Classifications

• • G—PHYSICS
  • G11—INFORMATION STORAGE
  • G11C—STATIC STORES
  • G11C27/00—Electric analogue stores, e.g. for storing instantaneous values
• • G—PHYSICS
  • G11—INFORMATION STORAGE
  • G11C—STATIC STORES
  • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
  • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
  • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
  • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
  • G11C29/44—Indication or identification of errors, e.g. for repair
• • G—PHYSICS
  • G11—INFORMATION STORAGE
  • G11C—STATIC STORES
  • G11C27/00—Electric analogue stores, e.g. for storing instantaneous values
  • G11C27/005—Electric analogue stores, e.g. for storing instantaneous values with non-volatile charge storage, e.g. on floating gate or MNOS

Applications Claiming Priority (1)

Publications (1)

Family

ID=22248717

Family Applications (1)

Country Status (6)

Families Citing this family (1)

Family Cites Families (5)

• 1995
  • 1995-02-23 EP EP95912592A patent/EP0757836A4/en not_active Withdrawn
  • 1995-02-23 WO PCT/US1995/002258 patent/WO1996026523A1/en not_active Application Discontinuation
  • 1995-02-23 KR KR1019960705936A patent/KR970702563A/en not_active Application Discontinuation
  • 1995-02-23 JP JP8525635A patent/JPH09512380A/en active Pending
  • 1995-02-23 AU AU19689/95A patent/AU1968995A/en not_active Abandoned
  • 1995-02-23 CA CA002186141A patent/CA2186141C/en not_active Expired - Fee Related

Also Published As

Similar Documents