BR112017017352A2 - pacote semicondutor lado a lado - Google Patents
pacote semicondutor lado a ladoInfo
- Publication number
- BR112017017352A2 BR112017017352A2 BR112017017352A BR112017017352A BR112017017352A2 BR 112017017352 A2 BR112017017352 A2 BR 112017017352A2 BR 112017017352 A BR112017017352 A BR 112017017352A BR 112017017352 A BR112017017352 A BR 112017017352A BR 112017017352 A2 BR112017017352 A2 BR 112017017352A2
- Authority
- BR
- Brazil
- Prior art keywords
- matrix
- semiconductor package
- cavity
- active
- interconnection
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title abstract 2
- 239000011159 matrix material Substances 0.000 abstract 11
- 238000005338 heat storage Methods 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
Classifications
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- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
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- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
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- H01L24/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L24/14—Structure, shape, material or disposition of the bump connectors prior to the connecting process of a plurality of bump connectors
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- H01L24/10—Bump connectors ; Manufacturing methods related thereto
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- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L24/17—Structure, shape, material or disposition of the bump connectors after the connecting process of a plurality of bump connectors
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- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
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- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/1515—Shape
- H01L2924/15153—Shape the die mounting substrate comprising a recess for hosting the device
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- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/1515—Shape
- H01L2924/15158—Shape the die mounting substrate being other than a cuboid
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- H01L2924/1515—Shape
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- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1532—Connection portion the connection portion being formed on the die mounting surface of the substrate
- H01L2924/1533—Connection portion the connection portion being formed on the die mounting surface of the substrate the connection portion being formed both on the die mounting surface of the substrate and outside the die mounting surface of the substrate
- H01L2924/15331—Connection portion the connection portion being formed on the die mounting surface of the substrate the connection portion being formed both on the die mounting surface of the substrate and outside the die mounting surface of the substrate being a ball array, e.g. BGA
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- H—ELECTRICITY
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- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1532—Connection portion the connection portion being formed on the die mounting surface of the substrate
- H01L2924/1533—Connection portion the connection portion being formed on the die mounting surface of the substrate the connection portion being formed both on the die mounting surface of the substrate and outside the die mounting surface of the substrate
- H01L2924/15333—Connection portion the connection portion being formed on the die mounting surface of the substrate the connection portion being formed both on the die mounting surface of the substrate and outside the die mounting surface of the substrate being a land array, e.g. LGA
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Ceramic Engineering (AREA)
- Geometry (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
- Wire Bonding (AREA)
- Measuring And Recording Apparatus For Diagnosis (AREA)
Abstract
trata-se de um pacote semicondutor para uma configuração de matriz lado a lado que pode incluir um substrato que tem uma cavidade, um interposto de ponte posicionado no interior da cavidade e que tem um lado ativo voltado para os lados ativos de uma primeira matriz e de uma segunda matriz e sobreposto parcialmente de modo horizontal à primeira matriz e à segunda matriz a fim de fornecer uma interconexão entre a primeira matriz e a segunda matriz, sendo que um elemento térmico é fixado às partes posteriores da primeira matriz e da segunda matriz a fim de fornecer uma trajetória de calor e de armazenamento de calor para a primeira matriz e para a segunda matriz.
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US14/622,346 | 2015-02-13 | ||
US14/622,346 US9379090B1 (en) | 2015-02-13 | 2015-02-13 | System, apparatus, and method for split die interconnection |
PCT/US2016/014913 WO2016130317A1 (en) | 2015-02-13 | 2016-01-26 | Side by side semiconductor package |
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EP (1) | EP3257078B1 (pt) |
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US9136236B2 (en) * | 2012-09-28 | 2015-09-15 | Intel Corporation | Localized high density substrate routing |
US9190380B2 (en) | 2012-12-06 | 2015-11-17 | Intel Corporation | High density substrate routing in BBUL package |
US9666559B2 (en) | 2014-09-05 | 2017-05-30 | Invensas Corporation | Multichip modules and methods of fabrication |
US10438881B2 (en) * | 2015-10-29 | 2019-10-08 | Marvell World Trade Ltd. | Packaging arrangements including high density interconnect bridge |
US9721923B1 (en) * | 2016-04-14 | 2017-08-01 | Micron Technology, Inc. | Semiconductor package with multiple coplanar interposers |
US9761559B1 (en) * | 2016-04-21 | 2017-09-12 | Micron Technology, Inc. | Semiconductor package and fabrication method thereof |
KR102624199B1 (ko) * | 2016-11-17 | 2024-01-15 | 에스케이하이닉스 주식회사 | 관통 실리콘 비아 기술을 적용한 반도체 패키지 |
TWI652788B (zh) * | 2017-11-09 | 2019-03-01 | 大陸商上海兆芯集成電路有限公司 | 晶片封裝結構及晶片封裝結構陣列 |
US10651126B2 (en) * | 2017-12-08 | 2020-05-12 | Applied Materials, Inc. | Methods and apparatus for wafer-level die bridge |
KR102397905B1 (ko) | 2017-12-27 | 2022-05-13 | 삼성전자주식회사 | 인터포저 기판 및 반도체 패키지 |
US10580738B2 (en) | 2018-03-20 | 2020-03-03 | International Business Machines Corporation | Direct bonded heterogeneous integration packaging structures |
US20190312019A1 (en) * | 2018-04-10 | 2019-10-10 | Intel Corporation | Techniques for die tiling |
US10742217B2 (en) * | 2018-04-12 | 2020-08-11 | Apple Inc. | Systems and methods for implementing a scalable system |
US11355438B2 (en) | 2018-06-29 | 2022-06-07 | Intel Corporation | Hybrid fan-out architecture with EMIB and glass core for heterogeneous die integration applications |
US10700046B2 (en) * | 2018-08-07 | 2020-06-30 | Bae Systems Information And Electronic Systems Integration Inc. | Multi-chip hybrid system-in-package for providing interoperability and other enhanced features to high complexity integrated circuits |
US11817423B2 (en) * | 2019-07-29 | 2023-11-14 | Intel Corporation | Double-sided substrate with cavities for direct die-to-die interconnect |
US11694959B2 (en) * | 2019-07-29 | 2023-07-04 | Intel Corporation | Multi-die ultrafine pitch patch architecture and method of making |
US11688660B2 (en) * | 2019-08-07 | 2023-06-27 | Intel Corporation | Bridge for radio frequency (RF) multi-chip modules |
US11101191B2 (en) | 2019-11-22 | 2021-08-24 | International Business Machines Corporation | Laminated circuitry cooling for inter-chip bridges |
US12094800B2 (en) * | 2019-12-19 | 2024-09-17 | Intel Corporation | Thermally conductive slugs/active dies to improve cooling of stacked bottom dies |
KR20210147453A (ko) | 2020-05-29 | 2021-12-07 | 삼성전자주식회사 | 반도체 패키지 및 그 제조 방법 |
US20230035627A1 (en) * | 2021-07-27 | 2023-02-02 | Qualcomm Incorporated | Split die integrated circuit (ic) packages employing die-to-die (d2d) connections in die-substrate standoff cavity, and related fabrication methods |
US20230207523A1 (en) * | 2021-12-28 | 2023-06-29 | International Business Machines Corporation | Wafer to wafer high density interconnects |
US20240153878A1 (en) * | 2022-11-09 | 2024-05-09 | Nanya Technology Corporation | Semiconductor device with redistribution structure and method for fabricating the same |
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US6731009B1 (en) * | 2000-03-20 | 2004-05-04 | Cypress Semiconductor Corporation | Multi-die assembly |
US20050230842A1 (en) | 2004-04-20 | 2005-10-20 | Texas Instruments Incorporated | Multi-chip flip package with substrate for inter-die coupling |
US8064224B2 (en) * | 2008-03-31 | 2011-11-22 | Intel Corporation | Microelectronic package containing silicon patches for high density interconnects, and method of manufacturing same |
US7741567B2 (en) * | 2008-05-19 | 2010-06-22 | Texas Instruments Incorporated | Integrated circuit package having integrated faraday shield |
US8227904B2 (en) | 2009-06-24 | 2012-07-24 | Intel Corporation | Multi-chip package and method of providing die-to-die interconnects in same |
US8383457B2 (en) | 2010-09-03 | 2013-02-26 | Stats Chippac, Ltd. | Semiconductor device and method of forming interposer frame over semiconductor die to provide vertical interconnect |
KR20110085481A (ko) | 2010-01-20 | 2011-07-27 | 삼성전자주식회사 | 적층 반도체 패키지 |
US8274149B2 (en) | 2010-03-29 | 2012-09-25 | Advanced Semiconductor Engineering, Inc. | Semiconductor device package having a buffer structure and method of fabricating the same |
US9082633B2 (en) | 2011-10-13 | 2015-07-14 | Xilinx, Inc. | Multi-die integrated circuit structure with heat sink |
US8742576B2 (en) * | 2012-02-15 | 2014-06-03 | Oracle International Corporation | Maintaining alignment in a multi-chip module using a compressible structure |
JP6007566B2 (ja) * | 2012-04-19 | 2016-10-12 | 大日本印刷株式会社 | 部品内蔵配線基板、及び部品内蔵配線基板の放熱方法 |
US8872349B2 (en) * | 2012-09-11 | 2014-10-28 | Intel Corporation | Bridge interconnect with air gap in package assembly |
US9136159B2 (en) | 2012-11-15 | 2015-09-15 | Amkor Technology, Inc. | Method and system for a semiconductor for device package with a die-to-packaging substrate first bond |
US8796072B2 (en) | 2012-11-15 | 2014-08-05 | Amkor Technology, Inc. | Method and system for a semiconductor device package with a die-to-die first bond |
US9236366B2 (en) * | 2012-12-20 | 2016-01-12 | Intel Corporation | High density organic bridge device and method |
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BR112017017352B1 (pt) | 2022-12-13 |
KR102250743B1 (ko) | 2021-05-10 |
US9379090B1 (en) | 2016-06-28 |
JP2018508993A (ja) | 2018-03-29 |
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CN111883519A (zh) | 2020-11-03 |
CN107210288A (zh) | 2017-09-26 |
EP3257078A1 (en) | 2017-12-20 |
JP2019033297A (ja) | 2019-02-28 |
SG11201705247YA (en) | 2017-09-28 |
KR20170098320A (ko) | 2017-08-29 |
EP3257078B1 (en) | 2022-02-23 |
WO2016130317A1 (en) | 2016-08-18 |
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