ATE491145T1 - Probentests - Google Patents

Probentests

Info

Publication number
ATE491145T1
ATE491145T1 AT06076084T AT06076084T ATE491145T1 AT E491145 T1 ATE491145 T1 AT E491145T1 AT 06076084 T AT06076084 T AT 06076084T AT 06076084 T AT06076084 T AT 06076084T AT E491145 T1 ATE491145 T1 AT E491145T1
Authority
AT
Austria
Prior art keywords
sample under
light
under test
sample tests
marked area
Prior art date
Application number
AT06076084T
Other languages
English (en)
Inventor
Paul D Hayford
David W Long
Original Assignee
Illinois Tool Works
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GB0223607A external-priority patent/GB2394062A/en
Priority claimed from GB0224205A external-priority patent/GB0224205D0/en
Application filed by Illinois Tool Works filed Critical Illinois Tool Works
Application granted granted Critical
Publication of ATE491145T1 publication Critical patent/ATE491145T1/de

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/02Details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/02Mechanical
    • G01N2201/023Controlling conditions in casing
    • G01N2201/0233Gas purge
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/0014Type of force applied
    • G01N2203/0016Tensile or compressive
    • G01N2203/0017Tensile
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/0014Type of force applied
    • G01N2203/0025Shearing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02Details not specific for a particular testing method
    • G01N2203/022Environment of the test
    • G01N2203/0236Other environments
    • G01N2203/0238Inert
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02Details not specific for a particular testing method
    • G01N2203/022Environment of the test
    • G01N2203/0236Other environments
    • G01N2203/0242With circulation of a fluid
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02Details not specific for a particular testing method
    • G01N2203/06Indicating or recording means; Sensing means
    • G01N2203/0641Indicating or recording means; Sensing means using optical, X-ray, ultraviolet, infrared or similar detectors
    • G01N2203/0647Image analysis

Landscapes

  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Materials For Photolithography (AREA)
AT06076084T 2002-10-10 2003-10-09 Probentests ATE491145T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB0223607A GB2394062A (en) 2002-10-10 2002-10-10 Mechanical testing of material samples
GB0224205A GB0224205D0 (en) 2002-10-17 2002-10-17 Monitoring of samples utilising polarised light

Publications (1)

Publication Number Publication Date
ATE491145T1 true ATE491145T1 (de) 2010-12-15

Family

ID=32299714

Family Applications (2)

Application Number Title Priority Date Filing Date
AT03256385T ATE348324T1 (de) 2002-10-10 2003-10-09 Mechanische materialprüfung
AT06076084T ATE491145T1 (de) 2002-10-10 2003-10-09 Probentests

Family Applications Before (1)

Application Number Title Priority Date Filing Date
AT03256385T ATE348324T1 (de) 2002-10-10 2003-10-09 Mechanische materialprüfung

Country Status (7)

Country Link
US (2) US7047819B2 (de)
EP (2) EP1424547B1 (de)
AT (2) ATE348324T1 (de)
DE (2) DE60310349T2 (de)
DK (1) DK1424547T3 (de)
ES (1) ES2279068T3 (de)
PT (1) PT1424547E (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100363731C (zh) * 2006-05-12 2008-01-23 清华大学 卧式动静态电液伺服显微观测试验机
US20080053320A1 (en) * 2006-09-06 2008-03-06 Illinois Tool Works Inc. Pad printing of video targets for strain measurement
US7500401B2 (en) * 2007-04-17 2009-03-10 Illinois Tools Works Inc. Swivel jaw face for tensile and similar testing
DE112010003179B4 (de) 2009-09-18 2016-12-29 Illinois Tool Works, Inc. Optische Verschiebungsmessvorrichtung und Verfahren zur Messung einer Verschiebung
JP6031821B2 (ja) * 2012-05-22 2016-11-24 株式会社島津製作所 変位量測定方法および材料試験機
CN107041152B (zh) * 2014-06-27 2019-10-22 伊利诺斯工具制品有限公司 光学应变仪
GB2569465B (en) * 2014-07-28 2019-09-18 Illinois Tool Works Real-time video extensometer
US10551169B1 (en) 2018-04-27 2020-02-04 Epsilon Technology Corporation Positioning system for materials testing
US11803943B2 (en) * 2019-06-25 2023-10-31 Illinois Tool Works Inc. Brightness and contrast correction for video extensometer systems and methods
CN112748023B (zh) * 2020-12-29 2023-10-31 广西科技大学 一种土工合成材料温度控制斜剪试验装置及试验方法

Family Cites Families (34)

* Cited by examiner, † Cited by third party
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US3715915A (en) * 1971-04-28 1973-02-13 Nasa Light intensity strain analysis
DE2329618A1 (de) * 1973-06-09 1975-01-02 Fraunhofer Ges Forschung Anordnung zur vielfarbigen anzeige, bestehend aus lichtquelle und linearpolarisationsfilter
US3937071A (en) * 1975-07-11 1976-02-10 The United States Of America As Represented By The Secretary Of The Army Fatigue test apparatus
US4323311A (en) * 1979-05-11 1982-04-06 Sira Institute Limited Apparatus and method for detecting holes in sheet material
US4286843A (en) * 1979-05-14 1981-09-01 Reytblatt Zinovy V Polariscope and filter therefor
US4339660A (en) * 1980-05-15 1982-07-13 Erwin Sick Gmbh Optik-Elektronik Reflection light barrier apparatus for recognizing both strongly and weakly reflecting objects
US4591996A (en) * 1981-05-18 1986-05-27 Vachon Reginald I Apparatus and method for determining stress and strain in pipes, pressure vessels, structural members and other deformable bodies
JPS60244839A (ja) * 1984-05-19 1985-12-04 Kureha Chem Ind Co Ltd 材料試験装置
US4690552A (en) * 1985-08-19 1987-09-01 Industrial Holographics, Inc. Optical method and apparatus for strain analysis
HU203598B (en) * 1986-03-10 1991-08-28 Pannonglas Ipari Rt Method and apparatus for integral optical testing deletorius stresses in bottom of the glassware, in particular bottles and hollow ware
DE3813340A1 (de) * 1987-04-27 1988-11-10 Yokohama Rubber Co Ltd Zugfestigkeits-pruefgeraet
DE3806690A1 (de) * 1988-03-02 1988-11-03 Baeckmann Reinhard Verfahren und einrichtung zum nachweis von lumineszenz-, waermestrahlungs- und schallemissionen und sonstigen strahlungen und ladungsemissionen bei bruchvorgaengen
US4869110A (en) * 1988-06-16 1989-09-26 Systems Integration Technology, Inc. Laser strain extensometer for material testing
GB2223319B (en) * 1988-10-03 1992-08-26 Rolls Royce Plc Method & means for fatigue testing
US5007265A (en) * 1988-12-19 1991-04-16 Rockwell International Optical monitor for superplastic forming
US5029023A (en) * 1989-09-29 1991-07-02 Regents Of The University Of California Laser-amplified motion detector and method
US5029194A (en) * 1990-02-05 1991-07-02 Troxler Electronic Laboratories, Inc. Method and apparatus for accurately measuring the distance to a surface
US5671042A (en) * 1992-02-18 1997-09-23 Illinois Institute Of Technology Holomoire strain analyzer
US5541413A (en) * 1992-04-24 1996-07-30 Thiokol Corporation Acousto-optic tunable filter-based surface scanning system and process
FR2688064B1 (fr) * 1992-07-22 1997-10-17 Scanera Sc Dispositif de detection de defauts de materiaux fibreux
US5361641A (en) * 1992-12-21 1994-11-08 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Apparatus for performing high-temperature fiber push-out testing
IT1262407B (it) * 1993-09-06 1996-06-19 Finmeccanica Spa Strumentazione utilizzante componenti in ottica integrata per la diagnostica di parti con sensori a fibra ottica inclusi o fissati sulla superficie.
US5552890A (en) * 1994-04-19 1996-09-03 Tricor Systems, Inc. Gloss measurement system
US5683181A (en) * 1995-05-12 1997-11-04 Thermal Wave Imaging, Inc. Method and apparatus for enhancing thermal wave imaging of reflective low-emissivity solids
US6175416B1 (en) * 1996-08-06 2001-01-16 Brown University Research Foundation Optical stress generator and detector
US5659140A (en) * 1996-08-13 1997-08-19 Pavement Technology, Inc. Testing machine for pavement samples
US5913246A (en) * 1996-11-19 1999-06-15 Simonelli; Robert Joseph Mechanical stress test machine
US5783752A (en) * 1997-02-20 1998-07-21 Microe Diffuse surface interference position sensor
AU6330898A (en) * 1997-02-21 1998-09-09 Southwest Research Institute High-cycle fatigue test machine
US6055053A (en) * 1997-06-02 2000-04-25 Stress Photonics, Inc. Full field photoelastic stress analysis
US6341878B1 (en) * 1999-08-31 2002-01-29 Cognex Corporation Method and apparatus for providing uniform diffuse illumination to a surface
US6784982B1 (en) * 1999-11-04 2004-08-31 Regents Of The University Of Minnesota Direct mapping of DNA chips to detector arrays
FR2810737B1 (fr) * 2000-06-23 2003-04-18 Oreal Appareil et procede d'examen d'une surface
US6943869B2 (en) * 2002-10-04 2005-09-13 Resesarch Foundation, Inc. Method and apparatus for measuring strain using a luminescent photoelastic coating

Also Published As

Publication number Publication date
DE60310349T2 (de) 2007-07-12
ES2279068T3 (es) 2007-08-16
ATE348324T1 (de) 2007-01-15
US20060185440A1 (en) 2006-08-24
DK1424547T3 (da) 2007-04-10
DE60310349D1 (de) 2007-01-25
DE60335306D1 (de) 2011-01-20
EP1424547A2 (de) 2004-06-02
EP1424547A3 (de) 2004-10-27
EP1739403A1 (de) 2007-01-03
PT1424547E (pt) 2007-03-30
EP1424547B1 (de) 2006-12-13
US7047819B2 (en) 2006-05-23
US7610815B2 (en) 2009-11-03
EP1739403B1 (de) 2010-12-08
US20040145724A1 (en) 2004-07-29

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