BR112012017260A2 - Método e sistema para detectar materiais" - Google Patents

Método e sistema para detectar materiais"

Info

Publication number
BR112012017260A2
BR112012017260A2 BR112012017260A BR112012017260A BR112012017260A2 BR 112012017260 A2 BR112012017260 A2 BR 112012017260A2 BR 112012017260 A BR112012017260 A BR 112012017260A BR 112012017260 A BR112012017260 A BR 112012017260A BR 112012017260 A2 BR112012017260 A2 BR 112012017260A2
Authority
BR
Brazil
Prior art keywords
signal
parallel mode
approximately
native
range
Prior art date
Application number
BR112012017260A
Other languages
English (en)
Inventor
Curtis A Birnbach
Original Assignee
Advanced Fusion Systems Llc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advanced Fusion Systems Llc filed Critical Advanced Fusion Systems Llc
Publication of BR112012017260A2 publication Critical patent/BR112012017260A2/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • G01N22/02—Investigating the presence of flaws
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/10—Complex mathematical operations
    • G06F17/14—Fourier, Walsh or analogous domain transformations, e.g. Laplace, Hilbert, Karhunen-Loeve, transforms
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/10—Complex mathematical operations
    • G06F17/16—Matrix or vector computation, e.g. matrix-matrix or matrix-vector multiplication, matrix factorization

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Mathematical Physics (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Mathematical Analysis (AREA)
  • Data Mining & Analysis (AREA)
  • Mathematical Optimization (AREA)
  • Theoretical Computer Science (AREA)
  • Pure & Applied Mathematics (AREA)
  • Computational Mathematics (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • Algebra (AREA)
  • Databases & Information Systems (AREA)
  • Software Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Computing Systems (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

MÉTODO E SISTEMA PARA DETECTAR MATERIAIS. É revelado um método para detectar um ou ambos do material nativo em um objeto e qualquer material externo no objeto através da espectroscopia de modo paralelo, compreendendo aquisição de dados de modo paralelo, processamento de sinal e redução de dados e fornecimento de resultados. A aquisição de dados de modo paralelo compreende produzir um sinal de interrogação contendo simultaneamente radiação eletromagnética de largura de banda suficiente na faixa de aproximadamente 10 GHz a aproximadamente 25 THz para permitir a detecção simultânea de uma pluralidade de sinais em uma pluralidade de frequências, cada sinal estando em alguma amplitude, que fornece coletivamente uma assinatura espectral única de um material cuja detecção é desejada. O processamento de sinal e redução de dados compreende o processamento de um sinal resultante da exposição do objeto a radiação de interrogação para produzir uma matriz de dados tridimensional representativa de pelo menos qualquer material nativo ou externo associado com o objeto. A técnica de correlação é usada para comparar a matriz de dados com uma biblioteca de referência.
BR112012017260A 2010-02-12 2011-02-14 Método e sistema para detectar materiais" BR112012017260A2 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US30431810P 2010-02-12 2010-02-12
PCT/US2011/024794 WO2011100714A1 (en) 2010-02-12 2011-02-14 Method and system for detecting materials

Publications (1)

Publication Number Publication Date
BR112012017260A2 true BR112012017260A2 (pt) 2017-10-03

Family

ID=44368196

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112012017260A BR112012017260A2 (pt) 2010-02-12 2011-02-14 Método e sistema para detectar materiais"

Country Status (13)

Country Link
US (1) US8682596B2 (pt)
EP (1) EP2534468A4 (pt)
JP (3) JP2013519885A (pt)
KR (2) KR101863378B1 (pt)
CN (1) CN102812345B (pt)
AU (1) AU2011216259B2 (pt)
BR (1) BR112012017260A2 (pt)
CA (2) CA3029954C (pt)
IL (1) IL220757A (pt)
MX (1) MX2012008949A (pt)
NZ (1) NZ600888A (pt)
RU (1) RU2552126C2 (pt)
WO (1) WO2011100714A1 (pt)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8968698B2 (en) 2009-07-07 2015-03-03 Cytec Technology Corp. Processes for recovering metals from aqueous solutions
CN104038157B (zh) * 2014-06-20 2017-02-15 中国工程物理研究院应用电子学研究所 一种磁绝缘线振荡器
JP6706790B2 (ja) * 2016-03-11 2020-06-10 大学共同利用機関法人自然科学研究機構 テラヘルツ波イメージング装置
CN110383063B (zh) * 2017-03-10 2022-05-24 博势股份有限公司 借助于电磁波探测混凝土的结构
CN109916862B (zh) * 2019-02-27 2020-06-02 北京大学 一种增强多色相干spr器件及其控制方法
RU2726130C1 (ru) * 2019-11-05 2020-07-09 Общество с ограниченной ответственностью "Терагерцовая и инфракрасная фотоника" (ООО "ТИНФОТОНИКА") Способ оценки гидратации роговицы глаза в субтерагерцевом диапазоне частот

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US4661783A (en) 1981-03-18 1987-04-28 The United States Of America As Represented By The Secretary Of The Navy Free electron and cyclotron resonance distributed feedback lasers and masers
US4596967A (en) 1983-12-29 1986-06-24 The United States Of America As Represented By The United States Department Of Energy High power microwave generator
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JP2615964B2 (ja) * 1989-01-27 1997-06-04 松下電器産業株式会社 光学的情報処理装置
JPH0699287A (ja) * 1992-09-18 1994-04-12 Sumitomo Metal Ind Ltd 高周波溶接装置の溶接電力制御方法
US5418380A (en) * 1994-04-12 1995-05-23 Martin Marietta Corporation Optical correlator using ferroelectric liquid crystal spatial light modulators and Fourier transform lenses
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WO2004008092A1 (de) * 2002-07-15 2004-01-22 Campus Technologies Ag Vorrichtung und verfahren zur optischen spektroskopie und optischen sensorik sowie verwendung der vorrichtung
US20040113103A1 (en) * 2002-11-25 2004-06-17 Zhilkov Stanislav V. Terahertz and mid-infrared probing apparatus with high repetition rate pulses, and methods of using same
US7230244B2 (en) * 2003-05-16 2007-06-12 Sarnoff Corporation Method and apparatus for the detection of terahertz radiation absorption
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CA2713018C (en) * 2008-01-24 2013-11-12 Curtis A. Birnbach High voltage inverter
CN101476936B (zh) * 2009-01-19 2011-01-05 杭州电子科技大学 一种基于法-珀腔阵列式微型光谱仪

Also Published As

Publication number Publication date
KR101863378B1 (ko) 2018-05-31
EP2534468A1 (en) 2012-12-19
AU2011216259B2 (en) 2014-04-24
CN102812345B (zh) 2019-07-26
JP2016173368A (ja) 2016-09-29
EP2534468A4 (en) 2015-06-24
JP2013519885A (ja) 2013-05-30
JP2015111138A (ja) 2015-06-18
KR20170129299A (ko) 2017-11-24
JP5937707B2 (ja) 2016-06-22
KR101908256B1 (ko) 2018-10-15
IL220757A0 (en) 2012-08-30
CN102812345A (zh) 2012-12-05
RU2552126C2 (ru) 2015-06-10
US8682596B2 (en) 2014-03-25
NZ600888A (en) 2014-04-30
CA2786018C (en) 2019-05-07
AU2011216259A1 (en) 2012-07-19
US20110201510A1 (en) 2011-08-18
WO2011100714A1 (en) 2011-08-18
JP6192761B2 (ja) 2017-09-06
RU2012130788A (ru) 2014-02-10
CA2786018A1 (en) 2011-08-18
MX2012008949A (es) 2012-09-07
CA3029954C (en) 2020-07-07
KR20120135228A (ko) 2012-12-12
IL220757A (en) 2016-09-29
CA3029954A1 (en) 2011-08-18

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