AU4600696A - Uncooled ybacuo thin film infrared detector - Google Patents

Uncooled ybacuo thin film infrared detector

Info

Publication number
AU4600696A
AU4600696A AU46006/96A AU4600696A AU4600696A AU 4600696 A AU4600696 A AU 4600696A AU 46006/96 A AU46006/96 A AU 46006/96A AU 4600696 A AU4600696 A AU 4600696A AU 4600696 A AU4600696 A AU 4600696A
Authority
AU
Australia
Prior art keywords
uncooled
thin film
infrared detector
film infrared
ybacuo thin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU46006/96A
Inventor
Donald P Butler
Zeynep Celik-Butler
Shan Pao-Chuan
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Research Corp Technologies Inc
Original Assignee
Southern Methodist University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US08/382,200 external-priority patent/US5572060A/en
Application filed by Southern Methodist University filed Critical Southern Methodist University
Publication of AU4600696A publication Critical patent/AU4600696A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/34—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using capacitors, e.g. pyroelectric capacitors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/20—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
    • H01L31/0256—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by the material
    • H01L31/0264—Inorganic materials
    • H01L31/032—Inorganic materials including, apart from doping materials or other impurities, only compounds not provided for in groups H01L31/0272 - H01L31/0312
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
    • H01L31/09—Devices sensitive to infrared, visible or ultraviolet radiation
    • H01L31/095—Devices sensitive to infrared, visible or ultraviolet radiation comprising amorphous semiconductors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N19/00—Integrated devices, or assemblies of multiple devices, comprising at least one thermoelectric or thermomagnetic element covered by groups H10N10/00 - H10N15/00

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Electromagnetism (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Chemical & Material Sciences (AREA)
  • Inorganic Chemistry (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Thin Film Transistor (AREA)
  • Radiation Pyrometers (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Semiconductor Memories (AREA)
  • Non-Volatile Memory (AREA)
  • Insulated Gate Type Field-Effect Transistor (AREA)
AU46006/96A 1995-02-01 1995-12-29 Uncooled ybacuo thin film infrared detector Abandoned AU4600696A (en)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US08/382,200 US5572060A (en) 1995-02-01 1995-02-01 Uncooled YBaCuO thin film infrared detector
US382200 1995-02-01
US42495P 1995-06-22 1995-06-22
US000424 1995-06-22
PCT/US1995/016399 WO1996024165A1 (en) 1995-02-01 1995-12-29 UNCOOLED YBaCuO THIN FILM INFRARED DETECTOR

Publications (1)

Publication Number Publication Date
AU4600696A true AU4600696A (en) 1996-08-21

Family

ID=26667608

Family Applications (1)

Application Number Title Priority Date Filing Date
AU46006/96A Abandoned AU4600696A (en) 1995-02-01 1995-12-29 Uncooled ybacuo thin film infrared detector

Country Status (4)

Country Link
EP (1) EP0815595A4 (en)
JP (2) JP3442080B2 (en)
AU (1) AU4600696A (en)
CA (1) CA2212002C (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011078398A1 (en) 2009-12-25 2011-06-30 Ricoh Company, Ltd. Field-effect transistor, semiconductor memory, display element, image display device, and system
JP5899615B2 (en) * 2010-03-18 2016-04-06 株式会社リコー Insulating film manufacturing method and semiconductor device manufacturing method
JP5633346B2 (en) * 2009-12-25 2014-12-03 株式会社リコー Field effect transistor, semiconductor memory, display element, image display apparatus and system
JP6172522B2 (en) * 2013-12-04 2017-08-02 ソニー株式会社 Infrared detector, detection method thereof, and electronic device

Also Published As

Publication number Publication date
JPH11500578A (en) 1999-01-12
EP0815595A4 (en) 1999-05-06
CA2212002A1 (en) 1996-08-08
EP0815595A1 (en) 1998-01-07
JP3442080B2 (en) 2003-09-02
CA2212002C (en) 2003-10-07
JP2003332573A (en) 2003-11-21

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