ATE284023T1 - Stabilisiertes fabry-perot interferometer und verfahren zum stabilisieren eines fabry-perot interferometers - Google Patents

Stabilisiertes fabry-perot interferometer und verfahren zum stabilisieren eines fabry-perot interferometers

Info

Publication number
ATE284023T1
ATE284023T1 AT02013601T AT02013601T ATE284023T1 AT E284023 T1 ATE284023 T1 AT E284023T1 AT 02013601 T AT02013601 T AT 02013601T AT 02013601 T AT02013601 T AT 02013601T AT E284023 T1 ATE284023 T1 AT E284023T1
Authority
AT
Austria
Prior art keywords
interferometer
fabry
perot interferometer
stabilizing
stabilized
Prior art date
Application number
AT02013601T
Other languages
English (en)
Inventor
John R Sandercock
Original Assignee
John R Sandercock
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by John R Sandercock filed Critical John R Sandercock
Application granted granted Critical
Publication of ATE284023T1 publication Critical patent/ATE284023T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J3/26—Generating the spectrum; Monochromators using multiple reflection, e.g. Fabry-Perot interferometer, variable interference filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Electrochromic Elements, Electrophoresis, Or Variable Reflection Or Absorption Elements (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Optical Filters (AREA)
AT02013601T 2002-06-19 2002-06-19 Stabilisiertes fabry-perot interferometer und verfahren zum stabilisieren eines fabry-perot interferometers ATE284023T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP02013601A EP1376080B1 (de) 2002-06-19 2002-06-19 Stabilisiertes Fabry-Perot Interferometer und Verfahren zum Stabilisieren eines Fabry-Perot Interferometers

Publications (1)

Publication Number Publication Date
ATE284023T1 true ATE284023T1 (de) 2004-12-15

Family

ID=29716792

Family Applications (1)

Application Number Title Priority Date Filing Date
AT02013601T ATE284023T1 (de) 2002-06-19 2002-06-19 Stabilisiertes fabry-perot interferometer und verfahren zum stabilisieren eines fabry-perot interferometers

Country Status (5)

Country Link
US (1) US6989906B2 (de)
EP (1) EP1376080B1 (de)
JP (1) JP2004020564A (de)
AT (1) ATE284023T1 (de)
DE (1) DE60202137T2 (de)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1586854A3 (de) * 2004-04-15 2006-02-08 Davidson Instruments Interferometrischer Signalkonditionierer zur Messung der absoluten Länge von Spalten in einem fiberoptischen Fabry-Pérot-Interferometer
US7492463B2 (en) 2004-04-15 2009-02-17 Davidson Instruments Inc. Method and apparatus for continuous readout of Fabry-Perot fiber optic sensor
EP1681540A1 (de) * 2004-12-21 2006-07-19 Davidson Instruments, Inc. Mehrkanalarrayprozessor
EP1674833A3 (de) * 2004-12-21 2007-05-30 Davidson Instruments, Inc. Faseroptisches Sensorsystem
EP1869737B1 (de) * 2005-03-16 2021-05-12 Davidson Instruments, Inc. Hochintensitäts-fabry-perot-sensor
WO2007033069A2 (en) * 2005-09-13 2007-03-22 Davidson Instruments Inc. Tracking algorithm for linear array signal processor for fabry-perot cross-correlation pattern and method of using same
US7684051B2 (en) 2006-04-18 2010-03-23 Halliburton Energy Services, Inc. Fiber optic seismic sensor based on MEMS cantilever
EP2021747B1 (de) * 2006-04-26 2018-08-01 Halliburton Energy Services, Inc. Faseroptischer seismischer mems-sensor mit von schwenkbalken getragener masse
US7599413B2 (en) * 2006-05-19 2009-10-06 Pavilion Integration Corp. Self-contained module for injecting signal into slave laser without any modifications or adaptations to it
US8115937B2 (en) * 2006-08-16 2012-02-14 Davidson Instruments Methods and apparatus for measuring multiple Fabry-Perot gaps
US7633624B1 (en) * 2006-11-06 2009-12-15 Itt Manufacturing Enterprises, Inc. Self compensating cube corner interferometer
US20080123104A1 (en) * 2006-11-27 2008-05-29 Roctest Ltee High selectivity band-pass interferometer with tuning capabilities
CA2676246C (en) * 2007-01-24 2013-03-19 Halliburton Energy Services, Inc. Transducer for measuring environmental parameters
JP6036341B2 (ja) * 2013-01-29 2016-11-30 セイコーエプソン株式会社 光学モジュール、及び電子機器

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4444501A (en) * 1982-02-12 1984-04-24 The United States Of America As Represented By The Secretary Of Commerce Stabilization mechanism for optical interferometer
US4583228A (en) * 1983-11-21 1986-04-15 At&T Bell Laboratories Frequency stabilization of lasers
US4850709A (en) * 1986-03-04 1989-07-25 Canon Kabushiki Kaisha Fabri-perot spectroscopy method and apparatus utilizing the same
JPH0339712A (ja) * 1989-07-06 1991-02-20 Nec Corp 光ビーム結合器
US5172383A (en) * 1990-09-19 1992-12-15 At&T Bell Laboratories Mode partition noise screening apparatus
US5835214A (en) * 1991-02-22 1998-11-10 Applied Spectral Imaging Ltd. Method and apparatus for spectral analysis of images
US5471300A (en) * 1994-04-12 1995-11-28 Northrop Grumman Corporation Apparatus and method for providing a feedback measurement in a laser system
FR2730868B1 (fr) * 1995-02-21 1997-04-25 Commissariat Energie Atomique Capteur a reseau de bragg photoinscrit a bon rapport signal sur bruit
US6282213B1 (en) * 1998-09-14 2001-08-28 Interscience, Inc. Tunable diode laser with fast digital line selection
FR2786937B1 (fr) * 1998-12-04 2001-02-16 Photonetics Source multi-longueur d'onde
US6819429B2 (en) * 2000-04-07 2004-11-16 Exfo Electro-Optical Engineering Inc. Multi-pass optical spectrum analyzer having a polarization-dependent tunable filter
US6804324B2 (en) * 2001-03-01 2004-10-12 Osmo, Inc. X-ray phase contrast imaging using a fabry-perot interferometer concept
US6744524B1 (en) * 2002-06-03 2004-06-01 Nortel Networks Limited Method and apparatus for calibrating a fabry-perot interferometer based measurement system

Also Published As

Publication number Publication date
EP1376080A1 (de) 2004-01-02
US6989906B2 (en) 2006-01-24
DE60202137D1 (de) 2005-01-05
JP2004020564A (ja) 2004-01-22
US20040021872A1 (en) 2004-02-05
DE60202137T2 (de) 2005-03-31
EP1376080B1 (de) 2004-12-01

Similar Documents

Publication Publication Date Title
DE60202137D1 (de) Stabilisiertes Fabry-Perot Interferometer und Verfahren zum Stabilisieren eines Fabry-Perot Interferometers
AU2005243045B2 (en) Optical inspection of surfaces open to different directions in a piece of material
JP2004504586A5 (de)
DK0852715T3 (da) Integreret optisk interferometrisk sensor
ATE367762T1 (de) Durch verfolgung der retina unterstützte optische kohärenztomographie
JP2004512125A5 (de)
JPS5887886A (ja) リングレ−ザ・ジヤイロスコ−プにおいてビ−ム・ロツク・インを最小にする装置および方法
EP1393115A4 (de) Systeme und verfahren zum scannen einer probe mit einem lichtstrahl
JP2008047653A5 (de)
KR920001957A (ko) 물체 위치 및 방위 광학적 결정 디바이스
DE69622896D1 (de) Verbesserungen an Oberflächenkrümmungsmessungen
Ding et al. A compact and high-precision method for active beam stabilization system
AU2002358120A1 (en) Centreline identification in a docking guidance system
ATE285082T1 (de) Scanner
EP1308875A3 (de) Hochgeschwindigkeitslaserabtastmodul mit gefaltetem Strahlengang
JP2003194518A (ja) レーザ距離計測装置
EP1195752A3 (de) Laserlichtintensitätssteuerungsvorrichtung
JP2760181B2 (ja) 狭帯域レーザ装置
Barrett et al. High-bandwidth interferometer for real-time measurement of deformable mirrors
JP2004144614A (ja) 干渉計
ATE376166T1 (de) Photothermisches messsystem
WO2004111575A3 (en) Interferometric absolute and real-time surface curvature sensor insensitive to tilt, translation and vibration
ATE152237T1 (de) Interferometer bestehend aus einer integrierten anordnung und einem reflektierenden teil, die durch eine messzone voneinander getrennt sind
JPH1068603A (ja) 空間位置決め方法
JPS6328091A (ja) レ−ザ発振器の発振波長安定化装置

Legal Events

Date Code Title Description
UEP Publication of translation of european patent specification

Ref document number: 1376080

Country of ref document: EP

REN Ceased due to non-payment of the annual fee