BR112012017434A2 - aparelho de imagem de raios x e método de imagem de raios x - Google Patents

aparelho de imagem de raios x e método de imagem de raios x

Info

Publication number
BR112012017434A2
BR112012017434A2 BR112012017434A BR112012017434A BR112012017434A2 BR 112012017434 A2 BR112012017434 A2 BR 112012017434A2 BR 112012017434 A BR112012017434 A BR 112012017434A BR 112012017434 A BR112012017434 A BR 112012017434A BR 112012017434 A2 BR112012017434 A2 BR 112012017434A2
Authority
BR
Brazil
Prior art keywords
light
ray
ray imaging
scintillator
imaging device
Prior art date
Application number
BR112012017434A
Other languages
English (en)
Inventor
Kazuhiro Takada
Kazunori Fukuda
Masatoshi Watanabe
Taihei Mukaide
Takashi Noma
Original Assignee
Canon Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Kk filed Critical Canon Kk
Publication of BR112012017434A2 publication Critical patent/BR112012017434A2/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/041—Phase-contrast imaging, e.g. using grating interferometers

Landscapes

  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Molecular Biology (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Biochemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

aparelho de imagem de raios x e método de imagem de raios x. um aparelho de umagem de raios x, que adquire uma de imagem de contraste de fase diferencial de objeto de teste, sem utilizar uma máscara de blindagem de luz para raios x. o aparelho inclui uma fonte de raios x, um elemento de separação, configurado para dividir especialmente um raio x emitido a partir de uma fonte de raios x, e um cintilador, configurado para emitir luz quando um feixe de raios x dividido, dividido no elemento de separação, for incidente no cintilador. o aparelho também inclui uma unidade de limitação de transmissão de luz, configurada para limitar a quantidade de transmissão da luz emitida a partir do cintilador, e uma pluralidade de detectores de luz, cada um configurado para detectar a quantidade de luz que tenha transmitido através da unidade de limitação de transmissão de luz. a unidade de limitação de luz é configurada de tal modo que uma intensidade de luz, detectada em cada um dos detectores de luz, muda em resposta a uma mudança em uma posição incidente do feixe de raios x.
BR112012017434A 2010-01-29 2011-01-27 aparelho de imagem de raios x e método de imagem de raios x BR112012017434A2 (pt)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2010019448 2010-01-29
JP2010159886A JP5213923B2 (ja) 2010-01-29 2010-07-14 Ｘ線撮像装置およびｘ線撮像方法
PCT/JP2011/052203 WO2011093523A2 (en) 2010-01-29 2011-01-27 X-ray imaging apparatus and x-ray imaging method

Publications (1)

Publication Number Publication Date
BR112012017434A2 true BR112012017434A2 (pt) 2016-04-19

Family

ID=44319933

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112012017434A BR112012017434A2 (pt) 2010-01-29 2011-01-27 aparelho de imagem de raios x e método de imagem de raios x

Country Status (8)

Country Link
US (1) US9031189B2 (pt)
EP (1) EP2529252A2 (pt)
JP (1) JP5213923B2 (pt)
KR (1) KR101414707B1 (pt)
CN (1) CN102713679A (pt)
BR (1) BR112012017434A2 (pt)
RU (1) RU2510048C1 (pt)
WO (1) WO2011093523A2 (pt)

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GB2479329B (en) * 2009-01-15 2013-08-14 Canon Kk X-ray imaging apparatus and method of X-ray imaging
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JP5213923B2 (ja) * 2010-01-29 2013-06-19 キヤノン株式会社 Ｘ線撮像装置およびｘ線撮像方法
JP4795472B2 (ja) * 2010-03-05 2011-10-19 キヤノン株式会社 Ｘ線撮像装置およびｘ線撮像方法
JP5733908B2 (ja) * 2010-04-27 2015-06-10 キヤノン株式会社 Ｘ線撮像装置
JP5610885B2 (ja) 2010-07-12 2014-10-22 キヤノン株式会社 Ｘ線撮像装置および撮像方法
JP6228457B2 (ja) * 2010-10-19 2017-11-08 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 微分位相コントラスト画像形成
GB201112506D0 (en) * 2011-07-21 2011-08-31 Ucl Business Plc Phase imaging
WO2013187012A1 (en) * 2012-06-15 2013-12-19 Canon Kabushiki Kaisha X-ray apparatus and x-ray measurement method
JP2014139564A (ja) * 2012-12-20 2014-07-31 Sony Corp 撮像装置および電子機器
KR101690122B1 (ko) * 2013-11-26 2017-01-09 한국전기연구원 Ｘ―ｒａｙ 다중에너지 필터를 이용한 플라즈마 이온 분포 측정 방법 및 그 시스템
JP6475315B2 (ja) 2014-07-17 2019-02-27 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． Ｘ線イメージング装置
WO2016143401A1 (ja) * 2015-03-10 2016-09-15 株式会社島津製作所 Ｘ線検出器
CN107427271B (zh) * 2015-04-09 2020-10-02 株式会社岛津制作所 X射线摄影装置
CN105204059B (zh) * 2015-09-11 2017-12-15 中国工程物理研究院激光聚变研究中心 一种局部区域软x射线辐射流定量测量装置与测量方法
KR101909822B1 (ko) * 2017-05-30 2018-10-18 한국과학기술원 방사선 이미지 센싱 장치, 이의 동작 방법, 및 이의 제조 방법
CN110308614B (zh) * 2018-03-20 2021-04-27 中国科学院物理研究所 X射线强度关联成像的方法和装置
CN111803109A (zh) * 2020-08-14 2020-10-23 上海联影医疗科技有限公司 一种x射线探测器及x射线成像系统

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Also Published As

Publication number Publication date
RU2012136774A (ru) 2014-03-10
WO2011093523A2 (en) 2011-08-04
US20120294421A1 (en) 2012-11-22
JP2011172900A (ja) 2011-09-08
RU2510048C1 (ru) 2014-03-20
CN102713679A (zh) 2012-10-03
US9031189B2 (en) 2015-05-12
KR101414707B1 (ko) 2014-07-04
EP2529252A2 (en) 2012-12-05
WO2011093523A3 (en) 2012-03-01
JP5213923B2 (ja) 2013-06-19
KR20120120336A (ko) 2012-11-01

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Legal Events

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B08F Application fees: application dismissed [chapter 8.6 patent gazette]

Free format text: REFERENTE A 6A ANUIDADE.

B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: EM VIRTUDE DO ARQUIVAMENTO PUBLICADO NA RPI 2395 DE 29-11-2016 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDO O ARQUIVAMENTO DO PEDIDO DE PATENTE, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.