AU1074901A - Time-delayed-integration imaging with active pixel sensors - Google Patents

Time-delayed-integration imaging with active pixel sensors

Info

Publication number
AU1074901A
AU1074901A AU10749/01A AU1074901A AU1074901A AU 1074901 A AU1074901 A AU 1074901A AU 10749/01 A AU10749/01 A AU 10749/01A AU 1074901 A AU1074901 A AU 1074901A AU 1074901 A AU1074901 A AU 1074901A
Authority
AU
Australia
Prior art keywords
delayed
time
active pixel
pixel sensors
integration imaging
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU10749/01A
Inventor
Thomas Cunningham
Monico Ortiz
Bedabrata Pain
Guang Yang
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
California Institute of Technology CalTech
Original Assignee
California Institute of Technology CalTech
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by California Institute of Technology CalTech filed Critical California Institute of Technology CalTech
Publication of AU1074901A publication Critical patent/AU1074901A/en
Abandoned legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
    • H04N25/75—Circuitry for providing, modifying or processing image signals from the pixel array
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/48—Increasing resolution by shifting the sensor relative to the scene
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N9/00—Details of colour television systems
    • H04N9/03—Circuitry for demodulating colour component signals modulated spatially by colour striped filters by frequency separation

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
AU10749/01A 1999-10-05 2000-10-05 Time-delayed-integration imaging with active pixel sensors Abandoned AU1074901A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US15788599P 1999-10-05 1999-10-05
US60157885 1999-10-05
PCT/US2000/027746 WO2001026382A1 (en) 1999-10-05 2000-10-05 Time-delayed-integration imaging with active pixel sensors

Publications (1)

Publication Number Publication Date
AU1074901A true AU1074901A (en) 2001-05-10

Family

ID=22565700

Family Applications (1)

Application Number Title Priority Date Filing Date
AU10749/01A Abandoned AU1074901A (en) 1999-10-05 2000-10-05 Time-delayed-integration imaging with active pixel sensors

Country Status (4)

Country Link
JP (1) JP2003511920A (en)
KR (1) KR100434806B1 (en)
AU (1) AU1074901A (en)
WO (1) WO2001026382A1 (en)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7009163B2 (en) * 2001-06-22 2006-03-07 Orbotech Ltd. High-sensitivity optical scanning using memory integration
JP4251811B2 (en) * 2002-02-07 2009-04-08 富士通マイクロエレクトロニクス株式会社 Correlated double sampling circuit and CMOS image sensor having the correlated double sampling circuit
US7154075B2 (en) * 2003-11-13 2006-12-26 Micron Technology, Inc. Method and apparatus for pixel signal binning and interpolation in column circuits of a sensor circuit
JP2005181014A (en) * 2003-12-17 2005-07-07 Hitachi Software Eng Co Ltd Image reading apparatus and image reading method
JP4680640B2 (en) * 2005-03-16 2011-05-11 株式会社リコー Image input apparatus and image input method
US7932752B2 (en) 2005-11-08 2011-04-26 Panasonic Corporation Correlated double sampling circuit and sample hold circuit
EP2025146A1 (en) * 2006-05-23 2009-02-18 Thomson Licensing Image sensor circuit
JP5043388B2 (en) 2006-09-07 2012-10-10 キヤノン株式会社 Solid-state imaging device and imaging system
FR2906080B1 (en) * 2006-09-19 2008-11-28 E2V Semiconductors Soc Par Act SCALING IMAGE SENSOR WITH SUCCESSIVE INTEGRATIONS AND SOMMATION, WITH ACTIVE CMOS PIXELS
KR100931859B1 (en) * 2007-10-18 2009-12-15 주식회사 힘스 Wafer Inspection Camera
WO2009058092A1 (en) * 2007-11-01 2009-05-07 Sectra Mamea Ab X-ray detector
JP5151507B2 (en) * 2008-01-29 2013-02-27 ソニー株式会社 Solid-state imaging device, signal readout method of solid-state imaging device, and imaging apparatus
FR2953642B1 (en) 2009-12-09 2012-07-13 E2V Semiconductors MULTILINEAIRE IMAGE SENSOR WITH CHARGE INTEGRATION.
FR2959901B1 (en) 2010-05-04 2015-07-24 E2V Semiconductors IMAGE SENSOR WITH SAMPLE MATRIX
EP2571252A4 (en) * 2010-05-13 2014-04-23 Konica Minolta Business Tech Solid-state image pickup device, image pickup device, and driving method
FR2960341B1 (en) 2010-05-18 2012-05-11 E2V Semiconductors MATRIX IMAGE SENSOR WITH TRANSFER OF DISSYMETRIC GRID LOADS.
US8644376B2 (en) * 2010-09-30 2014-02-04 Alcatel Lucent Apparatus and method for generating compressive measurements of video using spatial and temporal integration
GB2486039B (en) 2010-11-30 2016-10-05 X-Scan Imaging Corp CMOS time delay integration sensor for X-ray imaging applications
KR101220883B1 (en) * 2011-01-21 2013-01-29 주식회사 룩센테크놀러지 X-ray readout integrated circuit and method for detecting x-rays with adjustable amplification gain and x-ray sensor using the same
FR2971084B1 (en) 2011-01-28 2013-08-23 E2V Semiconductors MULTILINEAR IMAGE SENSOR WITH CHARGE INTEGRATION
FR2990299B1 (en) 2012-05-03 2014-05-09 E2V Semiconductors MATRIX IMAGE SENSOR WITH TWO-WAY CHARGING TRANSFER WITH DISSYMETRIC GRIDS
DE102014207599B4 (en) * 2014-04-23 2024-09-26 Robert Bosch Gmbh Method and computer program for operating a photodetector
FR3036848B1 (en) 2015-05-28 2017-05-19 E2V Semiconductors LOAD TRANSFER IMAGE SENSOR WITH DOUBLE GATE IMPLANTATION
DE102017209643A1 (en) * 2017-06-08 2018-12-13 Robert Bosch Gmbh Operating procedure and control unit for a LiDAR system, LiDAR system and working device

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5949483A (en) * 1994-01-28 1999-09-07 California Institute Of Technology Active pixel sensor array with multiresolution readout
AU1159397A (en) * 1995-11-07 1997-05-29 California Institute Of Technology An image sensor with high dynamic range linear output
US5886659A (en) * 1996-08-21 1999-03-23 California Institute Of Technology On-focal-plane analog-to-digital conversion for current-mode imaging devices
US5909026A (en) * 1996-11-12 1999-06-01 California Institute Of Technology Integrated sensor with frame memory and programmable resolution for light adaptive imaging
US5965871A (en) * 1997-11-05 1999-10-12 Pixart Technology, Inc. Column readout multiplexer for CMOS image sensors with multiple readout and fixed pattern noise cancellation

Also Published As

Publication number Publication date
JP2003511920A (en) 2003-03-25
KR100434806B1 (en) 2004-06-07
KR20020056896A (en) 2002-07-10
WO2001026382A1 (en) 2001-04-12
WO2001026382A9 (en) 2002-12-05

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase