BRPI0718200A8 - Aparelho para observar a aparência da superfície de uma amostra, e, método para observar a aparência da superfície de uma amostra - Google Patents
Aparelho para observar a aparência da superfície de uma amostra, e, método para observar a aparência da superfície de uma amostraInfo
- Publication number
- BRPI0718200A8 BRPI0718200A8 BRPI0718200A BRPI0718200A BRPI0718200A8 BR PI0718200 A8 BRPI0718200 A8 BR PI0718200A8 BR PI0718200 A BRPI0718200 A BR PI0718200A BR PI0718200 A BRPI0718200 A BR PI0718200A BR PI0718200 A8 BRPI0718200 A8 BR PI0718200A8
- Authority
- BR
- Brazil
- Prior art keywords
- observing
- sample
- surface appearance
- appearance
- light source
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
- G01N21/474—Details of optical heads therefor, e.g. using optical fibres
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B5/00—Measuring for diagnostic purposes; Identification of persons
- A61B5/103—Detecting, measuring or recording devices for testing the shape, pattern, colour, size or movement of the body or parts thereof, for diagnostic purposes
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B5/00—Measuring for diagnostic purposes; Identification of persons
- A61B5/0059—Measuring for diagnostic purposes; Identification of persons using light, e.g. diagnosis by transillumination, diascopy, fluorescence
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B5/00—Measuring for diagnostic purposes; Identification of persons
- A61B5/44—Detecting, measuring or recording for evaluating the integumentary system, e.g. skin, hair or nails
- A61B5/441—Skin evaluation, e.g. for skin disorder diagnosis
- A61B5/442—Evaluating skin mechanical properties, e.g. elasticity, hardness, texture, wrinkle assessment
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N2021/4704—Angular selective
- G01N2021/4711—Multiangle measurement
Landscapes
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Pathology (AREA)
- Biophysics (AREA)
- Veterinary Medicine (AREA)
- Public Health (AREA)
- Animal Behavior & Ethology (AREA)
- Surgery (AREA)
- Molecular Biology (AREA)
- Medical Informatics (AREA)
- Heart & Thoracic Surgery (AREA)
- Engineering & Computer Science (AREA)
- Biomedical Technology (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Immunology (AREA)
- General Physics & Mathematics (AREA)
- Biochemistry (AREA)
- Dermatology (AREA)
- Oral & Maxillofacial Surgery (AREA)
- Dentistry (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Microscoopes, Condenser (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
APARELHO PARA OBSERVAR A APARÊNCIA DA SUPERFÍCIE DE UMA AMOSTRA, E, MÉTODO PARA OBSERVAR A APARÊNCIA DA SUPERFÍCIE DE UMA AMOSTRA. Um aparelho para observar a aparência da superfície (2) de unia amostra (1), compreendendo uma fonte de luz (11) para iluminar dita superfície (2) a partir de uma predeterminada direção e meios para observar a superfície (2). Meios para observar a superfície (2) compreendem um número de espelhos substancialmente planos (8) observados em diferentes direções com respeito à dita superfície (2). Os meios, além disto, compreendem um sistema óptico (6, 14) para observar ditos espelhos planos (8). Cada espelho plano (8) reflete uma imagem da superfície (2) da amostra (1) para uma parte de recepção de imagem (6) do sistema óptico (6, 14). O local da fonte de luz (11) é ajustável, de modo que a superfície (2) da amostra (1) possa ser iluminada a partir de diferentes posições predeterminadas.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP06121782 | 2006-10-05 | ||
PCT/IB2007/053943 WO2008041162A1 (en) | 2006-10-05 | 2007-09-28 | An apparatus and a method for observing the surface of a sample |
Publications (2)
Publication Number | Publication Date |
---|---|
BRPI0718200A2 BRPI0718200A2 (pt) | 2017-10-24 |
BRPI0718200A8 true BRPI0718200A8 (pt) | 2017-12-05 |
Family
ID=39027495
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BRPI0718200A BRPI0718200A8 (pt) | 2006-10-05 | 2007-09-28 | Aparelho para observar a aparência da superfície de uma amostra, e, método para observar a aparência da superfície de uma amostra |
Country Status (8)
Country | Link |
---|---|
US (1) | US8077319B2 (pt) |
EP (1) | EP2074408A1 (pt) |
JP (1) | JP5411698B2 (pt) |
KR (1) | KR101396146B1 (pt) |
CN (1) | CN101523195B (pt) |
BR (1) | BRPI0718200A8 (pt) |
RU (1) | RU2473887C2 (pt) |
WO (1) | WO2008041162A1 (pt) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5571651B2 (ja) * | 2008-03-18 | 2014-08-13 | コーニンクレッカ フィリップス エヌ ヴェ | 皮膚撮像装置及び皮膚分析システム |
CN102470251B (zh) | 2009-07-09 | 2015-08-05 | 皇家飞利浦电子股份有限公司 | 皮肤辐射设备和方法 |
US9816683B2 (en) * | 2011-10-20 | 2017-11-14 | Appotronics Corporation Limited | Light sources system and projection device using the same |
KR102475651B1 (ko) | 2015-12-30 | 2022-12-09 | 엘지이노텍 주식회사 | 인체 착용장치 및 이의 동작 방법 |
DE102016108079A1 (de) * | 2016-05-02 | 2017-11-02 | Carl Zeiss Microscopy Gmbh | Artefaktreduktion bei der winkelselektiven beleuchtung |
KR102310449B1 (ko) * | 2019-11-14 | 2021-10-12 | 아나나스엘엘씨 유한책임회사 | 개선된 구조의 다면 비전 검사 시스템 및 검사 방법 |
KR102303073B1 (ko) * | 2019-11-14 | 2021-09-17 | 아나나스엘엘씨 유한책임회사 | 다면 비전 검사 알고리즘 및 이를 이용한 시스템 |
KR102547544B1 (ko) * | 2021-05-25 | 2023-06-27 | 한국기계연구원 | 3차원 조리개 모듈 및 이의 제조방법 |
Family Cites Families (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4360275A (en) | 1980-08-11 | 1982-11-23 | Litton Systems Inc. | Device for measurement of optical scattering |
HU188795B (en) * | 1982-05-28 | 1986-05-28 | Koezponti Elelmiszeripari Kutato Intezet,Hu | Detecting arrangement for meassuring the intensity of radiation scattering at a given angle from a sample exposed to radiation of given angle of incidence |
SU1326004A1 (ru) * | 1985-07-30 | 1990-07-23 | Институт Полупроводников Ан Усср | Устройство дл контрол дефектов оптических поверхностей |
US4815858A (en) * | 1987-10-09 | 1989-03-28 | The United States Of America As Represented By The Secretary Of The Navy | Reflectometers |
US5309339A (en) * | 1992-06-24 | 1994-05-03 | The Schepens Eye Research Institute, Inc. | Concentrator for laser light |
US5256871A (en) * | 1992-12-22 | 1993-10-26 | Emhart Glass Machinery Investments Inc. | Machine for video inspection of glass containers with intersecting light beams |
US5485263A (en) * | 1994-08-18 | 1996-01-16 | United Parcel Service Of America, Inc. | Optical path equalizer |
US5845002A (en) * | 1994-11-03 | 1998-12-01 | Sunkist Growers, Inc. | Method and apparatus for detecting surface features of translucent objects |
IL113428A0 (en) | 1995-04-20 | 1995-07-31 | Yissum Res Dev Co | Glossmeter |
DE19706973A1 (de) * | 1997-02-21 | 1998-08-27 | Wacker Siltronic Halbleitermat | Vorrichtung und Verfahren zur Untersuchung einer glatten Oberfläche einer Probe |
US5912741A (en) * | 1997-10-10 | 1999-06-15 | Northrop Grumman Corporation | Imaging scatterometer |
JP3631365B2 (ja) * | 1998-02-10 | 2005-03-23 | 日本ペイント株式会社 | 変角分光反射率の測定方法 |
US6424413B1 (en) * | 1998-06-12 | 2002-07-23 | Gretagmacbeth Llc | Multi-channel integrating sphere |
KR100849370B1 (ko) * | 1998-12-21 | 2008-07-31 | 코닌클리케 필립스 일렉트로닉스 엔.브이. | 스캐터로미터 |
DE19950588B4 (de) * | 1999-10-20 | 2013-07-18 | Byk Gardner Gmbh | Vorrichtung und Verfahren zur Qualitätskontrolle von insbesondere lackierten Oberflächen |
DE1207386T1 (de) * | 2000-11-20 | 2003-05-28 | Dow Global Technologies Inc | Verfahren zum Charakterisieren des Aussehens eines Gegenstandes, zum Vorhersagen des Aussehens eines Gegenstandes und zum Herstellen eines Gegenstandes mit vorbestimmtem Aussehen, das optional auf Grundlage eines Referenzobjektes bestimmt wurde |
US6538730B2 (en) * | 2001-04-06 | 2003-03-25 | Kla-Tencor Technologies Corporation | Defect detection system |
WO2004077032A1 (en) | 2003-02-28 | 2004-09-10 | Koninklijke Philips Electronics N.V. | A scatterometer and a method for observing a surface |
DE602004027006D1 (de) | 2003-02-28 | 2010-06-17 | Koninkl Philips Electronics Nv | Streumesser und verfahren zur untersuchung einer oberfläche |
WO2004111688A2 (en) * | 2003-06-06 | 2004-12-23 | New York University | Method and apparatus for determining a bidirectional reflectance distribution function of a subject |
US7145663B2 (en) * | 2004-09-20 | 2006-12-05 | Zetetic Institute | Catoptric imaging systems comprising pellicle and/or aperture-array beam-splitters and non-adaptive and/or adaptive catoptric surfaces |
KR101256391B1 (ko) * | 2004-10-08 | 2013-04-25 | 코닌클리케 필립스 일렉트로닉스 엔.브이. | 테스트 표면의 광학 검사 |
US8018396B2 (en) * | 2008-08-18 | 2011-09-13 | Auden Techno Corp. | Dual-resonance retractable antenna |
-
2007
- 2007-09-28 BR BRPI0718200A patent/BRPI0718200A8/pt not_active IP Right Cessation
- 2007-09-28 US US12/443,737 patent/US8077319B2/en not_active Expired - Fee Related
- 2007-09-28 CN CN2007800371103A patent/CN101523195B/zh not_active Expired - Fee Related
- 2007-09-28 JP JP2009530981A patent/JP5411698B2/ja not_active Expired - Fee Related
- 2007-09-28 EP EP07826573A patent/EP2074408A1/en not_active Withdrawn
- 2007-09-28 RU RU2009116927/28A patent/RU2473887C2/ru not_active IP Right Cessation
- 2007-09-28 WO PCT/IB2007/053943 patent/WO2008041162A1/en active Application Filing
- 2007-09-28 KR KR1020097006757A patent/KR101396146B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
JP2010506163A (ja) | 2010-02-25 |
US8077319B2 (en) | 2011-12-13 |
WO2008041162A1 (en) | 2008-04-10 |
KR20090064557A (ko) | 2009-06-19 |
US20100091291A1 (en) | 2010-04-15 |
KR101396146B1 (ko) | 2014-05-19 |
JP5411698B2 (ja) | 2014-02-12 |
RU2009116927A (ru) | 2010-11-10 |
RU2473887C2 (ru) | 2013-01-27 |
CN101523195B (zh) | 2012-04-25 |
EP2074408A1 (en) | 2009-07-01 |
BRPI0718200A2 (pt) | 2017-10-24 |
CN101523195A (zh) | 2009-09-02 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
BRPI0718200A8 (pt) | Aparelho para observar a aparência da superfície de uma amostra, e, método para observar a aparência da superfície de uma amostra | |
ES2529431T3 (es) | Control de iluminación | |
ATE445823T1 (de) | Messgerät | |
ES2875052T3 (es) | Disposición para mediciones ópticas y método relacionado | |
MY158795A (en) | Gemstone viewer | |
BRPI0416441A (pt) | sistema de medição de posição de capacete, conjunto de capacete com tal sistema, e método de cálculo confiável em tempo real da direção de olhar da pupila | |
WO2008156907A3 (en) | Acquisition of surface normal maps from spherical gradient illumination | |
WO2011092493A3 (en) | Gemstone sparkle analysis | |
EP1602981A3 (en) | Illumination optical system and exposure apparatus | |
EP1648177A3 (en) | Illumination optical system and image display apparatus making use thereof | |
ATE531312T1 (de) | Optische messvorrichtung | |
TW200608053A (en) | Illuminator for dark field inspection | |
ATE545011T1 (de) | Einrichtung zum automatischen messen von kenngrössen einer brillenlinse | |
DE60033463D1 (de) | Bildanzeigevorrichtung | |
EP2199661A3 (en) | Rotating light | |
BR112013031255A2 (pt) | equipamento de inspeção para a seção de boca de frasco | |
BRPI0600902A (pt) | dispositivo e método para demonstrar e quantificar a textura da pele | |
WO2009040716A3 (en) | An apparatus and method for observing the surface of a sample | |
EP2511593A3 (en) | Lighting fixtures having illuminated crystal panels and methods for providing illumination | |
EP1686313A3 (en) | Vehicle lighting device and vehicle headlight unit including the lighting device | |
EP1698939A3 (en) | Exposure apparatus and method, measuring apparatus, and device manufacturing method | |
US7792419B2 (en) | Illuminator-especially for cylindrical curved surfaces | |
BR112012033763A2 (pt) | aperfeiçoamentos em ou relacionados a oftalmologia | |
DE602006004890D1 (de) | Beleuchtungsvorrichtung einer fotolithographievorrichtung | |
BRPI0409418A (pt) | sistema de visualização de marcações ópticas de uma lente oftálmica, dispositivo de tamponagem e processo de orientação de lentes que utilizam um tal sistema |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
B25D | Requested change of name of applicant approved |
Owner name: KONINKLIJKE PHILIPS N.V. (NL) |
|
B25G | Requested change of headquarter approved |
Owner name: KONINKLIJKE PHILIPS N.V. (NL) |
|
B07A | Application suspended after technical examination (opinion) [chapter 7.1 patent gazette] | ||
B08F | Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette] |
Free format text: REFERENTE A 11A ANUIDADE. |
|
B08K | Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette] |
Free format text: EM VIRTUDE DO ARQUIVAMENTO PUBLICADO NA RPI 2481 DE 24-07-2018 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDO O ARQUIVAMENTO DO PEDIDO DE PATENTE, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013. |