BE764639A - Procede et dispositifs de mesure en continu de l'epaisseur des films oude leurs enduits - Google Patents

Procede et dispositifs de mesure en continu de l'epaisseur des films oude leurs enduits

Info

Publication number
BE764639A
BE764639A BE764639A BE764639A BE764639A BE 764639 A BE764639 A BE 764639A BE 764639 A BE764639 A BE 764639A BE 764639 A BE764639 A BE 764639A BE 764639 A BE764639 A BE 764639A
Authority
BE
Belgium
Prior art keywords
coatings
films
thickness
devices
continuous measurement
Prior art date
Application number
BE764639A
Other languages
English (en)
French (fr)
Original Assignee
Cellophane Sa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cellophane Sa filed Critical Cellophane Sa
Publication of BE764639A publication Critical patent/BE764639A/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
BE764639A 1970-03-25 1971-03-22 Procede et dispositifs de mesure en continu de l'epaisseur des films oude leurs enduits BE764639A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7010636A FR2082717A5 (de) 1970-03-25 1970-03-25

Publications (1)

Publication Number Publication Date
BE764639A true BE764639A (fr) 1971-08-16

Family

ID=9052839

Family Applications (1)

Application Number Title Priority Date Filing Date
BE764639A BE764639A (fr) 1970-03-25 1971-03-22 Procede et dispositifs de mesure en continu de l'epaisseur des films oude leurs enduits

Country Status (5)

Country Link
US (1) US3732016A (de)
BE (1) BE764639A (de)
DE (1) DE2114061C3 (de)
FR (1) FR2082717A5 (de)
NL (1) NL7103883A (de)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4593533A (en) * 1974-12-05 1986-06-10 Alsenz Richard H Method and apparatus for detecting and controlling the formation of ice or frost
GB2016678B (en) * 1978-03-10 1982-09-15 Asahi Dow Ltd Infrared multilayer film thickness measuring method and apparatus
DE2919858A1 (de) * 1978-05-17 1979-11-22 British Steel Corp Verfahren und vorrichtung zur bestimmung der abmessungen von werkstuecken
US4285745A (en) * 1979-08-01 1981-08-25 Ppg Industries, Inc. Method of determining optical quality of a laminated article
US4371482A (en) * 1979-08-01 1983-02-01 Ppg Industries, Inc. Method of determining optical quality of a shaped article
DD151902A1 (de) * 1980-06-09 1981-11-11 Frank Schumann Verfahren zur bestimmung der dicke von klebstoffschichten auf buchblockruecken
JPS58103604A (ja) * 1981-12-16 1983-06-20 Teijin Ltd フイルムの厚さ測定方法及び測定装置
US4676936A (en) * 1985-12-23 1987-06-30 The Dow Chemical Company Controlled coextrusion of barrier sheet
FI83911C (fi) * 1986-05-14 1992-01-10 Tapio Technologies Oy Foerfarande och anordning foer maetning av ett hinnartat eller skivlikt bands tjocklek.
DE3638932A1 (de) * 1986-11-14 1988-05-26 Kaemmerer Gmbh Verfahren zur messung von beschichtungsmengen, insbesondere von silikon-beschichtungen auf papier oder kunststoffolie
DE3768088D1 (de) * 1987-06-03 1991-03-28 Hewlett Packard Gmbh Verfahren zur bestimmung der perfusion.
US4952226A (en) * 1989-02-27 1990-08-28 American Telephone And Telegraph Company Lightguide coating control
DE4130677C2 (de) * 1991-09-14 1995-11-23 Roland Man Druckmasch Vorrichtung zur lichtelektrischen Überwachung des Laufes von Bahnen in Rotationsdruckmaschinen
US5396332A (en) * 1993-02-08 1995-03-07 Ciszek; Theodoer F. Apparatus and method for measuring the thickness of a semiconductor wafer
US20040046969A1 (en) * 2002-09-10 2004-03-11 Honeywell International Inc. System and method for monitoring thin film deposition on optical substrates
US7259858B2 (en) * 2004-11-04 2007-08-21 Carestream Health, Inc. Imaging apparatus having media sensing system
US7573586B1 (en) * 2008-06-02 2009-08-11 United Technologies Corporation Method and system for measuring a coating thickness
WO2015177645A2 (en) * 2014-03-25 2015-11-26 Devos John Arthur Thin-film coating apparatus for applying enhanced performance coatings on outdoor substrates
US20220291135A1 (en) * 2019-07-29 2022-09-15 Basf Coatings Gmbh Device and method for monitoring the drying/curing process of coatings

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3378676A (en) * 1963-07-16 1968-04-16 Industrial Nucleonics Corp System employing plural time-spaced average computations for measuring a second variable characteristic imparted to a material initially having a first variable characteristic
US3473122A (en) * 1966-12-05 1969-10-14 Hickok Electrical Instr Co The Digital voltmeter

Also Published As

Publication number Publication date
FR2082717A5 (de) 1971-12-10
US3732016A (en) 1973-05-08
NL7103883A (de) 1971-09-28
DE2114061A1 (de) 1971-10-07
DE2114061C3 (de) 1980-01-31
DE2114061B2 (de) 1979-05-31

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Legal Events

Date Code Title Description
RE Patent lapsed

Owner name: LA CELLOPHANE

Effective date: 19840322