BR112013020017A2 - sensores de temperatura de semicondutor - Google Patents

sensores de temperatura de semicondutor

Info

Publication number
BR112013020017A2
BR112013020017A2 BR112013020017A BR112013020017A BR112013020017A2 BR 112013020017 A2 BR112013020017 A2 BR 112013020017A2 BR 112013020017 A BR112013020017 A BR 112013020017A BR 112013020017 A BR112013020017 A BR 112013020017A BR 112013020017 A2 BR112013020017 A2 BR 112013020017A2
Authority
BR
Brazil
Prior art keywords
temperature sensors
semiconductor temperature
semiconductor
sensors
temperature
Prior art date
Application number
BR112013020017A
Other languages
English (en)
Inventor
Bruset Ola
Carsten Skoglund Per
Weberg Stein-Erik
Luzi Werner
Original Assignee
Nordic Semiconductor Asa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nordic Semiconductor Asa filed Critical Nordic Semiconductor Asa
Publication of BR112013020017A2 publication Critical patent/BR112013020017A2/pt

Links

Classifications

    • GPHYSICS
    • G08SIGNALLING
    • G08CTRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILAR SIGNALS
    • G08C17/00Arrangements for transmitting signals characterised by the use of a wireless electrical link
    • G08C17/02Arrangements for transmitting signals characterised by the use of a wireless electrical link using a radio link
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01KMEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/01Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01KMEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/32Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using change of resonant frequency of a crystal

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Oscillators With Electromechanical Resonators (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
BR112013020017A 2011-02-07 2012-02-07 sensores de temperatura de semicondutor BR112013020017A2 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB1102070.8A GB201102070D0 (en) 2011-02-07 2011-02-07 Semiconductor temperature sensors
PCT/GB2012/050261 WO2012107749A1 (en) 2011-02-07 2012-02-07 Semiconductor temperature sensors

Publications (1)

Publication Number Publication Date
BR112013020017A2 true BR112013020017A2 (pt) 2017-06-06

Family

ID=43836309

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112013020017A BR112013020017A2 (pt) 2011-02-07 2012-02-07 sensores de temperatura de semicondutor

Country Status (10)

Country Link
US (1) US8967856B2 (pt)
EP (1) EP2673608A1 (pt)
JP (1) JP5952836B2 (pt)
KR (1) KR20140056155A (pt)
CN (1) CN103384816B (pt)
BR (1) BR112013020017A2 (pt)
GB (2) GB201102070D0 (pt)
SG (1) SG192103A1 (pt)
TW (1) TWI545307B (pt)
WO (1) WO2012107749A1 (pt)

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US9039278B2 (en) 2013-01-30 2015-05-26 Taiwan Semiconductor Manufacturing Company, Ltd. Ratio meter of a thermal sensor
CN104596662B (zh) * 2014-12-08 2017-06-13 深圳市芯海科技有限公司 优化线性度的片上数字温度传感器
CN104568208B (zh) * 2015-01-13 2017-11-10 合肥工业大学 一种集成于射频识别标签的温度传感器
US9720033B2 (en) * 2015-09-29 2017-08-01 Apple Inc. On-chip parameter measurement
CN105784134A (zh) * 2016-03-24 2016-07-20 苏州路之遥科技股份有限公司 一种无线测温器的通信方法
JP6678094B2 (ja) * 2016-12-05 2020-04-08 ルネサスエレクトロニクス株式会社 温度計測回路、方法、及びマイクロコンピュータユニット
KR20180099270A (ko) 2017-02-28 2018-09-05 삼성전자주식회사 온도 센서 및 온도 센싱 방법
CN107830940A (zh) * 2017-10-13 2018-03-23 京东方科技集团股份有限公司 一种温度传感器、阵列基板、显示装置
CN108132106A (zh) * 2018-01-22 2018-06-08 江苏星宇芯联电子科技有限公司 一种cmos温度传感器及其传感方法
GB201810547D0 (en) * 2018-06-27 2018-08-15 Nordic Semiconductor Asa OFDM channel estimation
US11609128B2 (en) * 2019-12-10 2023-03-21 Wiliot, LTD. Single layer LC oscillator
US11258447B2 (en) * 2020-02-20 2022-02-22 Apple Inc. Integration of analog circuits inside digital blocks
CN112268634A (zh) * 2020-10-22 2021-01-26 北京小米移动软件有限公司 温度监控的方法、装置及存储介质
CN112729590A (zh) * 2020-12-25 2021-04-30 中国科学院微电子研究所 温度传感器的读出装置、温度读出方法和电子设备
WO2022209436A1 (ja) 2021-03-31 2022-10-06 古野電気株式会社 電子回路デバイス、電子回路デバイスの温度測定方法
KR102569399B1 (ko) * 2021-04-09 2023-08-24 광운대학교 산학협력단 시간 기반 온 칩 디지털 온도 센서를 이용한 칩의 온도를 감지하는 방법

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Also Published As

Publication number Publication date
WO2012107749A1 (en) 2012-08-16
JP5952836B2 (ja) 2016-07-13
SG192103A1 (en) 2013-08-30
TW201237378A (en) 2012-09-16
US8967856B2 (en) 2015-03-03
EP2673608A1 (en) 2013-12-18
GB201202040D0 (en) 2012-03-21
GB2484858A (en) 2012-04-25
GB201102070D0 (en) 2011-03-23
JP2014510268A (ja) 2014-04-24
US20140294042A1 (en) 2014-10-02
KR20140056155A (ko) 2014-05-09
GB2484858B (en) 2013-03-13
CN103384816A (zh) 2013-11-06
TWI545307B (zh) 2016-08-11
CN103384816B (zh) 2015-09-16

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Legal Events

Date Code Title Description
B11A Dismissal acc. art.33 of ipl - examination not requested within 36 months of filing
B11Y Definitive dismissal - extension of time limit for request of examination expired [chapter 11.1.1 patent gazette]