ITMI20041468A1 - Procedimento e dispositivo per la misura di spessore di film termoplastici a retro-diffusione differenziale - Google Patents

Procedimento e dispositivo per la misura di spessore di film termoplastici a retro-diffusione differenziale

Info

Publication number
ITMI20041468A1
ITMI20041468A1 ITMI20041468A ITMI20041468A1 IT MI20041468 A1 ITMI20041468 A1 IT MI20041468A1 IT MI20041468 A ITMI20041468 A IT MI20041468A IT MI20041468 A1 ITMI20041468 A1 IT MI20041468A1
Authority
IT
Italy
Prior art keywords
differential
retro
thermoplastic
films
procedure
Prior art date
Application number
Other languages
English (en)
Inventor
Edoardo Deponte
Original Assignee
Edoardo Deponte
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Edoardo Deponte filed Critical Edoardo Deponte
Priority to ITMI20041468 priority Critical patent/ITMI20041468A1/it
Publication of ITMI20041468A1 publication Critical patent/ITMI20041468A1/it
Priority to EP05106648A priority patent/EP1619466A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
ITMI20041468 2004-07-21 2004-07-21 Procedimento e dispositivo per la misura di spessore di film termoplastici a retro-diffusione differenziale ITMI20041468A1 (it)

Priority Applications (2)

Application Number Priority Date Filing Date Title
ITMI20041468 ITMI20041468A1 (it) 2004-07-21 2004-07-21 Procedimento e dispositivo per la misura di spessore di film termoplastici a retro-diffusione differenziale
EP05106648A EP1619466A1 (en) 2004-07-21 2005-07-20 Procedure and a device for measuring the thickness of thermoplastic films with differential backscattering

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ITMI20041468 ITMI20041468A1 (it) 2004-07-21 2004-07-21 Procedimento e dispositivo per la misura di spessore di film termoplastici a retro-diffusione differenziale

Publications (1)

Publication Number Publication Date
ITMI20041468A1 true ITMI20041468A1 (it) 2004-10-21

Family

ID=35124562

Family Applications (1)

Application Number Title Priority Date Filing Date
ITMI20041468 ITMI20041468A1 (it) 2004-07-21 2004-07-21 Procedimento e dispositivo per la misura di spessore di film termoplastici a retro-diffusione differenziale

Country Status (2)

Country Link
EP (1) EP1619466A1 (it)
IT (1) ITMI20041468A1 (it)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102006016101A1 (de) * 2006-04-04 2007-10-18 Amepa Angewandte Messtechnik Und Prozessautomatisierung Gmbh Verfahren und Vorrichtung zur Messung einer Dicke einer transparenten organischen Schicht

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3693025A (en) * 1969-11-28 1972-09-19 Brun Sensor Systems Inc Apparatus and method for eliminating interference errors in dual-beam infrared reflection measurements on a diffusely reflecting surface by geometrical elimination of interference-producing specularly-reflected radiation components
GB2181835B (en) * 1985-10-01 1990-03-21 Univ Liverpool Monitoring device
JPH0781840B2 (ja) * 1988-06-29 1995-09-06 富士写真フイルム株式会社 光学式膜厚測定装置
DE4133359C2 (de) * 1991-10-09 1997-01-02 Porsche Ag Verfahren zur Messung der Dicke einer auf einer Fahrbahn vorhandenen Wasserschicht und Verwendung einer Vorrichtung hierfür
US6184528B1 (en) * 1998-08-27 2001-02-06 Vought Aircraft Industries, Inc. Method of spectral nondestructive evaluation
DE10026282A1 (de) * 2000-05-26 2001-12-06 Infralytic Gmbh Verfahren zur Bestimmung der Dicke von organischen Schichten
US20040061873A1 (en) * 2002-09-26 2004-04-01 Davis Brett L. Method and apparatus for detecting media thickness
US6903339B2 (en) * 2002-11-26 2005-06-07 The Boeing Company Method of measuring thickness of an opaque coating using infrared absorbance

Also Published As

Publication number Publication date
EP1619466A1 (en) 2006-01-25

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