ATE323275T1 - Verfahren zur bestimmung der grösse der deformation eines taststiftes - Google Patents
Verfahren zur bestimmung der grösse der deformation eines taststiftesInfo
- Publication number
- ATE323275T1 ATE323275T1 AT01201247T AT01201247T ATE323275T1 AT E323275 T1 ATE323275 T1 AT E323275T1 AT 01201247 T AT01201247 T AT 01201247T AT 01201247 T AT01201247 T AT 01201247T AT E323275 T1 ATE323275 T1 AT E323275T1
- Authority
- AT
- Austria
- Prior art keywords
- deformation
- style
- determining
- size
- touch probe
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/042—Calibration or calibration artifacts
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/045—Correction of measurements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/004—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points
- G01B5/008—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
- G01B5/012—Contact-making feeler heads therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/30—Measuring arrangements characterised by the use of mechanical techniques for measuring the deformation in a solid, e.g. mechanical strain gauge
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- A Measuring Device Byusing Mechanical Method (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP01201247A EP1248073B1 (de) | 2001-04-03 | 2001-04-03 | Verfahren zur Bestimmung der Grösse der Deformation eines Taststiftes |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE323275T1 true ATE323275T1 (de) | 2006-04-15 |
Family
ID=8180104
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT01201247T ATE323275T1 (de) | 2001-04-03 | 2001-04-03 | Verfahren zur bestimmung der grösse der deformation eines taststiftes |
Country Status (5)
Country | Link |
---|---|
US (1) | US6776023B2 (de) |
EP (1) | EP1248073B1 (de) |
JP (1) | JP2002310636A (de) |
AT (1) | ATE323275T1 (de) |
DE (1) | DE60118701T2 (de) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102006033443A1 (de) * | 2006-07-19 | 2008-01-31 | Saphirwerk Industrieprodukte Ag | Taststift mit integriertem RFID-Chip |
US7681432B2 (en) * | 2006-12-12 | 2010-03-23 | Agilent Technologies, Inc. | Calibrating force and displacement sensors of mechanical probes |
DE102007051054A1 (de) * | 2007-10-19 | 2009-04-30 | Carl Zeiss Industrielle Messtechnik Gmbh | Verfahren zum Korrigieren der Messwerte eines Koordinatenmessgeräts und Koordinatenmessgerät |
ES2559187T3 (es) * | 2011-07-06 | 2016-02-10 | Hexagon Metrology S.P.A. | Método de calibración de un modelo matemático para una máquina de medición de coordenadas para la compensación de errores dinámicos debidos a la deformación |
CN103486953B (zh) * | 2013-08-30 | 2016-02-24 | 广西玉柴机器股份有限公司 | 一种活塞环挠曲度通用检具 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3933575A1 (de) * | 1989-10-07 | 1991-04-18 | Hartmut Prof Dr Janocha | Tasteinrichtung |
US5321977A (en) * | 1992-12-31 | 1994-06-21 | International Business Machines Corporation | Integrated tip strain sensor for use in combination with a single axis atomic force microscope |
DE4436507A1 (de) * | 1994-10-13 | 1996-04-18 | Zeiss Carl Fa | Verfahren zur Koordinatenmessung an Werkstücken |
ATE199042T1 (de) * | 1995-03-10 | 2001-02-15 | Heidenhain Gmbh Dr Johannes | Mehrkoordinaten-tastkopf mit gleichen auslenkungen |
GB9517214D0 (en) * | 1995-08-23 | 1995-10-25 | Renishaw Plc | Calibration of an articulating probe head for a coordinating positioning machine |
DE19824107A1 (de) * | 1998-05-29 | 1999-12-23 | Werth Messtechnik Gmbh | Tastschnittverfahren sowie Anordnung zur Messgrößenbestimmung einer Oberfläche eines Prüflings nach dem Tastschnittverfahren |
GB9907644D0 (en) * | 1999-04-06 | 1999-05-26 | Renishaw Plc | Surface sensing device with optical sensor |
-
2001
- 2001-04-03 DE DE60118701T patent/DE60118701T2/de not_active Expired - Lifetime
- 2001-04-03 AT AT01201247T patent/ATE323275T1/de active
- 2001-04-03 EP EP01201247A patent/EP1248073B1/de not_active Expired - Lifetime
-
2002
- 2002-03-29 US US10/108,872 patent/US6776023B2/en not_active Expired - Fee Related
- 2002-04-02 JP JP2002099989A patent/JP2002310636A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
DE60118701D1 (de) | 2006-05-24 |
US20020138999A1 (en) | 2002-10-03 |
US6776023B2 (en) | 2004-08-17 |
EP1248073B1 (de) | 2006-04-12 |
JP2002310636A (ja) | 2002-10-23 |
DE60118701T2 (de) | 2007-04-12 |
EP1248073A1 (de) | 2002-10-09 |
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Legal Events
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UEP | Publication of translation of european patent specification |
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