first aspect of the present invention are identified by the ~ame numerals and will no~.
be described in detail.
In the optical system shown in Fig. 12, a light projecting optical unit 3 consisting of a projectio~ lens 4 and a light-emitting device 6 i5 disposed above an imaging lens 1 and the optical axis ~ 2 Of the projection lens 4 is inclined to the optical axis ~1-L2 of the imaging lens 1 such that the two optical axes intersect each other at point Cl.
:. .
.
, . .
-18 ~ 57 6 1 The light-emitting device 6 is a light-emitting diode whose radiating surface 6a has an an integral part thereof a patterned surface for forming a patterned image.
As shown in Figs. 13 and 14, the light-emitting diode 6 consists of a semiconductor chip 21 that has electrode plates 22 and 23 attached to opposite sides that are parallel to the p-n junction of the semiconductor. The upper electrode plate 22 serves as the radiating surface.
The radiating surface 6a of the light-emitting device 6 is inclined with respect to a plane 4a that extends through the projection lens 4 at a right angle to its optical axis ~ 2 so that a patterned image plane 6' that is conjugate to the radiating surface 6a will be formed in a spatially inclined manner with respect to the radiating surface 6a. The imaging structure is the same in the case of the already described first aspect of the present invention.
As is well known, the amount of light reflected form the object decreases in pro~ortion to the square of the distance from the object. Therefore, if the light-emitting device 6 has a constant intensity of radiation over the entire surface, its focus detecting capability will decrease as the distance to the object increases. In order to avoid this, the output of the light-emitting device 6 must be set to such a value that the object can ~81~76 l be provided with a focus-detectable contrast even if it is located at the farthest end S3 of the intended focusing range~ ~owever if the output of the light-emitting de~ice 6 is set in this way, a substantial portion of the light S emitted to be projected to a near-distant object is simply wasted~
In order to solve this problem, the li~ht-emitting device 6 u~ed in the focus detecting auxiliar.y light projecting apparatus of the present inYention has a gradient of radiation intensity across the radiating surface 6a and is 80 positioned that a high-intensit~ area of the device 6 will illuminate an object al a far distance while a low-intensity area thereof will illuminate an object at a near distance.
lS In the embodiment shown, the light-emîttirlg device 6 is provided with a gradient of radiation intensity by causing current to flow between the electrode plates 22 and 23 at different densities at different area~ of the radiating surface 6a. ~ore specifically, the electrode plate 22 attached to one side of the semiconductor chip 21 is shaped in an interdigital form, as shown in Fig. 13 at a magnified scale. The interdigitated pattern of the opaque electrode plate 22 forms the patterned image. A
lead wire 25 extending fro~ a terminal 24 is bonded to ~ne longitudinal end of this electrode plate 22. The bonded - 20 1;281576 1 end of the electrode plate 22 is located on the end nearest the imaging optical a~is Ll-L2 and corresponds to the furthest extent S3 of the metering zone. The resistance of the arms of the electrode plate 22 is comparable to the resistance of the p-n junction.
Therefore, more current flows through the p-n junction, and thus produces more intense light, at the end nearer the lead wire 25. The other electrode plate 23 is so formed, as shown in Fig. 14, that it e~ficiently contacts the entire surface of the other side of the semiconductor chip and is integral with a terminal 26 on the s1.de. ~n example of the dimensions of the upper surace electrode plate 22 is also given in Fig. 13.
The components of the light-emitting device 6 are molded with a transparent resin (e.g. an acrylic resin) as depicted b~ the one-long-and-two-short dashed line in Fig. 14, with only part o the terminals 24 and 26 projection rom the plastic casing. ~ condenser lens portion 30 is formed on the side of the resin casing from which the emitted light will emerge.
When a voltage is applied between the terminals 24 and 26 on the light-emitting diode 6 having the construction described above, light is emitted from the R-n junction of the semiconductor chip 21 and emerges from25 the side where the electrode plate 22 is provided. Since -21- 1~8157~
1 this electrode plate 22 functions as a patterned surface, the light emanating from the device 6 is already patterned.
The density of current flowing between the electrode plates 22 and 23 is subject to variation on accoun~ of such factors as the position at which the lead wire 25 is bonded to the electrode plate 22 and a specific configuration of the electrode plate and this is also responsible for the production of a gradient of radlation ~ intensity the radiating surface 6a.
According to the experimental data attained by the t present inventors, the intensity of light radiating from the brightest area of the radiating aurface 6a tas deined by the dashed line A in Fig. 8~ is about twice as much as the intensity of light radiating from the darkest area ~as defined by the dashed line ~). A speclflc value of the relative intensity of radiation can be appropriately datermined by modifying the configuration of the electrode plate 22 or the position at which the lead wire 25 is bonded thereto.
If the light-emitting diode described above is used as the light-emit~ing device 6 in the focus detecting auxiliary light projecting apparatus of the second aspect of the present invention, the brightness of the patterned image plane 6l (i.eO, the brightness of the patterned 22 1~ 81~7 6 1 image projected to the object) is effectively decreased if the object is at a near distance and is increased if it i8 at a far distanceO This leads to efficient utilization of the energy of light radiating from the light-emitting device 6 and energy conservation can be realized without sacrificing the system capability of focus detection. In addition, since the patterned surface is formed as an integral part of the light ~ource, the overall ~ize of the light projecting optical unit 3 can be reduced~
By properly adjusting the gradient of intensity of light radiating from the light-emitting device 6 or the layout of the light projecting optical unit 3, a focus detecting apparatus which reads the patterned image on the object by way of the imaging lens 1 can feature a substantially constant contrast for ~he patterned image irre~pective of the distance to the object. In this case, the focus detecting apparatus operates with consistent accuracy of detection and the energy saving offered by the auxiliary light projecting apparatus of the present invention can be realized in an ideal manner. me intensity of .
light may be in proportion to a distance from the light source to the object to be projected or may preferably be in proportion to the square of the distance.
me other modes of action and advantages of the focus detecting auxiliary light projecting apparatus according to the second aspect of the present invention, and possible modifications of the layout of the light projecting optical unit 3 may be readily understood by ~ 8~ ~7 l those skilled in the light of the description of the first aspect of the invention and need not be explained in detail.
According to the focus detecting auxiliary light projecting apparatus incorporating the first aspect of the present invention, a sharply patterned image can be projected to the object over a wide range of di.stance.
The apparatus is compact and can be readily integrated in the body of a cameraO
In addition to these advantages, the focus detecting auxiliary light projecting apparatus according to the second aspect of the present invention enables efficient utilization of the energy of light radiating f~om the light-emitting device to thereby achieve energy a saving. As a further advantage, the unitary combination of the light source and the patterned surface con1:ributes to a further reduction in the overall. size of the apparatus.
FOR A FOCUS DETECTING SYSTEM
Field of the Invention The present invention relates to a focus detecting (auto-focus) auxiliary or supplementary light projecting device in a passive automatic focusing apparatus which is used with still cameras, movie cameras and other photographic equipment.
RIEF DESCRIPTION OF THE DRAWINGS
Figs. 1 to 5 are diagrams showing three examples of the prior art focus detecting auxiliary light projecting apparatus; Fig. 1 is a side view of the optical system used in the first example; Fig. 2 is a perspective view of the ~ame optical system; Fig. 3 i9 a ~ide view of the optical system used in the second example; Fig. 4 i9 a 1~ perspective view of the same optical system; and Fig. 5 is a perspective view of the optlcal system used ln the th~rd example.
Figs. 6 to 11 show one embodiment of the focus detecting auxiliary light projecting apparatus according to the first aspect of the present invention; Fig. 6 is a side view showing the configuration of the optical system 4 ~
~l , 1~8~576 1 used in the apparatus; Fig. 7 is a perspective view of the same optical system; Fig. 8 is a block diagram showing the essential features of an auto-focusing system; Fig. 9 is an enlarged view illustrating the basic pattern to be formed on the patterned surface shown in Fig. 6; Fig. 10 is a side view showing various design parameters of the optical system shown in Fig. 6, the parameters assuming the numerical values specified herein; and Fig. 11 is a perspective view showing a modification of the layout of the optical system shown in Fig. 6; and Figs. 12 to 14 show one embodiment of the focus detecting auxiliary light projecting apparatus according to the second aspect of the present invention; Fig. 12 is a side view showing the configuration of the optical system used in the apparatus; Fig. 13 is a perspective view of the light-emitting device shown in Fig. 12; and Fig. 14 is plan view of the radiating surface of the same light-emitting device.
Backaround of the Invention There are two principal approaches to automatic focusing used in present-generation photographic e~uipment. The methods can be categorized as active or passive. In the active system, a beam of infrared light or ultrasonic waves is projected onto the scene or object to be imaged and the resulting reflected light or echo is received and used to calculate the distance to the object.
One problem with this approach is that the range over _ 3 _ ~81S76 lwhich distance measurement can be achieved i~
substantially limited by the maximum distance that can be covered by infrared light or ultrasonic waves. Therefore, automatic focusing of single-lens reflex cameras and other photographic equipment that employs lenses of long focal distance as well as these of short focal distance i5 chiefly accomplished by the passive method which utilizes available ambient light to directly effect image detection.
10Passive automatic focus detection with cameras is most commonly achieved by what is generally referred to as the correlation method. According to this method, a pair of light-receiving devices (e.g. CCDs,i.e. charge coupled device each having a plurality of light-receiving areas are used. By comparing the photoelectric output of a light-receiving area in one device with the output from the corresponding light-receiving area in the other device, the point where closest matching between the two outputs occurs is detected and used as the proper focused point. This correlation method, however, is not highly suitable for focus detection in a dark scene because a relatively small amount of light will be emitted from the scene for reception by the light-receiving devices. This approach requires good lighting and contract conditions and sometimes fails if the scene is dark or has a low contrast.
1 This problem could be solved by flooding the object with auxiliary light from the direction of the camera. However, if auxiliary illuminating light is simply projected from a location in the neighborhood of S the optical axis of imaging lenses in the camera, the illumination falls perpendicularly on the object and is reflected from the object to produce a strong specular or skin reflection component, which will return to the camera so as to reduce the contrast of the object.
The auxiliary light should not cause glare to the person in the scene and, to this end, it generally has a relatively long wavelength ~e.g. 700nm) in the low luminosity range where the human eye is practically insensitive. However, the low-contrast phenomenon described in the preceding paragraph becomes pronounced if the object i6 illuminated with auxiliary light of long wavelength. With a view to avoiding this problem, it has been proposed that a pattern of alternating light and dark vertical lines be projected for providing a contract for the object. Therefore, the auxiliary light projecting devices in current use are designed to deliberately provide contrast for the object by projecting as striped pattern onto the object.
An example of the system that operates on this principle is shown schematically in Figs. 1 and 2. The 1 system illustrated in these drawings is intended to be used for a camera equipped with a through-the-lens (TTL)-type auto-focusing (AF) mechanism and an imaging lens 10 also serves as a lens in the focus detecting system.
The imaging lens 10 and a projection lens 11 are arranged in such a manner that the optical axis Ll-L2 of the imaging lens is parallel to the optical axis ~ 2 f the projection lens 11. A patterned surface 12 that is disposed in a direction perpendicular to the optical axi~
~ 2 iS offset upwardly by a predetermined amount with respect to the axis ~ 2-A light source (not shown)is disposed in the back of the patterned surface 12 and light coming from this source passes through the patterned surface 12 and the projection lens 11 to form a patterned image 13 at point Cl on the optical axis Ll-L2 of the imaging lens 10. In Fig. 1, a film surface 14 is located behind the imaging lens 10.
The system shown in Figs. 1 and 2 produces a focused patterned image 13 if the object is within a very small distance range including point Cl. However, if the object is outside of this range, only a blurred patterned image 13 is produced and the necessary contrast cannot be imparted to the object. Nith a view to expanding the focusing range of patterned image 13, the F number of the projection lens 11 may be increased so as to provide a greater depth of focus but then, the amount of light available for the patterned image 13 is excessively 1 decreased to put constrains on the range over which proper focus detection can be achieved.
Another problem with the system depicted in Figs. 1 and 2 is that the gap between the optical axes ~1-5 ~2 and Ll-L2 causes parallax on account of the distance from the object. As a result, the actual focusing range of this system is limited by whichever is the smaller of the range limited by the pattern dimensions and the range limited by the depth of focus.
Another system that embodies the idea of projecting a striped pattern is shown in Figs. 3 and 4.
In this system, the projection lens 11 and imaging lens 10 are so positioned that the optical axis ~ 2 of the projection lens 11 will cross the optical axis Ll-L2 of lS the imaging at a point Cl on the imaging optical axis Ll-L2. The patterned surface 12 is disposed to cross the projecting optical axis ~ 2 at a right angle so that a patterned image 13 inclined to the imaging optical axis Ll-L2 will be formed at point Cl. This system provides a somewhat broader focusing range than the system shown in Figs. 1 and 2 but it still has the disadvantage that a blurred image of the patterned image 13 will be formed outside of this focusing range.
Therefore, in the actual system available commercially today, two units of the auxiliary light 1'~8~576 1 projecting system shown in Fig. 1 are together provided as shown in Fig. 5. In this arrangement, light issuing from a light source (not shown) passes through the patterned surface 12 and projection lens 11 to form a patterned image 13 at point Cl on the imaging optical axis Ll-L2, while light comin~ from another light source (not shown) passes through another patterned surface 12' and projection lens 11' to form a second patterned image 13' at another point C2 on the imaging optical axis Ll-L2.
This commercial system has the advantage that the focusing range can be expanded to a certain extent while effectively compensating for parallax. However, even this system does not offer a complete solution to the aforementioned problems and the focusing range that can be attained is limited to be within the depths of focus of Cl and C2. In addition, a compact system cannot be fabricated because it i5 necessary to install two projector units in, for example, an accessory strobe apparatus rather than in the camera body itself.
A TTL-type active AF system adapted to a TV zoom lens is shown on page 457 (47) of Xogaku (Optics), 10, 6 published by the Meeting on Optics, the Society of Applied Physics of Japan, December 1981. This system projects auxiliary light through an imaging lens and provides a wide focusing range. However, it requires that an image-1;~8~S76 1 focusing lens which matches the imaging lens be provided in front of both the light-emitting and the light-receiving devices. Therefore, the system cannot be readily adapted to a single-reflex lens camera which requires easy lens changing in its operation.
SUMMARY OF THE INVENTION
The present invention has been accomplished in order to solve the aforementioned problems of the prior art.
0 Accordingly, an object of the present invention is to provide an auto-focus auxiliary light projecting apparatus in which the focusing range of patterned image to be projected on the object i9 expanded to enable the object to be provided with an adequate contrast over a wide range of distance.
Another object of the invention is to provide such a device which, in addition, can be fabricated in a sufficiently small size to be incorporated in the body of photograhic equipment such as a camera.
According to one aspect of the present invention, a patterned surface for forming a patterned image is inclined with respect to a plane that extends through a projection lens at a right angle with respect to its optical axis so that a patterned image plane is conjugate 1'~8~576 1 to the patterned surface will be formed in a spatially inclined manner with respect to the patterned surface.
According to another aspect of the present invention, a patterned surface for forming a patterned image is provided as an integral part of the radiating surface of a light-emitting device that has a gradient of radiation intensity across its radiating surface. This radiating surface is inclined with respect to a plane that extends through a projection lens at a right angle with respect to its optical axis so that a patterned image plane conjugate to the radiating surface will be formed in a spatially inclined manner with respect to the radiating surface. The light-emitting devlce is so positioned that its high-intensity area will illuminate an object at a far distance and its low-intensity area will illuminate an object at a near distance.
57~i 1 DETAILED DESCRIPTION OF THE PREFERRED EMBODIMEN~S
Embodiments of the present invention are hereinafter described with reference to accompanying FigsO 6 to 140 Inclined Patterned Surface Figs. 6 and 7 show in a side and a perspective view, respectivelyF the configuration of an optical system in a focus detecting auxiliary light projecting apparatus according to one embodiment of the first aspect of the present invention~ It is intended that the apparatus is applied to a camera equipped with a TTL-type AF system.
! In these figures, an imaging lens l is included in the camera. In order for the image of an object ~not shown) to be formed in focus on a film surface 2, the imaging lens 1 is adapted to be driven ~rom the position indicated by the solid line to the positlon indicated by either the one-long-and-two-short dashed line or the dashed line in response to the result of focus detection.
The imaging lens l also serves as a lens in the focus detecting system such that part of the light emanating from the object passing the l~ns l is reflected by a movable mirror 20, shown in Fig. 8r into a focus detecting apparatus 22 which may operate on a variety ~f principles of focus detecting such as by detection of contrast or by detection of phase difference~ One example .
81',76 1 was described in more detail in the backgorund section.
The output of the focus detecting apparatus 22 is used by a lens drive circuit 24 to translate the imaging lens 1 along the imaging optical axis Ll-L2 to bring the imaging lens 1 into focus with the object.
Above the imaging lens 1 is disposed, as shown in Fig. 6f a projection optical unit 3 which makes up a focus detecting auxiliary light projecting apparatus. The optical unit 3 is an integral assembly of a projection lens 4, a patterned surface 5 and a light source 6.
The layout and configurations of the individual components of the optical unit 3 are described below. First, the projection lens 4 is so positioned that its optical axis ~ 2 is inclined to the optical axis Ll-L2 of the imaging lens 1, with the two optical axes intersecting each other at a point Cl. The patterned surface 5, the light transmitting parts of which dif~usely pass the light from the light source 6, is inclined to a plane 4a which passes through the projection lens 4 and which intersects its optical axis ~ 2 at a right angle. The projection optical unit 3 taken generally forms a tilting optical systemr It is generally known that when an object plane is inclined with respect to a plane through a lens that intersects its optical axis, the resulting image plane is spatially inclined with respect to the object plane in , ~ 81 5 l accordance with the law of Schib-Lief~ Therefore, in the light projecting optical unit 3, too, a patterned image plane 5' which is a conjugate surface with respect to the patterned surface 5 will form (i.eO, will be focused) in a spatially inclined manner with respect to the patterned surface 5, as shown in FigO 7.
In the embodiment shown, the imaging lens 1 is so positioned that its optical axis Ll-L2 will partially lie in the patterned image plane 5'~ Consequently, the extension of the plane 4a which crosses the projection optical axis ~ 2 at a right angle ~ill intersect the extension of the patterned surface 5 at; a point CO which is located on the optical axis Ll-L2 oi. the imaging lens 1~
The patterned surface 5 i8 provided with a pattern of alternating transparent or translucent and opaque lines that extend longitudinally with respect to the optical axes across its surface. The pattern has an irregular or non-periodic pitches. Part of this patterned surface 5 is shown at an enlarged scale in Fig. g together with the dimensions of several transparent ~unhatched) and opaque (cross-hatched) lines.
Light issuing from the light source 6 disposed in the back of the patterned surface 5 passes through the patterned surface and the images of points Pl to P4 on the patterned surface 5 are formed at respective points Pl' to 1 P4 ~ on the patterned image plane 5 J t in such a manner that the pattern of alternating clear and opaque lines in the ~urface 5 will align on the plane 5' in a direction parallel to the imaging optical axis Ll-L2~ In the embodiment shown, the light source will project light, for exarnple~ red light which is in the wavelength region of low luminoslty where ~he human eye is prac~ically insensitive.
Three design dimensions Sl, S2 and S3 t and two angles ~1 and ~2 for the components of the projecting optical unit 3 are indicated in Fig. 9.
The angle ~1 is the relative inclination of the ~wo optical axes ~ 2 and Ll-L2 and the angle ~;! iS the inclination of the patterned surface 5 with respect to the pro~ection lens 4. The design dimension Sl is t~e location of the intersection of the two optical axes ~ 2 and Ll-L2 and S2 and S3 define the longitudinal limits of the patterned image plane 5 and thus the limits of the AF
mechanism of the invention. The design dimensîons and the angles mày have the following values assuming ~ mm for the focal length (fj of the projection lens 4:
Table Sl = 1~668 m ~1 = 2~2 S2 = 1 m ~2 = 7-3 S3 = 5 m 12~76 1 In the embodiment described above, if the object is situated on the patterned image plane 5', a sharp patterned image of good contrast can always be projected irrespective of the distance to the object.
The patterned image plane 5' can be enlarged by increasing the size of the patterned surface 5 and i its Rize is increased and a brighter illumination provided by the light source 6, the range of focus detection can be extended to the farthest point that is permissible by the detection capacity of the optical unit 3.
Focus detection, whether it is achieved by the active or passive method, is directed to only part: of the imaging range, which is generally referred to as the di6tance measuring zone. In the embodiment being considered, this distance measuring zone is set tc- lle in the neighborhood of the optical axis Ll-L2 of the imaging lens. Therefore, in the embodiment described above, the optical axis Ll-L2 of the imaging lens 1 is situated on the patterned image plane 5' in order to enable precise focus detection and focus adjustment.
The apparatus according to the embodiment described above can be fabricated in a compact size because the single light projecting optical unit 3 is capable of covering any of the objects that are within the distance metering zone, which if fairly large. As a 1 further advantage, this unit which is an integral combination of the projection lens 4, patterned surface 5 and ~hc light source can be readily assembled into the camera body such as to satisfy the requirements for the layout specified by the present inventionO
In the embodiment described above, the pro~ectîng optical unit 3 is disposed above the imaging lens 1 but thi.s is no~ ~he only layout ~ha~ can be employed to allow the optical axis Ll-L2 of the lens 1 to be situated on the patterned image plane 5'. Equally good resul~s are attained even when this unit is disposed exactly on ~he side of the imaging lens 1, as shown in Fig. 10. In other words, the optical unit 3 may be disposed at any location around the imagin~ lens 1.
As ~ust mentioned in the preceding paragraph, the optical axis ~l-L2 Of the imaging lens 1 does not necessarily have to be included in the patterned image plane 5'. If the object within the distance metering zone can be provided with a detectable contrast r the patterned image plane 5' may be positioned in other attitudes such as to cross the imaging optical axis Ll-L2 at a single point or to lie parallel to the axi~ the imagîng optical~
Even in these cases, results which are comparable to those attained in the embodiment described above can b~
obtained. The position of the patterned image plane 5' 157~;
1 can be changed by any appropriate method such as alteringthe position at which the light projecting optical unit 3 is disposed or the angle at which the projection lens 4 is inclined with respect to the patterned surface 5 as long s as the patterned image plane 5' lies within the field of view of the imaging lens 1.
The embodiment described above concerns the case in which the distance metering zone is set in the neighborhood of the optical axis Ll-L2 of the imaging lens 1. Even if the metering zone is set to lie in other regions, equally good results can be att:ained by positioning the patterned image plane 5' to be situated in Rubstantial agreement with this zone.
~n the first embodiment, the extensio:ns of the patterned Rurface 5 and the plane 4a though the proiection lens 4 that crosses itR optical axis ~ 2 at a right angle intersect each other at the point Co on the imaging optical axis Ll-L2. ~owever, substantially equal results are attained if the crossing point CO is located slightly away from the optical axis Ll-h2 because what occurs in this case is simply that the patterned image rotates slightly about the point Cl.
The foregoing embodiment assumes the case in which the present invention is applied to an automat7c focus detecting apparatus that is intended to be used in a still .
~81~76 1 camera equipped with a TTL-type AF system. It should, however, be noted that the concept of the present invention is also applicable to a movie camera (TV camera) and to a camera that employs a focus detecting optical system which is ;ndependent of an imaging optical system.
In the embodiment described above~ the pattexned surface 5 is disposed separately from the light: source butr needless to say, the patterned surface may be formed as an integral part of the radiating surface of the light source.
Varied IntensitY Pattern One embodiment of the present invention according to its second aspect i9 hereunder described with reference to Figs. 12 to 14 in which the components which are the same as those employed in the first aspect of the present invention are identified by the ~ame numerals and will no~.
be described in detail.
In the optical system shown in Fig. 12, a light projecting optical unit 3 consisting of a projectio~ lens 4 and a light-emitting device 6 i5 disposed above an imaging lens 1 and the optical axis ~ 2 Of the projection lens 4 is inclined to the optical axis ~1-L2 of the imaging lens 1 such that the two optical axes intersect each other at point Cl.
:. .
.
, . .
-18 ~ 57 6 1 The light-emitting device 6 is a light-emitting diode whose radiating surface 6a has an an integral part thereof a patterned surface for forming a patterned image.
As shown in Figs. 13 and 14, the light-emitting diode 6 consists of a semiconductor chip 21 that has electrode plates 22 and 23 attached to opposite sides that are parallel to the p-n junction of the semiconductor. The upper electrode plate 22 serves as the radiating surface.
The radiating surface 6a of the light-emitting device 6 is inclined with respect to a plane 4a that extends through the projection lens 4 at a right angle to its optical axis ~ 2 so that a patterned image plane 6' that is conjugate to the radiating surface 6a will be formed in a spatially inclined manner with respect to the radiating surface 6a. The imaging structure is the same in the case of the already described first aspect of the present invention.
As is well known, the amount of light reflected form the object decreases in pro~ortion to the square of the distance from the object. Therefore, if the light-emitting device 6 has a constant intensity of radiation over the entire surface, its focus detecting capability will decrease as the distance to the object increases. In order to avoid this, the output of the light-emitting device 6 must be set to such a value that the object can ~81~76 l be provided with a focus-detectable contrast even if it is located at the farthest end S3 of the intended focusing range~ ~owever if the output of the light-emitting de~ice 6 is set in this way, a substantial portion of the light S emitted to be projected to a near-distant object is simply wasted~
In order to solve this problem, the li~ht-emitting device 6 u~ed in the focus detecting auxiliar.y light projecting apparatus of the present inYention has a gradient of radiation intensity across the radiating surface 6a and is 80 positioned that a high-intensit~ area of the device 6 will illuminate an object al a far distance while a low-intensity area thereof will illuminate an object at a near distance.
lS In the embodiment shown, the light-emîttirlg device 6 is provided with a gradient of radiation intensity by causing current to flow between the electrode plates 22 and 23 at different densities at different area~ of the radiating surface 6a. ~ore specifically, the electrode plate 22 attached to one side of the semiconductor chip 21 is shaped in an interdigital form, as shown in Fig. 13 at a magnified scale. The interdigitated pattern of the opaque electrode plate 22 forms the patterned image. A
lead wire 25 extending fro~ a terminal 24 is bonded to ~ne longitudinal end of this electrode plate 22. The bonded - 20 1;281576 1 end of the electrode plate 22 is located on the end nearest the imaging optical a~is Ll-L2 and corresponds to the furthest extent S3 of the metering zone. The resistance of the arms of the electrode plate 22 is comparable to the resistance of the p-n junction.
Therefore, more current flows through the p-n junction, and thus produces more intense light, at the end nearer the lead wire 25. The other electrode plate 23 is so formed, as shown in Fig. 14, that it e~ficiently contacts the entire surface of the other side of the semiconductor chip and is integral with a terminal 26 on the s1.de. ~n example of the dimensions of the upper surace electrode plate 22 is also given in Fig. 13.
The components of the light-emitting device 6 are molded with a transparent resin (e.g. an acrylic resin) as depicted b~ the one-long-and-two-short dashed line in Fig. 14, with only part o the terminals 24 and 26 projection rom the plastic casing. ~ condenser lens portion 30 is formed on the side of the resin casing from which the emitted light will emerge.
When a voltage is applied between the terminals 24 and 26 on the light-emitting diode 6 having the construction described above, light is emitted from the R-n junction of the semiconductor chip 21 and emerges from25 the side where the electrode plate 22 is provided. Since -21- 1~8157~
1 this electrode plate 22 functions as a patterned surface, the light emanating from the device 6 is already patterned.
The density of current flowing between the electrode plates 22 and 23 is subject to variation on accoun~ of such factors as the position at which the lead wire 25 is bonded to the electrode plate 22 and a specific configuration of the electrode plate and this is also responsible for the production of a gradient of radlation ~ intensity the radiating surface 6a.
According to the experimental data attained by the t present inventors, the intensity of light radiating from the brightest area of the radiating aurface 6a tas deined by the dashed line A in Fig. 8~ is about twice as much as the intensity of light radiating from the darkest area ~as defined by the dashed line ~). A speclflc value of the relative intensity of radiation can be appropriately datermined by modifying the configuration of the electrode plate 22 or the position at which the lead wire 25 is bonded thereto.
If the light-emitting diode described above is used as the light-emit~ing device 6 in the focus detecting auxiliary light projecting apparatus of the second aspect of the present invention, the brightness of the patterned image plane 6l (i.eO, the brightness of the patterned 22 1~ 81~7 6 1 image projected to the object) is effectively decreased if the object is at a near distance and is increased if it i8 at a far distanceO This leads to efficient utilization of the energy of light radiating from the light-emitting device 6 and energy conservation can be realized without sacrificing the system capability of focus detection. In addition, since the patterned surface is formed as an integral part of the light ~ource, the overall ~ize of the light projecting optical unit 3 can be reduced~
By properly adjusting the gradient of intensity of light radiating from the light-emitting device 6 or the layout of the light projecting optical unit 3, a focus detecting apparatus which reads the patterned image on the object by way of the imaging lens 1 can feature a substantially constant contrast for ~he patterned image irre~pective of the distance to the object. In this case, the focus detecting apparatus operates with consistent accuracy of detection and the energy saving offered by the auxiliary light projecting apparatus of the present invention can be realized in an ideal manner. me intensity of .
light may be in proportion to a distance from the light source to the object to be projected or may preferably be in proportion to the square of the distance.
me other modes of action and advantages of the focus detecting auxiliary light projecting apparatus according to the second aspect of the present invention, and possible modifications of the layout of the light projecting optical unit 3 may be readily understood by ~ 8~ ~7 l those skilled in the light of the description of the first aspect of the invention and need not be explained in detail.
According to the focus detecting auxiliary light projecting apparatus incorporating the first aspect of the present invention, a sharply patterned image can be projected to the object over a wide range of di.stance.
The apparatus is compact and can be readily integrated in the body of a cameraO
In addition to these advantages, the focus detecting auxiliary light projecting apparatus according to the second aspect of the present invention enables efficient utilization of the energy of light radiating f~om the light-emitting device to thereby achieve energy a saving. As a further advantage, the unitary combination of the light source and the patterned surface con1:ributes to a further reduction in the overall. size of the apparatus.
Claims (35)
1. A focusing device, comprising:
means for detecting a focusing condition of a first lens relative to an object along a first optical axis;
a patterned surface having a patterned image; and a projection lens for projecting said patterned image of said patterned surface onto said object at least during an operation of said detecting means, a normal of said patterned surface being inclined to a second optical axis of said projection lens, whereby said projected patterned image extends at least partially in a direction along said first optical axis.
means for detecting a focusing condition of a first lens relative to an object along a first optical axis;
a patterned surface having a patterned image; and a projection lens for projecting said patterned image of said patterned surface onto said object at least during an operation of said detecting means, a normal of said patterned surface being inclined to a second optical axis of said projection lens, whereby said projected patterned image extends at least partially in a direction along said first optical axis.
2. A focusing device as recited in claim 1, wherein said patterned surface is inclined to a plane passing through said projection lens at right angles to said second optical axis of said projection lens.
3. A focusing device as recited in claim 1, wherein said projected patterned image is conjugate to said patterned image of said patterned surface.
4. A focusing device as recited in claim 1, wherein said patterned surface comprises a predetermined pattern of alternatingly transmitting and blocking portions and further comprising a light source transmitting light through said patterned surface to said projection lens.
5. A focusing device as recited in claim 4, wherein said light source emits primarily red light of a wavelength of low human sensitivity.
6. A focusing device as recited in claim 4, wherein said pattern has an irregular or non-periodic pitch.
7. A focusing device as recited in claim 1, wherein said first lens is an imaging lens and said detecting means detects said focusing condition according to light received through said imaging lens and said projection lens is disposed in the vicinity of said first optical axis of said imaging lens.
8. A focusing device as recited in claim 7, wherein said optical axis of said projection lens intersects said first optical axis of said imaging lens.
9. A focusing device as recited in claim 8, wherein said projected patterned image is conjugate to said patterned image of said patterned surface and lies in a plane including said first optical axis of said imaging lens.
10. A focusing device as recited in claim 7, wherein said first optical axis substantially passes through an intersection of an extension of said patterned surface and said plane passing through said projection lens.
11. A focusing device as recited in claim 7, wherein said first optical axis passes away from an intersection of an extension of said patterned surface and said plane passing through said projection lens.
12. A focusing device as recited in claim 1, further comprising a light source having a light emission pattern as said patterned image.
13. A focusing device as recited in claim 12, wherein said light source is a semiconductor light source with a light emitting semiconductor junction and said light emission pattern is formed by current electrodes on said semiconductor light source.
14. A focusing device as recited in claim 13, wherein said current electrodes provide greater current density to one portion of said semiconductor light source extending linearly along said current electrodes than to another said portion, thereby providing varying light emission intensity, a greater light emission intensity being projected by said projection lens to a further portion of said projected patterned image away from said projection lens.
15. A focusing device as recited in claim 1, wherein said detecting means is operable for detecting focusing of said object being located within a distance measuring zone and wherein said projected patterned image substantially extends across opposing sides of said distance measuring zone.
16. A focusing device as recited in claim 15, further comprising a light source having said patterned surface formed as an integral part of its light radiating surface.
17. A focusing device as recited in claim 16, wherein said light source, said patterned surface and said projection lens are molded together.
18. A focusing device as recited in claim 17, wherein said first lens is an imaging lens and said detecting means detects said focusing condition according to light received through said imaging lens.
19. A focusing device as recited in claim 1, wherein said patterned surface is planar.
20. A focusing device comprising:
means for detecting a focusing condition of a first lens relative to an object along a first optical axis;
a patterned surface having a patterned image;
a projection lens for projecting said patterned image of said patterned surface onto said object during an operation of said detecting means, whereby said projected patterned image extends at least partially in a direction along said first optical axis; and a light source having said patterned surface formed as an integral part of its light radiating surface.
means for detecting a focusing condition of a first lens relative to an object along a first optical axis;
a patterned surface having a patterned image;
a projection lens for projecting said patterned image of said patterned surface onto said object during an operation of said detecting means, whereby said projected patterned image extends at least partially in a direction along said first optical axis; and a light source having said patterned surface formed as an integral part of its light radiating surface.
21. A focusing device as recited in claim 20, wherein said light source, said patterned surface and said projection lens are molded together.
22. A focus detecting auxiliary light projecting apparatus having a projection lens for projecting a patterned image onto an object and a patterned surface for forming the patterned image, a normal of said patterned surface being inclined with respect to the optical axis thereof so that a patterned image plane which is conjugative to said patterned surface will be formed in a spatially inclined manner with respect to said patterned surface.
23. A light projecting apparatus as recited in claim 22, wherein said patterned surface being inclined with respect to a plane that extends through said projection lens at a right angle with respect to the optical axis thereof.
24. A light projecting apparatus as recited in claim 23, wherein said patterned surface comprises a predetermined pattern of alternatingly transmitting and blocking portion and further comprising a light source transmitting light through said patterned surface to said projection lens, said pattern having an irregular or non-periodic pitch.
25. A light projecting apparatus as recited in claim 24, wherein an optical axis of an imaging lens substantially passes through an intersection of an extension of said patterned surface and of said plane passing through said projection lens.
26. A light projecting apparatus as recited in claim 24, wherein an optical axis of an imaging lens is completely disposed away from an intersection of an extension of said patterned surface and said plane passing through said projection lens.
27. A light projecting apparatus as recited in claim 24, said light being adapted to be incorporated in a body of a camera.
28. A focusing device as recited in claim 22, wherein said patterned surface is planar.
29. A light projecting device, comprising:
a light source having a patterned surface said patterned surface having a patterned image varying across a first direction of said patterned surface, said light source emitting a light intensity varying in a second direction of said patterned surface transverse to said first direction; and a projection lens for transmitting said patterned image of said patterned surface along an optical axis of said projection lens, wherein a high light intensity portion of said patterned surface is imaged by said projection lens at a greater distance from said projection lens than a low light intensity portion of said patterned surface.
a light source having a patterned surface said patterned surface having a patterned image varying across a first direction of said patterned surface, said light source emitting a light intensity varying in a second direction of said patterned surface transverse to said first direction; and a projection lens for transmitting said patterned image of said patterned surface along an optical axis of said projection lens, wherein a high light intensity portion of said patterned surface is imaged by said projection lens at a greater distance from said projection lens than a low light intensity portion of said patterned surface.
30. A light projecting device as recited in claim 29, wherein said light intensity varies substantially monotonically.
31. A light projecting device as recited in claim 29, wherein said light intensity varies so that it is in proportion to a square of a distance from said light source to an object to be projected.
32. A light projecting device as recited in claim 29, wherein said light source is a light emitting device having said patterned surface as an integral part of its radiating surface.
33. A light projecting device as recited in claim 29, further comprising means for detecting a focusing condition of a lens viewing an object onto which said image of said patterned surface is imaged.
34. A light projecting device as recited in claim 33, wherein said light source is a light emitting device having said patterned surface as an integral part of its radiating surface.
35. A light projecting device as recited in claim 29, wherein a normal of said patterned surface is inclined with respect to said optical axis of said projection lens.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6696786 | 1986-03-25 | ||
| JP66967/86 | 1986-03-25 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CA1281576C true CA1281576C (en) | 1991-03-19 |
Family
ID=13331300
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA000532929A Expired - Lifetime CA1281576C (en) | 1986-03-25 | 1987-03-25 | Auxiliary light projecting apparatus for a focus detecting system |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JPH0697299B2 (en) |
| KR (1) | KR900003655B1 (en) |
| CA (1) | CA1281576C (en) |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5596406A (en) * | 1979-01-19 | 1980-07-22 | Hitachi Ltd | Device for determining roughness of surface |
| JPH0677100B2 (en) * | 1985-01-19 | 1994-09-28 | ミノルタカメラ株式会社 | Illumination optical system for focus detection |
-
1987
- 1987-02-06 JP JP62026124A patent/JPH0697299B2/en not_active Expired - Fee Related
- 1987-03-25 KR KR8702720A patent/KR900003655B1/en not_active IP Right Cessation
- 1987-03-25 CA CA000532929A patent/CA1281576C/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| KR870009254A (en) | 1987-10-24 |
| JPH0697299B2 (en) | 1994-11-30 |
| KR900003655B1 (en) | 1990-05-28 |
| JPS6323114A (en) | 1988-01-30 |
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