AU2003281276A8 - Method for recognizing and locating material flaws with adjustment of measuring and exciter coils - Google Patents

Method for recognizing and locating material flaws with adjustment of measuring and exciter coils

Info

Publication number
AU2003281276A8
AU2003281276A8 AU2003281276A AU2003281276A AU2003281276A8 AU 2003281276 A8 AU2003281276 A8 AU 2003281276A8 AU 2003281276 A AU2003281276 A AU 2003281276A AU 2003281276 A AU2003281276 A AU 2003281276A AU 2003281276 A8 AU2003281276 A8 AU 2003281276A8
Authority
AU
Australia
Prior art keywords
recognizing
adjustment
measuring
exciter coils
locating material
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2003281276A
Other versions
AU2003281276A1 (en
Inventor
Carsten Mayer
Berthold Schweikart
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
RINAS GERATETECHNIK GmbH
Original Assignee
RINAS GERATETECHNIK GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by RINAS GERATETECHNIK GmbH filed Critical RINAS GERATETECHNIK GmbH
Publication of AU2003281276A1 publication Critical patent/AU2003281276A1/en
Publication of AU2003281276A8 publication Critical patent/AU2003281276A8/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9013—Arrangements for scanning
    • G01N27/902—Arrangements for scanning by moving the sensors
AU2003281276A 2002-07-02 2003-06-18 Method for recognizing and locating material flaws with adjustment of measuring and exciter coils Abandoned AU2003281276A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE2002129735 DE10229735A1 (en) 2002-07-02 2002-07-02 Process for the detection and localization of material defects
DE10229735.5 2002-07-02
PCT/EP2003/006443 WO2004005912A2 (en) 2002-07-02 2003-06-18 Method for recognizing and locating material flaws with adjustment of measuring and exciter coils

Publications (2)

Publication Number Publication Date
AU2003281276A1 AU2003281276A1 (en) 2004-01-23
AU2003281276A8 true AU2003281276A8 (en) 2004-01-23

Family

ID=29761581

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2003281276A Abandoned AU2003281276A1 (en) 2002-07-02 2003-06-18 Method for recognizing and locating material flaws with adjustment of measuring and exciter coils

Country Status (3)

Country Link
AU (1) AU2003281276A1 (en)
DE (1) DE10229735A1 (en)
WO (1) WO2004005912A2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4756409B1 (en) * 2011-02-18 2011-08-24 大日機械工業株式会社 Nondestructive inspection apparatus and nondestructive inspection method using alternating magnetic field

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3422346A (en) * 1965-02-01 1969-01-14 Republic Steel Corp Eddy current inspection system
US3875502A (en) * 1973-05-24 1975-04-01 Foerster Inst Dr Friedrich Coil arrangement and circuit for eddy current testing
US3916301A (en) * 1974-05-20 1975-10-28 Republic Steel Corp Magnetic flaw detection apparatus
US4191922A (en) * 1978-03-14 1980-03-04 Republic Steel Corporation Electromagnetic flaw detection system and method incorporating improved automatic coil error signal compensation
US4207520A (en) * 1978-04-06 1980-06-10 The United States Of America As Represented By The Secretary Of The Air Force Multiple frequency digital eddy current inspection system
FR2451032A1 (en) * 1979-03-09 1980-10-03 Commissariat Energie Atomique DIGITAL APPARATUS FOR CHECKING WORKPIECES BY EDGE CURRENT
US4303885A (en) * 1979-06-18 1981-12-01 Electric Power Research Institute, Inc. Digitally controlled multifrequency eddy current test apparatus and method
DE3148640T1 (en) * 1980-05-22 1982-07-29 Secr Defence Brit IMPROVEMENTS IN OR RELATING TO MEASUREMENT APPARATUS
JPS57207858A (en) * 1981-06-17 1982-12-20 Nippon Steel Corp Hot flaw detecting method of metallic material
DE3125732A1 (en) * 1981-06-30 1983-01-13 Nukem Gmbh, 6450 Hanau METHOD AND DEVICE FOR TESTING MATERIALS ACCORDING TO THE FLUID FLOW PRINCIPLE
US4495587A (en) * 1981-12-08 1985-01-22 Bethlehem Steel Corporation Automatic nondestructive roll defect inspection system
JPS6166958A (en) * 1984-09-10 1986-04-05 Sumitomo Light Metal Ind Ltd Absolute value type eddy current flaw detecting device
US5055784A (en) * 1987-12-07 1991-10-08 American Research Corporation Of Virginia Bridgeless system for directly measuring complex impedance of an eddy current probe
GB8826817D0 (en) * 1988-11-16 1988-12-21 Nat Nuclear Corp Ltd Eddy current non-destructive examination
GB8829617D0 (en) * 1988-12-20 1989-02-15 Loma Group Ltd Method and apparatus using a varying electromagnetic field for determining the nature,or a property of a material
JPH05249085A (en) * 1992-03-10 1993-09-28 Sumitomo Metal Ind Ltd Eddy-current flaw detection apparatus
FR2769986B1 (en) * 1997-10-22 2000-01-28 Intercontrole Sa APPARATUS FOR NON-DESTRUCTIVE CONTROL OF METAL PARTS BY EDGE CURRENTS

Also Published As

Publication number Publication date
AU2003281276A1 (en) 2004-01-23
WO2004005912A3 (en) 2004-05-13
DE10229735A1 (en) 2004-01-22
WO2004005912A2 (en) 2004-01-15

Similar Documents

Publication Publication Date Title
GB2402480B (en) Method and apparatus for determining oriented density measurements including stand-off corrections
AU2003247524A8 (en) Method and apparatus for detection of radioactive material
HK1096731A1 (en) Method and apparatus for detection of radioactive material
EP1735588A4 (en) Apparatus and method for determining orientation parameters of an elongate object
GB2409526B (en) Apparatus and method for measurement of the magnetic induction tensor using triaxial induction arrays
AU2003220672A1 (en) Method and apparatus for determining properties of a test material by scratch testing
AU2003227509A1 (en) Method and device for measuring temperature of base material
GB0217570D0 (en) Method and apparatus for quantifying material or object properties
AU2003293526A1 (en) Method and apparatus for measuring thickness of a test object between two eddy current sensor heads
GB0217012D0 (en) Method and apparatus for testing thin material
EP1379865A4 (en) Method and apparatus for carrying out non-destructive testing of materials
AU2003280139A1 (en) Method and apparatus for measuring distance
HK1093258A1 (en) Apparatus and method for measuring signal quality
AU2002329471A1 (en) Method and apparatus for measuring material properties and lift-off components of an object using a magnetic probe
HK1061711A1 (en) Coil impedance detection for object detection method and apparatus
AU2003269469A8 (en) Method and apparatus for magnetic resonance analysis
AU2003240334A8 (en) Method and apparatus for determining peripheral breast thickness
GB2416209B (en) Method and apparatus for measuring film thickness and film thickness growth
AU2003281276A8 (en) Method for recognizing and locating material flaws with adjustment of measuring and exciter coils
AU2003297889A8 (en) Method and apparatus for asperity detection
GB0327630D0 (en) Method and apparatus for measuring surface configuration
AU2003265943A8 (en) Acoustic method and device for distance measurement
HK1038981A1 (en) Apparatus and method for processing thin-film magnetic head material
AU2003280310A8 (en) A method and apparatus for determining a property of a sample
GB2399415B (en) Method and apparatus for NMR measurement of magnetic materials

Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase