AU5141100A - Humidity chamber for scanning stylus atomic force microscope with cantilever tracking - Google Patents

Humidity chamber for scanning stylus atomic force microscope with cantilever tracking

Info

Publication number
AU5141100A
AU5141100A AU51411/00A AU5141100A AU5141100A AU 5141100 A AU5141100 A AU 5141100A AU 51411/00 A AU51411/00 A AU 51411/00A AU 5141100 A AU5141100 A AU 5141100A AU 5141100 A AU5141100 A AU 5141100A
Authority
AU
Australia
Prior art keywords
atomic force
force microscope
humidity chamber
scanning stylus
cantilever
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU51411/00A
Inventor
Edward Embree
Jonathan Martin
Mark Vanlandingham
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Standards and Technology (NIST)
Original Assignee
National Institute of Standards and Technology (NIST)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by National Institute of Standards and Technology (NIST) filed Critical National Institute of Standards and Technology (NIST)
Publication of AU5141100A publication Critical patent/AU5141100A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
    • G01Q30/08—Means for establishing or regulating a desired environmental condition within a sample chamber
    • G01Q30/12—Fluid environment
    • G01Q30/14—Liquid environment

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
AU51411/00A 1999-05-19 2000-05-18 Humidity chamber for scanning stylus atomic force microscope with cantilever tracking Abandoned AU5141100A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13488599P 1999-05-19 1999-05-19
US60134885 1999-05-19
PCT/US2000/013658 WO2000070297A2 (en) 1999-05-19 2000-05-18 Humidity chamber for scanning atomic force microscope

Publications (1)

Publication Number Publication Date
AU5141100A true AU5141100A (en) 2000-12-05

Family

ID=22465458

Family Applications (1)

Application Number Title Priority Date Filing Date
AU51411/00A Abandoned AU5141100A (en) 1999-05-19 2000-05-18 Humidity chamber for scanning stylus atomic force microscope with cantilever tracking

Country Status (2)

Country Link
AU (1) AU5141100A (en)
WO (1) WO2000070297A2 (en)

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4892830A (en) * 1987-04-02 1990-01-09 Baylor College Of Medicine Environmentally controlled in vitro incubator
US5393980A (en) * 1993-05-11 1995-02-28 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Quality monitor and monitoring technique employing optically stimulated electron emmission
GB2290656B (en) * 1994-06-23 1998-03-25 Grongar Wynn Lloyd A scanning probe and an approach mechanism therefor
US5675154A (en) * 1995-02-10 1997-10-07 Molecular Imaging Corporation Scanning probe microscope
JPH0963525A (en) * 1995-08-22 1997-03-07 Nikon Corp Scanning electron microscope
JPH10241620A (en) * 1997-02-27 1998-09-11 Nikon Corp Environment control type scanning-type electronic microscope
US6130434A (en) * 1998-05-22 2000-10-10 Euro-Celtique, S.A. Dissolution stage for an environmental scanning electron microscope
US6051825A (en) * 1998-06-19 2000-04-18 Molecular Imaging Corporation Conducting scanning probe microscope with environmental control

Also Published As

Publication number Publication date
WO2000070297A2 (en) 2000-11-23
WO2000070297A3 (en) 2002-10-03

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase