AU2003266412A1 - Digital data signal testing using arbitrary test signal - Google Patents

Digital data signal testing using arbitrary test signal

Info

Publication number
AU2003266412A1
AU2003266412A1 AU2003266412A AU2003266412A AU2003266412A1 AU 2003266412 A1 AU2003266412 A1 AU 2003266412A1 AU 2003266412 A AU2003266412 A AU 2003266412A AU 2003266412 A AU2003266412 A AU 2003266412A AU 2003266412 A1 AU2003266412 A1 AU 2003266412A1
Authority
AU
Australia
Prior art keywords
digital data
arbitrary test
data signal
testing
test signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2003266412A
Other languages
English (en)
Inventor
Joachim Moll
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of AU2003266412A1 publication Critical patent/AU2003266412A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/3171—BER [Bit Error Rate] test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G01R23/20—Measurement of non-linear distortion
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/20—Arrangements for detecting or preventing errors in the information received using signal quality detector
    • H04L1/203—Details of error rate determination, e.g. BER, FER or WER

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Mathematical Physics (AREA)
  • Dc Digital Transmission (AREA)
AU2003266412A 2003-08-06 2003-08-06 Digital data signal testing using arbitrary test signal Abandoned AU2003266412A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/EP2003/050365 WO2005015248A1 (fr) 2003-08-06 2003-08-06 Essai de signal de donnees numeriques au moyen d'un signal d'essai arbitraire

Publications (1)

Publication Number Publication Date
AU2003266412A1 true AU2003266412A1 (en) 2005-02-25

Family

ID=34129910

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2003266412A Abandoned AU2003266412A1 (en) 2003-08-06 2003-08-06 Digital data signal testing using arbitrary test signal

Country Status (4)

Country Link
EP (1) EP1654548A1 (fr)
JP (1) JP2007515816A (fr)
AU (1) AU2003266412A1 (fr)
WO (1) WO2005015248A1 (fr)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7272756B2 (en) * 2005-05-03 2007-09-18 Agere Systems Inc. Exploitive test pattern apparatus and method
US7447965B2 (en) 2005-05-03 2008-11-04 Agere Systems Inc. Offset test pattern apparatus and method
JP5166924B2 (ja) * 2008-03-11 2013-03-21 株式会社日立製作所 信号再生回路
US10171127B2 (en) 2017-05-19 2019-01-01 Rohde & Schwarz Gmbh & Co. Kg Method, system and computer program for synchronizing pseudorandom binary sequence modules

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE60103361T2 (de) * 2001-03-16 2005-06-09 Agilent Technologies Inc., A Delaware Corp., Palo Alto Bitfehlerratenmessung
US6961317B2 (en) * 2001-09-28 2005-11-01 Agilent Technologies, Inc. Identifying and synchronizing permuted channels in a parallel channel bit error rate tester

Also Published As

Publication number Publication date
EP1654548A1 (fr) 2006-05-10
JP2007515816A (ja) 2007-06-14
WO2005015248A1 (fr) 2005-02-17

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase