BE692931A - - Google Patents

Info

Publication number
BE692931A
BE692931A BE692931DA BE692931A BE 692931 A BE692931 A BE 692931A BE 692931D A BE692931D A BE 692931DA BE 692931 A BE692931 A BE 692931A
Authority
BE
Belgium
Application number
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of BE692931A publication Critical patent/BE692931A/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025Sample holders or supports therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
BE692931D 1966-01-20 1967-01-20 BE692931A (hu)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US52192666A 1966-01-20 1966-01-20

Publications (1)

Publication Number Publication Date
BE692931A true BE692931A (hu) 1967-07-20

Family

ID=24078704

Family Applications (1)

Application Number Title Priority Date Filing Date
BE692931D BE692931A (hu) 1966-01-20 1967-01-20

Country Status (4)

Country Link
BE (1) BE692931A (hu)
DE (1) DE1598413A1 (hu)
FR (1) FR1503449A (hu)
NL (1) NL6700870A (hu)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0153989A3 (en) * 1983-09-13 1986-02-05 Nicolet Instrument Corporation Sample holder for a powder diffractometer
US4678340A (en) * 1984-09-27 1987-07-07 Nicolet Instrument Corporation Sample holder for powder x-ray diffractometer
ES2266772T3 (es) 2002-01-15 2007-03-01 Avantium International B.V. Metodo para realizar analisis de difraccion de polvo.
EP1327877A1 (en) * 2002-01-15 2003-07-16 Avantium International B.V. Method for successively performing powder diffraction analysis on a plurality of samples
CN100485373C (zh) 2004-07-14 2009-05-06 西南技术工程研究所 短波长x射线衍射测量装置和方法

Also Published As

Publication number Publication date
NL6700870A (hu) 1967-07-21
FR1503449A (fr) 1967-11-24
DE1598413A1 (de) 1970-04-23

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