AU2001278964A1 - Apparatus and method for in-situ measurement of residual surface stresses - Google Patents

Apparatus and method for in-situ measurement of residual surface stresses

Info

Publication number
AU2001278964A1
AU2001278964A1 AU2001278964A AU7896401A AU2001278964A1 AU 2001278964 A1 AU2001278964 A1 AU 2001278964A1 AU 2001278964 A AU2001278964 A AU 2001278964A AU 7896401 A AU7896401 A AU 7896401A AU 2001278964 A1 AU2001278964 A1 AU 2001278964A1
Authority
AU
Australia
Prior art keywords
situ measurement
residual surface
surface stresses
stresses
residual
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001278964A
Inventor
Clayton O. Ruud
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Electric Power Research Institute Inc
Original Assignee
Electric Power Research Institute Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Electric Power Research Institute Inc filed Critical Electric Power Research Institute Inc
Publication of AU2001278964A1 publication Critical patent/AU2001278964A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/06—Indicating or recording means; Sensing means
    • G01N2203/0641—Indicating or recording means; Sensing means using optical, X-ray, ultraviolet, infrared or similar detectors

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
AU2001278964A 2000-07-21 2001-07-19 Apparatus and method for in-situ measurement of residual surface stresses Abandoned AU2001278964A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US21999700P 2000-07-21 2000-07-21
US60219997 2000-07-21
PCT/US2001/022780 WO2002008739A1 (en) 2000-07-21 2001-07-19 Apparatus and method for in-situ measurement of residual surface stresses

Publications (1)

Publication Number Publication Date
AU2001278964A1 true AU2001278964A1 (en) 2002-02-05

Family

ID=22821609

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001278964A Abandoned AU2001278964A1 (en) 2000-07-21 2001-07-19 Apparatus and method for in-situ measurement of residual surface stresses

Country Status (7)

Country Link
US (1) US6493420B2 (en)
EP (1) EP1311836A4 (en)
JP (1) JP2004505242A (en)
KR (1) KR100815872B1 (en)
AU (1) AU2001278964A1 (en)
CA (1) CA2416687C (en)
WO (1) WO2002008739A1 (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6697453B1 (en) * 2002-02-08 2004-02-24 Metscan Technologies, Llc Portable X-ray diffractometer
WO2005031329A1 (en) * 2003-08-04 2005-04-07 X-Ray Optical Systems, Inc. In-situ x-ray diffraction system using sources and detectors at fixed angular positions
US7340239B2 (en) * 2004-01-05 2008-03-04 Nokia Corporation Mechanism to allow use of typed emergency calls
CN102323279B (en) * 2011-06-17 2013-01-09 东南大学 X-ray tomography-based in-situ loading device
US10598556B2 (en) 2013-08-21 2020-03-24 United Technologies Corporation Method for in-situ markers for thermal mechanical structural health monitoring
JP6308374B1 (en) * 2016-12-02 2018-04-11 パルステック工業株式会社 X-ray diffraction measurement method and diffraction ring reader
CN106770402B (en) * 2017-01-11 2023-08-04 中国工程物理研究院核物理与化学研究所 Three-dimensional calibration measuring device for neutron diffraction stress analysis
US10066929B1 (en) * 2017-04-25 2018-09-04 The Boeing Company Method for measuring residual strain for cured composite part
JP6815933B2 (en) 2017-05-31 2021-01-20 株式会社神戸製鋼所 Stress measurement method

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4489425A (en) 1983-01-14 1984-12-18 Science Applications, Inc. Means and method for determining residual stress on a polycrystalline sample by X-ray diffraction
US4686631A (en) 1985-02-08 1987-08-11 Ruud Clayton O Method for determining internal stresses in polycrystalline solids
US5148458A (en) * 1990-01-18 1992-09-15 Clayton Ruud Method and apparatus for simultaneous phase composition and residual stress measurement by x-ray diffraction
US5414747A (en) * 1993-02-22 1995-05-09 The Penn State Research Foundation Method and apparatus for in-process analysis of polycrystalline films and coatings by x-ray diffraction
US5724401A (en) 1996-01-24 1998-03-03 The Penn State Research Foundation Large angle solid state position sensitive x-ray detector system
US5828724A (en) 1997-03-25 1998-10-27 Advanced Technology Materials, Inc. Photo-sensor fiber-optic stress analysis system

Also Published As

Publication number Publication date
JP2004505242A (en) 2004-02-19
US20020051514A1 (en) 2002-05-02
CA2416687C (en) 2011-06-14
EP1311836A4 (en) 2006-04-05
KR100815872B1 (en) 2008-03-24
CA2416687A1 (en) 2002-01-31
US6493420B2 (en) 2002-12-10
WO2002008739A1 (en) 2002-01-31
EP1311836A1 (en) 2003-05-21
KR20030038672A (en) 2003-05-16

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