BE727001A - - Google Patents
Info
- Publication number
- BE727001A BE727001A BE727001DA BE727001A BE 727001 A BE727001 A BE 727001A BE 727001D A BE727001D A BE 727001DA BE 727001 A BE727001 A BE 727001A
- Authority
- BE
- Belgium
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02015—Interferometers characterised by the beam path configuration
- G01B9/02017—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations
- G01B9/02021—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations contacting different faces of object, e.g. opposite faces
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/02056—Passive reduction of errors
- G01B9/02061—Reduction or prevention of effects of tilts or misalignment
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/70—Using polarization in the interferometer
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US69882168A | 1968-01-18 | 1968-01-18 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| BE727001A true BE727001A (US20090192370A1-20090730-C00001.png) | 1969-07-17 |
Family
ID=24806795
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| BE727001D BE727001A (US20090192370A1-20090730-C00001.png) | 1968-01-18 | 1969-01-17 |
Country Status (9)
Families Citing this family (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3941480A (en) * | 1974-02-08 | 1976-03-02 | The Gerber Scientific Instrument Company | Work locating system and method with temperature and other compensation capabilities |
| US4056323A (en) * | 1975-04-02 | 1977-11-01 | Ludman Jacques E | Interferometer optical system |
| US4280054A (en) * | 1979-04-30 | 1981-07-21 | Varian Associates, Inc. | X-Y Work table |
| EP0341960A3 (en) * | 1988-05-10 | 1990-10-03 | Hewlett-Packard Company | Method for improving performance of a laser interferometer in the presence of wavefront distortion |
| JP2000283722A (ja) | 1999-03-29 | 2000-10-13 | Ando Electric Co Ltd | 光学部品駆動装置と光干渉計 |
| DE10118392A1 (de) | 2001-04-13 | 2002-11-07 | Zeiss Carl | System und Verfahren zum Bestimmen einer Position oder/und Orientierung zweier Objekte relativ zueinander sowie Strahlführungsanordnung, Interferometeranordnung und Vorrichtung zum Ändern einer optischen Weglänge zum Einsatz in einem solchen System und Verfahren |
| JP4198929B2 (ja) * | 2002-03-27 | 2008-12-17 | パイオニア株式会社 | レーザ測長器及びレーザ測長方法 |
| US20060076385A1 (en) | 2002-04-18 | 2006-04-13 | Etter Mark A | Power tool control system |
| US7073268B1 (en) | 2002-04-18 | 2006-07-11 | Black & Decker Inc. | Level apparatus |
| US7369916B2 (en) | 2002-04-18 | 2008-05-06 | Black & Decker Inc. | Drill press |
| US6937336B2 (en) * | 2002-08-15 | 2005-08-30 | Black & Decker, Inc. | Optical alignment system for power tool |
| US7359762B2 (en) | 2002-04-18 | 2008-04-15 | Black & Decker Inc. | Measurement and alignment device including a display system |
| US8004664B2 (en) | 2002-04-18 | 2011-08-23 | Chang Type Industrial Company | Power tool control system |
| US20030233921A1 (en) | 2002-06-19 | 2003-12-25 | Garcia Jaime E. | Cutter with optical alignment system |
| US7137327B2 (en) | 2002-10-31 | 2006-11-21 | Black & Decker Inc. | Riving knife assembly for a dual bevel table saw |
| US7290474B2 (en) | 2003-04-29 | 2007-11-06 | Black & Decker Inc. | System for rapidly stopping a spinning table saw blade |
| US20050113701A1 (en) * | 2003-11-26 | 2005-05-26 | Scimed Life Systems, Inc. | Rotating measuring device |
| US7243440B2 (en) | 2004-10-06 | 2007-07-17 | Black & Decker Inc. | Gauge for use with power tools |
| DE102008001482A1 (de) * | 2008-04-30 | 2009-11-05 | Robert Bosch Gmbh | Interferometrische Anordnung sowie Verfahren zum Einstellen eines Gangunterschieds |
| DE102008001473B3 (de) * | 2008-04-30 | 2009-12-31 | Robert Bosch Gmbh | Optische Anordnung zur Beleuchtung eines Messobjektes, interferometrische Anordnung zur Vermessung von Flächen eines Messobjektes |
| GB201000775D0 (en) | 2010-01-18 | 2010-03-03 | Stfc Science & Technology | Interferometer spectrometer |
| JP2011215016A (ja) * | 2010-03-31 | 2011-10-27 | Fujifilm Corp | 非球面形状測定装置 |
| DE202011110732U1 (de) * | 2011-05-10 | 2015-12-10 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Optische Anordnung zur Laserinterferenzstrukturierung einer Probe mit Strahlführung gleicher Weglänge |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2151631A (en) * | 1936-05-07 | 1939-03-21 | Williams William Ewart | Optical interferometer |
| US2527338A (en) * | 1946-10-12 | 1950-10-24 | American Cyanamid Co | Diffraction grating ruling engine |
| US2841049A (en) * | 1955-03-30 | 1958-07-01 | Perkin Elmer Corp | Interferometer |
| US3409375A (en) * | 1964-10-21 | 1968-11-05 | Cutler Hammer Inc | Gauging interferometer systems |
-
1968
- 1968-01-18 US US698821A patent/US3597091A/en not_active Expired - Lifetime
-
1969
- 1969-01-13 GB GB0855/69A patent/GB1254911A/en not_active Expired
- 1969-01-14 CH CH45469A patent/CH506047A/fr not_active IP Right Cessation
- 1969-01-17 NL NL6900796A patent/NL6900796A/xx unknown
- 1969-01-17 IL IL31441A patent/IL31441A0/xx unknown
- 1969-01-17 BE BE727001D patent/BE727001A/xx unknown
- 1969-01-17 FR FR6900821A patent/FR2000401A1/fr not_active Withdrawn
- 1969-01-17 DE DE19691902290 patent/DE1902290A1/de active Pending
- 1969-01-18 JP JP44003333A patent/JPS4832139B1/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| DE1902290A1 (de) | 1969-09-04 |
| FR2000401A1 (US20090192370A1-20090730-C00001.png) | 1969-09-05 |
| US3597091A (en) | 1971-08-03 |
| NL6900796A (US20090192370A1-20090730-C00001.png) | 1969-07-22 |
| CH506047A (fr) | 1971-04-15 |
| IL31441A0 (en) | 1969-03-27 |
| JPS4832139B1 (US20090192370A1-20090730-C00001.png) | 1973-10-04 |
| GB1254911A (en) | 1971-11-24 |
