AU2001280949A1 - Wafer area pressure control - Google Patents

Wafer area pressure control

Info

Publication number
AU2001280949A1
AU2001280949A1 AU2001280949A AU8094901A AU2001280949A1 AU 2001280949 A1 AU2001280949 A1 AU 2001280949A1 AU 2001280949 A AU2001280949 A AU 2001280949A AU 8094901 A AU8094901 A AU 8094901A AU 2001280949 A1 AU2001280949 A1 AU 2001280949A1
Authority
AU
Australia
Prior art keywords
pressure control
wafer area
area pressure
wafer
control
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001280949A
Inventor
Fangli Hao
Eric Lenz
Bruno Morel
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Lam Research Corp
Original Assignee
Lam Research Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lam Research Corp filed Critical Lam Research Corp
Publication of AU2001280949A1 publication Critical patent/AU2001280949A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
    • H01L21/3065—Plasma etching; Reactive-ion etching
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32431—Constructional details of the reactor
    • H01J37/3244—Gas supply means
    • H01J37/32449—Gas control, e.g. control of the gas flow
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32431—Constructional details of the reactor
    • H01J37/32623—Mechanical discharge control means
AU2001280949A 2000-08-11 2001-07-31 Wafer area pressure control Abandoned AU2001280949A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/637,736 US6433484B1 (en) 2000-08-11 2000-08-11 Wafer area pressure control
US09/637,736 2000-08-11
PCT/US2001/024103 WO2002015236A2 (en) 2000-08-11 2001-07-31 Wafer area pressure control

Publications (1)

Publication Number Publication Date
AU2001280949A1 true AU2001280949A1 (en) 2002-02-25

Family

ID=24557172

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001280949A Abandoned AU2001280949A1 (en) 2000-08-11 2001-07-31 Wafer area pressure control

Country Status (9)

Country Link
US (1) US6433484B1 (en)
EP (1) EP1362362B1 (en)
JP (2) JP4868693B2 (en)
KR (1) KR100807133B1 (en)
CN (1) CN1269178C (en)
AU (1) AU2001280949A1 (en)
DE (1) DE60140766D1 (en)
TW (1) TWI235403B (en)
WO (1) WO2002015236A2 (en)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0250853A (en) * 1988-08-12 1990-02-20 Nec Corp Image forming apparatus
US6492774B1 (en) * 2000-10-04 2002-12-10 Lam Research Corporation Wafer area pressure control for plasma confinement
US6800173B2 (en) * 2000-12-15 2004-10-05 Novellus Systems, Inc. Variable gas conductance control for a process chamber
US6846747B2 (en) 2002-04-09 2005-01-25 Unaxis Usa Inc. Method for etching vias
JP3940095B2 (en) * 2003-05-08 2007-07-04 忠弘 大見 Substrate processing equipment
US20050103267A1 (en) * 2003-11-14 2005-05-19 Hur Gwang H. Flat panel display manufacturing apparatus
US20050263070A1 (en) * 2004-05-25 2005-12-01 Tokyo Electron Limited Pressure control and plasma confinement in a plasma processing chamber
KR100539266B1 (en) 2004-06-02 2005-12-27 삼성전자주식회사 Plasma processing apparatus having segment confinements
US20060043067A1 (en) * 2004-08-26 2006-03-02 Lam Research Corporation Yttria insulator ring for use inside a plasma chamber
US7364623B2 (en) * 2005-01-27 2008-04-29 Lam Research Corporation Confinement ring drive
US7837825B2 (en) * 2005-06-13 2010-11-23 Lam Research Corporation Confined plasma with adjustable electrode area ratio
CN100452945C (en) * 2007-06-20 2009-01-14 中微半导体设备(上海)有限公司 Decoupling reactive ion etching chamber containing multiple processing platforms
US8043430B2 (en) * 2006-12-20 2011-10-25 Lam Research Corporation Methods and apparatuses for controlling gas flow conductance in a capacitively-coupled plasma processing chamber
US7824519B2 (en) * 2007-05-18 2010-11-02 Lam Research Corporation Variable volume plasma processing chamber and associated methods
US8679288B2 (en) 2008-06-09 2014-03-25 Lam Research Corporation Showerhead electrode assemblies for plasma processing apparatuses
US8449679B2 (en) 2008-08-15 2013-05-28 Lam Research Corporation Temperature controlled hot edge ring assembly
US8627783B2 (en) * 2008-12-19 2014-01-14 Lam Research Corporation Combined wafer area pressure control and plasma confinement assembly
US8540844B2 (en) * 2008-12-19 2013-09-24 Lam Research Corporation Plasma confinement structures in plasma processing systems
US8869741B2 (en) * 2008-12-19 2014-10-28 Lam Research Corporation Methods and apparatus for dual confinement and ultra-high pressure in an adjustable gap plasma chamber
KR101723253B1 (en) * 2009-08-31 2017-04-04 램 리써치 코포레이션 A local plasma confinement and pressure control arrangement and methods thereof
WO2011038344A2 (en) * 2009-09-28 2011-03-31 Lam Research Corporation Unitized confinement ring arrangements and methods thereof
CN102136410B (en) * 2010-01-27 2013-04-10 中芯国际集成电路制造(上海)有限公司 Method for cleaning technological cavities of semiconductor
US20130052369A1 (en) * 2010-05-06 2013-02-28 Oerlikon Solar Ag, Truebbach Plasma reactor
US9478428B2 (en) * 2010-10-05 2016-10-25 Skyworks Solutions, Inc. Apparatus and methods for shielding a plasma etcher electrode
US20120083129A1 (en) 2010-10-05 2012-04-05 Skyworks Solutions, Inc. Apparatus and methods for focusing plasma
US20150020848A1 (en) * 2013-07-19 2015-01-22 Lam Research Corporation Systems and Methods for In-Situ Wafer Edge and Backside Plasma Cleaning
KR101680850B1 (en) * 2016-06-28 2016-11-29 주식회사 기가레인 Plasma processing apparatus having control of exhaust flow path size
CN113745081B (en) * 2020-05-27 2024-03-12 中微半导体设备(上海)股份有限公司 Isolation ring assembly, plasma processing device and processing method

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6068784A (en) 1989-10-03 2000-05-30 Applied Materials, Inc. Process used in an RF coupled plasma reactor
US5246532A (en) * 1990-10-26 1993-09-21 Mitsubishi Denki Kabushiki Kaisha Plasma processing apparatus
JP2638443B2 (en) * 1993-08-31 1997-08-06 日本電気株式会社 Dry etching method and dry etching apparatus
US5534751A (en) 1995-07-10 1996-07-09 Lam Research Corporation Plasma etching apparatus utilizing plasma confinement
US5968275A (en) * 1997-06-25 1999-10-19 Lam Research Corporation Methods and apparatus for passivating a substrate in a plasma reactor
US6008130A (en) * 1997-08-14 1999-12-28 Vlsi Technology, Inc. Polymer adhesive plasma confinement ring
US6019060A (en) * 1998-06-24 2000-02-01 Lam Research Corporation Cam-based arrangement for positioning confinement rings in a plasma processing chamber
US5998932A (en) * 1998-06-26 1999-12-07 Lam Research Corporation Focus ring arrangement for substantially eliminating unconfined plasma in a plasma processing chamber
JP2000030896A (en) * 1998-07-10 2000-01-28 Anelva Corp Plasma confining device
JP2000058512A (en) * 1998-08-03 2000-02-25 Matsushita Electric Ind Co Ltd Device and method for plasma treatment
US6178919B1 (en) * 1998-12-28 2001-01-30 Lam Research Corporation Perforated plasma confinement ring in plasma reactors
JP3632564B2 (en) * 2000-05-17 2005-03-23 セイコーエプソン株式会社 Semiconductor wafer manufacturing method and plasma CVD apparatus

Also Published As

Publication number Publication date
EP1362362A2 (en) 2003-11-19
TWI235403B (en) 2005-07-01
EP1362362B1 (en) 2009-12-09
CN1489778A (en) 2004-04-14
WO2002015236A2 (en) 2002-02-21
KR100807133B1 (en) 2008-02-27
JP2012015552A (en) 2012-01-19
CN1269178C (en) 2006-08-09
JP5566982B2 (en) 2014-08-06
DE60140766D1 (en) 2010-01-21
JP4868693B2 (en) 2012-02-01
WO2002015236A3 (en) 2003-09-04
US6433484B1 (en) 2002-08-13
KR20030066595A (en) 2003-08-09
JP2004511085A (en) 2004-04-08

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