AU2021224704B2 - Light-emitting device, light-emitting method, spectrophotometer, and spectrum measurement method - Google Patents
Light-emitting device, light-emitting method, spectrophotometer, and spectrum measurement method Download PDFInfo
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- 238000001228 spectrum Methods 0.000 title claims abstract description 91
- 238000000034 method Methods 0.000 title abstract description 17
- 238000000691 measurement method Methods 0.000 title abstract 2
- 230000003287 optical effect Effects 0.000 claims description 77
- 238000004458 analytical method Methods 0.000 claims description 45
- 230000009466 transformation Effects 0.000 claims description 39
- 230000001131 transforming effect Effects 0.000 claims description 12
- 238000012360 testing method Methods 0.000 abstract description 13
- 238000001914 filtration Methods 0.000 abstract description 12
- 230000000694 effects Effects 0.000 abstract description 4
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 38
- 239000011787 zinc oxide Substances 0.000 description 19
- UQSXHKLRYXJYBZ-UHFFFAOYSA-N Iron oxide Chemical compound [Fe]=O UQSXHKLRYXJYBZ-UHFFFAOYSA-N 0.000 description 16
- 238000010586 diagram Methods 0.000 description 13
- 239000000203 mixture Substances 0.000 description 11
- 229910052721 tungsten Inorganic materials 0.000 description 9
- 239000010937 tungsten Substances 0.000 description 9
- 238000001514 detection method Methods 0.000 description 8
- 229910052736 halogen Inorganic materials 0.000 description 7
- 229920000915 polyvinyl chloride Polymers 0.000 description 7
- 239000004800 polyvinyl chloride Substances 0.000 description 7
- 239000011248 coating agent Substances 0.000 description 6
- 238000000576 coating method Methods 0.000 description 6
- 238000005516 engineering process Methods 0.000 description 5
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 5
- 230000000052 comparative effect Effects 0.000 description 4
- -1 tungsten halogen Chemical class 0.000 description 4
- 238000010521 absorption reaction Methods 0.000 description 3
- 150000002367 halogens Chemical class 0.000 description 3
- 230000005855 radiation Effects 0.000 description 2
- 230000003595 spectral effect Effects 0.000 description 2
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 239000003814 drug Substances 0.000 description 1
- 238000000295 emission spectrum Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000013507 mapping Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/075—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L33/00
- H01L25/0753—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L33/00 the devices being arranged next to each other
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/40—Arrangement of two or more semiconductor lasers, not provided for in groups H01S5/02 - H01S5/30
- H01S5/4025—Array arrangements, e.g. constituted by discrete laser diodes or laser bar
- H01S5/4087—Array arrangements, e.g. constituted by discrete laser diodes or laser bar emitting more than one wavelength
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/40—Arrangement of two or more semiconductor lasers, not provided for in groups H01S5/02 - H01S5/30
- H01S5/42—Arrays of surface emitting lasers
- H01S5/423—Arrays of surface emitting lasers having a vertical cavity
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- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- Optics & Photonics (AREA)
- Computer Hardware Design (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Manufacturing & Machinery (AREA)
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- Life Sciences & Earth Sciences (AREA)
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- Analytical Chemistry (AREA)
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- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Spectrometry And Color Measurement (AREA)
Abstract
The present invention provides a spectrophotometer and a light-emitting device used by same. The light-emitting device at least comprises a plurality of light-emitting elements which each emit light having a light emission peak wavelength and a wavelength range, the wavelength ranges of two light-emitting elements corresponding to two adjacent light emission peak wavelengths overlap, or the wavelength ranges of two light-emitting elements corresponding to two adjacent light emission peak wavelengths do not overlap; and the plurality of light-emitting elements each can present a discontinuous light emission at a lighting frequency. The present invention also provides a light-emitting method and a spectrum measurement method according to the light-emitting device and the spectrophotometer. A frequency domain signal of background noise can be discarded and a frequency domain signal of a spectrum signal of an object to be measured can be kept, so as to yield a filtering effect to achieve accurate test, and replace wavelength resolution characteristics of conventional spectrophotometers.
Description
[1] The present disclosure relates to a light emitting apparatus, in particularly to, a light
emitting apparatus which is able to select a wavelength range, a difference between adjacent light
emission peak wavelengths, full widths at half maximum and lighting frequencies of lights emitted
by light emitting diodes (LED), and further to a light emitting method, a spectrometer and a
spectrum detection method which utilize the light emitting apparatus.
[2] Spectrometers can be used to measure the transmitted light through the object or the
reflected light on the surface of the object, and the conventional spectrometer usually includes a
light source and a monochromator, wherein the light source can be a halogen gas-filled tungsten
filament lamp (halogen tungsten lamp) to produce a continuous spectrum of Vis-near IR (visible
light-near infrared light) with an emission spectrum of about 320 nm to 2500 nm. Next, the
monochromator composed of a prism or a grating selects a monochromatic light of a specific
wavelength for the absorption or reflection measurement of the sample (or called tested object),
which of course also includes continuous scanning within the set wavelength range to analyze the
absorption optical spectrum or reflection optical spectrum of the sample. However, as the problems
of the tungsten filament lamp mentioned by the issued patent of CN101236107B, due to the high
calorific value and high temperature of the tungsten filament lamp, when using the tungsten
filament lamp as a light source for organic product testing such as agricultural products, food, pharmaceuticals, petrochemical products, high temperature will cause qualitative changes in organic samples, which seriously affects the test results. The disclosure in the aforementioned the issued patent of CN101236107B is included in the present disclosure.
[3] The issued patent of CN101236107B discloses the light source of the spectrometer can be
multiple light emitting diodes (LEDs). Each LED emits a monochromatic spectrum with a different
wavelength range. In addition to combining the aforementioned multiple LEDs into a continuous
spectrum, according to the design, merely the LED corresponding to the wavelength range is turned
on when merely the monochromatic light of a certain wavelength range is needed. That is, the
multiple LEDs can be turned on at the same time to form a continuous optical spectrum, and the
LEDs can be sequentially turned on according to corresponding to the wavelength ranges which are
needed to be scanned. However, the issued patent of CN101236107B focuses the emission light
beams of the LEDs on the entrance slit of the monochromator, and thus the problem of the high
manufacturing cost and high system complexity of the monochromator cannot be solved. The issued
patent of CN205388567U utilizes the assembly of LEDs and fibers to replace monochromator, and
further utilizes a full reflection mirror to increase the light path length to enhance the sample
detecting efficiency. The disclosure in the aforementioned the issued patent of CN205388567U is
included in the present disclosure, and the issued patent of CN109932335A further discloses the
similar technology.
[4] Although the aforementioned three patents have improved the problems of traditional
spectrometer's light source heating and monochromator cost. However, the wavelength resolution
(usually greater than 10nm) of the spectroscopy using the LED array as the light source in the third
patent mentioned above is lower than the wavelength resolution (usually 1 nm) of the conventional
spectrometer using halogen lamps and monochromator. It causes doubts about the three patents that utilize the LED array as the light source to correctly analyze the optical spectrum of the sample.
Another problem of the three patents is that the signal-to-noise ratio (SNR or S/N) cannot be
improved. The aforementioned three patented utilizes the LED arrays to replace tungsten halogen
lamps as light sources. In addition, they have not changed other operation of the light source, so
obviously there is no improvement in the SNR caused by the light source end, and the
aforementioned three patents cannot further improve SNR.
[5] The main objective of the present disclosure is to provide a light emitting apparatus
composed of a plurality of LEDs emitting lights with different wavelength ranges from each other
and a spectrometer composed of the light emitting apparatus. The analysis result of the spectrometer
of the present disclosure for a sample is close to the high analysis results of the conventional
tungsten halogen spectrometer, and at the same time, the present disclosure improves the
signal-to-noise ratio in the optical spectrum of the test results of the sample, so as to achieve the
high accuracy of the test.
[6] The technical means used in the present disclosure are illustrated as follows.
[7] To achieve the above objective, the present disclosure provides a light emitting apparatus,
the light emitting apparatus at least comprises a plurality of light emitting units, and each of them
emits a light with a light emission peak wavelength and a wavelength range. The wavelength ranges
of the two light emitting units with the two adjacent light emission peak wavelengths are
overlapped to form a continuous wavelength range which is wider than each of the wavelength
ranges of the two light emitting units with the two adjacent light emission peak wavelengths, or
alternatively, the wavelength ranges of the two light emitting units with the two adjacent light emission peak wavelengths are non-overlapped; the two adjacent light emission peak wavelengths have a wavelength difference being larger than or equal to 1 nm, and each of the light emission peak wavelengths has full widths at half maximum being larger than 0 nm and less than or equal to nm.
[8] In one embodiment of the present disclosure, the light emitting unit is a light emitting
diode, a vertical-cavity surface-emitting laser or a laser diode.
[9] In one embodiment of the present disclosure, each of the light emitting units
discontinuously emits the light with a lighting frequency, and all of the lighting frequencies are
identical to or different from each other, or partial of the lighting frequencies are identical to or
different from each other.
[10] In one embodiment of the present disclosure, the lighting frequency is 0.05-500
times/second.
[11] In one embodiment of the present disclosure, associated with the lighting frequency,
a time interval for turning on the light emitting unit is 0.001-10 seconds.
[12] In one embodiment of the present disclosure, associated with lighting frequency, a
time interval for turning off the light emitting unit is 0.001-10 seconds.
[13] In one embodiment of the present disclosure, the two adjacent light emission peak
wavelengths have the wavelength difference being 1-80 nm.
[14] In one embodiment of the present disclosure, the two adjacent light emission peak
wavelengths have the wavelength difference being 5-80 nm.
[15] In one embodiment of the present disclosure, each of the full widths at half
maximum of the corresponding light emission peak wavelength is 15-50 nm.
[16] In one embodiment of the present disclosure, each of the full widths at half
maximum of the corresponding light emission peak wavelength is 15-40 nm.
[17] To achieve the above objective, the present disclosure further provides a
spectrometer which at least comprises a light source controller, the above light emitting apparatus, a
photodetector and a computer. The light source controller is electrically connected to the light
emitting apparatus, the photodetector is electrically connected to the computer, the photodetector
receives a light beam emitted by the light emitting apparatus, and a propagation path of the light
beam between the light emitting apparatus and photodetector forms a light path.
[18] In one embodiment of the present disclosure, a mathematical analysis module is
installed in the photodetector or the computer, the mathematical analysis module is electrically or
signally connected to the photodetector or the computer, the mathematical analysis module is a
hardware or software based module, and a signal collected by the photodetector is transmitted to the
mathematical analysis module; in the time interval for turning on the light emitting unit, associated
with the lighting frequency, the signal collected by the photodetector is a combination signal of a
background noise and an optical spectrum signal of the tested object; in the time interval for turning
off the light emitting unit, associated with the lighting frequency, the signal collected by the
photodetector is the background noise; the combination signal forms a time domain signal of the
tested object, and the mathematical analysis module comprises a time domain/frequency domain
transformation unit for transforming the time domain signal of the tested object to a frequency
domain signal of the tested object.
[19] In one embodiment of the present disclosure, the time domain/frequency domain
transformation unit is a Fourier transform unit for transforming the time domain signal of the tested
object to the frequency domain signal of the tested object via a Fourier transformation.
[20] In one embodiment of the present disclosure, the frequency domain signal of the
tested object comprises a frequency domain signal of the optical spectrum signal of the tested object
and a frequency domain signal of the background noise, the mathematical analysis module discards
the frequency domain signal of the background noise and reserves the frequency domain signal of
the optical spectrum signal of the tested object, the mathematical analysis module further comprises
a frequency domain/time domain transformation unit for transforming the reserved frequency
domain signal of the optical spectrum signal of the tested object to the filtered time domain signal
of the tested object.
[21] In one embodiment of the present disclosure, the frequency domain/time domain
transformation unit is an inverse Fourier transform unit for transforming the reserved frequency
domain signal of the optical spectrum signal of the tested object to the filtered time domain signal
of the tested object via an inverse Fourier transformation.
[22] The present disclosure also provides a light emitting method comprising sequential
steps as follows: a light emitting unit providing step: providing a plurality of light emitting units,
each of them emits a light with a light emission peak wavelength and a wavelength range, wherein
the wavelength ranges of the two light emitting units with the two adjacent light emission peak
wavelengths are overlapped to form a continuous wavelength range which is wider than each of the
wavelength ranges of the two light emitting units with the two adjacent light emission peak
wavelengths, or alternatively, the wavelength ranges of the two light emitting units with the two
adjacent light emission peak wavelengths are non-overlapped; the two adjacent light emission peak
wavelengths have a wavelength difference being larger than or equal to 1 nm, each of the light
emission peak wavelengths has full widths at half maximum being larger than 0 nm and less than or
equal to 60 nm; and a light emission step: controlling each of the light emitting units to discontinuously emit the light with a lighting frequency, wherein the lighting frequency is 0.05-500 times/second, associated with the lighting frequency, a time interval for turning on the light emitting unit is 0.001-10 seconds, and a time interval for turning off the light emitting unit is 0.001-10 seconds.
[23] The present disclosure further provides a spectrum detection method which
comprises the steps of the above light emitting method and a filtering step. The filtering step is
described as follows: an optical spectrum signal of the tested object and a background noise are
received, in the time interval for turning on the light emitting unit; associated with the lighting
frequency, the signal collected by the photodetector is a combination signal of the background noise
and the optical spectrum signal of the tested object; in the time interval for turning off the light
emitting unit, associated with the lighting frequency, the signal collected by the photodetector is the
background noise; the combination signal forms a time domain signal of the tested object, the time
domain signal of the tested object is transformed to a frequency domain signal of the tested object
via a Fourier transformation; the frequency domain signal of the tested object comprises a
frequency domain signal of the optical spectrum signal of the tested object and a frequency domain
signal of the background noise, the frequency domain signal of the background noise is discarded,
and the frequency domain signal of the optical spectrum signal of the tested object is reserved.
[24] In one embodiment of the present disclosure, the spectrum detection method further
comprises an inverse transformation step, and the inverse transformation step transforms the
reserved frequency domain signal of the optical spectrum signal of the tested object to the filtered
time domain signal of the tested object via an inverse Fourier transformation.
[25] The present disclosure utilizes the light emitting units to make the two adjacent light
emission peak wavelengths have a wavelength difference being larger than or equal to 1 nm, and to make the light emission peak wavelengths have full widths at half maximum being larger than 0 nm and less than or equal to 60 nm. The light emitting units discontinuously emit the lights with lighting frequencies, and the time domain signal of the tested object is transformed to a frequency domain signal of the tested object via a Fourier transformation. The frequency domain signal of the tested object comprises a frequency domain signal of the optical spectrum signal of the tested object and a frequency domain signal of the background noise, the frequency domain signal of the background noise is discarded, and the frequency domain signal of the optical spectrum signal of the tested object is reserved. Therefore, the filtering effect is achieved to increase the test accuracy, and wavelength resolution characteristics of the light emitting apparatus and the spectrometer of the present disclosure can replace wavelength resolution characteristics of the conventional spectrometer.
[26] FIG. 1 is a first schematic diagram showing implementations of a light emitting
apparatus and a spectrometer of the present disclosure.
[27] FIG. 2 is schematic diagram showing an emission optical spectrum of a LED
according to a first embodiment of the present disclosure.
[28] FIG. 3 is schematic diagram showing an emission optical spectrum of a LED
according to a second embodiment of the present disclosure.
[29] FIG. 4 is schematic diagram showing an emission optical spectrum of a LED
according to a third embodiment of the present disclosure.
[30] FIG. 5A is a second schematic diagram showing implementations of a light emitting
apparatus and a spectrometer of the present disclosure.
[31] FIG. 5B is a third schematic diagram showing implementations of a light emitting
apparatus and a spectrometer of the present disclosure.
[32] FIG. 6A is a schematic diagram showing a time domain signal of a tested object
measured by a spectrometer of the present disclosure.
[33] FIG. 6B is a schematic diagram showing a frequency domain signal of a tested
object after the time domain signal of the tested object measured by the spectrometer of the present
disclosure is performed with a Fourier transformation.
[34] FIG. 6C is a schematic diagram showing a filtered time domain signal of a tested
object after the reserved frequency domain signal of the optical spectrum signal of the tested object
filtered by the spectrometer is performed with an inverse Fourier transformation.
[35] FIG. 7A is a schematic diagram showing reflection optical spectrums of zinc oxide
and a mixture of the zinc oxide and iron oxide of a first comparative example, which are measured
by a conventional spectrometer.
[36] FIG. 7B is a schematic diagram showing reflection optical spectrums of zinc oxide
and a mixture of the zinc oxide and iron oxide of a first application example, which are measured
by a spectrometer of the present disclosure.
[37] FIG. 7C is a schematic diagram showing reflection optical spectrums of zinc oxide
and a mixture of the zinc oxide and iron oxide of a second application example, which are measured
by a spectrometer of the present disclosure.
[38] FIG. 7D is a schematic diagram showing reflection optical spectrums of zinc oxide
and a mixture of the zinc oxide and iron oxide of a third application example, which are measured
by a spectrometer of the present disclosure.
[39] FIG. 8 is flowchart of a light emitting method of the present disclosure.
[40] FIG. 9 is flowchart of a spectrum detection method of the present disclosure.
Reference Label Number in Drawings are listed as follows: 1 spectrometer, 11 light source
controller, 111 microcontroller unit, 112 clock generator, 12 light emitting apparatus, 120
circuit board, 121 LED, 1211 LED, 122 LED, 1221 LED, 123 LED, 13 photodetector, 14
computer, A tested object, L light beam, M mathematical analysis module, M1 time
domain/frequency domain transformation unit, M2 frequency domain/time domain
transformation unit, R light path, S01 light emitting unit providing step, S02 light emission
step, S03 filtering step, S04 inverse transformation step.
[41] Firstly, refer to an embodiment of FIG. 1, the light emitting apparatus 12 is used in a
spectrometer 1, and the spectrometer 1 comprises a light source controller 11, a light emitting
apparatus 12, a photodetector 13 and a computer 14. The light source controller 11 is electrically
connected to the light emitting apparatus 12 and an external power source (not shown in drawings),
the photodetector 13 1 is electrically connected to the computer 14, the photodetector 13 receives a
light beam L emitted by the light emitting apparatus 12, and a propagation path of the light beam L
between the light emitting apparatus 12 and the photodetector 13 forms a light path R. The
photodetector 13 can be a photomultiplier, a photoconducting detector or a Si bolometer. A tested
object A is disposed on the light path R, and the light of the light path R passes through the tested
object A or is reflected on the surface of the tested object A. In FIG. 1, the light of the light path R
passes through the tested object A, so as to measure the absorption optical spectrum of the tested
object A. In addition, in the implementation which the light of the light path R is reflected on the
surface of the tested object A, the reflection optical spectrum of the tested object A is measured (see
FIG. 13A). The photodetector 13 converts the light beam L into an optical spectrum signal of the
tested object A, and the optical spectrum signal of the tested object A is transmitted to the computer
14, and the computer 14 converts the optical spectrum signal of the tested object A to an optical
spectrum of the tested object A. The computer 14 can be a personal computer, a notebook or a
server.
[42] The light emitting apparatus 12 at least comprises a plurality of light emitting units,
and each of them emits a light with a light emission peak wavelength and a wavelength range. The
light emission peak wavelength or the wavelength range is 300-2500 nm, wherein the light emitting
unit can be a light emitting diode (LED), a vertical-cavity surface-emitting laser (VCEL) or a laser
diode (LD). In the following embodiments, the light emitting unit can be the LED, but the present
disclosure is not limited thereto. The people who are skilled in the art can know the LED, VCEL
and LD in the present disclosure are interchangeable, and this will not affect the dedicated results
and implementations of the present disclosure. In the embodiment of FIG. 1, the light emitting
apparatus 12 comprises three LEDs 121-123, the first LED 121 emits a first light beam with a first
wavelength range, the second LED 122 emits a second light beam with a second wavelength range,
and the third LED 123 emits a third light beam with a third wavelength range. The first light beam
has a first light emission peak wavelength within the first wavelength range, the second light beam
has a second light emission peak wavelength within the second wavelength range, and the third
light beam has a third light emission peak wavelength within the third wavelength range. The first
LED 121, the second LED 122 and the third LED 123 are electrically connected to a circuit board
120 of the light emitting apparatus 12, and the circuit board 120 is electrically connected to the light
source controller 11. In other words, the light source controller 11 is electrically connected to the
first LED 121, the second LED 122 and the third LED 123, and the light source controller 11 can control the first LED 121, the second LED 122 and the third LED 123 to be turned on or off (bright or dark, powered on or powered off). That is, the light source controller 11 controls multiple LEDs to be turned on or off (bright or dark). Preferably, the light source controller 11 controls the first
LED 121, the second LED 122 and the third LED 123 continuously or discontinuously radiate. That
is, the light source controller 11 controls multiple LEDs to continuously or discontinuously radiate.
More preferably, the light source controller 11 controls the first LED 121, the second LED 122 and
the third LED 123 to discontinuously radiate with lighting frequencies. That is, the light source
controller 11 controls the LEDs to discontinuously radiate with lighting frequencies. The lighting
frequencies can be identical to or different from each other. For example, the light source controller
11 comprises a microcontroller unit electrically connected to the external power source and a clock
generator electrically connected to the microcontroller unit 111. The lighting frequencies are
generated by the clock generator 112, the signals of the lighting frequencies are transmitted to the
microcontroller unit 111, and then the microcontroller unit 111 controls the LEDs (such as, the first
LED 121, the second LED 122 and the third LED 123) electrically connected to the microcontroller
unit 111 to be turned on or off according to the lighting frequencies. It is noted that, the clock
generator 112 for generating the lighting frequencies can be a clock generation module integrated in
the microcontroller unit 111. The clock generation module can be implemented by a software or a
hardware, and thus it does not need to set the clock generator on the exterior of the microcontroller
unit 111. It is noted that, according to the technical features of the light source controller 11, based
upon the actual requirements, the LEDs are turned on or off at the same time, or one or partial
LEDs are selected to turned on or off, or the LEDs are turned on or off in turn, or the LEDs are
turned on or off by using one of the above manners with the lighting frequency.
[43] Refer to the first embodiment of FIG. 2, the wavelength ranges of the two light
emitting units with the two adjacent light emission peak wavelengths are overlapped to form a
continuous wavelength range which is wider than each of the wavelength ranges of the two light
emitting units with the two adjacent light emission peak wavelengths, and the continuous
wavelength range is 300-2500 nm. In FIG. 2, there are three light emission peak wavelengths and
three corresponding wavelength ranges, and they are "the first light emission peak wavelength (734
nm) and the corresponding first wavelength range of the first light beam", "the second light
emission peak wavelength (810 nm) and the corresponding second wavelength range of the second
light beam" and "the third light emission peak wavelength (882 nm) and the corresponding third
wavelength range of the third light beam". The first light emission peak wavelength and the second
light emission peak wavelength are two adjacent light emission peak wavelengths, and similarly,
the second light emission peak wavelength and the third light emission peak wavelength are two
adjacent light emission peak wavelengths. The first wavelength range corresponding to the first
light emission peak wavelength is 660-780 nm, the second wavelength range corresponding to the
second light emission peak wavelength is 710-850 nm, thus the first wavelength range and the
second wavelength range are overlapped within 710-780 nm, and the first wavelength range and the
second wavelength range forms the continuous wavelength range of 660-850 nm. Similarly, the
second wavelength range corresponding to the second light emission peak wavelength is 710-850
nm, the third wavelength range corresponding to the third light emission peak wavelength is
780-940 nm, thus the second wavelength range and the third wavelength range are overlapped
within 780-850 nm, and the second wavelength range and the third wavelength range forms the
continuous wavelength range of 710-940 nm. In the present disclosure, the overlapped portion of
the wavelength ranges of the two light emitting units with the two adjacent light emission peak wavelengths is preferred to be less. Further, the wavelength ranges of the two light emitting units with the two adjacent light emission peak wavelengths can be non-overlapped in other embodiments, which are illustrated in the later descriptions.
[44] The two adjacent light emission peak wavelengths have a wavelength difference
being larger than or equal to 1 nm, preferably, 1-80 nm, and more preferably, 5-80 nm. In FIG. 2,
the first light emission peak wavelength (734 nm) and the second light emission peak wavelength
(810 nm) have the wavelength difference being 76 nm, and the second light emission peak
wavelength (810 nm) and the third light emission peak wavelength (882 nm) have the wavelength
difference being 72 nm. It is noted that, the numerical range of the present disclosure usually
comprises two end values, and the wavelength difference being 5-80 nm of the two adjacent light
emission peak wavelengths means the wavelength difference is larger than or equal to 5 nm, and
less than and equal to 80 nm.
[45] Refer to the second embodiment of FIG. 3, the second embodiment is modified from
the first embodiment, and similar parts of the second embodiment and the first embodiment are not
described again. The difference between the second embodiment and the first embodiment is that
the light emitting apparatus 12 comprises five LEDs 121, 1211, 122, 123, 1221. The first through
third LEDs 121-123 emit the first through third light beams with the first through wavelength
ranges, the fourth and fifth LED 1211, 1221 emit the fourth and fifth light beams with the fourth
and fifth wavelength ranges. The fourth light beam has the fourth light emission peak wavelength
(772 nm) in the fourth wavelength range, and the fifth light beam has the fifth light emission peak
wavelength (854 nm) in the fifth wavelength range. In FIG. 3, the light emission peak wavelengths
are respectively the first light emission peak wavelength (734 nm), the fourth light emission peak
wavelength (772 nm), the second light emission peak wavelength (810 nm), the fifth light emission peak wavelength (854 nm) and the third light emission peak wavelength (882 nm) in an increment order. The first light emission peak wavelength (734 nm) and the fourth light emission peak wavelength (772 nm) being adjacent to each other have the wavelength difference being 38 nm, the fourth light emission peak wavelength (772 nm) and the second light emission peak wavelength
(810 nm) being adjacent to each other have the wavelength difference being 38 nm, the second light
emission peak wavelength (810 nm) and the fifth light emission peak wavelength (854 nm) being
adjacent to each other have the wavelength difference being 44 nm, and the fifth light emission
peak wavelength (854 nm) and the third light emission peak wavelength (882 nm) being adjacent to
each other have the wavelength difference being 28 nm.
[46] Refer to the third embodiment of FIG. 4, the third embodiment is modified from the
first and second embodiments, and the similar parts of the third embodiment and the first, second
embodiments are not described again. The difference between the third embodiment and the first
embodiment is that the light emitting apparatus 12 comprises 12 LEDs. In FIG. 4, the light emission
peak wavelengths of the 12 LEDs are 734 nm (first light emission peak wavelength), 747 nm, 760
nm, 772 nm (the fourth light emission peak wavelength), 785 nm, 798 nm, 810 nm (the second light
emission peak wavelength), 824 nm, 839 nm, 854 nm (the fifth light emission peak wavelength),
867 nm and 882 nm (the third light emission peak wavelength) in increment order. Among the light
emission peak wavelengths of the 12 LEDs, the wavelength differences of each two light emission
peak wavelengths are respectively 13 nm, 13 nm, 12 nm, 13 nm, 13 nm, 12 nm, 14 nm, 15 nm, 15
nm, 13 nm and 15 nm. If the light emitting units of the first through third embodiments are LDs, the
wavelength difference of the two adjacent light emission peak wavelengths can be larger than or
equal to 1 nm, such as 1 nm.
[47] Each of the full widths at half maximum of the light emission peak wavelengths is
larger than 0 nm and less than or equal to 60 nm. For example, in the first through third
embodiments, the light emission peak wavelengths of the 12 LEDs are 734 nm (first light emission
peak wavelength), 747 nm, 760 nm, 772 nm (the fourth light emission peak wavelength), 785 nm,
798 nm, 810 nm (the second light emission peak wavelength), 824 nm, 839 nm, 854 nm (the fifth
light emission peak wavelength), 867 nm and 882 nm (the third light emission peak wavelength) in
increment order, and the full widths at half maximum of the first through fifth light emission peak
wavelengths associated with the first through fifth light beams are larger than 0 nm and less than or
equal to 60 nm, preferably, 15-50, and more preferably, 15-40 nm. The full widths at half maximum
of other light emission peak wavelengths being 747 nm, 760 nm, 785 nm, 798 nm, 824 nm, 839 nm
and 867 nm (see FIG. 4) are larger than 0 nm and less than or equal to 60 nm, preferably, 15-50,
and more preferably, 15-40 nm. According to the experiment operation of the present disclosure,
the full widths at half maximum of the light emission peak wavelengths in the first through third
embodiments are 55 nm. If the light emitting units of the first through third embodiments are LDs,
the full widths at half maximum of the light emission peak wavelengths can be larger than 0 nm and
less than or equal to 60 nm, such as 1 nm.
[48] The wavelength ranges of the two light emitting units with the two adjacent light
emission peak wavelengths are non-overlapped. For example, if the full widths at half maximum of
the light emission peak wavelengths in the first through third embodiments are 15 nm, each width
of the wavelength range of the light emission peak wavelength is 40 nm (i.e. the difference between
the maximum and minimum of the wavelength range), and two adjacent light emission peak
wavelengths have the wavelength difference being 80 nm. For example, if the light emitting units
are LDs, each full width at half maximum of the light emission peak wavelength is 1 nm, and the width of the wavelength range is 4 nm, two adjacent light emission peak wavelengths have the wavelength difference being 5 nm, and the wavelength ranges of the two LDs with the two adjacent light emission peak wavelengths are non-overlapped.
[49] Preferably, when operating the spectrometer 1 in the first through third embodiment
to measure the tested object A to generate the optical spectrum of the tested object A, as mentioned
above, the light source controller 11 controls the LEDs to discontinuous radiate with the lighting
frequencies. All of the lighting frequencies are identical to or different from each other or partial of
the lighting frequencies are identical to or different from each other. The lighting frequency is
0.05-500 times/second. Associated with the lighting frequency, a time interval for turning on
(lighting) the light emitting unit is 0.001-10 seconds. Associated with lighting frequency, a time
interval for turning off (slaking) the light emitting unit is 0.001-10 seconds. The period of the
lighting frequency means the sum of the time intervals for sequentially turning on (lighting) and
turning off (slaking) the light emitting unit once. The period of the lighting frequency is the
reciprocal of the lighting frequency. In other words, the period of the lighting frequency can be
interpreted as the sum of the time interval which the LED is turned on and the time interval which
the LED is turned off after the LED is turned on. The time interval for turning on the LED is
0.001-10 seconds and the time interval for turning off the LED is 0.001-10 seconds. Preferably, the
lighting frequency is 0.5-500 times/second, and more preferably, the lighting frequency is 5-500
times/second. The LEDs discontinuously radiates, and thus the effect of the thermal energy of the
light emitted by the LEDs on the tested object A can be greatly reduced, and the qualitative change
of the tested object A containing an organism can be avoided. The present disclosure is therefore
particularly suitable for the tested object A that is sensitive to thermal energy, and more particularly
suitable for the LED which emits the light with the wavelength range being the that of the near infrared light. A mathematical analysis module M is installed in the photodetector 13 (see FIG. 5A) or the computer 14 (see FIG. 5B), the mathematical analysis module M is electrically or signally connected to the photodetector 13 (see FIG. 5A), or the mathematical analysis module M is electrically or signally connected to the computer 14 (see FIG. 5B), and the mathematical analysis module M can be a software based or hardware based module. A signal collected by the photodetector 13 is transmitted to the mathematical analysis module M. When operating the spectrometer 1 to measure the tested object A to generate the optical spectrum of the tested object, the LEDs can be turned on or off at the same time with the same lighting frequency. In the time interval for turning on the light emitting unit, associated with the lighting frequency, the signal collected by the photodetector 13 is a combination signal of a background noise and an optical spectrum signal of the tested object. In the time interval for turning off the light emitting unit, associated with the lighting frequency, the signal collected by the photodetector 13 is the background noise. Referring to FIG. 6A, the spectrometer 1 is operated to make the LEDs discontinuously radiate with the lighting frequency to detect the tested object A, a combination signal of the background noise and the optical spectrum signal of the tested object A forms a time domain signal of the tested object A and an optical spectrum of the time domain signal associated with the tested object A. The optical spectrum signal of the tested object A and the background noise collected by the photodetector 13 are transmitted to the mathematical analysis module M, and the mathematical analysis module M processes the time domain signal of the tested object A to discard the background noise. For example, the mathematical analysis module M comprises a time domain/frequency domain transformation unit M1 (see FIG. 5A) for transforming the time domain signal of the tested object A to a frequency domain signal of the tested object A, the time domain/frequency domain transformation unit M1 is a Fourier transform unit for transforming the time domain signal of the tested object A to the frequency domain signal of the tested object A via a
Fourier transformation. The frequency domain signal of the tested object A can be seen in FIG. 6B.
The frequency domain signal of the tested object A comprises the frequency domain signal of the
optical spectrum signal of the tested object A and the frequency domain signal of the background
noise. In FIG. 6B, the frequency domain signal with the peak value at 0 Hz is less than frequency
domain signal of the lighting frequency, and it is the frequency domain signal of the background
noise. In FIG. 6B, the other frequency domain signal with other peak values except for the
frequency domain signal with the peak value at 0 Hz (i.e. the frequency domain signal of the
background noise) is the frequency signal of the optical spectrum signal of the tested object A.
Preferably, in the frequency domain signal of the tested object A, the frequency domain signal
being larger than or equal to the frequency signal of the lighting frequency is the frequency domain
signal of the optical spectrum signal of the tested object A. The mathematical analysis module M
discards the discards the frequency domain signal of the background noise and reserves the
frequency domain signal of the optical spectrum signal of the tested object A, so as to achieve the
filtering effect. Since the mathematical analysis module M discards the frequency domain signal of
the background noise, the reserved frequency domain signal of the optical spectrum signal of the
tested object A does not comprise the background noise. Thus, compared to the conventional
spectrometer, the spectrometer 1not only enhance the SNR of the optical spectrum of the tested
object A, but also obtain the optical spectrum without background noise sine the spectrometer 1
discards and filters out the frequency domain signal of the background noise. Referring to FIG. 5A
and FIG. 5B, the microcontroller unit 111 of the light source controller 11 is electrically or signally
connected to the mathematical analysis module M, so as to transmit the lighting frequencies, the
time intervals associated with the lighting frequency for turning on the LEDs and the time intervals associated with the lighting frequency for turning off the LEDs to the mathematical analysis module
M, such that when the microcontroller unit 111 turns on or off the LEDs electrically connected to
the microcontroller unit 111 according to the lighting frequencies, the time intervals associated with
the lighting frequency for turning on the LEDs and the time intervals associated with the lighting
frequency for turning off the LEDs, the mathematical analysis module M can correspond the time
intervals associated with the lighting frequency for turning on the LEDs to the optical spectrum
signal of the tested object, and correspond the time intervals associated with the lighting frequency
for turning off the LEDs to the background noise.
[50] It is noted that the discontinuous radiation waveform for presenting the lighting
frequency of the LEDs can be a square wave, a positive sine wave or a negative sine wave.
[51] In addition, the mathematical analysis module M can process the reserved frequency
domain signal of the optical spectrum signal of the tested object A after filtering out, and transforms
the frequency domain signal of the optical spectrum signal of the tested object A to a filtered time
domain signal of the tested object A. The filtered time domain signal of the tested object A merely
has the filtered optical spectrum signal of the tested object without background noise. For example,
the mathematical analysis module M comprises a frequency domain/time domain transformation
unit M2 (see FIG. 5B) for transforming the reserved frequency domain signal of the optical
spectrum signal of the tested object A to the filtered time domain signal of the tested object A. The
frequency domain/time domain transformation unit M2 is an inverse Fourier transform unit for
transforming the reserved frequency domain signal of the optical spectrum signal of the tested
object A to the filtered time domain signal of the tested object A via an inverse Fourier
transformation, and the filtered time domain signal of the tested object A after filtering out can be
seen in FIG. 6C. Compared to FIG. 6A and FIG. 6C, it is obvious to see that the filtered time domain signal of the tested object A in FIG. 6C is the filtered optical spectrum signal of the tested object A having the square waveform, and the filtered time domain signal of the tested object A does not have the background noise. In other words, the background noise in FIG. 6C is zero, and if dividing the filtered optical spectrum signal of the tested object A over the background noise, the obtained SNR is infinite. Therefore, the present disclosure enhance the SNR of the optical spectrum of the test results of the sample (tested object A), and the high test accuracy can be achieved. It is noted that, the mathematical analysis module M, the time domain/frequency domain transformation unit M1 and the frequency domain/time domain transformation unit M2 can be implemented by the hardware and/or the software. The mathematical analysis module M, the time domain/frequency domain transformation unit M1 and the frequency domain/time domain transformation unit M2 are electrically or signally connected to each other.
[52] [WAVELENGTH RESOLUTION TEST OF COMPARATIVE AND
[53] The comparative example 1 uses the conventional spectrometer of
SE-2020-050-VNIR made by Oto photonics, which uses the tungsten halogen lamp as the light
source and has a 1 nm wavelength resolution by using the grating. The conventional spectrometer is
used to measure the reflection optical spectrum signal of the tested objects of the zinc oxide and the
mixture of zinc oxide and iron oxide to obtain the optical spectrums of the tested objects, wherein
one of the tested objects is a PVC (Polyvinyl Chloride) plate with a 2 cm thickness and coated by a
zinc oxide coating with a 5 cm length and a 5 cm width, and the other one tested object a PVC plate
with a 2 cm thickness and coated by the mixture coating with a 5 cm length and a 5 cm width. The
obtained optical spectrum image data are processed and analyzed by a similarity (difference)
process technology, i.e. SAM (Spectral Angle Match or Spectral Angle Mapping) process and analysis technology, so as to perform the similarity analysis of the zinc oxide and the mixture of the zinc oxide and iron oxide. The SAM analysis result is 96.00 % (see FIG. 7A).
[54] Application examples 1-3 correspond to the light emitting apparatuses and
spectrometers of the first through third embodiments, the lighting frequency is 90.90 times/second,
the time interval associated with the lighting frequency for turning on the light emitting unit is 1I ms,
the time interval associated with the lighting frequency for turning off the light emitting unit is 10
ms, and the photodetector is the photodetector of SE-2020-050-VNIR made by Oto photonics. The
spectrometers 1 are used to measure the reflection optical spectrum signal of the tested objects of
the zinc oxide and the mixture of zinc oxide and iron oxide to obtain the optical spectrums of the
tested objects, wherein one of the tested objects is a PVC plate with a 2 cm thickness and coated by
a zinc oxide coating with a 5 cm length and a 5 cm width, and the other one tested object a PVC
plate with a 2 cm thickness and coated by the mixture coating with a 5 cm length and a 5 cm width.
The obtained optical spectrum image data are processed and analyzed by SAM process and analysis
technology, so as to perform the similarity analysis of the zinc oxide and the mixture of the zinc
oxide and iron oxide. The SAM analysis results are respectively 97.69 % (FIG. 7B), 97.48 % (FIG.
7C) and 96.54% (FIG. 7D), and all of them are close to the analysis result of 96.00 % using the
conventional spectrometer of the comparative example 1. Thus, wavelength resolution
characteristics of the light emitting apparatus and the spectrometer in the first through embodiments
are close to that of the conventional spectrometer. Thus, the wavelength resolution characteristics of
the light emitting apparatuses and the spectrometers of the application examples 1-3 (i.e. the first
through third embodiments) can replace wavelength resolution characteristics of the conventional
spectrometer.
[55] Thus, according to the light emitting apparatus 12 and spectrometer 1, FIG. 8 shows
a flow chart of a light emitting method which comprises the light emitting unit providing step SO1
and a light emission step S02.
[56] In the light emitting unit providing step S01: a plurality of light emitting units, each
of them emits a light with a light emission peak wavelength and a wavelength range are provides,
the wavelength ranges of the two light emitting units with the two adjacent light emission peak
wavelengths are overlapped to form a continuous wavelength range which is wider than each of the
wavelength ranges of the two light emitting units with the two adjacent light emission peak
wavelengths, or alternatively, the wavelength ranges of the two light emitting units with the two
adjacent light emission peak wavelengths are non-overlapped; the two adjacent light emission peak
wavelengths have a wavelength difference being larger than or equal to 1 nm, and at least one
portions of the light emission peak wavelengths have full widths at half maximum being larger than
nm and less than or equal to 60 nm. The light emitting unit can be the LED, VCSEL or LD.
Preferably, the two adjacent light emission peak wavelengths have the wavelength difference being
1-80 nm, and more preferably, the two adjacent light emission peak wavelengths have the
wavelength difference being 5-80 nm. Preferably, each of the full widths at half maximum of the
corresponding light emission peak wavelength is 15-50 nm, and more preferably, each of the full
widths at half maximum of the corresponding light emission peak wavelength is 15-40 nm.
[57] In the light emission step S02: each of the light emitting units is controlled to
discontinuously emit the light with a lighting frequency, wherein the lighting frequency is 0.05-500
times/second, associated with the lighting frequency, a time interval for turning on the light emitting
unit is 0.001-10 seconds, and a time interval for turning off the light emitting unit is 0.001-10 seconds. Preferably, the lighting frequency is 0.5-500 times/second, and more preferably, 5-500 times/second.
[58] Further according to the light emitting apparatus 12, the spectrometer 1 and the light
emitting method, FIG. 9 shows a flow chart of a spectrum detection method which comprises the
light emitting unit providing step S01 and the light emission step S02 of the light emitting method,
and further comprises a filtering step S03 and an inverse transformation step S04, wherein the steps
S01-0S4 are executed in order.
[59] In the filtering step S03: an optical spectrum signal of the tested object and a
background noise are received, in the time interval for turning on the light emitting unit, associated
with the lighting frequency, the signal collected by the photodetector is a combination signal of the
background noise and the optical spectrum signal of the tested object, and in the time interval for
turning off the light emitting unit, associated with the lighting frequency, the signal collected by the
photodetector is the background noise; the combination signal forms a time domain signal of the
tested object, the time domain signal of the tested object is transformed to a frequency domain
signal of the tested object via a Fourier transformation; the frequency domain signal of the tested
object comprises a frequency domain signal of the optical spectrum signal of the tested object and a
frequency domain signal of the background noise, the frequency domain signal of the background
noise is discarded, and the frequency domain signal of the optical spectrum signal of the tested
object is reserved.
[60] In the inverse transformation stepS04: the reserved frequency domain signal of the
optical spectrum signal of the tested object is transformed to the filtered time domain signal of the
tested object via an inverse Fourier transformation.
[61] [SNR TEST]
[62] Application example 4 uses the light emitting apparatus 12 and the spectrometer 1 of
the third embodiment, the lighting frequency is 100 times/second, the time interval of the lighting
frequency for turning on the LED is 5 ms, the time interval of the lighting frequency for turning off
the LED is 5 ms, the period of the lighting frequency is 10 ms, and the photodetector is the
photodetector of SE-2020-050-VNIR made by Oto photonics. The spectrometer 1 is used to
measure the reflection optical spectrum signal of the tested object of the zinc oxide, wherein the
tested objects is a PVC plate with a 2 cm thickness and coated by a zinc oxide coating with a 5 cm
length and a 5 cm width, and the other one tested object a PVC plate with a 2 cm thickness and
coated by the mixture coating with a 5 cm length and a 5 cm width. The spectrum detection method
is used to detect the reflection optical spectrum signal. The optical spectrum signal of the tested
object and the background noise form the time domain signal of the tested object and the time
domain signal of the tested object, which are shown in FIG. 6A, wherein the discontinuous
radiation waveform for presenting the lighting frequency of the LEDs is a square wave. Next, in the
filtering step, the time domain signal of the tested object is performed with the Fourier
transformation to be transformed to the frequency domain signal of the tested object, which can be
seen in FIG. 6B. The frequency domain signal of the tested object is easily to be separated into the
frequency domain signal of the optical spectrum signal of the tested object and the frequency
domain signal of the background noise. For example, the period of the lighting frequency is 10 ms,
and the light frequency is thus 100 Hz. In FIG. 6B, the frequency domain signal which larger than
or equal to 100 Hz is the frequency domain signal of the optical spectrum signal of the tested object,
and the frequency domain signal which is 0 Hz or less than 100 Hz is the frequency domain signal
of the background noise. The filtering step discards the frequency domain signal of the background
noise and reserves the frequency domain signal of the optical spectrum signal of the tested object.
Next, the inverse transformation step transforms the reserved frequency domain signal of the optical
spectrum signal of the tested object to the filtered time domain signal of the tested object (the
discontinuous square wave in FIG. 6C) via the inverse Fourier transformation. As shown in FIG.
6C, there are no background noise (i.e. the background noise is zero), and the SNR is infinite, which
achieve the high test or measure accuracy.
[63] From the above descriptions, compared to the current technology and product, the
light emitting apparatus, the light emitting method, the spectrometer and the spectrum detection
method have the analysis result for a sample being close to the high analysis results of the
conventional tungsten halogen spectrometer, and at the same time, the present disclosure improves
the signal-to-noise ratio in the optical spectrum of the test results of the sample, so as to achieve the
high accuracy of the test.
Claims (13)
1. A spectrometer, at least comprising: a light source controller; a light emitting apparatus; one or more photodetectors; and a computer; wherein the light source controller is electrically connected to the light emitting apparatus, the photodetector is electrically connected to the computer, the photodetector receives a light beam emitted by the light emitting apparatus, and a propagation path of the light beam between the light emitting apparatus and photodetector forms a light path; wherein the light emitting apparatus comprises a plurality of light emitting units, each of them emits a light with a light emission peak wavelength and a wavelength range; wherein the wavelength ranges of the two light emitting units with the two adjacent light emission peak wavelengths are overlapped to form a continuous wavelength range which is wider than each of the wavelength ranges of the two light emitting units with the two adjacent light emission peak wavelengths, or alternatively, the wavelength ranges of the two light emitting units with the two adjacent light emission peak wavelengths are non-overlapped; the two adjacent light emission peak wavelengths have a wavelength difference being larger than or equal to 1 nm, at least one portions of the light emission peak wavelengths have full widths at half maximum being larger than 0 nm and less than or equal to 60 nm; wherein a mathematical analysis module is installed in the photodetector or the computer, the mathematical analysis module is electrically or signally connected to the photodetector or the computer, the mathematical analysis module is a hardware or software based module, and a signal collected by the photodetector is transmitted to the mathematical analysis module; wherein the light source controller comprises a microcontroller unit, at least one lighting frequency is generated by a clock generator or a clock generation module integrated in the microcontroller unit, a signal of the lighting frequency is then transmitted to the microcontroller unit; the microcontroller unit is electrically or signally connected to the mathematical analysis module, so as to transmit the lighting frequencies, a time interval associated with the lighting frequency for turning on the light emitting unit and a time interval associated with the lighting frequency for turning off the light emitting unit to the mathematical analysis module, the microcontroller unit turns on or off the light emitting unit electrically connected to the microcontroller unit according to the lighting frequency, the time interval associated with the lighting frequency for turning on the light emitting unit and the time interval associated with the lighting frequency for turning off the light emitting unit; wherein in the time interval for turning on the light emitting unit, associated with the lighting frequency, the signal collected by the photodetector is a combination signal of a background noise and an optical spectrum signal of the tested object; in the time interval for turning off the light emitting unit, associated with the lighting frequency, the signal collected by the photodetector is the background noise; the combination signal forms a time domain signal of the tested object, and the mathematical analysis module comprises a time domain/frequency domain transformation unit for transforming the time domain signal of the tested object to a frequency domain signal of the tested object.
2. The spectrometer of claim 1, wherein the light emitting unit is a light emitting diode, a vertical-cavity surface-emitting laser or a laser diode.
3. The spectrometer of claim 2, wherein each of the light emitting units discontinuously emits the light with the lighting frequency, and all of the lighting frequencies are identical to or different from each other, or partial of the lighting frequencies are identical to or different from each other.
4. The spectrometer of claim 3, wherein the lighting frequency is 0.05 500 times/second.
5. The spectrometer of claim 4, wherein associated with the lighting frequency, a time interval for turning on the light emitting unit is 0.001 10 seconds.
6. The spectrometer of claim 5, wherein associated with lighting frequency, a time interval for turning off the light emitting unit is 0.001-10 seconds.
7. The spectrometer of claim 6, wherein the two adjacent light emission peak wavelengths have the wavelength difference being 1-80 nm.
8. The spectrometer of claim 7, wherein the two adjacent light emission peak wavelengths have the wavelength difference being 5-80 nm.
9. The spectrometer of claim 6, wherein each of the full widths at half maximum of the corresponding light emission peak wavelength is 15 50 nm.
10. The spectrometer of claim 9, wherein each of the full widths at half maximum of the corresponding light emission peak wavelength is 15 40 nm.
11. The spectrometer of claim 1, wherein the time domain/frequency domain transformation unit is a Fourier transform unit for transforming the time domain signal of the tested object to the frequency domain signal of the tested object via a Fourier transformation.
12. The spectrometer of claim 1, wherein the frequency domain signal of the tested object comprises a frequency domain signal of the optical spectrum signal of the tested object and a frequency domain signal of the background noise, the mathematical analysis module discards the frequency domain signal of the background noise and reserves the frequency domain signal of the optical spectrum signal of the tested object, the mathematical analysis module further comprises a frequency domain/time domain transformation unit for transforming the reserved frequency domain signal of the optical spectrum signal of the tested object to the filtered time domain signal of the tested object.
13. The spectrometer of claim 12, wherein the frequency domain/time domain transformation unit is an inverse Fourier transform unit for transforming the reserved frequency domain signal of the optical spectrum signal of the tested object to the filtered time domain signal of the tested object via an inverse Fourier transformation.
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| PCT/CN2021/076802 WO2021164719A1 (en) | 2020-02-20 | 2021-02-19 | Light-emitting device, light-emitting method, spectrophotometer, and spectrum measurement method |
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| TWI750706B (en) | 2020-06-20 | 2021-12-21 | 丁逸聖 | Light-emitting device, light-emitting method, light detection device, spectrum detection method, and light-emitting correction method |
| TWI795000B (en) * | 2021-09-29 | 2023-03-01 | 新加坡商兆晶生物科技股份有限公司（新加坡） | Optical analyzer and its optical analysis system |
| CN117120815A (en) * | 2021-11-18 | 2023-11-24 | 大连兆晶生物科技有限公司 | Optical analysis system and optical analyzer thereof |
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| CN111987079B (en) * | 2020-02-20 | 2023-03-28 | 大连兆晶生物科技有限公司 | Light emitting device, light emitting method, spectrometer and spectrum detection method |
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2020
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| WO2021164719A1 (en) | 2021-08-26 |
| AU2021224704A1 (en) | 2022-04-28 |
| CN111987079B (en) | 2023-03-28 |
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