ATE60442T1 - Reflektometrische methode der messung und vorrichtung zur durchfuehrung dieser methode. - Google Patents

Reflektometrische methode der messung und vorrichtung zur durchfuehrung dieser methode.

Info

Publication number
ATE60442T1
ATE60442T1 AT86850409T AT86850409T ATE60442T1 AT E60442 T1 ATE60442 T1 AT E60442T1 AT 86850409 T AT86850409 T AT 86850409T AT 86850409 T AT86850409 T AT 86850409T AT E60442 T1 ATE60442 T1 AT E60442T1
Authority
AT
Austria
Prior art keywords
measuring
measurement
channel
aid
sample
Prior art date
Application number
AT86850409T
Other languages
English (en)
Inventor
Aimo Heinonen
Original Assignee
Aimo Heinonen
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Aimo Heinonen filed Critical Aimo Heinonen
Application granted granted Critical
Publication of ATE60442T1 publication Critical patent/ATE60442T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/20—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
    • G01J1/22—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using a variable element in the light-path, e.g. filter, polarising means
    • G01J1/24—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using a variable element in the light-path, e.g. filter, polarising means using electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G01N2021/4752—Geometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/065—Integrating spheres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/127—Calibration; base line adjustment; drift compensation

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Medicines Containing Plant Substances (AREA)
  • Saccharide Compounds (AREA)
  • Fats And Perfumes (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Spinning Or Twisting Of Yarns (AREA)
AT86850409T 1985-11-27 1986-11-26 Reflektometrische methode der messung und vorrichtung zur durchfuehrung dieser methode. ATE60442T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI854700A FI78563C (fi) 1985-11-27 1985-11-27 Reflektometriskt maetningsfoerfarande och maetningsanordning foer genomfoerande av foerfarandet.
EP86850409A EP0229602B1 (de) 1985-11-27 1986-11-26 Reflektometrische Methode der Messung und Vorrichtung zur Durchführung dieser Methode

Publications (1)

Publication Number Publication Date
ATE60442T1 true ATE60442T1 (de) 1991-02-15

Family

ID=8521753

Family Applications (1)

Application Number Title Priority Date Filing Date
AT86850409T ATE60442T1 (de) 1985-11-27 1986-11-26 Reflektometrische methode der messung und vorrichtung zur durchfuehrung dieser methode.

Country Status (6)

Country Link
EP (1) EP0229602B1 (de)
JP (1) JPH0643958B2 (de)
AT (1) ATE60442T1 (de)
CA (1) CA1299386C (de)
DE (1) DE3677176D1 (de)
FI (1) FI78563C (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5825945A (en) * 1992-05-15 1998-10-20 Unisys Corp Document imaging with illumination from lambertian surfaces
FI98761C (fi) * 1994-01-28 1997-08-11 Conrex Automation Oy Mittauslaite reflektometrisiä mittauksia varten
US7663757B2 (en) 2006-09-27 2010-02-16 Alberta Research Council Inc. Apparatus and method for obtaining a reflectance property indication of a sample

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AT351295B (de) * 1977-12-09 1979-07-10 Vianova Kunstharz Ag Anordnung zur messung des glanzvermoegens von oberflaechen, insbesondere organischer ueberzuege
JPS591977B2 (ja) * 1978-01-25 1984-01-14 株式会社京都第一科学 呈色試験紙を用いた分析方法
HU190892B (en) * 1983-04-13 1986-12-28 Mta Mueszaki Fizikai Kutato Intezete,Hu Aparatus for measuring reflection of the planar surfaces, in particular fluckering meter

Also Published As

Publication number Publication date
EP0229602B1 (de) 1991-01-23
FI78563B (fi) 1989-04-28
FI854700L (fi) 1987-05-28
CA1299386C (en) 1992-04-28
JPS62188940A (ja) 1987-08-18
FI854700A0 (fi) 1985-11-27
DE3677176D1 (de) 1991-02-28
EP0229602A1 (de) 1987-07-22
JPH0643958B2 (ja) 1994-06-08
FI78563C (fi) 1989-08-10

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Legal Events

Date Code Title Description
UEP Publication of translation of european patent specification
REN Ceased due to non-payment of the annual fee