AU2001249121A1 - Controllable and testable oscillator apparatus for an integrated circuit - Google Patents

Controllable and testable oscillator apparatus for an integrated circuit

Info

Publication number
AU2001249121A1
AU2001249121A1 AU2001249121A AU4912101A AU2001249121A1 AU 2001249121 A1 AU2001249121 A1 AU 2001249121A1 AU 2001249121 A AU2001249121 A AU 2001249121A AU 4912101 A AU4912101 A AU 4912101A AU 2001249121 A1 AU2001249121 A1 AU 2001249121A1
Authority
AU
Australia
Prior art keywords
testable
controllable
integrated circuit
oscillator apparatus
oscillator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001249121A
Inventor
David Lawrence Albean
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thomson Licensing SAS
Original Assignee
Thomson Licensing SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thomson Licensing SAS filed Critical Thomson Licensing SAS
Publication of AU2001249121A1 publication Critical patent/AU2001249121A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/04—Generating or distributing clock signals or signals derived directly therefrom
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/01—Shaping pulses
    • H03K5/04—Shaping pulses by increasing duration; by decreasing duration
    • H03K5/05—Shaping pulses by increasing duration; by decreasing duration by the use of clock signals or other time reference signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3016—Delay or race condition test, e.g. race hazard test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318577—AC testing, e.g. current testing, burn-in
    • G01R31/31858—Delay testing
AU2001249121A 2000-03-24 2001-03-08 Controllable and testable oscillator apparatus for an integrated circuit Abandoned AU2001249121A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US19179800P 2000-03-24 2000-03-24
US60191798 2000-03-24
PCT/US2001/007455 WO2001073457A2 (en) 2000-03-24 2001-03-08 Controllable and testable oscillator apparatus for an integrated circuit

Publications (1)

Publication Number Publication Date
AU2001249121A1 true AU2001249121A1 (en) 2001-10-08

Family

ID=22706972

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001249121A Abandoned AU2001249121A1 (en) 2000-03-24 2001-03-08 Controllable and testable oscillator apparatus for an integrated circuit

Country Status (11)

Country Link
US (1) US6888414B2 (en)
EP (1) EP1266235B1 (en)
JP (1) JP4980538B2 (en)
KR (1) KR100754238B1 (en)
CN (1) CN1204408C (en)
AU (1) AU2001249121A1 (en)
DE (1) DE60139380D1 (en)
HK (1) HK1056014A1 (en)
MX (1) MXPA02008946A (en)
MY (1) MY130533A (en)
WO (1) WO2001073457A2 (en)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE60139380D1 (en) * 2000-03-24 2009-09-10 Thomson Licensing CONTROLLABLE AND TESTABLE OSCILLATOR DEVICE IN AN INTEGRATED CIRCUIT
JP4480238B2 (en) * 2000-07-18 2010-06-16 Ｏｋｉセミコンダクタ株式会社 Semiconductor device
US6850123B1 (en) * 2003-05-27 2005-02-01 Xilinx, Inc. Circuits and methods for characterizing the speed performance of multi-input combinatorial logic
GB0424766D0 (en) * 2004-11-10 2004-12-08 Koninkl Philips Electronics Nv Testable integrated circuit
US7373560B1 (en) 2004-12-08 2008-05-13 Xilinx, Inc. Circuit for measuring signal delays of asynchronous inputs of synchronous elements
EP1866658B1 (en) 2005-03-30 2009-01-07 Nxp B.V. Test prepared rf integrated circuit
KR100801054B1 (en) * 2005-10-08 2008-02-04 삼성전자주식회사 Apparatus for measuring timing margin of semiconductor circuit and apparatus for measuring on-chip characteristics comprising the same
US7679458B2 (en) * 2005-12-06 2010-03-16 Qualcomm, Incorporated Ring oscillator for determining select-to-output delay of a multiplexer
US7381101B2 (en) * 2006-08-25 2008-06-03 Lear Corporation Battery post connector
CN102109874B (en) * 2009-12-28 2015-04-22 北京普源精电科技有限公司 Multi-path signal generator
KR20120096329A (en) 2011-02-22 2012-08-30 삼성전자주식회사 Integrated system comprising signal analysys circuit
US9091827B2 (en) 2012-07-09 2015-07-28 Luxtera, Inc. Method and system for grating couplers incorporating perturbed waveguides
US10782479B2 (en) 2013-07-08 2020-09-22 Luxtera Llc Method and system for mode converters for grating couplers
US9500700B1 (en) * 2013-11-15 2016-11-22 Xilinx, Inc. Circuits for and methods of testing the operation of an input/output port
US10659014B2 (en) * 2017-10-13 2020-05-19 Samsung Electronics Co., Ltd. Clock control in semiconductor system

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4517532A (en) * 1983-07-01 1985-05-14 Motorola, Inc. Programmable ring oscillator
JPS61132883A (en) * 1984-12-03 1986-06-20 Nec Corp Semiconductor device
US5126691A (en) * 1991-06-17 1992-06-30 Motorola, Inc. Variable clock delay circuit
US5355097A (en) * 1992-09-11 1994-10-11 Cypress Semiconductor Corporation Potentiometric oscillator with reset and test input
TW255052B (en) * 1992-11-03 1995-08-21 Thomson Consumer Electronics
US5737342A (en) * 1996-05-31 1998-04-07 Quantum Corporation Method for in-chip testing of digital circuits of a synchronously sampled data detection channel
US5815043A (en) * 1997-02-13 1998-09-29 Apple Computer, Inc. Frequency controlled ring oscillator having by passable stages
JPH11231967A (en) 1998-02-17 1999-08-27 Nec Corp Clock output circuit
DE19830571C2 (en) * 1998-07-08 2003-03-27 Infineon Technologies Ag Integrated circuit
DE60139380D1 (en) * 2000-03-24 2009-09-10 Thomson Licensing CONTROLLABLE AND TESTABLE OSCILLATOR DEVICE IN AN INTEGRATED CIRCUIT

Also Published As

Publication number Publication date
HK1056014A1 (en) 2004-01-30
MXPA02008946A (en) 2003-02-10
EP1266235A2 (en) 2002-12-18
JP4980538B2 (en) 2012-07-18
CN1204408C (en) 2005-06-01
CN1419653A (en) 2003-05-21
US6888414B2 (en) 2005-05-03
JP2003529082A (en) 2003-09-30
KR100754238B1 (en) 2007-09-03
EP1266235B1 (en) 2009-07-29
MY130533A (en) 2007-06-29
WO2001073457A2 (en) 2001-10-04
DE60139380D1 (en) 2009-09-10
KR20020086684A (en) 2002-11-18
US20030048142A1 (en) 2003-03-13
WO2001073457A3 (en) 2002-04-04

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