ATE391894T1 - Verfahren zur optischen distanzenmessung - Google Patents

Verfahren zur optischen distanzenmessung

Info

Publication number
ATE391894T1
ATE391894T1 AT02737670T AT02737670T ATE391894T1 AT E391894 T1 ATE391894 T1 AT E391894T1 AT 02737670 T AT02737670 T AT 02737670T AT 02737670 T AT02737670 T AT 02737670T AT E391894 T1 ATE391894 T1 AT E391894T1
Authority
AT
Austria
Prior art keywords
specular
source
detector
fixed part
measurement head
Prior art date
Application number
AT02737670T
Other languages
English (en)
Inventor
Marc Schyns
Cecile Mathy
Original Assignee
Centre Rech Metallurgique
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre Rech Metallurgique filed Critical Centre Rech Metallurgique
Application granted granted Critical
Publication of ATE391894T1 publication Critical patent/ATE391894T1/de

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/30Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/30Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/306Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C2/00Hot-dipping or immersion processes for applying the coating material in the molten state without affecting the shape; Apparatus therefor
    • C23C2/003Apparatus
    • C23C2/0034Details related to elements immersed in bath
    • C23C2/00342Moving elements, e.g. pumps or mixers
    • C23C2/00344Means for moving substrates, e.g. immersed rollers or immersed bearings
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C2/00Hot-dipping or immersion processes for applying the coating material in the molten state without affecting the shape; Apparatus therefor
    • C23C2/14Removing excess of molten coatings; Controlling or regulating the coating thickness
    • C23C2/16Removing excess of molten coatings; Controlling or regulating the coating thickness using fluids under pressure, e.g. air knives
    • C23C2/18Removing excess of molten coatings from elongated material
    • C23C2/20Strips; Plates
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C2/00Hot-dipping or immersion processes for applying the coating material in the molten state without affecting the shape; Apparatus therefor
    • C23C2/50Controlling or regulating the coating processes
    • C23C2/52Controlling or regulating the coating processes with means for measuring or sensing
    • C23C2/524Position of the substrate

Landscapes

  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Coating With Molten Metal (AREA)
  • Measurement Of Optical Distance (AREA)
  • Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
AT02737670T 2001-08-30 2002-05-28 Verfahren zur optischen distanzenmessung ATE391894T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
BE2001/0567A BE1014355A3 (fr) 2001-08-30 2001-08-30 Procede et dispositif pour la mesure de distances sur des bandes de metal brillant.

Publications (1)

Publication Number Publication Date
ATE391894T1 true ATE391894T1 (de) 2008-04-15

Family

ID=3897089

Family Applications (1)

Application Number Title Priority Date Filing Date
AT02737670T ATE391894T1 (de) 2001-08-30 2002-05-28 Verfahren zur optischen distanzenmessung

Country Status (11)

Country Link
US (1) US7054013B2 (de)
EP (1) EP1421330B1 (de)
JP (1) JP3935469B2 (de)
KR (1) KR100890355B1 (de)
AT (1) ATE391894T1 (de)
BE (1) BE1014355A3 (de)
BR (1) BR0205972B1 (de)
CA (1) CA2426188C (de)
DE (1) DE60226039T2 (de)
ES (1) ES2303858T3 (de)
WO (1) WO2003019114A1 (de)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002525563A (ja) * 1998-09-14 2002-08-13 ベトリープスフォルシュンクスインスティトゥート・ファウデーエーハー・インスティトゥート・フュア・アンゲバンテ・フォルシュンク・ゲーエムベーハー 平坦製品の表面形状寸法及び平面度のための測定装置
BE1015581A3 (fr) * 2003-06-25 2005-06-07 Ct Rech Metallurgiques Asbl Procede et dispositif pour la determination et la correction en ligne des ondulations a la surface d'une bande d'acier revetue.
JP2006349534A (ja) * 2005-06-16 2006-12-28 Fujinon Corp 動体測定用干渉計装置および動体測定用光干渉計測方法
US8441532B2 (en) * 2009-02-24 2013-05-14 Corning Incorporated Shape measurement of specular reflective surface
US20100277748A1 (en) * 2009-04-30 2010-11-04 Sergey Potapenko Method and System for Measuring Relative Positions Of A Specular Reflection Surface
KR102453714B1 (ko) * 2011-02-28 2022-10-11 아르셀러미탈 인베스티가시온 와이 데살롤로 에스엘 핫 딥 코팅 라인 상의 스나우트 내부를 실시간 비디오 이미징하는 방법 및 장치
US10018467B2 (en) * 2011-06-09 2018-07-10 Clark Alexander Bendall System and method for measuring a distance to an object
DE102012003114B4 (de) * 2012-02-16 2014-02-13 Audiodev Gmbh Verfahren zum messen des abstands zwischen zwei gegenständen
US10288423B2 (en) * 2013-12-09 2019-05-14 Hatch Ltd. Measuring apparatus for determining distances to points on a reflective surface coated with metal and method for same
EP3643804B1 (de) 2018-10-24 2023-06-07 John Cockerill S.A. Verfahren zur steuerung der gleichförmigkeit des beschichtungsgewichts in industriellen verzinkungsanlagen
TWI725861B (zh) * 2020-05-29 2021-04-21 中國鋼鐵股份有限公司 鋼帶中心位置虛擬量測器及其量測方法
CN113405608B (zh) * 2021-07-07 2022-11-18 淮南泰隆机械制造有限公司 一种铁丝镀锌膜监测系统及其工作方法
CN114812457B (zh) * 2022-06-28 2022-09-23 太原理工大学 光路对准自调节的激光超声金属复合板测厚装置及方法
CN117821881A (zh) * 2024-01-11 2024-04-05 山东金富泰钢铁有限公司 一种镀锌板生产加工用可调式气刀及其使用方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2913879C2 (de) * 1979-04-06 1982-10-28 Frieseke & Hoepfner Gmbh, 8520 Erlangen Verfahren zur Regelung der Dicke von laufenden Meßgutbahnen
US4735508A (en) * 1986-06-02 1988-04-05 Honeywell Inc. Method and apparatus for measuring a curvature of a reflective surface
CA1266562A (en) * 1986-09-24 1990-03-13 Donald Stewart Distance measuring apparatus
US4948258A (en) * 1988-06-27 1990-08-14 Harbor Branch Oceanographic Institute, Inc. Structured illumination surface profiling and ranging systems and methods
US5087822A (en) * 1990-06-22 1992-02-11 Alcan International Limited Illumination system with incident beams from near and far dark field for high speed surface inspection of rolled aluminum sheet
DE59304141D1 (de) * 1992-07-16 1996-11-14 Duma Masch Anlagenbau Beschichtungsvorrichtung
US5477332A (en) * 1992-12-17 1995-12-19 Mcdonnell Douglas Corporation Digital image system and method for determining surface reflective and refractive characteristics of objects
DE4422861C2 (de) * 1994-06-30 1996-05-09 Honeywell Ag Vorrichtung zur Bestimmung von Materialeigenschaften von bewegtem blattförmigem Material
WO1998021550A1 (en) * 1996-11-12 1998-05-22 National Research Council Of Canada System and method for capturing a range image of a reflective surface
US6154279A (en) * 1998-04-09 2000-11-28 John W. Newman Method and apparatus for determining shapes of countersunk holes

Also Published As

Publication number Publication date
BE1014355A3 (fr) 2003-09-02
DE60226039T2 (de) 2009-05-14
DE60226039D1 (de) 2008-05-21
JP2005500547A (ja) 2005-01-06
KR100890355B1 (ko) 2009-03-25
CA2426188C (en) 2009-10-06
EP1421330B1 (de) 2008-04-09
US20040095584A1 (en) 2004-05-20
EP1421330A1 (de) 2004-05-26
CA2426188A1 (en) 2003-03-06
JP3935469B2 (ja) 2007-06-20
ES2303858T3 (es) 2008-09-01
BR0205972B1 (pt) 2013-09-03
US7054013B2 (en) 2006-05-30
BR0205972A (pt) 2003-09-30
WO2003019114A1 (fr) 2003-03-06
KR20040030448A (ko) 2004-04-09

Similar Documents

Publication Publication Date Title
ATE391894T1 (de) Verfahren zur optischen distanzenmessung
FI94551B (fi) Menetelmä ja laite liikkuvan työkappaleen pintaprofiilin tarkkailemiseksi
ATE284528T1 (de) Verfahren zum berührungslosen messen von geometrien von gegenständen
WO2000026609A3 (en) Method and apparatus for measuring substrate layer thickness during chemical mechanical polishing
CA2250435A1 (en) Method for the contact-free measurement of the distance of an object according to the principle of laser triangulation
EP0911001A3 (de) Einrichtung zum Messen eines optischen, kennzeichnenden Parameters
EP1677158A3 (de) Verfahrung zur Messung von Substratinformationen und Substrat für Gebrauch in einem lithografischen Apparat
WO2002097878A3 (en) Method and apparatus for determining process layer conformality
WO2012144904A4 (en) Position determination in a lithography system using a substrate having a partially reflective position mark
DE69927367D1 (de) Optoelektronische Formerfassung durch chromatische Kodierung mit Beleuchtungsebenen
DE50115839D1 (de) Verfahren und anordnung zur optischen positionsbestimmung eines bewegbaren spiegels
DE50008595D1 (de) Verfahren und vorrichtung zur detektion mikroskopisch kleiner objekte
EP0953836A3 (de) Oberflächenplasmonensensor
EP1227313A3 (de) Chip zur Messung durch Oberflächenplasmonenresonanz und Verfahren zu deren Herstellung
ATE294371T1 (de) Verfahren und vorrichtung zum erfassen eines biegewinkels an einem werkstück
ATE173814T1 (de) Verfahren und vorrichtung zur hochgenauen abstandsmessung von oberflächen
ATE467114T1 (de) Streumesser und verfahren zur untersuchung einer oberfläche
IT1257106B (it) Dispositivo per determinare la posizione di una cimossa ricavata tramite una fessura nello spessore di parete di una pezza in movimento
DE50008374D1 (de) Vorrichtung und Verfahren zur Justierung eines Abstandsmessgeräts
EP1265051A3 (de) Eine Methode und eine Vorrichtung zur Überwachung eines bewegten linearen Textilgewebes
ATE439569T1 (de) Messung der pyramidengrösse auf einer texturierten oberfläche
ATE453851T1 (de) Optischer sensor zur messung des abstands und der neigung einer fläche
JP2730546B2 (ja) 外部シャッタユニット
RU2310159C2 (ru) Способ измерения диаметра тонких протяженных нитей
DE50308028D1 (de) Vorrichtung und verfahren zur aufzeichnung der oberflächenbeschaffenheit eines faserartig strukturierten langestreckten gegenstandes

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties