AU2003276888B2 - Semiconductive corrosion and fouling control apparatus, system, and method - Google Patents

Semiconductive corrosion and fouling control apparatus, system, and method Download PDF

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Publication number
AU2003276888B2
AU2003276888B2 AU2003276888A AU2003276888A AU2003276888B2 AU 2003276888 B2 AU2003276888 B2 AU 2003276888B2 AU 2003276888 A AU2003276888 A AU 2003276888A AU 2003276888 A AU2003276888 A AU 2003276888A AU 2003276888 B2 AU2003276888 B2 AU 2003276888B2
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AU
Australia
Prior art keywords
parameter
filter
corrosion
coating
metal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
AU2003276888A
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English (en)
Other versions
AU2003276888A1 (en
Inventor
David B. Dowling
Farshad Khorrami
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Applied Semiconductor International Ltd
Original Assignee
Applied Semiconductor International Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US10/291,770 external-priority patent/US6811681B2/en
Application filed by Applied Semiconductor International Ltd filed Critical Applied Semiconductor International Ltd
Publication of AU2003276888A1 publication Critical patent/AU2003276888A1/en
Application granted granted Critical
Publication of AU2003276888B2 publication Critical patent/AU2003276888B2/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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Classifications

    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
    • C23F13/00—Inhibiting corrosion of metals by anodic or cathodic protection
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
    • C23F13/00—Inhibiting corrosion of metals by anodic or cathodic protection
    • C23F13/02—Inhibiting corrosion of metals by anodic or cathodic protection cathodic; Selection of conditions, parameters or procedures for cathodic protection, e.g. of electrical conditions
    • C23F13/04—Controlling or regulating desired parameters

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Prevention Of Electric Corrosion (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
  • Preventing Corrosion Or Incrustation Of Metals (AREA)
AU2003276888A 2002-10-17 2003-10-17 Semiconductive corrosion and fouling control apparatus, system, and method Ceased AU2003276888B2 (en)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US27173402A 2002-10-17 2002-10-17
US10/271,734 2002-10-17
US10/291,770 US6811681B2 (en) 2002-11-12 2002-11-12 Semiconductive corrosion and fouling control apparatus, system, and method
US10/291,770 2002-11-12
PCT/US2003/029133 WO2004035865A1 (fr) 2002-10-17 2003-10-17 Appareil, systeme et procede anti-corrosion et anti-encrassement a base de semi-conducteur

Publications (2)

Publication Number Publication Date
AU2003276888A1 AU2003276888A1 (en) 2004-05-04
AU2003276888B2 true AU2003276888B2 (en) 2008-04-17

Family

ID=32109814

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2003276888A Ceased AU2003276888B2 (en) 2002-10-17 2003-10-17 Semiconductive corrosion and fouling control apparatus, system, and method

Country Status (6)

Country Link
EP (1) EP1579034A4 (fr)
JP (1) JP5009502B2 (fr)
AU (1) AU2003276888B2 (fr)
CA (1) CA2502465C (fr)
EA (1) EA007147B1 (fr)
WO (1) WO2004035865A1 (fr)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7318889B2 (en) * 2005-06-02 2008-01-15 Applied Semiconductor International, Ltd. Apparatus, system and method for extending the life of sacrificial anodes on cathodic protection systems
WO2007120087A1 (fr) * 2006-04-19 2007-10-25 Volvo Technology Corporation Procédé permettant de prévoir l'effet d'un comportement de vieillissement d'un élément électrique et modèle de simulation permettant de simuler un tel comportement
RU2486288C2 (ru) * 2011-08-11 2013-06-27 Анатолий Александрович Анашкин Устройство для импульсной катодной защиты
AU2012392207B2 (en) 2012-10-11 2018-03-08 Sembcorp Marine Repairs & Upgrades Pte. Ltd. System and method for providing corrosion protection of metallic structure using time varying electromagnetic wave
RU2618968C1 (ru) * 2015-10-13 2017-05-11 Александр Петрович Молодцов Устройство для питания и автоматического регулирования выходного тока системы катодной защиты от коррозии металлоконструкций
RU170510U1 (ru) * 2016-07-28 2017-04-26 Федеральное государственное бюджетное образовательное учреждение высшего образования "Омский государственный университет путей сообщения" Автоматическая дренажная установка
RU2735162C1 (ru) * 2020-03-25 2020-10-28 Федеральное государственное унитарное предприятие "Всероссийский научно-исследовательский институт автоматики им. Н.Л.Духова"(ФГУП "ВНИИА") Устройство для защиты объекта от воздействия космоса
RU2735223C1 (ru) * 2020-03-25 2020-10-28 Федеральное государственное унитарное предприятие "Всероссийский научно-исследовательский институт автоматики им. Н.Л.Духова"(ФГУП "ВНИИА") Устройство для защиты объекта от воздействия космоса

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6551491B2 (en) * 2000-06-02 2003-04-22 Applied Semiconductor, Inc. Method and system of preventing corrosion of conductive structures
US6562201B2 (en) * 2001-06-08 2003-05-13 Applied Semiconductor, Inc. Semiconductive polymeric system, devices incorporating the same, and its use in controlling corrosion

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6524466B1 (en) * 2000-07-18 2003-02-25 Applied Semiconductor, Inc. Method and system of preventing fouling and corrosion of biomedical devices and structures
US6402933B1 (en) * 2001-06-08 2002-06-11 Applied Semiconductor, Inc. Method and system of preventing corrosion of conductive structures

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6551491B2 (en) * 2000-06-02 2003-04-22 Applied Semiconductor, Inc. Method and system of preventing corrosion of conductive structures
US6562201B2 (en) * 2001-06-08 2003-05-13 Applied Semiconductor, Inc. Semiconductive polymeric system, devices incorporating the same, and its use in controlling corrosion

Also Published As

Publication number Publication date
EP1579034A4 (fr) 2008-07-02
EP1579034A1 (fr) 2005-09-28
WO2004035865A1 (fr) 2004-04-29
AU2003276888A1 (en) 2004-05-04
WO2004035865A9 (fr) 2004-06-17
JP5009502B2 (ja) 2012-08-22
CA2502465C (fr) 2011-09-27
JP2006503184A (ja) 2006-01-26
CA2502465A1 (fr) 2004-04-29
EA200500665A1 (ru) 2005-10-27
EA007147B1 (ru) 2006-08-25

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US6811681B2 (en) Semiconductive corrosion and fouling control apparatus, system, and method
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US6402933B1 (en) Method and system of preventing corrosion of conductive structures
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AU2002348505B2 (en) Semiconductive polymeric system, devices incorporating the same, and its use in controlling corrosion
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Legal Events

Date Code Title Description
FGA Letters patent sealed or granted (standard patent)
MK14 Patent ceased section 143(a) (annual fees not paid) or expired