ATE392044T1 - Komparator-offsetkallibration für a/d-umsetzer - Google Patents
Komparator-offsetkallibration für a/d-umsetzerInfo
- Publication number
- ATE392044T1 ATE392044T1 AT03745492T AT03745492T ATE392044T1 AT E392044 T1 ATE392044 T1 AT E392044T1 AT 03745492 T AT03745492 T AT 03745492T AT 03745492 T AT03745492 T AT 03745492T AT E392044 T1 ATE392044 T1 AT E392044T1
- Authority
- AT
- Austria
- Prior art keywords
- comparator
- dac
- ccu
- array
- converters
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1009—Calibration
- H03M1/1033—Calibration over the full range of the converter, e.g. for correcting differential non-linearity
- H03M1/1057—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by trimming, i.e. by individually adjusting at least part of the quantisation value generators or stages to their nominal values
- H03M1/1061—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by trimming, i.e. by individually adjusting at least part of the quantisation value generators or stages to their nominal values using digitally programmable trimming circuits
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/34—Analogue value compared with reference values
- H03M1/36—Analogue value compared with reference values simultaneously only, i.e. parallel type
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Analogue/Digital Conversion (AREA)
- Measurement Of Current Or Voltage (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW091106646A TWI270255B (en) | 2002-02-13 | 2002-04-02 | Comparator offset calibration for A/D converters |
PCT/SE2003/000297 WO2003084071A1 (en) | 2002-04-02 | 2003-02-24 | Comparator offset calibration for a/d converters |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE392044T1 true ATE392044T1 (de) | 2008-04-15 |
Family
ID=28673310
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT03745492T ATE392044T1 (de) | 2002-04-02 | 2003-02-24 | Komparator-offsetkallibration für a/d-umsetzer |
Country Status (6)
Country | Link |
---|---|
US (1) | US7075465B2 (de) |
EP (1) | EP1614219B1 (de) |
CN (1) | CN100517974C (de) |
AT (1) | ATE392044T1 (de) |
AU (1) | AU2003210085A1 (de) |
WO (1) | WO2003084071A1 (de) |
Families Citing this family (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7196552B2 (en) * | 2005-04-12 | 2007-03-27 | Hewlett-Packard Development Company, L.P. | Comparator circuit with offset cancellation |
US7280064B2 (en) * | 2005-09-08 | 2007-10-09 | Realtek Semiconductor Corp. | Pipeline ADC with minimum overhead digital error correction |
US7352307B2 (en) * | 2006-02-09 | 2008-04-01 | Atmel Corporation | Comparator chain offset reduction |
US7688237B2 (en) * | 2006-12-21 | 2010-03-30 | Broadcom Corporation | Apparatus and method for analog-to-digital converter calibration |
US7589650B2 (en) * | 2006-12-29 | 2009-09-15 | Industrial Technology Research Institute | Analog-to-digital converter with calibration |
US8098087B1 (en) * | 2007-03-05 | 2012-01-17 | Altera Corporation | Method and apparatus for standby voltage offset cancellation |
KR101448917B1 (ko) * | 2007-09-11 | 2014-10-13 | 삼성전자주식회사 | 의사 멀티플 샘플링 방법을 사용하는 아날로그-디지털 변환장치 및 방법 |
US7511652B1 (en) | 2007-12-31 | 2009-03-31 | Industrial Technology Research Institute | Comparison device and analog-to-digital converter |
US7750830B2 (en) * | 2008-10-22 | 2010-07-06 | Industrial Technology Research Institute | Calibration device and method thereof for pipelined analog-to-digital converter |
US8451154B2 (en) * | 2008-10-22 | 2013-05-28 | Integrated Device Technology, Inc. | Pipelined ADC calibration |
US7880657B2 (en) * | 2009-02-26 | 2011-02-01 | Avago Technologies Ecbu Ip (Singapore) Pte. Ltd. | Interpolation accuracy improvement in motion encoder systems, devices and methods |
US7880658B2 (en) * | 2009-02-26 | 2011-02-01 | Avago Technologies Ecbu Ip (Singapore) Pte. Ltd. | Interpolation accuracy improvement in motion encoder systems, devices and methods |
JP2011040911A (ja) * | 2009-08-07 | 2011-02-24 | Renesas Electronics Corp | アナログ/デジタル変換回路及び補正方法 |
US8836549B2 (en) * | 2011-12-20 | 2014-09-16 | Analog Devices, Inc. | Use of logic circuit embedded into comparator for foreground offset cancellation |
CN103546152B (zh) * | 2012-07-13 | 2016-12-21 | 奇景光电股份有限公司 | 管线架构模拟数字转换器及其偏移电压影响校正方法 |
US8878713B1 (en) * | 2013-06-20 | 2014-11-04 | Fujitsu Limited | Crossbar switch calibration system for facilitating analog-to-digital conversion monotonicity |
CN103346793B (zh) * | 2013-07-19 | 2016-12-28 | 深圳创维-Rgb电子有限公司 | 一种adc自动校正的方法及装置 |
CN104348486B (zh) * | 2014-11-13 | 2017-11-17 | 复旦大学 | 一种带冗余位单级折叠内插流水线型模数转换器 |
US9557756B2 (en) * | 2015-02-10 | 2017-01-31 | Infineon Technologies Ag | Bias drift compensation |
CN105971976A (zh) * | 2016-05-25 | 2016-09-28 | 广西柳工机械股份有限公司 | 利用电压型压力传感器测量工程机械液压压力的方法 |
US11671286B2 (en) | 2018-12-12 | 2023-06-06 | Rambus Inc. | Live offset cancellation of the decision feedback equalization data slicers |
CN113328748B (zh) * | 2021-04-30 | 2023-12-15 | 澳门大学 | 模数转换电路 |
CN115642914B (zh) * | 2022-11-17 | 2023-03-21 | 湖南进芯电子科技有限公司 | 流水线型模数转换器校正电路、模数转换电路及方法 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2333171A (en) | 1998-01-08 | 1999-07-14 | Fujitsu Microelectronics Ltd | Thermometer coding circuitry |
US6052325A (en) * | 1998-05-22 | 2000-04-18 | Micron Technology, Inc. | Method and apparatus for translating signals |
US6515464B1 (en) * | 2000-09-29 | 2003-02-04 | Microchip Technology Incorporated | Input voltage offset calibration of an analog device using a microcontroller |
DE60119476T2 (de) | 2000-10-26 | 2006-11-23 | Fujitsu Ltd., Kawasaki | Segmentierte Schaltungsanordnung |
TW521505B (en) | 2000-12-18 | 2003-02-21 | Kai Hsiu Electronics Co Ltd | Self-calibration circuit of high-speed comparator |
SE522569C2 (sv) * | 2001-02-27 | 2004-02-17 | Ericsson Telefon Ab L M | Dynamisk elemetanpassning i a/d-omvandlare |
SE518900C2 (sv) * | 2001-03-26 | 2002-12-03 | Ericsson Telefon Ab L M | Metod och anordning för kalibrering av A/D-omvandlare med bubbelhantering |
US6720757B2 (en) | 2002-03-26 | 2004-04-13 | Broadcom Corporation | Variable gain received signal strength indicator |
-
2003
- 2003-02-24 WO PCT/SE2003/000297 patent/WO2003084071A1/en not_active Application Discontinuation
- 2003-02-24 CN CNB038078481A patent/CN100517974C/zh not_active Expired - Fee Related
- 2003-02-24 EP EP03745492A patent/EP1614219B1/de not_active Expired - Lifetime
- 2003-02-24 AU AU2003210085A patent/AU2003210085A1/en not_active Abandoned
- 2003-02-24 AT AT03745492T patent/ATE392044T1/de not_active IP Right Cessation
- 2003-02-24 US US10/509,828 patent/US7075465B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
AU2003210085A1 (en) | 2003-10-13 |
CN100517974C (zh) | 2009-07-22 |
WO2003084071A1 (en) | 2003-10-09 |
EP1614219A1 (de) | 2006-01-11 |
US20050219090A1 (en) | 2005-10-06 |
US7075465B2 (en) | 2006-07-11 |
CN1647388A (zh) | 2005-07-27 |
EP1614219B1 (de) | 2008-04-09 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |