ATE4072T1 - Objekthalter fuer inverse mikroskope. - Google Patents

Objekthalter fuer inverse mikroskope.

Info

Publication number
ATE4072T1
ATE4072T1 AT81105555T AT81105555T ATE4072T1 AT E4072 T1 ATE4072 T1 AT E4072T1 AT 81105555 T AT81105555 T AT 81105555T AT 81105555 T AT81105555 T AT 81105555T AT E4072 T1 ATE4072 T1 AT E4072T1
Authority
AT
Austria
Prior art keywords
holder
specimen
accepting
capability
object holder
Prior art date
Application number
AT81105555T
Other languages
German (de)
English (en)
Inventor
Horst Fischer
Friedrich K Dr. Moellring
Original Assignee
Firma Carl Zeiss
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Firma Carl Zeiss filed Critical Firma Carl Zeiss
Application granted granted Critical
Publication of ATE4072T1 publication Critical patent/ATE4072T1/de

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/26—Stages; Adjusting means therefor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/0088—Inverse microscopes
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S269/00—Work holders
    • Y10S269/902—Work holder member with v-shaped notch or groove

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Microscoopes, Condenser (AREA)
AT81105555T 1980-07-25 1981-07-15 Objekthalter fuer inverse mikroskope. ATE4072T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE3028154A DE3028154C2 (de) 1980-07-25 1980-07-25 Objekthalter für inverse Mikroskope
EP81105555A EP0045010B1 (de) 1980-07-25 1981-07-15 Objekthalter für inverse Mikroskope

Publications (1)

Publication Number Publication Date
ATE4072T1 true ATE4072T1 (de) 1983-07-15

Family

ID=6108042

Family Applications (1)

Application Number Title Priority Date Filing Date
AT81105555T ATE4072T1 (de) 1980-07-25 1981-07-15 Objekthalter fuer inverse mikroskope.

Country Status (5)

Country Link
US (1) US4436385A (US08197722-20120612-C00042.png)
EP (1) EP0045010B1 (US08197722-20120612-C00042.png)
JP (1) JPS5756812A (US08197722-20120612-C00042.png)
AT (1) ATE4072T1 (US08197722-20120612-C00042.png)
DE (1) DE3028154C2 (US08197722-20120612-C00042.png)

Families Citing this family (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6219613U (US08197722-20120612-C00042.png) * 1985-07-18 1987-02-05
US4722598A (en) * 1986-12-04 1988-02-02 Max M. Ford Diagnostic microscope slide having multiple sample wells and cover
JPS63119645U (US08197722-20120612-C00042.png) * 1987-01-28 1988-08-02
JP2500152Y2 (ja) * 1987-03-31 1996-06-05 株式会社ニコン 標本ホルダ
DE3731120A1 (de) * 1987-09-16 1989-03-30 Leitz Ernst Gmbh Universeller objekthalter fuer mikroskope
US5149071A (en) * 1991-11-04 1992-09-22 Oliveira Paul L Double-jaw vice for holding workpieces
DE69300928T2 (de) * 1992-03-11 1996-08-22 Mitsubishi Cable Ind Ltd Flexible Förderschnecke.
JP2846562B2 (ja) * 1993-11-04 1999-01-13 株式会社エス・テイ・ジャパン 顕微分析用試料ホルダ
US5568833A (en) * 1995-06-07 1996-10-29 Allison Engine Company, Inc. Method and apparatus for directional solidification of integral component casting
DE19606653C1 (de) * 1996-02-23 1997-01-16 Leica Ag Einrichtung zum Brechen von Dreiecks-Glasmessern für die Ultra-Mikrotomie
US6469779B2 (en) 1997-02-07 2002-10-22 Arcturus Engineering, Inc. Laser capture microdissection method and apparatus
US6495195B2 (en) * 1997-02-14 2002-12-17 Arcturus Engineering, Inc. Broadband absorbing film for laser capture microdissection
US5873566A (en) * 1997-04-17 1999-02-23 International Business Machines Corporation Locator actuation apparatus
US6005386A (en) * 1997-04-17 1999-12-21 International Business Machines Corporation Substrate tester method and apparatus having rotatable and infinitely adjustable locator jaws
US6043667A (en) * 1997-04-17 2000-03-28 International Business Machines Corporation Substrate tester location clamping, sensing, and contacting method and apparatus
US5917329A (en) * 1997-04-17 1999-06-29 International Business Machines Corporation Substrate tester having shorting pad actuator method and apparatus
US5955655A (en) * 1997-08-08 1999-09-21 Evans; Paul R. Replaceable test specimens for machines adapted to test material wear and lubrication properties and associated methods
US7075640B2 (en) * 1997-10-01 2006-07-11 Arcturus Bioscience, Inc. Consumable for laser capture microdissection
US5985085A (en) * 1997-10-01 1999-11-16 Arcturus Engineering, Inc. Method of manufacturing consumable for laser capture microdissection
US7473401B1 (en) 1997-12-04 2009-01-06 Mds Analytical Technologies (Us) Inc. Fluidic extraction of microdissected samples
EP1210577A2 (en) 1999-04-29 2002-06-05 Arcturus Engineering, Inc. Processing technology for lcm samples
AU2922701A (en) 1999-11-04 2001-05-14 Arcturus Engineering, Inc. Automated laser capture microdissection
US10156501B2 (en) 2001-11-05 2018-12-18 Life Technologies Corporation Automated microdissection instrument for determining a location of a laser beam projection on a worksurface area
US8715955B2 (en) 2004-09-09 2014-05-06 Life Technologies Corporation Laser microdissection apparatus and method
US8722357B2 (en) * 2001-11-05 2014-05-13 Life Technologies Corporation Automated microdissection instrument
JP4562165B2 (ja) * 2002-08-28 2010-10-13 株式会社東海ヒット 顕微鏡観察用培養器
US20050128575A1 (en) * 2003-12-11 2005-06-16 Leica Microsystems Inc. Microscope stage contrasting means
JP4740584B2 (ja) * 2004-12-14 2011-08-03 オリンパス株式会社 観察装置
DE102005009756B4 (de) * 2005-03-03 2007-03-01 Leica Microsystems (Schweiz) Ag Objekthalter für mikroskopische Untersuchungen
US7696770B2 (en) * 2007-01-26 2010-04-13 International Business Machines Corportion Self-centering nest for electronics testing
JP5342123B2 (ja) * 2007-09-19 2013-11-13 浜松ホトニクス株式会社 カートリッジ及び試験片測定装置
US20090139311A1 (en) 2007-10-05 2009-06-04 Applied Biosystems Inc. Biological Analysis Systems, Devices, and Methods
DE102012025612B3 (de) * 2012-03-29 2014-07-24 Leica Microsystems Cms Gmbh Halterung für Probenträger unterschiedlicher Form und Größe sowie Mikroskoptisch mit einer solchen Halterung
DE202012102044U1 (de) * 2012-03-29 2012-07-16 Leica Microsystems Cms Gmbh Halterung für Probenträger unterschiedlicher Form und Größe
CN107850620B (zh) * 2015-06-25 2020-11-17 布鲁克纳米公司 用于扫描探针显微镜的样本容器保持器

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE7232969U (de) * 1973-03-15 Leitz E Gmbh Objekttisch für optische Geräte
US3765745A (en) * 1972-04-10 1973-10-16 Zeiss Stiftung Microscope stage
DE2242887C3 (de) * 1972-08-31 1975-10-02 Wilhelm Will Kg, Optisches Werk, 6331 Nauborn Kreuztisch für Mikroskope
US4012111A (en) * 1975-08-25 1977-03-15 Honeywell Inc. Microscope object slide positioning system

Also Published As

Publication number Publication date
DE3028154C2 (de) 1986-07-03
JPS5756812A (en) 1982-04-05
US4436385A (en) 1984-03-13
JPS6223843B2 (US08197722-20120612-C00042.png) 1987-05-26
DE3028154A1 (de) 1982-03-11
EP0045010B1 (de) 1983-07-06
EP0045010A1 (de) 1982-02-03

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Legal Events

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