BR112014031574A2 - detector de radiação para um dispositivo para exame, dispositivo para exame, e método de produção de um detector de radiação - Google Patents

detector de radiação para um dispositivo para exame, dispositivo para exame, e método de produção de um detector de radiação

Info

Publication number
BR112014031574A2
BR112014031574A2 BR112014031574A BR112014031574A BR112014031574A2 BR 112014031574 A2 BR112014031574 A2 BR 112014031574A2 BR 112014031574 A BR112014031574 A BR 112014031574A BR 112014031574 A BR112014031574 A BR 112014031574A BR 112014031574 A2 BR112014031574 A2 BR 112014031574A2
Authority
BR
Brazil
Prior art keywords
radiation detector
examination device
producing
tft
organic
Prior art date
Application number
BR112014031574A
Other languages
English (en)
Inventor
Jorritsma Jorrit
Simon Matthias
Original Assignee
Koninklijke Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Nv filed Critical Koninklijke Philips Nv
Publication of BR112014031574A2 publication Critical patent/BR112014031574A2/pt

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K39/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic radiation-sensitive element covered by group H10K30/00
    • H10K39/30—Devices controlled by radiation
    • H10K39/36—Devices specially adapted for detecting X-ray radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20182—Modular detectors, e.g. tiled scintillators or tiled photodiodes
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K30/00—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation
    • H10K30/80—Constructional details
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy
    • Y02E10/549—Organic PV cells

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Electromagnetism (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Light Receiving Elements (AREA)
  • Solid State Image Pick-Up Elements (AREA)

Abstract

resumo detector de radiação para um dispositivo para exame, dispositivo para exame, e método de produção de um detector de radiação a presente invenção refere-se a um detector de radiação com fotodiodos orgânicos e a um método de produção de um detector de radiação. a placa tft (103, 104) é colocada entre o cintilador (101) e a pilha de camada de fotodiodo orgânico (105, 106, 107, 108). isto implica o uso de tft eletrônico transparente, por exemplo, um a-si com vidro traseiro afinado ou um tft orgânico em uma folha metálica. a ordem geométrica possibilita uma infinidade de possíveis pilhas construídas para opds e possui vantagens para encapsulamento e fabricação. 1/1
BR112014031574A 2012-06-20 2013-06-13 detector de radiação para um dispositivo para exame, dispositivo para exame, e método de produção de um detector de radiação BR112014031574A2 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201261661889P 2012-06-20 2012-06-20
PCT/IB2013/054845 WO2013190434A1 (en) 2012-06-20 2013-06-13 Radiation detector with an organic photodiode

Publications (1)

Publication Number Publication Date
BR112014031574A2 true BR112014031574A2 (pt) 2017-06-27

Family

ID=48914386

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112014031574A BR112014031574A2 (pt) 2012-06-20 2013-06-13 detector de radiação para um dispositivo para exame, dispositivo para exame, e método de produção de um detector de radiação

Country Status (7)

Country Link
US (1) US20150137088A1 (pt)
EP (1) EP2864813A1 (pt)
JP (1) JP2015529793A (pt)
CN (1) CN104412128A (pt)
BR (1) BR112014031574A2 (pt)
RU (1) RU2015101436A (pt)
WO (1) WO2013190434A1 (pt)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20160111473A1 (en) * 2014-10-17 2016-04-21 General Electric Company Organic photodiodes, organic x-ray detectors and x-ray systems
US20160148980A1 (en) * 2014-11-21 2016-05-26 General Electric Company Organic x-ray detectors and related systems
US10890669B2 (en) * 2015-01-14 2021-01-12 General Electric Company Flexible X-ray detector and methods for fabricating the same
WO2016131647A1 (en) 2015-02-17 2016-08-25 Koninklijke Philips N.V. Medical imaging detector
CN108139491B (zh) * 2015-10-21 2022-06-07 皇家飞利浦有限公司 用于低能量辐射量子和高能量辐射量子的组合探测的辐射探测器
FR3046300B1 (fr) * 2015-12-23 2018-07-20 Commissariat A L'energie Atomique Et Aux Energies Alternatives Dispositif optoelectronique organique, matrice de tels dispositifs et procede de fabrication de telles matrices.
EP3206235B1 (en) 2016-02-12 2021-04-28 Nokia Technologies Oy Method of forming an apparatus comprising a two dimensional material
US11340359B2 (en) * 2017-05-01 2022-05-24 Koninklijke Philips N.V. Multi-layer radiation detector
DE102017209498A1 (de) 2017-06-06 2018-12-06 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Sensorbauelement und Verfahren zum Herstellen desselben
US10608041B2 (en) * 2018-04-12 2020-03-31 Palo Alto Research Center Incorporated Bendable x-ray detector with TFT backplane in the neutral plane
CN109585477B (zh) * 2018-10-31 2021-03-19 奕瑞影像科技（太仓）有限公司 平板探测器结构及其制备方法
US10825855B2 (en) 2018-12-13 2020-11-03 Palo Alto Research Center Incorporated Flexible x-ray sensor with integrated strain sensor
CN111312902A (zh) * 2020-02-27 2020-06-19 上海奕瑞光电子科技股份有限公司 平板探测器结构及其制备方法
CN111244287A (zh) * 2020-03-17 2020-06-05 上海奕瑞光电子科技股份有限公司 有机光电二极管、x射线探测器及其制备方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1051762A1 (en) * 1998-02-02 2000-11-15 Uniax Corporation X-y addressable electric microswitch arrays and sensor matrices employing them
US7078702B2 (en) * 2002-07-25 2006-07-18 General Electric Company Imager
US7745798B2 (en) * 2005-11-15 2010-06-29 Fujifilm Corporation Dual-phosphor flat panel radiation detector
US20070152290A1 (en) * 2005-12-30 2007-07-05 Lexmark International, Inc Thin film light-activated power switches, photovoltaic devices and methods for making micro-fluid ejected electronic devices
US7956332B2 (en) * 2008-10-29 2011-06-07 General Electric Company Multi-layer radiation detector assembly
JP5448877B2 (ja) * 2010-01-25 2014-03-19 富士フイルム株式会社 放射線検出器
JP5604323B2 (ja) * 2011-01-31 2014-10-08 富士フイルム株式会社 放射線画像検出装置
US8581254B2 (en) * 2011-09-30 2013-11-12 General Electric Company Photodetector having improved quantum efficiency

Also Published As

Publication number Publication date
WO2013190434A1 (en) 2013-12-27
RU2015101436A (ru) 2016-08-10
JP2015529793A (ja) 2015-10-08
US20150137088A1 (en) 2015-05-21
EP2864813A1 (en) 2015-04-29
CN104412128A (zh) 2015-03-11

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Legal Events

Date Code Title Description
B11A Dismissal acc. art.33 of ipl - examination not requested within 36 months of filing
B11Y Definitive dismissal - extension of time limit for request of examination expired [chapter 11.1.1 patent gazette]