BE709744A - - Google Patents
Info
- Publication number
- BE709744A BE709744A BE709744DA BE709744A BE 709744 A BE709744 A BE 709744A BE 709744D A BE709744D A BE 709744DA BE 709744 A BE709744 A BE 709744A
- Authority
- BE
- Belgium
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P54/00—Cutting or separating of wafers, substrates or parts of devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B13/00—Apparatus or processes specially adapted for manufacturing conductors or cables
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D99/00—Subject matter not provided for in other groups of this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/927—Electromigration resistant metallization
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49004—Electrical device making including measuring or testing of device or component part
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Electrodes Of Semiconductors (AREA)
- Conductive Materials (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US61394767A | 1967-02-03 | 1967-02-03 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| BE709744A true BE709744A (en:Method) | 1968-05-30 |
Family
ID=24459309
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| BE709744D BE709744A (en:Method) | 1967-02-03 | 1968-01-23 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US3474530A (en:Method) |
| JP (1) | JPS482400B1 (en:Method) |
| BE (1) | BE709744A (en:Method) |
| FR (1) | FR1558596A (en:Method) |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3548491A (en) * | 1967-02-03 | 1970-12-22 | Ibm | Mass production of electronic devices |
| US3879840A (en) * | 1969-01-15 | 1975-04-29 | Ibm | Copper doped aluminum conductive stripes and method therefor |
| NL87258C (en:Method) * | 1969-01-15 | |||
| US3631304A (en) * | 1970-05-26 | 1971-12-28 | Cogar Corp | Semiconductor device, electrical conductor and fabrication methods therefor |
| US3878442A (en) * | 1970-05-26 | 1975-04-15 | Harshad J Bhatt | Electrical conductor having a high resistance to electromigration |
| US4534100A (en) * | 1982-06-28 | 1985-08-13 | The United States Of America As Represented By The Secretary Of The Air Force | Electrical method of making conductive paths in silicon |
| USRE32625E (en) * | 1983-01-05 | 1988-03-15 | Syracuse University | Dynamic testing of electrical conductors |
| US4483629A (en) * | 1983-01-05 | 1984-11-20 | Syracuse University | Dynamic testing of electrical conductors |
| US4606781A (en) * | 1984-10-18 | 1986-08-19 | Motorola, Inc. | Method for resistor trimming by metal migration |
| US4652812A (en) * | 1984-11-27 | 1987-03-24 | Harris Corporation | One-sided ion migration velocity measurement and electromigration failure warning device |
| US5497076A (en) * | 1993-10-25 | 1996-03-05 | Lsi Logic Corporation | Determination of failure criteria based upon grain boundary electromigration in metal alloy films |
| US5612627A (en) * | 1994-12-01 | 1997-03-18 | Advanced Micro Devices, Inc. | Method for evaluating the effect of a barrier layer on electromigration for plug and non-plug interconnect systems |
| JP2880695B2 (ja) * | 1996-09-27 | 1999-04-12 | 松下電子工業株式会社 | 半導体記憶装置の加速試験方法 |
| JP3189778B2 (ja) * | 1998-03-11 | 2001-07-16 | 日本電気株式会社 | 配線の温度上昇シミュレーション方法 |
| JP4480649B2 (ja) * | 2005-09-05 | 2010-06-16 | 富士通マイクロエレクトロニクス株式会社 | ヒューズ素子及びその切断方法 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2799824A (en) * | 1953-03-10 | 1957-07-16 | Louis N Heynick | Shock testing device |
-
1967
- 1967-02-03 US US613947A patent/US3474530A/en not_active Expired - Lifetime
-
1968
- 1968-01-10 FR FR1558596D patent/FR1558596A/fr not_active Expired
- 1968-01-23 BE BE709744D patent/BE709744A/xx unknown
- 1968-02-01 JP JP576468A patent/JPS482400B1/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| FR1558596A (en:Method) | 1969-02-28 |
| US3474530A (en) | 1969-10-28 |
| JPS482400B1 (en:Method) | 1973-01-24 |