CA1245368A - Test probe for printed circuit boards or the like - Google Patents
Test probe for printed circuit boards or the likeInfo
- Publication number
- CA1245368A CA1245368A CA000515719A CA515719A CA1245368A CA 1245368 A CA1245368 A CA 1245368A CA 000515719 A CA000515719 A CA 000515719A CA 515719 A CA515719 A CA 515719A CA 1245368 A CA1245368 A CA 1245368A
- Authority
- CA
- Canada
- Prior art keywords
- insulator
- pin
- test probe
- end portion
- probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Measuring Leads Or Probes (AREA)
Abstract
TEST PROBE FOR PRINTED CIRCUIT BOARDS OR THE LIKE
Abstract of the Disclosure A test probe ("pogo pin") or the like for use in testing printed circuit boards (PCBs) or the like. An otherwise conventional test probe, having a first end for contacting a PCB along a line of action parallel to the longitudinal axis of the probe, has an insulator around the first end. The insulator circumferentially surrounds the first end and protrudes beyond the first end, in an axial direction, at at least one point. As a result, the probe cannot make electrical contact with a planar object; the probe will, however, make electrical contact with d lead protruding from a PCB.
- i -
Abstract of the Disclosure A test probe ("pogo pin") or the like for use in testing printed circuit boards (PCBs) or the like. An otherwise conventional test probe, having a first end for contacting a PCB along a line of action parallel to the longitudinal axis of the probe, has an insulator around the first end. The insulator circumferentially surrounds the first end and protrudes beyond the first end, in an axial direction, at at least one point. As a result, the probe cannot make electrical contact with a planar object; the probe will, however, make electrical contact with d lead protruding from a PCB.
- i -
Description
~S3~8 TEST PROBE FOR PRINTED CIRCUIT BOARDS OR THE LIKE
This invention relates generally to probes (pins) or the like used for making test connections to printed circuit boards (PCB) or the like, and more particularly to such a probe or pin incorporating an insulator portion.
Background of the Invention Test probes (pins) used for testing PCBs are well known, as are various schemes for testing PCBs using those probes.
One such probe is manufactured by Fairchild Camera & Instrument Corp.
and has their part number 733284; a probe of this type is sometimes referred to as a "pogo pin". Some testing schemes for testing PCBs are depicted in the following patents to which attention is directed:
U.S. patent No. 4,099,120 dated July 4, l978 by A. Aksu; U.S. patent No. 4,321,533 dated March 23, 1982 by J.L. Matrone; and U.S. patent No. 4,322,682 dated ~arch 30, 1982 by K.H. Schadwill.
One problem with the test probes and the testing methods described above is that the test is carried out on the circuitry of the PCB and not on the r,ormal connector used with the PCB. As a result, if a component lead is missing (e.g. a lead joining the connector to the PCB) the PCB will test OK via the test probes but when installed in a conventional manner (i.e. via its connector) in a piece of equipment, it will not function properly due to the missing connection.
Summary of the Invention The present invention is directed to overcoming the above-mentioned problem. That is, the present invention is directed to alleviating the problem of having the test probe make an electrical contact when the component lead is missing. In other words, the test S~6~3 probe of the present invention is designed to prevent an electrical contact with the PCB circuitry if the component lead is missing, yet to allow electrical contact if the lead is located properly.
To achieve this objective, the present invention incorporates an insulating collar of material around an otherwise standard test probe. The insulating collar has a "high" spot at one location which prevents the metallic parts of the test probe from making an electrical connection with a planar object (such as a PCB
with a missing component lead) but which will allow electrical contact if the lead in question, is in place.
Stated in other terms, the present invention is a test probe for use in testing printed circuit boards (PCB) or the like, the test probe being generally tubular in shape and having a first end for contacting a PCB along a line of action parallel to the longitudinal axis of the probe, the test probe characterized by: a collar oF insulating material at the first end, surrounding the circumference of the first end and having at least one portion extending, in an axial direction, beyond the extent of the first end.
Stated in yet other terms, the present invention is a collar of insulating material for use on a test probe used for testing printed circuit boards (PCB) or the like, the test probe being generally tubular in shape and having a first end for contacting a PCB along a line of action parallel to the longitudinal axis of the probe, the collar characterized by: a generally tubular or cylindrical-shaped member for mating with the first end of the probe and having at least one portion extending, in an axial direction, beyond the extent of the first end.
Brief Description of the Drawings The invention will now be described in more detail with ~2'~3~i8 reference to the accompanying drawings wherein like parts in each of the several figures are identified by the same reference character, and wherein:
Figure 1 is an elevational view of a prior art test probe;
Figure 2 is an elevational view of the probe of Figure 1 in use, Figure 3 is an elevational view o-f the probe of the present invention in use;
Figure 4 is another elevational view of the probe of the present invention in use;
Figure 5 is a front elevational view oF the probe of the present invention;
Figure 6 is a side eleva-tional view of the probe of the present invention;
Figure 7 is a top plan view of only a portion of the probe of Figure 6;
Figure 8 is a front elevational view of an alternative embodiment of a portion of the probe of Figure 6; and Figures 9 and 10 are front elevational views of alternative embodiments of the probe of Figure 6.
_tailed Description Figure 1 depicts a prior art test probe 10 commonly used for testing PCBs. Probe 10 is in fact part No. 733284 made by Fairchild Camera & Instrument Corp. Probe 10 supports collar 11 and four prongs 12a, 12b, 12c, and 12d (referred to collectively as prongs 12). Probe 10 is generally tubular in shape and is approximately 0.040 inches (1.02 mm) wide throughout most of its L2~;3~3 length and approximately 0.050 inches (1~27 mm) wide at its widest part (i.e. at collar 11). Probe 10 is approximately 1.3 inches (3.3 cm) long.
Figure 2 depicts probe 10 in operation. Also shown in Figure 2 is a portion of a printed circuit board (PCB) 13 supporting a solder pad 14 and a component lead 16 extending both above and below PCB 13. As is well known, probe 10 is applied to lead 16 for testing purposes. Prongs 12 make electrical contact with lead 16 and consequently permits testing to be accomplished.
If component lead 16 is missing (e.g. a component was omitted from PCB 13) probe 10 can still make contact with solder pad 14 and may result in erroneous test results. ~or example, lead 16 may connect with an edge connector. If lead 16 is required to connect with an edge connector but the lead is missing, then PCB 13 may test OK according to test probe 10, yet PCB 13 will fail when connections are made via its normal edge connector.
Figure 3 depicts test probe 20 according to the present invention that is designed to prevent such erroneous test results.
That is, probe 20 is designed to make an electrical contact with PCB
13 if and only if a lead is present at the desired location on PCB
13.
Test probe 20 has a collar 21 and four prongs 22a, 22b, 22c, and 22d (referred to collectively as prongs 22). Probe 20 is generally tubular in shape and has approximately the same dimensions as probe 10. Probe 20 additionally has an insulator 23. Insulator 23 (comprised of, for example nylon) is generally tubular or cylindrical in shape and includes a protruberance 24 at one point so as to extend beyond the reach of prongs 22. As a result of insulator 23, as shown S3 Ei8 in Figure 3, if a lead does not protrude from PCB 13, prongs 22 are not able to make electrical contact with PCB 13. That is, protruberance 24 of insulator 23 contacts PCB 13 keeping prongs 22 of probe 20 spaced from solder pad 14 so that no electrical connection is made.
Figure 4 depicts the operation of probe 20 when a lead 16 is present. As can be seen from Figure 4, when lead 16 is present, prongs 22 contact lead 16 and make an electrical connection between lead 16 and probe 20. Insulator 23 and protruberance 24 do not come into play when lead 16 is present.
Figures 5, 6 and 7 depict one preferred embodiment of the present invention. Figure 5 is a front elevational view depicting insulator 23 and its generally triangular protruberance 24. Probe 20 is approximately 0.040 inches (1.02 mm) wide, collar 21 is approximately 0.050 inches (1.27 mm) wide, and insulator 23 is approximately 0.060 inches (1.52 mrn) wide at its widestO Note that insulator 23 is attached to probe 20 via a friction fit. Note also that protruberance 24 extends beyond prongs 22 by about 0.010 inches (0.25 mm). Figure 6 is the same as Figure 5 but is a side elevational view, Figure 7 is a top plan view of insulator 23 by itself.
Figure 8 is a front elevational view of an alternative shape for insulator 23 and is referenced as insulator 23c. A further alternative would be to have more than one protruberance 24 on insulator Z3 (see Figure 9 showing probe 20a with insulator 23a), and a yet further alternative would be to have insulator 23 itself extend beyond prongs 22 (i.e. see Figure 10 depicting probe 20b having insulator 23b extending as far as protruberance 24 thereby obviating ;368 the need for a separate protruberance 24).
It should be noted that in the preferred embodiment of the invention, probe 20 (Figure 5) is constructed by taking probe 10 (Figure 1) and adding to it, insulator 23.
A....
This invention relates generally to probes (pins) or the like used for making test connections to printed circuit boards (PCB) or the like, and more particularly to such a probe or pin incorporating an insulator portion.
Background of the Invention Test probes (pins) used for testing PCBs are well known, as are various schemes for testing PCBs using those probes.
One such probe is manufactured by Fairchild Camera & Instrument Corp.
and has their part number 733284; a probe of this type is sometimes referred to as a "pogo pin". Some testing schemes for testing PCBs are depicted in the following patents to which attention is directed:
U.S. patent No. 4,099,120 dated July 4, l978 by A. Aksu; U.S. patent No. 4,321,533 dated March 23, 1982 by J.L. Matrone; and U.S. patent No. 4,322,682 dated ~arch 30, 1982 by K.H. Schadwill.
One problem with the test probes and the testing methods described above is that the test is carried out on the circuitry of the PCB and not on the r,ormal connector used with the PCB. As a result, if a component lead is missing (e.g. a lead joining the connector to the PCB) the PCB will test OK via the test probes but when installed in a conventional manner (i.e. via its connector) in a piece of equipment, it will not function properly due to the missing connection.
Summary of the Invention The present invention is directed to overcoming the above-mentioned problem. That is, the present invention is directed to alleviating the problem of having the test probe make an electrical contact when the component lead is missing. In other words, the test S~6~3 probe of the present invention is designed to prevent an electrical contact with the PCB circuitry if the component lead is missing, yet to allow electrical contact if the lead is located properly.
To achieve this objective, the present invention incorporates an insulating collar of material around an otherwise standard test probe. The insulating collar has a "high" spot at one location which prevents the metallic parts of the test probe from making an electrical connection with a planar object (such as a PCB
with a missing component lead) but which will allow electrical contact if the lead in question, is in place.
Stated in other terms, the present invention is a test probe for use in testing printed circuit boards (PCB) or the like, the test probe being generally tubular in shape and having a first end for contacting a PCB along a line of action parallel to the longitudinal axis of the probe, the test probe characterized by: a collar oF insulating material at the first end, surrounding the circumference of the first end and having at least one portion extending, in an axial direction, beyond the extent of the first end.
Stated in yet other terms, the present invention is a collar of insulating material for use on a test probe used for testing printed circuit boards (PCB) or the like, the test probe being generally tubular in shape and having a first end for contacting a PCB along a line of action parallel to the longitudinal axis of the probe, the collar characterized by: a generally tubular or cylindrical-shaped member for mating with the first end of the probe and having at least one portion extending, in an axial direction, beyond the extent of the first end.
Brief Description of the Drawings The invention will now be described in more detail with ~2'~3~i8 reference to the accompanying drawings wherein like parts in each of the several figures are identified by the same reference character, and wherein:
Figure 1 is an elevational view of a prior art test probe;
Figure 2 is an elevational view of the probe of Figure 1 in use, Figure 3 is an elevational view o-f the probe of the present invention in use;
Figure 4 is another elevational view of the probe of the present invention in use;
Figure 5 is a front elevational view oF the probe of the present invention;
Figure 6 is a side eleva-tional view of the probe of the present invention;
Figure 7 is a top plan view of only a portion of the probe of Figure 6;
Figure 8 is a front elevational view of an alternative embodiment of a portion of the probe of Figure 6; and Figures 9 and 10 are front elevational views of alternative embodiments of the probe of Figure 6.
_tailed Description Figure 1 depicts a prior art test probe 10 commonly used for testing PCBs. Probe 10 is in fact part No. 733284 made by Fairchild Camera & Instrument Corp. Probe 10 supports collar 11 and four prongs 12a, 12b, 12c, and 12d (referred to collectively as prongs 12). Probe 10 is generally tubular in shape and is approximately 0.040 inches (1.02 mm) wide throughout most of its L2~;3~3 length and approximately 0.050 inches (1~27 mm) wide at its widest part (i.e. at collar 11). Probe 10 is approximately 1.3 inches (3.3 cm) long.
Figure 2 depicts probe 10 in operation. Also shown in Figure 2 is a portion of a printed circuit board (PCB) 13 supporting a solder pad 14 and a component lead 16 extending both above and below PCB 13. As is well known, probe 10 is applied to lead 16 for testing purposes. Prongs 12 make electrical contact with lead 16 and consequently permits testing to be accomplished.
If component lead 16 is missing (e.g. a component was omitted from PCB 13) probe 10 can still make contact with solder pad 14 and may result in erroneous test results. ~or example, lead 16 may connect with an edge connector. If lead 16 is required to connect with an edge connector but the lead is missing, then PCB 13 may test OK according to test probe 10, yet PCB 13 will fail when connections are made via its normal edge connector.
Figure 3 depicts test probe 20 according to the present invention that is designed to prevent such erroneous test results.
That is, probe 20 is designed to make an electrical contact with PCB
13 if and only if a lead is present at the desired location on PCB
13.
Test probe 20 has a collar 21 and four prongs 22a, 22b, 22c, and 22d (referred to collectively as prongs 22). Probe 20 is generally tubular in shape and has approximately the same dimensions as probe 10. Probe 20 additionally has an insulator 23. Insulator 23 (comprised of, for example nylon) is generally tubular or cylindrical in shape and includes a protruberance 24 at one point so as to extend beyond the reach of prongs 22. As a result of insulator 23, as shown S3 Ei8 in Figure 3, if a lead does not protrude from PCB 13, prongs 22 are not able to make electrical contact with PCB 13. That is, protruberance 24 of insulator 23 contacts PCB 13 keeping prongs 22 of probe 20 spaced from solder pad 14 so that no electrical connection is made.
Figure 4 depicts the operation of probe 20 when a lead 16 is present. As can be seen from Figure 4, when lead 16 is present, prongs 22 contact lead 16 and make an electrical connection between lead 16 and probe 20. Insulator 23 and protruberance 24 do not come into play when lead 16 is present.
Figures 5, 6 and 7 depict one preferred embodiment of the present invention. Figure 5 is a front elevational view depicting insulator 23 and its generally triangular protruberance 24. Probe 20 is approximately 0.040 inches (1.02 mm) wide, collar 21 is approximately 0.050 inches (1.27 mm) wide, and insulator 23 is approximately 0.060 inches (1.52 mrn) wide at its widestO Note that insulator 23 is attached to probe 20 via a friction fit. Note also that protruberance 24 extends beyond prongs 22 by about 0.010 inches (0.25 mm). Figure 6 is the same as Figure 5 but is a side elevational view, Figure 7 is a top plan view of insulator 23 by itself.
Figure 8 is a front elevational view of an alternative shape for insulator 23 and is referenced as insulator 23c. A further alternative would be to have more than one protruberance 24 on insulator Z3 (see Figure 9 showing probe 20a with insulator 23a), and a yet further alternative would be to have insulator 23 itself extend beyond prongs 22 (i.e. see Figure 10 depicting probe 20b having insulator 23b extending as far as protruberance 24 thereby obviating ;368 the need for a separate protruberance 24).
It should be noted that in the preferred embodiment of the invention, probe 20 (Figure 5) is constructed by taking probe 10 (Figure 1) and adding to it, insulator 23.
A....
Claims (26)
PROPERTY OR PRIVILEGE IS CLAIMED ARE DEFINED AS FOLLOWS:
1. A test probe suitable for use in testing leads of printed circuit boards comprising:
(a) a pin having an end portion adapted to contact a lead on a printed circuit board;
(b) a collar disposed about said pin at a location spaced from said end portion; and (c) an insulator fixedly secured to said end portion and abutting said collar, said insulator having a portion thereof extending axially beyond said end portion of said pin such that only said axially extended insulator portion extends beyond said end portion, whereby in the absence of a lead during testing, electrical contact with said test probe is prevented.
(a) a pin having an end portion adapted to contact a lead on a printed circuit board;
(b) a collar disposed about said pin at a location spaced from said end portion; and (c) an insulator fixedly secured to said end portion and abutting said collar, said insulator having a portion thereof extending axially beyond said end portion of said pin such that only said axially extended insulator portion extends beyond said end portion, whereby in the absence of a lead during testing, electrical contact with said test probe is prevented.
2. The test probe of claim 1 wherein said insulator has only one axially extended portion, said axially extended portion extending circumferentially for no more than about 90 degrees about said pin.
3. The test probe of claim 1 wherein said insulator has only two axially extended portions.
4. The test probe of claim 1 wherein the portion of said insulator extends axially beyond said end portion of said pin by less than approximately 0.07 inches in length.
5. The test probe of claim 2, wherein the portion of the insulator extends axially beyond said end portion of said pin by less than approximately 0.07 inches in length.
6. The test probe of claim 3, wherein the portion of the insulator extends axially beyond said end portion of said pin by less than approximately 0.07 inches in length.
7. A test probe as claimed in claim 1, wherein said insulator is cylindrical.
8. An insulator as claimed in claim 1, wherein said insulator portion extends beyond said end portion of said pin by approximately 0.01 inches to 0.07 inches.
9. A test probe suitable for use in testing printed circuit boards comprising:
(a) a probe pin having an end portion adapted to contact a lead on a printed circuit board; and (b) an insulator fixedly secured to said probe pin, said insulator having a portion thereof extending axially beyond said end portion of said probe pin such that only said axially extended insulator portion extends beyond said end portion, whereby in the absence of a lead during testing, electrical contact with said test probe is prevented.
(a) a probe pin having an end portion adapted to contact a lead on a printed circuit board; and (b) an insulator fixedly secured to said probe pin, said insulator having a portion thereof extending axially beyond said end portion of said probe pin such that only said axially extended insulator portion extends beyond said end portion, whereby in the absence of a lead during testing, electrical contact with said test probe is prevented.
10. A test probe as claimed in claim 9, wherein said probe has a collar disposed about said pin at a location spaced from said end portion of said pin.
11. A test probe as claimed in claim 9, wherein said insulator is attached to said pin by a friction fit.
12. A test probe as claimed in claim 9, wherein said insulator has only one axially extended portion, said axially extended portion extending circumferentially for no more than about 90 degrees about said probe pin.
13. A test probe as claimed in claim 9, wherein said insulator has only two axially extended portions.
14. A test probe as claimed in claim 9, wherein the portion of said insulator extends axially beyond said end portion of said pin by less than approximately 0.07 inches in length.
15. A test probe as claimed in claim 12, wherein the portion of said insulator extends axially beyond said end portion of said pin by less than approximately 0.07 inches in length.
16. A test probe as claimed in claim 13, wherein the portion of said insulator extends axially beyond said end portion of said pin by less than approximately 0.07 inches in length.
17. A test probe as claimed in claim 9, wherein said insulator is cylindrical.
18. An insulator fitted on the circumference of a test pin suitable for use in testing leads of printed circuit boards, the pin having an end portion adapted to contact a lead on a printed circuit board; a collar disposed about said pin and at a location spaced From said end portion;
said insulator abutting the collar and having a portion thereof extending axially beyond said end portion of the pin such that only said axially extended insulator portion extends beyond said end portion, whereby in the absence of a lead during testing, electrical contact with said test probe is prevented.
said insulator abutting the collar and having a portion thereof extending axially beyond said end portion of the pin such that only said axially extended insulator portion extends beyond said end portion, whereby in the absence of a lead during testing, electrical contact with said test probe is prevented.
19. An insulator as claimed in claim 18, wherein said insulator is cylindrical.
20. An insulator as claimed in claim 18, wherein said portion of said insulator extends axially beyond said end portion of said pin by approximately 0.01 inches to 0.07 inches.
21. An insulator as claimed in claim 18, being attached to the pin by a friction fit.
22. An insulator as claimed in claim 18, wherein said insulator has only one portion, said axially extending portion extending circumferentially for no more than about 90 degrees about said pin.
23. The test probe as claimed in claim 1, wherein said insulator incompletely covers sides of said end portion.
24. The test probe as claimed in claim 1, wherein said end portion includes a plurality of prongs adapted to receive the lead.
25. The test probe as claimed in claim 9, wherein said insulator incompletely covers sides of said end portion.
26. The test probe as claimed in claim 9, wherein said end portion includes a plurality of prongs adapted to receive the lead.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US85401986A | 1986-04-21 | 1986-04-21 | |
| US854,019 | 1986-04-21 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CA1245368A true CA1245368A (en) | 1988-11-22 |
Family
ID=25317519
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA000515719A Expired CA1245368A (en) | 1986-04-21 | 1986-08-11 | Test probe for printed circuit boards or the like |
Country Status (1)
| Country | Link |
|---|---|
| CA (1) | CA1245368A (en) |
-
1986
- 1986-08-11 CA CA000515719A patent/CA1245368A/en not_active Expired
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MKEX | Expiry |