AU2001223931A1 - A method and system for measuring bumps height - Google Patents
A method and system for measuring bumps heightInfo
- Publication number
- AU2001223931A1 AU2001223931A1 AU2001223931A AU2393101A AU2001223931A1 AU 2001223931 A1 AU2001223931 A1 AU 2001223931A1 AU 2001223931 A AU2001223931 A AU 2001223931A AU 2393101 A AU2393101 A AU 2393101A AU 2001223931 A1 AU2001223931 A1 AU 2001223931A1
- Authority
- AU
- Australia
- Prior art keywords
- measuring
- bumps height
- height
- measuring bumps
- bumps
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2531—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object using several gratings, projected with variable angle of incidence on the object, and one detection device
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0608—Height gauges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2509—Color coding
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
- G01N21/95684—Patterns showing highly reflecting parts, e.g. metallic elements
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
IL13400800A IL134008A0 (en) | 2000-01-12 | 2000-01-12 | A method and system for measuring bump height |
IL134008 | 2000-01-12 | ||
PCT/IL2001/000019 WO2001051885A1 (en) | 2000-01-12 | 2001-01-09 | A method and system for measuring bumps height |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2001223931A1 true AU2001223931A1 (en) | 2001-07-24 |
Family
ID=11073700
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2001223931A Abandoned AU2001223931A1 (en) | 2000-01-12 | 2001-01-09 | A method and system for measuring bumps height |
Country Status (3)
Country | Link |
---|---|
AU (1) | AU2001223931A1 (en) |
IL (1) | IL134008A0 (en) |
WO (1) | WO2001051885A1 (en) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
IL146174A (en) | 2001-10-25 | 2007-08-19 | Camtek Ltd | Confocal wafer-inspection system |
WO2014023344A1 (en) * | 2012-08-07 | 2014-02-13 | Carl Zeiss Industrielle Messtechnik Gmbh | Improved chromatic sensor and method |
US9599558B2 (en) | 2012-08-07 | 2017-03-21 | Carl Zeiss Industrielle Messtechnik Gmbh | Measuring device for measuring a measurement object and related method |
JP6098505B2 (en) * | 2013-12-27 | 2017-03-22 | トヨタ自動車株式会社 | Welding quality inspection device and welding quality inspection method |
DE102014108789A1 (en) * | 2014-06-24 | 2016-01-07 | Byk-Gardner Gmbh | Multi-stage process for the examination of surfaces and corresponding device |
CN104197837B (en) * | 2014-09-19 | 2017-08-01 | 福建师范大学 | The non-contact optical measuring method and device of a kind of complex surface object volume |
CN110757278B (en) * | 2019-10-23 | 2020-09-18 | 清华大学 | Wafer thickness measuring device and grinding machine |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2126745B (en) * | 1982-09-02 | 1986-07-23 | Mo Nauchno Issledovatelskyinst | Method and device for determining cornea surface topography |
US5039868A (en) * | 1988-11-24 | 1991-08-13 | Omron Corporation | Method of and apparatus for inspecting printed circuit boards and the like |
-
2000
- 2000-01-12 IL IL13400800A patent/IL134008A0/en unknown
-
2001
- 2001-01-09 AU AU2001223931A patent/AU2001223931A1/en not_active Abandoned
- 2001-01-09 WO PCT/IL2001/000019 patent/WO2001051885A1/en active Application Filing
Also Published As
Publication number | Publication date |
---|---|
IL134008A0 (en) | 2001-04-30 |
WO2001051885A1 (en) | 2001-07-19 |
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