AU4039701A - Measuring microscope - Google Patents

Measuring microscope

Info

Publication number
AU4039701A
AU4039701A AU40397/01A AU4039701A AU4039701A AU 4039701 A AU4039701 A AU 4039701A AU 40397/01 A AU40397/01 A AU 40397/01A AU 4039701 A AU4039701 A AU 4039701A AU 4039701 A AU4039701 A AU 4039701A
Authority
AU
Australia
Prior art keywords
measuring microscope
microscope
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU40397/01A
Inventor
Roman Buchler
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of AU4039701A publication Critical patent/AU4039701A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/04—Measuring microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/0016—Technical microscopes, e.g. for inspection or measuring in industrial production processes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/26—Stages; Adjusting means therefor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/362—Mechanical details, e.g. mountings for the camera or image sensor, housings

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Length Measuring Devices By Optical Means (AREA)
AU40397/01A 2000-03-27 2001-03-16 Measuring microscope Abandoned AU4039701A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
CH5812000 2000-03-27
CH581/00 2000-03-27
PCT/CH2001/000165 WO2001073374A1 (en) 2000-03-27 2001-03-16 Measuring microscope

Publications (1)

Publication Number Publication Date
AU4039701A true AU4039701A (en) 2001-10-08

Family

ID=4521510

Family Applications (1)

Application Number Title Priority Date Filing Date
AU40397/01A Abandoned AU4039701A (en) 2000-03-27 2001-03-16 Measuring microscope

Country Status (2)

Country Link
AU (1) AU4039701A (en)
WO (1) WO2001073374A1 (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005017808A (en) * 2003-06-27 2005-01-20 Olympus Corp Optical microscope system, optical axis correction method using same, optical axis correction program, and recording medium having the program recorded therein
DE102008010435B4 (en) * 2008-02-21 2010-07-29 Tecan Trading Ag Data acquisition procedure with a laser scanner device
CN101979958B (en) * 2010-10-29 2012-05-23 天津海鸥表业集团有限公司 Semi-automatic visual detection instrument for escape wheel of watch
ITRN20120030A1 (en) * 2012-06-08 2013-12-09 Vici & C S R L OPTICAL MEASUREMENT MACHINE
EP2916158A1 (en) 2014-03-06 2015-09-09 European Molecular Biology Laboratory Microscope
JP6419471B2 (en) * 2014-07-07 2018-11-07 オリンパス株式会社 Measuring microscope, method to support sample tilt correction
DE102016110956A1 (en) * 2016-06-15 2017-12-21 Schreiner Group Gmbh & Co. Kg Measuring arrangement for measuring structures of a test object
CN110220981B (en) * 2019-06-18 2024-06-18 武汉工程大学 Positioning instrument for ultrasonic scanning microscope

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4833382A (en) * 1986-06-06 1989-05-23 Gibbs David L Method and apparatus for use in microscope investigations
JPS63152293A (en) * 1986-12-09 1988-06-24 マイクロワ−ルド　オブ　インナ−　スペ−ス　リミテイド Display
DE9007492U1 (en) * 1990-06-22 1992-01-16 Leica Mikroskopie und Systeme GmbH, 6330 Wetzlar Roller friction screw drive
EP0819963B1 (en) * 1996-07-16 2003-09-17 Perkin-Elmer Limited Control of IR microscope
JP3047831U (en) * 1997-10-08 1998-04-28 稲畑産業株式会社 Digital optical microscope and telescope
JP2001521182A (en) * 1997-10-17 2001-11-06 アキュメッド インターナショナル インコーポレイテッド High precision computer-assisted microscope

Also Published As

Publication number Publication date
WO2001073374A1 (en) 2001-10-04

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase