AU5964700A - Device for measuring the humidity and reflectance of surfaces - Google Patents

Device for measuring the humidity and reflectance of surfaces

Info

Publication number
AU5964700A
AU5964700A AU59647/00A AU5964700A AU5964700A AU 5964700 A AU5964700 A AU 5964700A AU 59647/00 A AU59647/00 A AU 59647/00A AU 5964700 A AU5964700 A AU 5964700A AU 5964700 A AU5964700 A AU 5964700A
Authority
AU
Australia
Prior art keywords
reflectance
humidity
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU59647/00A
Inventor
Wilhelm Rapp
Markus Riemenschneider
Thomas Schulze
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
INGENIEURBURO
Piller Group GmbH
Original Assignee
INGBUERO
Piller GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by INGBUERO, Piller GmbH filed Critical INGBUERO
Publication of AU5964700A publication Critical patent/AU5964700A/en
Abandoned legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3554Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for determining moisture content
    • G01N21/3559Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for determining moisture content in sheets, e.g. in paper
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55Specular reflectivity
    • G01N21/57Measuring gloss
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/86Investigating moving sheets
AU59647/00A 1999-06-16 2000-06-15 Device for measuring the humidity and reflectance of surfaces Abandoned AU5964700A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE19927452A DE19927452C2 (en) 1999-06-16 1999-06-16 Device for measuring moisture and reflectivity of surfaces
US199274525 1999-06-16
PCT/DE2000/001892 WO2000077493A2 (en) 1999-06-16 2000-06-15 Device for measuring the humidity and reflectance of surfaces

Publications (1)

Publication Number Publication Date
AU5964700A true AU5964700A (en) 2001-01-02

Family

ID=7911424

Family Applications (1)

Application Number Title Priority Date Filing Date
AU59647/00A Abandoned AU5964700A (en) 1999-06-16 2000-06-15 Device for measuring the humidity and reflectance of surfaces

Country Status (3)

Country Link
AU (1) AU5964700A (en)
DE (1) DE19927452C2 (en)
WO (1) WO2000077493A2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2824138B1 (en) * 2001-04-27 2003-06-13 Usinor REFLECTOMETER-LIKE BRIGHTNESS MEASURING DEVICE

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US384553A (en) * 1888-06-12 Sash-fastener
US3614450A (en) * 1969-02-17 1971-10-19 Measurex Corp Apparatus for measuring the amount of a substance that is associated with a base material
US3675019A (en) * 1971-03-19 1972-07-04 Measurex Corp Apparatus for measuring the amount of a substance that is associated with a base material
IT982680B (en) * 1972-04-10 1974-10-21 Infra Systems Inc MEASUREMENT SYSTEM USING INFRARED RADIA
US3792271A (en) * 1972-06-30 1974-02-12 Asea Ab Means for determining moisture content and/or surface weight
DE3149809A1 (en) * 1981-12-16 1983-07-21 Robert Bosch Gmbh, 7000 Stuttgart Apparatus for producing evacuated bag packs
DE3336659C2 (en) * 1982-10-12 1993-10-07 Sentrol Systems Ltd Measuring device for determining the profile of the moisture content of a material web transversely to its running direction
GB8325691D0 (en) * 1983-09-26 1983-10-26 Wiggins Teape Group Ltd Measuring water content
EP0177921B1 (en) * 1984-10-08 1993-01-13 Dai Nippon Insatsu Kabushiki Kaisha Method and device for measuring the quantity of water dampening the face of an offset printing plate
DE3611645A1 (en) * 1986-04-07 1987-10-08 Grapho Metronic Gmbh & Co Method and device for regulating the proportions of ink and damping medium in a layer of emulsion on the printing plate of an offset printing machine
US4884697A (en) * 1988-06-21 1989-12-05 Takacs Peter Z Surface profiling interferometer
US5067817A (en) * 1990-02-08 1991-11-26 Bauer Associates, Inc. Method and device for noncontacting self-referencing measurement of surface curvature and profile
DE4131835A1 (en) * 1991-09-22 1993-03-25 Optronik Gmbh Berlin Opto Elek Surface fault detector e.g. for moving textiles during production - has raster line of illumination sources with similar receiver lines for reflected and transmitted light, and uses parallel processing technique
US5674698A (en) * 1992-09-14 1997-10-07 Sri International Up-converting reporters for biological and other assays using laser excitation techniques
DE4321177A1 (en) * 1993-06-25 1995-01-05 Heidelberger Druckmasch Ag Device for parallel image inspection and color control on a printed product
DE19831612A1 (en) * 1998-07-14 2000-01-20 Voith Sulzer Papiermasch Gmbh Measuring system

Also Published As

Publication number Publication date
WO2000077493A3 (en) 2001-04-19
DE19927452C2 (en) 2001-05-03
WO2000077493A8 (en) 2003-08-14
WO2000077493A2 (en) 2000-12-21
DE19927452A1 (en) 2001-01-25

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase