ATE556303T1 - Strahlungsmessvorrichtung, strahlungssteuersystem und strahlungsmessverfahren - Google Patents
Strahlungsmessvorrichtung, strahlungssteuersystem und strahlungsmessverfahrenInfo
- Publication number
- ATE556303T1 ATE556303T1 AT05790683T AT05790683T ATE556303T1 AT E556303 T1 ATE556303 T1 AT E556303T1 AT 05790683 T AT05790683 T AT 05790683T AT 05790683 T AT05790683 T AT 05790683T AT E556303 T1 ATE556303 T1 AT E556303T1
- Authority
- AT
- Austria
- Prior art keywords
- radiation
- dust
- sensor
- measuring
- sensitive
- Prior art date
Links
- 230000005855 radiation Effects 0.000 title abstract 6
- 238000005259 measurement Methods 0.000 title abstract 3
- 238000000691 measurement method Methods 0.000 title 1
- 239000000428 dust Substances 0.000 abstract 4
- 230000008021 deposition Effects 0.000 abstract 2
- 238000000034 method Methods 0.000 abstract 2
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0414—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using plane or convex mirrors, parallel phase plates, or plane beam-splitters
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B39/00—Circuit arrangements or apparatus for operating incandescent light sources
- H05B39/04—Controlling
- H05B39/041—Controlling the light-intensity of the source
- H05B39/042—Controlling the light-intensity of the source by measuring the incident light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/0252—Constructional arrangements for compensating for fluctuations caused by, e.g. temperature, or using cooling or temperature stabilization of parts of the device; Controlling the atmosphere inside a photometer; Purge systems, cleaning devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/0271—Housings; Attachments or accessories for photometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J2001/4247—Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02B—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO BUILDINGS, e.g. HOUSING, HOUSE APPLIANCES OR RELATED END-USER APPLICATIONS
- Y02B20/00—Energy efficient lighting technologies, e.g. halogen lamps or gas discharge lamps
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP04104452 | 2004-09-15 | ||
PCT/IB2005/052907 WO2006030345A1 (en) | 2004-09-15 | 2005-09-06 | Radiation measuring device, radiation control system, and radiation measuring method |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE556303T1 true ATE556303T1 (de) | 2012-05-15 |
Family
ID=35355757
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT05790683T ATE556303T1 (de) | 2004-09-15 | 2005-09-06 | Strahlungsmessvorrichtung, strahlungssteuersystem und strahlungsmessverfahren |
Country Status (5)
Country | Link |
---|---|
EP (1) | EP1794553B1 (de) |
JP (1) | JP5033629B2 (de) |
CN (1) | CN101023329B (de) |
AT (1) | ATE556303T1 (de) |
WO (1) | WO2006030345A1 (de) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102288300B (zh) * | 2011-05-10 | 2012-11-07 | 中国科学技术大学 | 一种基于双材料微悬臂梁的辐射热通量测量装置 |
CN102879107B (zh) * | 2012-09-25 | 2015-02-25 | 中国科学院地理科学与资源研究所 | 热红外下行辐射测定装置及其测定方法 |
CN104501949B (zh) * | 2014-12-29 | 2016-08-24 | 中国科学院长春光学精密机械与物理研究所 | 基于替代法和探测器效率的腔体吸收率测量方法 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3300646A (en) * | 1964-02-06 | 1967-01-24 | Eastman Kodak Co | Light integrator using diffuse surface of a light-conducting rod |
US3457407A (en) * | 1966-07-27 | 1969-07-22 | Us Navy | Apparatus for quantitatively detecting foreign particles present in atmospheric air |
GB1281342A (en) * | 1968-10-09 | 1972-07-12 | English Clays Lovering Pochin | Apparatus for measuring concentration of solids in a fluid |
JPS545777A (en) * | 1977-06-15 | 1979-01-17 | Matsushita Electric Works Ltd | Infrated absorption type gas alarming device |
JPS639826A (ja) * | 1986-06-30 | 1988-01-16 | Hochiki Corp | 炎検出装置 |
JPS6463822A (en) * | 1987-09-03 | 1989-03-09 | Toshiba Corp | Measuring device for energy of electromagnetic wave |
EP0695932A1 (de) * | 1994-08-03 | 1996-02-07 | Hl Planartechnik Gmbh | Thermoelektrisches Bauelement |
JPH1164104A (ja) * | 1997-08-20 | 1999-03-05 | Tec Corp | 光センサ装置および照明器具 |
DE19842403B4 (de) * | 1998-09-16 | 2004-05-06 | Braun Gmbh | Strahlungssensor mit mehreren Sensorelementen |
-
2005
- 2005-09-06 WO PCT/IB2005/052907 patent/WO2006030345A1/en active Application Filing
- 2005-09-06 CN CN2005800311279A patent/CN101023329B/zh not_active Expired - Fee Related
- 2005-09-06 JP JP2007531886A patent/JP5033629B2/ja not_active Expired - Fee Related
- 2005-09-06 EP EP05790683A patent/EP1794553B1/de not_active Not-in-force
- 2005-09-06 AT AT05790683T patent/ATE556303T1/de active
Also Published As
Publication number | Publication date |
---|---|
JP2008513764A (ja) | 2008-05-01 |
EP1794553B1 (de) | 2012-05-02 |
WO2006030345A1 (en) | 2006-03-23 |
CN101023329B (zh) | 2011-06-08 |
JP5033629B2 (ja) | 2012-09-26 |
CN101023329A (zh) | 2007-08-22 |
EP1794553A1 (de) | 2007-06-13 |
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