CN111987079A - Light emitting device, light emitting method, spectrometer and spectrum detection method - Google Patents
Light emitting device, light emitting method, spectrometer and spectrum detection method Download PDFInfo
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- 238000001228 spectrum Methods 0.000 title claims abstract description 79
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- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 42
- 239000011787 zinc oxide Substances 0.000 description 21
- UQSXHKLRYXJYBZ-UHFFFAOYSA-N Iron oxide Chemical compound [Fe]=O UQSXHKLRYXJYBZ-UHFFFAOYSA-N 0.000 description 20
- 238000010586 diagram Methods 0.000 description 15
- 229910052721 tungsten Inorganic materials 0.000 description 9
- 239000010937 tungsten Substances 0.000 description 9
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- 238000000576 coating method Methods 0.000 description 8
- 229910052736 halogen Inorganic materials 0.000 description 8
- 229920000915 polyvinyl chloride Polymers 0.000 description 6
- 239000004800 polyvinyl chloride Substances 0.000 description 6
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 6
- 150000002367 halogens Chemical class 0.000 description 5
- 230000000052 comparative effect Effects 0.000 description 4
- 238000000295 emission spectrum Methods 0.000 description 4
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- -1 tungsten halogen Chemical class 0.000 description 4
- 238000012545 processing Methods 0.000 description 3
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- 238000000862 absorption spectrum Methods 0.000 description 2
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- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
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- 229910052710 silicon Inorganic materials 0.000 description 1
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- 238000004611 spectroscopical analysis Methods 0.000 description 1
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- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
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- H01L25/075—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L33/00
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
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- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/40—Arrangement of two or more semiconductor lasers, not provided for in groups H01S5/02 - H01S5/30
- H01S5/4025—Array arrangements, e.g. constituted by discrete laser diodes or laser bar
- H01S5/4087—Array arrangements, e.g. constituted by discrete laser diodes or laser bar emitting more than one wavelength
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/40—Arrangement of two or more semiconductor lasers, not provided for in groups H01S5/02 - H01S5/30
- H01S5/42—Arrays of surface emitting lasers
- H01S5/423—Arrays of surface emitting lasers having a vertical cavity
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Abstract
The invention provides a spectrometer and a light-emitting device used by the spectrometer, wherein the light-emitting device at least comprises: a plurality of light emitting elements each emitting light having an emission peak wavelength and a wavelength range, the wavelength ranges of two light emitting elements corresponding to two adjacent emission peak wavelengths being partially overlapped, or the wavelength ranges of two light emitting elements corresponding to two adjacent emission peak wavelengths being not overlapped; and the plurality of light emitting elements can respectively emit light discontinuously with a light-on and light-off frequency. The invention also provides a light emitting method and a spectrum detection method according to the light emitting device and the spectrometer, which can discard the frequency domain signal of the background noise and leave the frequency domain signal of the spectrum signal of the object to be tested, so as to achieve the filtering effect and enable the test to be accurate, and replace the characteristic of the traditional spectrometer in wavelength resolution.
Description
Technical Field
The present invention relates to a light emitting device, and more particularly, to a light emitting device, a light emitting method, a spectrometer, and a spectrum detection method capable of selecting a wavelength range of light emitted from a light emitting diode, a light emission peak wavelength (FWHM) difference range between adjacent light emission peak wavelengths, a Full-Width at Half Maximum (FWHM) range, and a lighting frequency (lighting frequency).
Background
The conventional spectrometer (also called spectrophotometer) generally includes a light source and a monochromator (monochromator), wherein the light source can use a tungsten halogen lamp (halogen lamp) filled with halogen gas to generate light with a continuous spectrum of Vis-near ir (visible-near infrared) having an emission spectrum of about 320nm to 2500nm, and then the monochromator composed of a prism (prism) or a grating (grating) selects monochromatic light with a specific wavelength for absorption or reflection measurement of a sample (or object), which of course includes continuous scanning in a set wavelength range to analyze an absorption spectrum or a reflection spectrum of the sample. However, like the tungsten lamp described in the chinese patent publication No. CN101236107B, due to the large heat generation and high temperature of the tungsten lamp, when organic products such as agricultural products, food, pharmaceutical products and petrochemical products are tested using the tungsten lamp as a light source, the high temperature may cause quality change of the organic samples, thereby seriously affecting the testing result. The technology disclosed in the aforementioned patent No. CN101236107B can also be cited in the present invention.
The CN101236107B patent discloses a plurality of Light-emitting diodes (LEDs) as the Light source of the spectrometer, each LED emits monochromatic Light with different wavelength ranges, and in addition to the combination of the plurality of LEDs into a continuous spectrum, when only monochromatic Light with a certain wavelength range is required according to the design, only the LED corresponding to the wavelength range needs to be lit, so that the plurality of LEDs can be lit simultaneously to synthesize a continuous spectrum, or the corresponding LEDs can be lit sequentially according to the wavelength range to be scanned. However, the aforementioned patent No. CN101236107B focuses the emitted light of a plurality of LEDs on the entrance slit of the monochromator, and thus, it cannot solve the problems of high cost and complex system of the monochromator. The publication of the patent publication No. CN205388567U discloses the use of a combination of multiple LEDs and optical fibers to avoid using a monochromator, and the use of a total reflector to increase the measurement optical path to improve the efficiency of detecting the sample. The technology disclosed in the aforementioned patent No. CN101236107B can also be cited in the present invention. In addition, the chinese patent publication No. CN109932335A also discloses a similar technique.
Although the above three patents improve the problems of heat generation of the light source and the high cost of the monochromator of the conventional spectrometer, the wavelength resolution (usually greater than 10nm) of the spectrometer (spectroscopy) using the LED array as the light source is lower than that (usually 1nm) of the conventional spectrometer using the halogen tungsten lamp and the monochromator, which causes the doubts of the above three patents using the LED array as the light source in correctly analyzing the spectrogram of the sample. Another problem of the three aforementioned patents is that the Signal-to-noise ratio (Signal-to-noise ratio, SNR or S/N, also called Signal-to-noise ratio) cannot be further increased, and the LED arrays of the three aforementioned patents are only used to replace the tungsten halogen lamp as the light source, and other operation modes of the light source are not changed, so obviously there is no improvement in SNR caused by the light source end, and therefore the three aforementioned patents cannot further increase SNR.
Disclosure of Invention
The main objective of the present invention is to provide a light emitting device composed of a plurality of LEDs emitting different wavelength ranges and a spectrometer composed of the light emitting device, wherein the analysis result of the spectrometer of the present invention on a sample is close to the high analysis result of the conventional halogen tungsten lamp spectrometer, and the signal-to-noise ratio in the spectrogram of the detection result of the sample is improved to achieve the effect of accurate test.
The technical means adopted by the invention are as follows.
To achieve the above object, the present invention provides a light emitting device, comprising: a plurality of light emitting elements each emitting light having an emission peak wavelength and a wavelength range; wherein the equal wavelength ranges of two light-emitting elements corresponding to two adjacent light-emitting peak wavelengths are partially overlapped to form a continuous wavelength range wider than the wavelength range of each of the light-emitting elements, or the equal wavelength ranges of two light-emitting elements corresponding to two adjacent light-emitting peak wavelengths are not overlapped; the difference between the wavelengths of the adjacent two light-emitting peak values is greater than or equal to 1nm, and the full width at half maximum of the wavelength corresponding to each light-emitting peak value is greater than 0nm and less than or equal to 60 nm.
In an embodiment of the invention, the light emitting device is a light emitting diode, a vertical cavity surface emitting laser or a laser diode.
In an embodiment of the invention, the plurality of light emitting elements can respectively emit light discontinuously with an on-off frequency, and the plurality of on-off frequencies can be the same as or different from each other, or the plurality of on-off frequencies can be partially the same as or different from each other.
In one embodiment of the present invention, the on/off frequency is between 0.05 times/second and 500 times/second.
In an embodiment of the invention, the time interval for turning on the light emitting device in the on/off frequency is between 0.001 second and 10 seconds.
In an embodiment of the invention, a time interval of turning off the light emitting device in the on-off frequency is between 0.001 second and 10 seconds.
In an embodiment of the invention, the difference between two adjacent emission peak wavelengths is between 1nm and 80 nm.
In an embodiment of the invention, the difference between the wavelengths of the two adjacent light-emitting peak wavelengths is between 5nm and 80 nm.
In an embodiment of the invention, a full width at half maximum of a wavelength corresponding to each of the light-emitting peak wavelengths is between 15nm and 50 nm.
In an embodiment of the invention, a full width at half maximum of a wavelength corresponding to each of the light-emitting peak wavelengths is between 15nm and 40 nm.
In order to achieve the above object, the present invention further provides a spectrometer, which at least comprises a light source controller, the light emitting device, a light detector and a calculator; the light source controller is electrically connected with the light-emitting device, the light detector is electrically connected with the calculator, the light detector receives light emitted by the light-emitting device, and a light path is formed by the light in a traveling path between the light-emitting device and the light detector.
In an embodiment of the present invention, a mathematical analysis module is disposed on the light detector or the calculator, the mathematical analysis module is electrically or signal-connected to the light detector, or the mathematical analysis module is electrically or signal-connected to the calculator, and the mathematical analysis module is in a software or hardware type, and the signal collected by the light detector is transmitted to the mathematical analysis module; in the time interval of the on-off frequency for turning on the light-emitting device, the signal received by the light detector is the combination of a spectrum signal of an object to be detected and a background noise; in the time interval of turning off the light-emitting device in the on-off frequency, the signal received by the light detector is the background noise; the object spectrum signal and the background noise constitute an object time domain signal, and the mathematical analysis module comprises a time domain and frequency domain conversion unit for converting the object time domain signal into an object frequency domain signal.
In an embodiment of the invention, the time-domain/frequency-domain converting unit is a fourier converting unit for fourier converting the time-domain signal of the object to be measured into the frequency-domain signal of the object to be measured.
In an embodiment of the invention, the object frequency domain signal includes a frequency domain signal of the object spectrum signal and a frequency domain signal of the background noise, the mathematical analysis module can discard the frequency domain signal of the background noise and leave the frequency domain signal of the object spectrum signal, and the mathematical analysis module includes a frequency domain time domain conversion unit for converting the left frequency domain signal of the object spectrum signal into a filtered object time domain signal.
In an embodiment of the invention, the frequency-domain time-domain converting unit is a fourier inverse converting unit capable of performing fourier inverse conversion on the frequency-domain signal of the remaining spectral signal of the object to be measured into the filtered time-domain signal of the object to be measured.
The invention also provides a light-emitting method, which sequentially comprises the following steps: a step of providing a light emitting element: providing a plurality of light emitting elements each emitting light having an emission peak wavelength and a wavelength range, the wavelength ranges of two light emitting elements corresponding to two adjacent emission peak wavelengths being partially overlapped to form a continuous wavelength range wider than the wavelength range of each of the light emitting elements, or the wavelength ranges of two light emitting elements corresponding to two adjacent emission peak wavelengths being non-overlapped; the difference between the wavelengths of two adjacent light-emitting peak values is more than or equal to 1nm, and the half-height width of the wavelength corresponding to each light-emitting peak value is more than 0nm and less than or equal to 60 nm; a light emitting step: the light-emitting elements are respectively controlled to emit light discontinuously with a light-on and light-off frequency, the light-on and light-off frequency is between 0.05 times/second and 500 times/second, the time interval for turning on the light-emitting elements in the light-on and light-off frequency is between 0.001 second and 10 seconds, and the time interval for turning off the light-emitting elements in the light-on and light-off frequency is between 0.001 second and 10 seconds.
The invention also provides a spectrum detection method, comprising the above-mentioned light emitting method, the spectrum detection method further comprises a filtering step, receiving a spectrum signal of an object to be detected and a background noise, the time interval of turning on the light emitting element in the on-off frequency, the received signal being the combination of the spectrum signal of the object to be detected and the background noise, the time interval of turning off the light emitting element in the on-off frequency, the received signal being the background noise, the spectrum signal of the object to be detected and the background noise constituting an object time domain signal to be detected, the object time domain signal to be detected is fourier-converted into an object frequency domain signal, the object frequency domain signal to be detected is divided into the frequency domain signal of the spectrum signal of the object to be detected and the frequency domain signal of the background noise, and then the frequency domain signal of the background noise is discarded and the frequency domain signal of the spectrum signal of the object to be detected is left.
In an embodiment of the invention, the spectrum detection method further includes an inverse transform step, where the inverse transform step performs fourier inverse transform on the frequency domain signal of the spectrum signal of the object to be detected, which is left as described above, into a filtered time domain signal of the object to be detected.
The present invention uses a plurality of light emitting elements, so that the difference between the wavelengths of two adjacent light emitting peak values is greater than or equal to 1nm, and the full width at half maximum of the wavelength corresponding to each of the emission peak wavelengths is greater than 0nm and less than or equal to 60nm, and the plurality of light-emitting devices can respectively emit light with a non-continuous on/off frequency to Fourier transform the time domain signal of the object to be tested into the frequency domain signal of the object to be tested, and the frequency domain signal of the object to be measured is divided into the frequency domain signal of the spectrum signal of the object to be measured and the frequency domain signal of the background noise, then, the frequency domain signal of the background noise is discarded and the frequency domain signal of the spectrum signal of the object to be tested is left to achieve the filtering effect and make the test accurate, the characteristic of the light-emitting device and the spectrometer in wavelength resolution can replace the characteristic of the traditional spectrometer in wavelength resolution.
Drawings
FIG. 1 is a schematic diagram of a light emitting device and a spectrometer according to an embodiment of the present invention.
Fig. 2 is an emission spectrum of a light emitting diode according to a first embodiment of the present invention.
Fig. 3 is an emission spectrum of a light emitting diode according to a second embodiment of the present invention.
Fig. 4 is an emission spectrum of a light emitting diode according to a third embodiment of the present invention.
FIG. 5A is a schematic diagram of an embodiment of a light emitting device and a spectrometer according to the present invention.
Fig. 5B is a schematic diagram of an embodiment of a light emitting device and a spectrometer according to the invention.
FIG. 6A is a diagram of the time domain signal of the object to be measured by the spectrometer of the present invention.
FIG. 6B is a frequency domain signal diagram of the object after Fourier transformation of the time domain signal of the object to be measured by the spectrometer of the present invention.
FIG. 6C is a time-domain signal diagram of the object to be measured after filtering, wherein the frequency-domain signal of the spectrum signal of the object to be measured left after the filtering effect is performed by the spectrometer of the invention after Fourier inverse transformation.
FIG. 7A is a graph of the reflection spectra of zinc oxide and zinc oxide mixed iron oxide measured using a conventional spectrometer in comparative example 1.
Fig. 7B is a graph of the reflection spectrum of zinc oxide and zinc oxide mixed iron oxide measured using the spectrometer of the present invention in application example 1.
Fig. 7C is a graph of the reflection spectrum of zinc oxide and zinc oxide mixed iron oxide measured using the spectrometer of the present invention in application example 2.
FIG. 7D is a graph showing the reflectance spectrum of zinc oxide and zinc oxide mixed iron oxide measured by the spectrometer of application example 3.
Fig. 8 is a flow chart of the steps of the lighting method of the present invention.
FIG. 9 is a flow chart of the steps of the spectral detection method of the present invention.
Description of the figure numbers:
1 spectrometer
11 light source controller
111 microcontroller
112 clock generator
12 light emitting device
120 circuit board
121 first light emitting diode
1211 fourth light emitting diode
122 second light emitting diode
1221 fifth light emitting diode
123 third light emitting diode
13 light detector
14 calculator
A test substance
L ray
M mathematical analysis module
M1 time-domain frequency-domain conversion unit
M2 frequency domain and time domain conversion unit
R optical path
S01 light-emitting element providing step
S02 light emitting step
S03 Filtering step
S04 reverses the conversion step.
Detailed Description
First, referring to the first embodiment of fig. 1, a light emitting device 12 of the present invention is applied to a spectrometer 1, and the spectrometer 1 includes a light source controller 11, the light emitting device 12, a light detector 13 and a calculator 14. The light source controller 11 is electrically connected to the light emitting device 12 and an external power source (not shown), the light detector 13 is electrically connected to the calculator 14, the light detector 13 receives a light L emitted from the light emitting device 12, and the light L forms an optical path R in a traveling path between the light emitting device 12 and the light detector 13, and the light detector 13 may be, for example, a photomultiplier (photomultiplier), a photoconductive detector (photoconductive detector), or a silicon thermal radiation detector (Si bolometer). An object to be measured A is placed on the light path R, and the light path R penetrates through the object to be measured A or forms reflection on the surface of the object to be measured A. In fig. 1, the light path R is taken as an example to penetrate the object a to be measured, so as to measure the absorption spectrum of the object a to be measured. In addition, in the implementation mode that the light path R forms reflection on the surface of the object a, the reflection spectrum of the object a is measured. The light detector 13 converts the light L into a spectrum signal of an object to be measured and transmits the spectrum signal of the object to be measured to the calculator 14, the calculator 14 converts the spectrum signal of the object to be measured to form a spectrum chart of the object to be measured, and the calculator 14 is, for example, a personal computer, a notebook computer or a computer server.
The light-emitting device 12 at least includes: a plurality of light Emitting elements each Emitting light having an emission peak wavelength (light emission peak wavelength) and a wavelength range between 300nm and 2500nm, wherein the light Emitting elements may be light Emitting diodes, Vertical-Cavity Surface-Emitting lasers (VCSELs), or Laser Diodes (LDs). The light emitting device of the following embodiments is exemplified by a light emitting diode for convenience of description, but not limited to the light emitting diode exemplified by the present invention, and the skilled person will know the aspect of the light emitting device: the light emitting diode, the vertical cavity surface emitting laser or the laser diode can be replaced with each other in the invention, and the practical implementation of the invention is not affected. In the embodiment of fig. 1, the light emitting device 12 includes three light emitting diodes, which are a first light emitting diode 121 emitting a first light having a first wavelength range, a second light emitting diode 122 emitting a second light having a second wavelength range, and a third light emitting diode 123 emitting a third light having a third wavelength range, wherein the first light has a first peak wavelength in the first wavelength range, the second light has a second peak wavelength in the second wavelength range, and the third light has a third peak wavelength in the third wavelength range. The first led 121, the second led 122 and the third led 123 are electrically connected to a circuit board 120 of the light emitting device 12, the circuit board 120 is electrically connected to the light source controller 11, in other words, the light source controller 11 is electrically connected to the first led 121, the second led 122 and the third led 123, and the light source controller 11 can control on or off (on or off ) of the first led 121, the second led 122 and the third led 123 respectively, that is, the light source controller 11 can control on or off (on or off) of a plurality of the leds respectively. Preferably, the light source controller 11 can control and enable the first light emitting diode 121, the second light emitting diode 122 and the third light emitting diode 123 to emit light continuously or discontinuously, respectively, that is, the light source controller 11 can control and enable the plurality of light emitting diodes to emit light continuously or discontinuously, respectively. Preferably, the light source controller 11 is capable of controlling and enabling the first led 121, the second led 122 and the third led 123 to respectively emit light discontinuously with an on/off frequency, that is, the light source controller 11 is capable of controlling and enabling a plurality of the leds to respectively emit light discontinuously with an on/off frequency, where a plurality of the on/off frequencies may be the same as or different from each other, or a plurality of the on/off frequencies may be partially the same as or different from each other. For example, the light source controller 11 includes a Microcontroller (Microcontroller Unit)111 electrically connected to the external power source and a clock generator (clock generator)112 electrically connected to the Microcontroller 111, wherein the on/off frequency is generated by the clock generator 112 and then a signal of the on/off frequency is transmitted to the Microcontroller 111, and the Microcontroller 111 turns on or off the plurality of light emitting diodes (such as the first light emitting diode 121, the second light emitting diode 122 and the third light emitting diode 123) electrically connected to the Microcontroller 111 according to the on/off frequency. Specifically, the clock generator 112 may also be a clock generation module integrated in the microcontroller 111 for generating the on/off frequency, and the clock generation module may be in a software or hardware type, so that the clock generator 112 is not required to be additionally disposed outside the microcontroller 111. It should be noted that, of course, according to the technical features of the light source controller 11, only one or a part of the light emitting diodes may be turned on or off at the same time according to actual requirements, or only one or a part of the light emitting diodes may be turned on or off sequentially, or any one of the above manners may be turned on or off in the on-off frequency manner.
Referring to fig. 2, the wavelength ranges of two light emitting diodes corresponding to two adjacent light emitting peak wavelengths are partially overlapped to form a continuous wavelength range wider than the wavelength range of each of the light emitting diodes, and the continuous wavelength range is between 300nm and 2500 nm. In fig. 2, three emission peak wavelengths and corresponding wavelength ranges are shared, which are the first wavelength range corresponding to the first emission peak wavelength (734nm) of the first light, the second wavelength range corresponding to the second emission peak wavelength (810nm) of the second light, and the third wavelength range corresponding to the third emission peak wavelength (882nm) of the third light, respectively. The first emission peak wavelength and the second emission peak wavelength are two adjacent emission peak wavelengths, and similarly, the second emission peak wavelength and the third emission peak wavelength are also two adjacent emission peak wavelengths. The first wavelength range corresponding to the first light-emitting peak wavelength is between 660nm and 780nm, the second wavelength range corresponding to the second light-emitting peak wavelength of the second light is between 710nm and 850nm, and the first wavelength range and the second wavelength range are partially overlapped between 710nm and 780nm, so that the first wavelength range and the second wavelength range jointly form the continuous wavelength range between 660nm and 850 nm. Similarly, the second wavelength range corresponding to the second peak wavelength is 710nm to 850nm, the third wavelength range corresponding to the third peak wavelength of the third light is 780nm to 940nm, and the second wavelength range and the third wavelength range partially overlap each other between 780nm to 850nm, so that the second wavelength range and the third wavelength range together form the continuous wavelength range between 710nm to 940 nm. In the present invention, the overlapping portion of the wavelength ranges of two light emitting diodes corresponding to two adjacent light emitting peak wavelengths is better if the overlapping portion is less. Of course, the wavelength ranges of two light emitting diodes corresponding to two adjacent light emitting peak wavelengths may not overlap, which will be described later.
Two adjacent light-emitting peak wavelengths are different from each other by 1nm or more, preferably between 1nm and 80nm, and more preferably between 5nm and 80 nm. In fig. 2, the adjacent first emission peak wavelength (734nm) and the second emission peak wavelength (810nm) are different from each other by 76nm, and the adjacent second emission peak wavelength (810nm) and the third emission peak wavelength (882nm) are different from each other by 72 nm. The numerical range limits stated in the present invention and the claims are always included, unless otherwise stated, for example, two adjacent ones of the emission peak wavelengths differ from each other by between 5nm and 80nm, which means greater than or equal to 5nm and less than or equal to 80 nm.
Please refer to the second embodiment of fig. 3, which is a derivative embodiment of the first embodiment, and therefore, the parts of the second embodiment that are the same as the first embodiment will not be described again. The second embodiment is different from the first embodiment in that the light emitting device 12 of the second embodiment comprises five light emitting diodes, which are respectively a fourth light emitting diode 1211, a second light emitting diode 122, a fifth light emitting diode 1221 and a third light emitting diode 123 that emit a fourth light having a fourth wavelength range, the fourth light having a fourth light emitting peak wavelength (772nm) in the fourth wavelength range, and the fifth light having a fifth light emitting peak wavelength (854nm) in the fifth wavelength range. In fig. 3, the emission peak wavelengths are, in order from small to large, the first emission peak wavelength (734nm), the fourth emission peak wavelength (772nm), the second emission peak wavelength (810nm), the fifth emission peak wavelength (854nm) and the third emission peak wavelength (882nm), the adjacent first emission peak wavelength (734nm) and the adjacent fourth emission peak wavelength (772nm) are different from each other by 38nm, the adjacent fourth emission peak wavelength (772nm) and the adjacent second emission peak wavelength (810nm) are different from each other by 38nm, the adjacent second emission peak wavelength (810nm) and the adjacent fifth emission peak wavelength (854nm) are different from each other by 44nm, and the adjacent fifth emission peak wavelength (854nm) and the adjacent third emission peak wavelength (882nm) are different from each other by 28 nm.
Please refer to the third embodiment in fig. 4, which is a derivative of the first and second embodiments, and therefore, the parts of the third embodiment that are the same as the first and second embodiments will not be described again. The third embodiment is different from the first embodiment in that the light-emitting device 12 of the second embodiment comprises 12 light-emitting diodes, and in fig. 4, the light-emitting peak wavelengths of the 12 light-emitting diodes are 734nm (the first light-emitting peak wavelength), 747nm, 760nm, 772nm (the fourth light-emitting peak wavelength), 785nm, 798nm, 810nm (the second light-emitting peak wavelength), 824nm, 839nm, 854nm (the fifth light-emitting peak wavelength), 867nm and 882nm (the third light-emitting peak wavelength) in order from small to large. Among the 12 light-emitting diodes, the difference between the adjacent two light-emitting peak wavelengths is respectively 13nm, 12nm, 13nm, 12nm, 14nm, 15nm, 13nm and 15nm in sequence. If the light emitting device in the first, second and third embodiments is a laser diode instead, the difference between the wavelengths of the two adjacent light emitting peaks may be greater than or equal to 1nm, for example, 1 nm.
The full width at half maximum of the wavelength corresponding to each of the emission peak wavelengths is greater than 0nm and less than or equal to 60nm, for example, in the first, second and third embodiments, the emission peak wavelengths are 734nm (the first emission peak wavelength), 747nm, 760nm, 772nm (the fourth emission peak wavelength), 785nm, 798nm, 810nm (the second emission peak wavelength), 824nm, 839nm, 854nm (the fifth emission peak wavelength), 867nm and 882nm (the third emission peak wavelength), from small to large, respectively, the full width at half maximum of the wavelength corresponding to the first emission peak wavelength of the first light, the full width at half maximum of the wavelength corresponding to the second emission peak wavelength of the second light, the full width at half maximum of the wavelength corresponding to the third emission peak wavelength of the third light, the full width at half maximum of the wavelength corresponding to the fourth emission peak wavelength of the fourth light, and the full width at half maximum of the wavelength corresponding to the fifth emission peak wavelength of the fifth light are greater than 0nm and less than or equal to 0nm 60nm, preferably between 15nm and 50nm, more preferably between 15nm and 40 nm. The full width at half maximum of the wavelengths corresponding to the other unexplained emission peak wavelengths of 747nm, 760nm, 785nm, 798nm, 824nm, 839nm and 867nm (FIG. 4) is also greater than 0nm and less than or equal to 60nm, preferably between 15nm and 50nm, and more preferably between 15nm and 40 nm. In the experimental operation of the present invention, the full width at half maximum of the wavelength corresponding to the peak wavelength of the light emission in the first, second, and third embodiments is 55 nm; if the light emitting device is a laser diode, the full width at half maximum of the wavelength corresponding to each of the emission peak wavelengths is greater than 0nm and less than or equal to 60nm, such as 1 nm.
For example, if the full width at half maximum of the wavelength corresponding to each of the two adjacent light-emitting peak wavelengths in the first, second, and third embodiments is 15nm, the width of the wavelength range corresponding to each of the light-emitting peak wavelengths (i.e., the difference between the maximum value and the minimum value of the wavelength range) is 40nm, and the difference between the two adjacent light-emitting peak wavelengths is 80 nm. For example, if the light emitting devices are laser diodes, the full width at half maximum of the wavelength corresponding to each of the emission peak wavelengths is 1nm, the width of the wavelength range is 4nm, and the difference between the emission peak wavelengths of two adjacent light emitting devices is 5nm, the wavelength ranges of the two light emitting devices (laser diodes) corresponding to the two adjacent emission peak wavelengths do not overlap.
Preferably, when the spectrometer 1 is operated to detect the object a to generate the object spectrogram in the first, second and third embodiments, as mentioned above, the light source controller 11 can respectively control and make the plurality of light emitting diodes to emit light discontinuously at the on/off frequencies, the plurality of on/off frequencies may be the same as each other or different from each other, or the plurality of on/off frequencies may be partially the same or different from each other, the on/off frequencies are between 0.05 times/second and 500 times/second, the time interval during which the light emitting diodes are turned on (on) in the on/off frequencies is between 0.001 second and 10 seconds, the time interval during which the light emitting diodes are turned off (off) in the on/off frequencies is between 0.001 second and 10 seconds, the cycle of the on/off frequencies is the sum of the time interval during which the light emitting diodes are turned on (on) and the time interval during which the light emitting diodes are turned off (off) at one time, the period of the on-off frequency is the inverse of the on-off frequency; in other words, the period of the on/off frequency can be understood as the sum of the on time intervals of the plurality of light emitting diodes, which are continuously turned on and continuously turned off immediately and continuously, the on time interval is between 0.001 seconds and 10 seconds, and the off time interval is between 0.001 seconds and 10 seconds. Preferably, the extinguishing frequency is between 0.5 times/second and 500 times/second; more preferably, the switching frequency is between 5 times/second and 500 times/second. The plurality of light-emitting diodes are in a discontinuous light-emitting state, so that the influence of the heat energy of the light emitted by the light-emitting diodes on the object A to be detected can be greatly reduced, and the object A to be detected containing an organic tube is prevented from being changed in quality, so that the light-emitting diode is particularly suitable for the object A to be detected sensitive to heat energy, and is more particularly suitable for the light emitted by the light-emitting diodes in the wavelength range to be near infrared light. A mathematical analysis module M is disposed on the light detector 13 (fig. 5A) or the calculator 14 (fig. 5B), the mathematical analysis module M is electrically or signal-connected to the light detector 13 (fig. 5A) or the mathematical analysis module M is electrically or signal-connected to the calculator 14 (fig. 5B), the mathematical analysis module M can be in a software or hardware type, and the signal collected by the light detector 13 is transmitted to the mathematical analysis module M. When the spectrometer 1 is operated to detect the object a to generate the object spectrogram, the plurality of leds can be turned on or off simultaneously at the same on/off frequency, the time interval of turning on (lighting) the leds in the on/off frequency is a combination of the object spectrum signal and a background noise (or called background noise), the time interval of turning off (lighting) the leds in the on/off frequency is a combination of the object spectrum signal and the background noise, and the signal received by the photodetector 13 is the background noise. Please refer to fig. 6A, which is a time domain signal diagram of an object to be measured and a time domain signal diagram of the object to be measured, which are formed by the combination of the spectrum signal of the object to be measured and the background noise when the spectrometer 1 is operated in the non-continuous light emitting mode with the on-off frequency to detect the object to be measured a. The object spectrum signal and the background noise collected by the optical detector 13 are transmitted to the mathematical analysis module M, and the mathematical analysis module M processes the object time domain signal and discards the background noise, for example, the mathematical analysis module M includes a time domain/frequency domain conversion unit M1 (fig. 5A) for converting the object time domain signal into an object frequency domain signal, the time domain/frequency domain conversion unit M1 may be a Fourier conversion unit for performing Fourier conversion (Fourier transform) on the object time domain signal into the object frequency domain signal, and the converted object frequency domain signal and object frequency domain signal are shown in fig. 6B, and the object frequency domain signal is easily divided into the frequency domain signal of the object spectrum signal and the frequency domain signal of the background noise. In FIG. 6B, the frequency domain signal at the peak of 0Hz or the frequency domain signal less than the turn-on/turn-off frequency is the frequency domain signal of the background noise; in fig. 6B, except the frequency domain signal of the peak at 0Hz (the frequency domain signal of the background noise), the remaining signals of the peak are the frequency domain signals of the object spectrum signal. Preferably, in the frequency domain signal of the object to be measured, the frequency domain signal greater than or equal to the on-off frequency is the frequency domain signal of the spectrum signal of the object to be measured. The mathematical analysis module M discards the frequency domain signal of the background noise and leaves the frequency domain signal of the spectrum signal of the object to be measured, so as to achieve the filtering effect. Because the mathematical analysis module M discards the frequency domain signal of the background noise, the frequency domain signal of the spectrum signal of the object to be measured left is completely the object to be measured and does not include the background signal, so compared with the conventional spectrometer, the spectrometer 1 of the present invention not only improves the signal-to-noise ratio of the object to be measured in the spectrum, but also the spectrometer 1 of the present invention can achieve the spectrum without background noise even because the frequency domain signal of the background noise is discarded for filtering. Referring to fig. 5A and 5B again, the microcontroller 111 of the light source controller 11 can be electrically or signal-connected to the mathematical analysis module M to synchronously transmit the on/off frequency, the time interval of turning on (illuminating) the light emitting diode in the on/off frequency, and the time interval of turning off (extinguishing) the light emitting diode in the on/off frequency to the mathematical analysis module M, so that when the microcontroller 111 turns on or off the plurality of light emitting diodes electrically connected to the microcontroller 111 respectively according to the on/off frequency, the time interval of turning on (illuminating) the light emitting diode in the on/off frequency, and the time interval of turning off (extinguishing) the light emitting diode in the on/off frequency, the mathematical analysis module M can correspond the time interval of turning on (illuminating) the light emitting diode in the on/off frequency to the spectrum signal of the object to be measured, and the mathematical analysis module M can correspond the time interval of turning off (extinguishing) the light emitting diode in the on/off frequency to the spectrum signal of the object to be measured, and the mathematical analysis module M can turn off the time The interval corresponds to the background noise.
Specifically, the discontinuous light-emitting waveform of the plurality of light-emitting diodes with the on-off frequency is a square wave, a sine wave or a negative sine wave.
In addition, the mathematical analysis module M can also process the frequency domain signal of the spectrum signal of the object left by the filtering effect, and convert the frequency domain signal of the spectrum signal of the object left into a filtered time domain signal of the object to be detected and a filtered time domain signal diagram of the object to be detected, wherein only one filtered spectrum signal of the object to be detected exists in the filtered time domain signal of the object to be detected, and the background noise does not exist. For example, the mathematical analysis module M includes a frequency-domain time-domain conversion unit M2 (fig. 5B) for converting the frequency-domain signal of the remaining spectral signal of the object into a filtered time-domain signal of the object, the frequency-domain time-domain conversion unit M2 may be a Fourier inverse conversion unit for performing Fourier inverse conversion (inverse Fourier Transform) on the frequency-domain signal of the remaining spectral signal of the object into the filtered time-domain signal of the object, and the converted filtered time-domain signal of the object and the filtered time-domain signal of the object are shown in fig. 6C. As is apparent from comparing fig. 6A and 6C, in fig. 6C, the filtered time-domain signal of the object to be measured in the filtered time-domain signal diagram of the object to be measured only has the spectrum signal of the object to be measured and appears as a square wave, and the filtered time-domain signal diagram of the object to be measured does not have any background noise. In other words, in fig. 6C, the background signal is zero, so if the value of the filtered spectrum signal of the dut is divided by the value of the background signal, the resulting signal-to-noise ratio will be infinite; therefore, the invention improves the signal-to-noise ratio in the spectrogram of the detection result of the sample (object to be detected), and can achieve the effect of accurate test. In particular, the mathematical analysis module M, the time-domain/frequency-domain conversion unit M1 and the frequency-domain/time-domain conversion unit M2 may be software or hardware types, or a combination thereof, respectively; the mathematical analysis module M, the time-domain/frequency-domain conversion unit M1 and the frequency-domain/time-domain conversion unit M2 are electrically or signal-connected to each other.
[ wavelength resolution test for comparative example and application example ]
Comparative example 1A conventional spectrometer of type SE-2020-050-VNIR, produced by Taiwan ultramicrooptics, using a tungsten halogen lamp as a light source and a grating for obtaining a resolution of 1nm wavelength was used, detecting reflection spectrum signals of the zinc oxide coating and the zinc oxide mixed iron oxide coating on two different substances, namely a 5cm long, 5cm wide and 0.2 thick flaky PVC (Polyvinyl Chloride) plate coated with the zinc oxide coating on the surface and a 5cm long, 5cm wide and 0.2 thick flaky PVC plate coated with the zinc oxide mixed iron oxide coating on the surface, then, based on the obtained Spectral image data, a similarity (difference) processing and analyzing technique, i.e., a Spectral Angle Matching (SAM) processing and analyzing technique, is used to perform similarity analysis on two different substances, i.e., zinc oxide and zinc oxide mixed iron oxide, and the SAM analysis result is 96.00% (fig. 7A).
Application examples 1, 2 and 3 respectively use the light emitting device and the spectrometer of the first, second and third embodiments, the light emitting device and the spectrometer have a light-out frequency of about 90.90 times/second, a time interval of turning on (lighting) the light emitting diode in the light-out frequency of 1 millisecond (1ms), a time interval of turning off (extinguishing) the light emitting diode in the light-out frequency of 10 milliseconds (10ms), and a photodetector of the same type as SE-2020-050-VNIR of taiwan ultramicro optics corporation, respectively detect the reflection spectrum signals of the zinc oxide coating and the zinc oxide mixed iron oxide coating for the 5cm long, 5cm wide and 0.2 thick sheet PVC plate coated with the zinc oxide coating and the 5cm long, 5cm wide and 0.2 thick sheet PVC plate coated with the zinc oxide mixed iron oxide coating, and then use the SAM processing analysis technique based on the obtained spectrum image data, the results of the SAM analysis of the similarity between the zinc oxide and the mixed iron oxide of zinc oxide were 97.69% (fig. 7B), 97.48% (fig. 7C), and 96.54% (fig. 7D), which were close to 96.00% of the conventional spectrometer of comparative example 1, respectively, and thus the wavelength resolution characteristics of the light emitting device and the spectrometer of examples one, two, and three were similar to those of the conventional spectrometer. Therefore, the characteristics of the light emitting devices and spectrometers of embodiments one, two and three used in examples 1, 2 and 3 in wavelength resolution can be applied to replace the characteristics of the conventional spectrometers in wavelength resolution.
Therefore, according to the light emitting device 12 and the spectrometer 1, referring to fig. 8, the present invention provides a light emitting method, which sequentially comprises a step of providing a light emitting element S01 and a step of emitting light S02.
The light emitting element providing step S01: providing a plurality of light emitting elements each emitting light having an emission peak wavelength and a wavelength range, the wavelength ranges of two light emitting elements corresponding to two adjacent emission peak wavelengths being partially overlapped to form a continuous wavelength range wider than the wavelength range of each of the light emitting elements, or the wavelength ranges of two light emitting elements corresponding to two adjacent emission peak wavelengths being non-overlapped; the difference between the wavelengths of the adjacent two light-emitting peak values is greater than or equal to 1nm, and the full width at half maximum of the wavelength corresponding to each light-emitting peak value is greater than 0nm and less than or equal to 60 nm. The light emitting device can be a light emitting diode, a vertical cavity surface emitting laser or a laser diode. Preferably, the difference between two adjacent light-emitting peak wavelengths is between 1nm and 80nm, and more preferably, the difference between two adjacent light-emitting peak wavelengths is between 5nm and 80 nm. Preferably, the full width at half maximum of the wavelength corresponding to each of the emission peak wavelengths is between 15nm and 50nm, and more preferably, the full width at half maximum of the wavelength corresponding to each of the emission peak wavelengths is between 15nm and 40 nm.
The light emission step S02: the light-emitting elements are respectively controlled to emit light discontinuously with a light-on and light-off frequency, the light-on and light-off frequency is between 0.05 times/second and 500 times/second, the time interval for turning on the light-emitting elements in the light-on and light-off frequency is between 0.001 second and 10 seconds, and the time interval for turning off the light-emitting elements in the light-on and light-off frequency is between 0.001 second and 10 seconds. Preferably, the extinguishing frequency is between 0.5 times/second and 500 times/second; more preferably, the switching frequency is between 5 times/second and 500 times/second.
In addition to the step S01 of providing a light emitting element and the step S02 of the light emitting method, the spectrum detection method further includes a filtering step S03 and an inverse conversion step S04 after the step S02 of providing light, in sequence, according to the light emitting device 12, the spectrometer 1 and the light emitting method, as shown in fig. 9.
The filtering step S03: receiving a spectrum signal of an object to be measured and a background noise, turning on (lighting up) a time interval of the light-emitting element in the on-off frequency, wherein the received signal is a combination of the spectrum signal of the object to be measured and the background noise, turning off (turning off) the time interval of the light-emitting element in the on-off frequency, the received signal is the background noise (or called as the background noise), the spectrum signal of the object to be measured and the background noise constitute a time domain signal of the object to be measured, performing Fourier transform (Fourier transform) on the time domain signal of the object to be measured to obtain a frequency domain signal of the object to be measured, the frequency domain signal of the object to be measured is divided into a frequency domain signal of the spectrum signal of the object to be measured and a frequency domain signal of the background, and then discarding the frequency domain signal of the background noise and leaving the frequency domain signal of the spectrum signal of the object to be measured to achieve a filtering effect.
The reverse conversion step S04: and performing Fourier Transform (inverse Fourier Transform) on the frequency domain signal of the spectrum signal of the object to be measured to obtain a filtered time domain signal of the object to be measured.
[ Signal-to-noise ratio test ]
Application example 4 is the light emitting device and the spectrometer according to the third embodiment, the light-emitting device and the spectrometer have a light-out frequency of about 100 times/second, a time interval of turning on (illuminating) the light-emitting diode in the light-out frequency of 5 milliseconds (5ms), and a time interval of turning off (extinguishing) the light-emitting diode in the light-out frequency of 5 milliseconds (5ms), so that the period of the light-out frequency is 10 milliseconds (10ms), and a light detector of the same type as SE-2020-VNIR of taiwan supermicro optics corporation is used to detect the reflection spectrum signal of a 5cm long, 5cm wide, 0.2 thick sheet PVC plate coated with zinc oxide according to the spectrum detection method. The spectrum signal of the object to be tested and the background noise constitute the time domain signal of the object to be tested and the time domain signal diagram of the object to be tested, as shown in fig. 6A, wherein the plurality of light emitting diodes present the discontinuous light emitting waveform with the on-off frequency as a square wave. Then the time domain signal of the object to be measured is Fourier transformed into the frequency domain signal of the object to be measured and the frequency domain signal diagram of the object to be measured through the Fourier transform of the filtering step, as shown in FIG. 6B; the frequency domain signal of the object to be measured is easily divided into the frequency domain signal of the spectrum signal of the object to be measured and the frequency domain signal of the background noise, for example, the period of the on-off frequency is 10ms, so the corresponding frequency is 100Hz, so the frequency domain signal with the frequency greater than or equal to 100Hz in fig. 6B is the frequency domain signal of the spectrum signal of the object to be measured, and the frequency domain signal with the frequency greater than or equal to 0Hz or the frequency domain signal less than 100Hz is the frequency domain signal of the background noise, and the filtering step discards the frequency domain signal of the background noise and leaves the frequency domain signal of the spectrum signal of the object to be measured. Then, the inverse transform step performs fourier inverse transformation on the frequency domain signal of the spectrum signal of the object to be measured left as described above into the filtered time domain signal of the object to be measured (discontinuous square wave in fig. 6C) and the filtered time domain signal diagram of the object to be measured, as shown in fig. 6C. Obviously, in fig. 6C, no background signal appears (or the background signal can be regarded as zero), so the signal-to-noise ratio will be infinite, thereby achieving the effect of accurate testing.
As can be seen from the above description, compared with the prior art and the product, the light emitting device, the light emitting method, the spectrometer and the spectrum detection method provided by the present invention have the advantages that the analysis result of the sample is close to the high analysis result of the conventional halogen tungsten lamp spectrometer, and the signal-to-noise ratio in the spectrum diagram of the detection result of the sample is improved, so that the effect of accurate test can be achieved.
Claims (18)
1. A light emitting device, comprising: a plurality of light emitting elements each emitting light having an emission peak wavelength and a wavelength range; wherein, the equal wavelength ranges of two light-emitting elements corresponding to two adjacent light-emitting peak wavelengths are partially overlapped to form a continuous wavelength range wider than each wavelength range of the light-emitting elements, or the equal wavelength ranges of two light-emitting elements corresponding to two adjacent light-emitting peak wavelengths are not overlapped; the difference between the wavelengths of the adjacent two light-emitting peak values is greater than or equal to 1nm, and the full width at half maximum of the wavelength corresponding to each light-emitting peak value is greater than 0nm and less than or equal to 60 nm.
2. The light-emitting device according to claim 1, wherein the light-emitting element is a light-emitting diode, a vertical cavity surface emitting laser, or a laser diode.
3. The light-emitting device according to claim 2, wherein a plurality of the light-emitting elements are capable of emitting light discontinuously with an on-off frequency, and a plurality of the on-off frequencies are the same as or different from each other, or a plurality of the on-off frequencies are partially the same as or different from each other.
4. The light-emitting device according to claim 3, wherein the ON/OFF frequency is between 0.05 times/sec and 500 times/sec.
5. The apparatus of claim 4, wherein the ON/OFF frequency is between 0.001 seconds and 10 seconds.
6. The light-emitting device according to claim 5, wherein the time interval for turning off the light-emitting element in the on-off frequency is between 0.001 second and 10 seconds.
7. The light-emitting device according to claim 6, wherein the difference between the wavelengths of the emission peaks is between 1nm and 80 nm.
8. The light-emitting device according to claim 7, wherein the difference between the wavelengths of the emission peaks is between 5nm and 80 nm.
9. The light-emitting device according to claim 6, wherein the full width at half maximum of the wavelength corresponding to each of the peak wavelengths of the emitted light is between 15nm and 50 nm.
10. The light-emitting device according to claim 9, wherein the full width at half maximum of the wavelength corresponding to each of the peak wavelengths of the emitted light is between 15nm and 40 nm.
11. A spectrometer, comprising: a light source controller (11), a light emitting device (12) according to claim 1, a light detector (13) and a calculator (14); the light source controller (11) is electrically connected with the light-emitting device (12), the light detector (13) is electrically connected with the calculator (14), the light detector (13) receives a light ray (L) emitted from the light-emitting device (12), and the light ray (L) forms a light path (R) in a traveling path between the light-emitting device (12) and the light detector (13).
12. The spectrometer as claimed in claim 11, wherein a mathematical analysis module (M) is disposed on the photodetector (13) or the calculator (14), the mathematical analysis module (M) is electrically or signal-connected to the photodetector (13) or the mathematical analysis module (M) is electrically or signal-connected to the calculator (14), and the mathematical analysis module (M) is of a software or hardware type, and the signal collected by the photodetector (13) is transmitted to the mathematical analysis module (M); in the time interval of the on/off frequency for turning on the light-emitting device, the signal received by the light detector (13) is the combination of a spectrum signal of an object to be detected and a background noise; in the time interval of turning off the light-emitting device in the on-off frequency, the signal received by the light detector (13) is the background noise; the object spectrum signal and the background noise constitute an object time domain signal, and the mathematical analysis module (M) includes a time domain/frequency domain conversion unit (M1) for converting the object time domain signal into an object frequency domain signal.
13. The spectrometer of claim 12, wherein the time-to-frequency domain transforming unit (M1) is a fourier transforming unit for fourier transforming the object time domain signal into the object frequency domain signal.
14. The spectrometer of claim 12, wherein the object frequency-domain signal comprises a frequency-domain signal of the object spectral signal and a frequency-domain signal of the background noise, the mathematical analysis module (M) is capable of discarding the frequency-domain signal of the background noise and leaving the frequency-domain signal of the object spectral signal, the mathematical analysis module (M) comprises a frequency-domain time-domain conversion unit (M2) for converting the remaining frequency-domain signal of the object spectral signal into a filtered object time-domain signal.
15. The spectrometer as claimed in claim 14, wherein the frequency-domain time-domain transforming unit (M2) is a fourier inverse transforming unit capable of fourier-transforming the frequency-domain signal of the remaining spectral signal of the object into the filtered time-domain signal of the object.
16. A light emitting method is characterized by sequentially comprising the following steps:
a step of providing a light emitting element (S01): providing a plurality of light emitting elements each emitting light having an emission peak wavelength and a wavelength range, the wavelength ranges of two light emitting elements corresponding to two adjacent emission peak wavelengths being partially overlapped to form a continuous wavelength range wider than the wavelength range of each of the light emitting elements, or the wavelength ranges of two light emitting elements corresponding to two adjacent emission peak wavelengths being non-overlapped; the difference between the wavelengths of two adjacent light-emitting peak values is more than or equal to 1nm, and the half-height width of the wavelength corresponding to each light-emitting peak value is more than 0nm and less than or equal to 60 nm;
a light emitting step (S02): the light-emitting elements are respectively controlled to emit light discontinuously with a light-on and light-off frequency, the light-on and light-off frequency is between 0.05 times/second and 500 times/second, the time interval for turning on the light-emitting elements in the light-on and light-off frequency is between 0.001 second and 10 seconds, and the time interval for turning off the light-emitting elements in the light-on and light-off frequency is between 0.001 second and 10 seconds.
17. A method of spectral detection comprising a method of emitting light according to claim 16, the method comprising:
a filtering step (S03): receiving a spectrum signal of an object to be detected and a background noise, turning on a time interval of the light-emitting element in the on-off frequency, combining the spectrum signal of the object to be detected and the background noise, turning off the time interval of the light-emitting element in the on-off frequency, taking the received signal as the background noise, forming a time domain signal of the object to be detected by the spectrum signal of the object to be detected and the background noise, carrying out Fourier transformation on the time domain signal of the object to be detected into a frequency domain signal of the object to be detected, dividing the frequency domain signal of the object to be detected into the frequency domain signal of the spectrum signal of the object to be detected and the frequency domain signal of the background noise, and then abandoning the frequency domain signal of the background noise and leaving the frequency domain signal of the spectrum signal of the object to be.
18. The method of claim 17, further comprising an inverse transform step (S04), the inverse transform step (S04) being performed to Fourier transform the frequency domain signal of the object spectrum signal left as described above into a filtered object time domain signal.
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| AU2021224704A AU2021224704B2 (en) | 2020-02-20 | 2021-02-19 | Light-emitting device, light-emitting method, spectrophotometer, and spectrum measurement method |
| PCT/CN2021/076802 WO2021164719A1 (en) | 2020-02-20 | 2021-02-19 | Light-emitting device, light-emitting method, spectrophotometer, and spectrum measurement method |
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| CN (1) | CN111987079B (en) |
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| WO (1) | WO2021164719A1 (en) |
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| WO2021164719A1 (en) * | 2020-02-20 | 2021-08-26 | 丁逸圣 | Light-emitting device, light-emitting method, spectrophotometer, and spectrum measurement method |
| WO2021255545A1 (en) * | 2020-06-20 | 2021-12-23 | 丁逸圣 | Light-emitting device, light-emitting method, light detection device, spectrum detection method, and light-emitting correction method |
| WO2023053046A1 (en) * | 2021-09-29 | 2023-04-06 | 大连兆晶生物科技有限公司 | Optical analyzer and optical analysis system therefor |
| WO2023089545A1 (en) * | 2021-11-18 | 2023-05-25 | 大连兆晶生物科技有限公司 | Optical analysis system and optical analyzer thereof |
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Also Published As
| Publication number | Publication date |
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| WO2021164719A1 (en) | 2021-08-26 |
| AU2021224704A1 (en) | 2022-04-28 |
| CN111987079B (en) | 2023-03-28 |
| AU2021224704B2 (en) | 2023-06-08 |
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