BR0208660A - Método e dispositivo para avaliação de superfìcie - Google Patents

Método e dispositivo para avaliação de superfìcie

Info

Publication number
BR0208660A
BR0208660A BR0208660-3A BR0208660A BR0208660A BR 0208660 A BR0208660 A BR 0208660A BR 0208660 A BR0208660 A BR 0208660A BR 0208660 A BR0208660 A BR 0208660A
Authority
BR
Brazil
Prior art keywords
imaging device
recording
imaging
light source
properties
Prior art date
Application number
BR0208660-3A
Other languages
English (en)
Portuguese (pt)
Inventor
Klaas Hendrik De Haas
Gerrit Cornelis Dubbeldam
Ivo Bernardus Nicolaas Va Lans
Robin Paul Fries
Original Assignee
Akzo Nobel Coatings Int Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Akzo Nobel Coatings Int Bv filed Critical Akzo Nobel Coatings Int Bv
Publication of BR0208660A publication Critical patent/BR0208660A/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0216—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using light concentrators or collectors or condensers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G01J3/504—Goniometric colour measurements, for example measurements of metallic or flake based paints
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/52—Measurement of colour; Colour measuring devices, e.g. colorimeters using colour charts
    • G01J3/524—Calibration of colorimeters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/57—Measuring gloss

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
BR0208660-3A 2001-04-06 2002-03-28 Método e dispositivo para avaliação de superfìcie BR0208660A (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP01201276 2001-04-06
PCT/EP2002/003682 WO2002082063A1 (en) 2001-04-06 2002-03-28 Method and device for surface evaluation

Publications (1)

Publication Number Publication Date
BR0208660A true BR0208660A (pt) 2004-03-09

Family

ID=8180117

Family Applications (1)

Application Number Title Priority Date Filing Date
BR0208660-3A BR0208660A (pt) 2001-04-06 2002-03-28 Método e dispositivo para avaliação de superfìcie

Country Status (9)

Country Link
EP (1) EP1373867A1 (ja)
JP (1) JP3933581B2 (ja)
KR (1) KR100875806B1 (ja)
CN (1) CN100403011C (ja)
AU (1) AU2002338353B2 (ja)
BR (1) BR0208660A (ja)
RU (1) RU2292037C2 (ja)
WO (1) WO2002082063A1 (ja)
ZA (1) ZA200307712B (ja)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0625890D0 (en) * 2006-12-23 2007-02-07 Colormatrix Holdings Inc Polymeric materials
US9025153B2 (en) * 2011-11-16 2015-05-05 Axalta Coating Systems Ip Co., Llc Process for predicting degree of mottling in coating compositions by wet color measurement
JP5475057B2 (ja) 2012-04-20 2014-04-16 株式会社 オフィス・カラーサイエンス 変角分光イメージング測定方法およびその装置
CN104412079B (zh) * 2012-05-09 2018-03-27 希捷科技有限公司 表面特征映射
CN103674903A (zh) * 2013-12-31 2014-03-26 爱彼思（苏州）自动化科技有限公司 非接触式光泽度仪
US9880098B2 (en) * 2014-10-28 2018-01-30 Axalta Coatings Systems Ip Co., Llc Method and systems for quantifying differences between colored surfaces
US9678018B2 (en) 2015-03-30 2017-06-13 Gemological Institute Of America Inc. (Gia) Apparatus and method for assessing optical quality of gemstones
CN106908149A (zh) * 2017-04-11 2017-06-30 上海电机学院 一种机器人物体颜色识别系统及方法
KR102047206B1 (ko) * 2018-10-31 2019-11-20 한국과학기술원 체적함수비별 반사율 측정을 위한 함수특성곡선-초분광 캠 테스트 방법 및 장치
JP7341835B2 (ja) * 2019-10-09 2023-09-11 株式会社日立製作所 粉体混合システム及び粉体混合方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2588297B2 (ja) * 1990-06-20 1997-03-05 日産自動車株式会社 塗装表面の鮮映性評価方法
US5078496A (en) * 1990-08-14 1992-01-07 Autospect, Inc. Machine vision surface characterization system
US5640237A (en) * 1995-08-29 1997-06-17 Kla Instruments Corporation Method and apparatus for detecting non-uniformities in reflective surafaces
JP3312849B2 (ja) * 1996-06-25 2002-08-12 松下電工株式会社 物体表面の欠陥検出方法
EP1016126B1 (en) * 1997-03-31 2018-12-26 Nanometrics Incorporated Optical inspection module and method for detecting particles and defects on substrates in integrated process tools

Also Published As

Publication number Publication date
EP1373867A1 (en) 2004-01-02
JP3933581B2 (ja) 2007-06-20
CN1505757A (zh) 2004-06-16
KR20040012743A (ko) 2004-02-11
WO2002082063A1 (en) 2002-10-17
JP2004526969A (ja) 2004-09-02
KR100875806B1 (ko) 2008-12-26
RU2292037C2 (ru) 2007-01-20
ZA200307712B (en) 2004-07-06
CN100403011C (zh) 2008-07-16
AU2002338353B2 (en) 2006-05-25
RU2003132476A (ru) 2005-03-20

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Legal Events

Date Code Title Description
B08F Application fees: application dismissed [chapter 8.6 patent gazette]

Free format text: REFERENTE A(S) 9A ANUIDADE(S)

B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: REFERENTE AO DESPACHO 8.6 PUBLICADO NA RPI 2103 DE 26/04/2011.