AU6203900A - Test probe head having encapsulated rigid pins - Google Patents

Test probe head having encapsulated rigid pins

Info

Publication number
AU6203900A
AU6203900A AU62039/00A AU6203900A AU6203900A AU 6203900 A AU6203900 A AU 6203900A AU 62039/00 A AU62039/00 A AU 62039/00A AU 6203900 A AU6203900 A AU 6203900A AU 6203900 A AU6203900 A AU 6203900A
Authority
AU
Australia
Prior art keywords
probe head
test probe
rigid pins
encapsulated rigid
encapsulated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU62039/00A
Inventor
Robert C. Doherty
Thomas K. Stewart
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
PJC TECHNOLOGIES Inc
Original Assignee
PJC TECHNOLOGIES Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US09/351,423 external-priority patent/US6330744B1/en
Application filed by PJC TECHNOLOGIES Inc filed Critical PJC TECHNOLOGIES Inc
Publication of AU6203900A publication Critical patent/AU6203900A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/0735—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card arranged on a flexible frame or film

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
AU62039/00A 1999-07-12 2000-06-30 Test probe head having encapsulated rigid pins Abandoned AU6203900A (en)

Applications Claiming Priority (27)

Application Number Priority Date Filing Date Title
US35200099A 1999-07-12 1999-07-12
US35142799A 1999-07-12 1999-07-12
US35128099A 1999-07-12 1999-07-12
US35142299A 1999-07-12 1999-07-12
US35127799A 1999-07-12 1999-07-12
US35127899A 1999-07-12 1999-07-12
US35241399A 1999-07-12 1999-07-12
US35152099A 1999-07-12 1999-07-12
US35127999A 1999-07-12 1999-07-12
US35199999A 1999-07-12 1999-07-12
US09351423 1999-07-12
US09351278 1999-07-12
US09351999 1999-07-12
US09351280 1999-07-12
US09351422 1999-07-12
US09352000 1999-07-12
US09352413 1999-07-12
US09351277 1999-07-12
US09/351,423 US6330744B1 (en) 1999-07-12 1999-07-12 Customized electrical test probe head using uniform probe assemblies
US09351520 1999-07-12
US09351427 1999-07-12
US09351279 1999-07-12
US45398999A 1999-12-02 1999-12-02
US45284199A 1999-12-02 1999-12-02
US09453989 1999-12-02
US09452841 1999-12-02
PCT/US2000/018196 WO2001004650A1 (en) 1999-07-12 2000-06-30 Test probe head having encapsulated rigid pins

Publications (1)

Publication Number Publication Date
AU6203900A true AU6203900A (en) 2001-01-30

Family

ID=27584597

Family Applications (1)

Application Number Title Priority Date Filing Date
AU62039/00A Abandoned AU6203900A (en) 1999-07-12 2000-06-30 Test probe head having encapsulated rigid pins

Country Status (2)

Country Link
AU (1) AU6203900A (en)
WO (1) WO2001004650A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050253602A1 (en) 2004-04-28 2005-11-17 Cram Daniel P Resilient contact probe apparatus, methods of using and making, and resilient contact probes
CN113030700B (en) * 2021-03-04 2022-03-08 强一半导体（苏州）有限公司 Wafer-level test probe card and wafer-level test probe card assembling method

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4963821A (en) * 1989-04-14 1990-10-16 Tektronix, Inc. Probe and method for testing a populated circuit board
US5098864A (en) * 1989-11-29 1992-03-24 Olin Corporation Process for manufacturing a metal pin grid array package
US5102829A (en) * 1991-07-22 1992-04-07 At&T Bell Laboratories Plastic pin grid array package
KR100196195B1 (en) * 1991-11-18 1999-06-15 이노우에 쥰이치 Probe card
US5400220A (en) * 1994-05-18 1995-03-21 Dell Usa, L.P. Mechanical printed circuit board and ball grid array interconnect apparatus

Also Published As

Publication number Publication date
WO2001004650A9 (en) 2002-07-25
WO2001004650A1 (en) 2001-01-18

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase