AU2003281925A1 - Method and device for determining a distance, an autofocus module, microscope and method for auto-focussing a microscope - Google Patents

Method and device for determining a distance, an autofocus module, microscope and method for auto-focussing a microscope

Info

Publication number
AU2003281925A1
AU2003281925A1 AU2003281925A AU2003281925A AU2003281925A1 AU 2003281925 A1 AU2003281925 A1 AU 2003281925A1 AU 2003281925 A AU2003281925 A AU 2003281925A AU 2003281925 A AU2003281925 A AU 2003281925A AU 2003281925 A1 AU2003281925 A1 AU 2003281925A1
Authority
AU
Australia
Prior art keywords
microscope
focussing
auto
determining
distance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2003281925A
Inventor
Jan Huisken
Urban Liebel
Ernst H. K. Stelzer
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Europaisches Laboratorium fuer Molekularbiologie EMBL
Original Assignee
Europaisches Laboratorium fuer Molekularbiologie EMBL
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Europaisches Laboratorium fuer Molekularbiologie EMBL filed Critical Europaisches Laboratorium fuer Molekularbiologie EMBL
Publication of AU2003281925A1 publication Critical patent/AU2003281925A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/241—Devices for focusing
    • G02B21/245—Devices for focusing using auxiliary sources, detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
  • Automatic Focus Adjustment (AREA)
AU2003281925A 2002-09-26 2003-09-25 Method and device for determining a distance, an autofocus module, microscope and method for auto-focussing a microscope Abandoned AU2003281925A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE2002144767 DE10244767A1 (en) 2002-09-26 2002-09-26 Method and device for determining the distance between a reference plane and an inner or outer optical interface of an object, and use thereof for determining a surface profile of an, in particular metallic, object, autofocus module, microscope and method for autofocusing a microscope
DE10244767.5 2002-09-26
PCT/DE2003/003265 WO2004029691A1 (en) 2002-09-26 2003-09-25 Method and device for determining a distance, an autofocus module, microscope and method for auto-focussing a microscope

Publications (1)

Publication Number Publication Date
AU2003281925A1 true AU2003281925A1 (en) 2004-04-19

Family

ID=31984070

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2003281925A Abandoned AU2003281925A1 (en) 2002-09-26 2003-09-25 Method and device for determining a distance, an autofocus module, microscope and method for auto-focussing a microscope

Country Status (3)

Country Link
AU (1) AU2003281925A1 (en)
DE (1) DE10244767A1 (en)
WO (1) WO2004029691A1 (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102004025210B4 (en) * 2004-05-22 2011-07-21 Halang, Wolfgang, Prof. Dr. Dr., 58119 Optical analogue displacement sensor
HUP0401802A2 (en) 2004-09-02 2006-03-28 3D Histech Kft Focusing method object carriers on fast-moving digitalization and object carrier moving mechanics, focusing optic, optical distance-measuring instrument
WO2006097123A1 (en) * 2005-03-16 2006-09-21 European Molecular Biology Laboratory Autofocussing system for microscope systems
CN102648389B (en) * 2009-05-19 2015-04-29 生物纳米基因公司 Devices and methods for dynamic determination of sample spatial orientation and dynamic repositioning
DE102014216227B4 (en) 2014-08-14 2020-06-18 Carl Zeiss Microscopy Gmbh Method and device for determining a distance between two optical interfaces spaced apart from one another along a first direction
EP3287829A1 (en) 2016-08-25 2018-02-28 Deutsches Krebsforschungszentrum Method of and microscope with installation for focus stabilization
EP3614192A1 (en) * 2018-08-20 2020-02-26 Till GmbH Microscope device
DE102018126011A1 (en) * 2018-10-19 2020-04-23 Leica Microsystems Cms Gmbh Method for determining the refractive index of an optical medium in a microscope and microscope
DE102019113975B4 (en) 2019-05-24 2023-10-19 Abberior Instruments Gmbh Method and device for monitoring the focus state of a microscope and microscope

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3328821C2 (en) * 1983-08-10 1986-10-02 Fa. Carl Zeiss, 7920 Heidenheim Auto focus for microscopes
US4687913A (en) * 1985-11-25 1987-08-18 Warner Lambert Technologies, Inc. Microscope autofocus system
JP2614843B2 (en) * 1985-12-02 1997-05-28 オリンパス光学工業株式会社 Autofocus microscope
DE3719422A1 (en) * 1986-12-19 1988-06-30 Hommelwerke Gmbh DEVICE FOR CONTACT-FREE MEASUREMENT OF A DISTANCE FROM A SURFACE, IN PARTICULAR TO SCAN A CONTOUR OF A SURFACE OF A WORKPIECE LENGTH OF A MEASURING PATH
JPH01123232A (en) * 1987-11-09 1989-05-16 Mitsubishi Electric Corp Pattern forming method
IT1241133B (en) * 1990-04-20 1993-12-29 Electronic Systems Spa APPARATUS AND SCANNING METHOD FOR MEASUREMENT OF LAYER READERS OF THE THICKNESS OF OPAQUE OR TRANSPARENT COATINGS APPLIED TO SURFACES OF ANY KIND
JPH0769162B2 (en) * 1990-04-23 1995-07-26 大日本スクリーン製造株式会社 Automatic focusing device for optical inspection system
US5122648A (en) * 1990-06-01 1992-06-16 Wyko Corporation Apparatus and method for automatically focusing an interference microscope
CH692254A5 (en) * 1996-06-29 2002-04-15 Zeiss Carl Microscope with an autofocus arrangement.
JPH10300442A (en) * 1997-04-24 1998-11-13 Takaoka Electric Mfg Co Ltd Shape measuring device

Also Published As

Publication number Publication date
WO2004029691A1 (en) 2004-04-08
DE10244767A1 (en) 2004-04-08

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase