AU2001274075A1 - Method and device for determining the thickness of transparent organic layers - Google Patents

Method and device for determining the thickness of transparent organic layers

Info

Publication number
AU2001274075A1
AU2001274075A1 AU2001274075A AU7407501A AU2001274075A1 AU 2001274075 A1 AU2001274075 A1 AU 2001274075A1 AU 2001274075 A AU2001274075 A AU 2001274075A AU 7407501 A AU7407501 A AU 7407501A AU 2001274075 A1 AU2001274075 A1 AU 2001274075A1
Authority
AU
Australia
Prior art keywords
determining
thickness
organic layers
transparent organic
transparent
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001274075A
Other languages
English (en)
Inventor
Holger Freitag
Thomas Huth-Fehre
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
INFRALYTIC GmbH
Original Assignee
INFRALYTIC GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by INFRALYTIC GmbH filed Critical INFRALYTIC GmbH
Publication of AU2001274075A1 publication Critical patent/AU2001274075A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
AU2001274075A 2000-05-26 2001-05-28 Method and device for determining the thickness of transparent organic layers Abandoned AU2001274075A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE10026282A DE10026282A1 (de) 2000-05-26 2000-05-26 Verfahren zur Bestimmung der Dicke von organischen Schichten
DE10026282 2000-05-26
PCT/EP2001/006070 WO2001092820A1 (fr) 2000-05-26 2001-05-28 Procede et dispositif et determination de l'epaisseur de couches organiques transparentes

Publications (1)

Publication Number Publication Date
AU2001274075A1 true AU2001274075A1 (en) 2001-12-11

Family

ID=7643761

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001274075A Abandoned AU2001274075A1 (en) 2000-05-26 2001-05-28 Method and device for determining the thickness of transparent organic layers

Country Status (4)

Country Link
EP (1) EP1287310B1 (fr)
AU (1) AU2001274075A1 (fr)
DE (2) DE10026282A1 (fr)
WO (1) WO2001092820A1 (fr)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6797958B2 (en) 2002-06-13 2004-09-28 The Boeing Company Method of measuring sol-gel coating thickness using infrared absorbance
US6784431B2 (en) 2002-06-13 2004-08-31 The Boeing Company Method of measuring anodize coating amount using infrared absorbance
US6903339B2 (en) 2002-11-26 2005-06-07 The Boeing Company Method of measuring thickness of an opaque coating using infrared absorbance
US7119336B2 (en) 2003-06-20 2006-10-10 The Boeing Company Method of measuring coating using two-wavelength infrared reflectance
US7075086B2 (en) 2003-08-28 2006-07-11 The Boeing Company Measurement of metal polish quality
US7514268B2 (en) 2003-11-24 2009-04-07 The Boeing Company Method for identifying contaminants
ITMI20041468A1 (it) * 2004-07-21 2004-10-21 Edoardo Deponte Procedimento e dispositivo per la misura di spessore di film termoplastici a retro-diffusione differenziale
DE102015007054A1 (de) 2015-06-02 2016-12-08 Thomas Huth-Fehre Verfahren und Vorrichtung zur Bestimmung der Dicke von dünnen organischen Schichten
DE102016211191A1 (de) * 2016-06-22 2017-12-28 Michael Tummuscheit Verfahren und Vorrichtung zur Bestimmung einer Schichtdicke einer organischen Schicht auf einer Oberfläche mittels Infrarotspektroskopie
DE102018110931C5 (de) * 2018-05-07 2023-06-29 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren und System zum Erfassen der Oberflächenbelegung einer Beschichtung auf einer Oberfläche eines bandförmigen Prüflings
DE102018126837A1 (de) 2018-10-26 2020-04-30 Emg Automation Gmbh Verfahren zur automatisierten Steuerung- und Regelung einer Maschine zur Schmiermittelaufbringung sowie Einrichtung zur automatisierten Steuerung- und Regelung einer Maschine zur Schmiermittelaufbringung
DE102020101613A1 (de) 2020-01-23 2021-07-29 Emg Automation Gmbh Verfahren zum quantitativen Nachweis einer Oberflächenbelegung einer ein Substrat belegenden Substanz sowie Messvorrichtung
JP7400617B2 (ja) * 2020-05-08 2023-12-19 コニカミノルタ株式会社 被覆率検出装置、画像形成装置、被覆率検出方法、および被覆率検出プログラム

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6017304A (ja) * 1983-07-08 1985-01-29 Mitsubishi Heavy Ind Ltd 不溶性液の薄膜厚測定法
JPS62223610A (ja) * 1986-03-25 1987-10-01 Sumitomo Metal Ind Ltd 膜厚測定方法
JP2943215B2 (ja) * 1990-03-07 1999-08-30 日本鋼管株式会社 防錆油の付着量測定方法及び装置
US5406082A (en) * 1992-04-24 1995-04-11 Thiokol Corporation Surface inspection and characterization system and process

Also Published As

Publication number Publication date
DE50104893D1 (de) 2005-01-27
EP1287310A1 (fr) 2003-03-05
DE10026282A1 (de) 2001-12-06
EP1287310B1 (fr) 2004-12-22
WO2001092820A1 (fr) 2001-12-06

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