ATE24614T1 - Anordnung zur veraenderung der kontaktabstaende eines kontaktfeldrasters an einem leiterplattenpruefgeraet. - Google Patents

Anordnung zur veraenderung der kontaktabstaende eines kontaktfeldrasters an einem leiterplattenpruefgeraet.

Info

Publication number
ATE24614T1
ATE24614T1 AT84113375T AT84113375T ATE24614T1 AT E24614 T1 ATE24614 T1 AT E24614T1 AT 84113375 T AT84113375 T AT 84113375T AT 84113375 T AT84113375 T AT 84113375T AT E24614 T1 ATE24614 T1 AT E24614T1
Authority
AT
Austria
Prior art keywords
contact
cards
changing
density
contacts
Prior art date
Application number
AT84113375T
Other languages
German (de)
English (en)
Inventor
Hubert Dipl-Phys Driller
Paul Mang
Original Assignee
Mania Elekt Automat Entwick
Paul Mang
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mania Elekt Automat Entwick, Paul Mang filed Critical Mania Elekt Automat Entwick
Application granted granted Critical
Publication of ATE24614T1 publication Critical patent/ATE24614T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
AT84113375T 1983-11-07 1984-11-06 Anordnung zur veraenderung der kontaktabstaende eines kontaktfeldrasters an einem leiterplattenpruefgeraet. ATE24614T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE3340179A DE3340179C1 (de) 1983-11-07 1983-11-07 Anordnung an einem Leiterplattenpruefgeraet zur Anpassung der Abstaende von Kontakten
EP84113375A EP0142119B1 (de) 1983-11-07 1984-11-06 Anordnung zur Veränderung der Kontaktabstände eines Kontaktfeldrasters an einem Leiterplattenprüfgerät

Publications (1)

Publication Number Publication Date
ATE24614T1 true ATE24614T1 (de) 1987-01-15

Family

ID=6213643

Family Applications (1)

Application Number Title Priority Date Filing Date
AT84113375T ATE24614T1 (de) 1983-11-07 1984-11-06 Anordnung zur veraenderung der kontaktabstaende eines kontaktfeldrasters an einem leiterplattenpruefgeraet.

Country Status (6)

Country Link
US (1) US4614386A (cg-RX-API-DMAC7.html)
EP (1) EP0142119B1 (cg-RX-API-DMAC7.html)
JP (1) JPS60161569A (cg-RX-API-DMAC7.html)
AT (1) ATE24614T1 (cg-RX-API-DMAC7.html)
CA (1) CA1221470A (cg-RX-API-DMAC7.html)
DE (2) DE3340179C1 (cg-RX-API-DMAC7.html)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ATE40603T1 (de) * 1985-11-12 1989-02-15 Mania Gmbh Leiterplattenpruefgeraet mit einem kontaktpunktraster erhoehter kontaktpunktdichte.
DE3630548A1 (de) * 1986-09-08 1988-03-10 Mania Gmbh Vorrichtung zum elektronischen pruefen von leiterplatten mit kontaktpunkten im 1/20 zoll-raster
DE3638372A1 (de) * 1986-11-11 1988-05-26 Lang Dahlke Helmut Vorrichtung zum pruefen von elektrischen leiterplatten
DE3806792A1 (de) * 1988-02-29 1989-09-07 Siemens Ag Vorrichtung zum pruefen von leiterplatten
DE3806793A1 (de) * 1988-02-29 1989-09-07 Siemens Ag Adaptereinrichtung fuer eine vorrichtung zum pruefen von leiterplatten
DE8908326U1 (de) * 1989-07-07 1989-09-07 Siemens AG, 1000 Berlin und 8000 München Adaptiervorrichtung zur Prüfung von filmmontierten integrierten Bausteinen
US5061190A (en) * 1990-08-14 1991-10-29 Ziatech Corporation Double density backward and forward compatible card edge connector system
EP0508561B1 (en) 1991-04-11 1996-07-17 METHODE ELECTRONICS, Inc. Apparatus for electronically testing printed circuit boards or the like
US5216361A (en) * 1991-07-10 1993-06-01 Schlumberger Technologies, Inc. Modular board test system having wireless receiver
TW381328B (en) * 1994-03-07 2000-02-01 Ibm Dual substrate package assembly for being electrically coupled to a conducting member
JPH07244116A (ja) * 1994-03-07 1995-09-19 Hitachi Chem Co Ltd 半導体特性測定用治具とその製造法並びにその使用方法
IT1282689B1 (it) * 1996-02-26 1998-03-31 Circuit Line Spa Dispositivo di conversione della griglia di punti di test di una macchina per il test elettrico di circuiti stampati non montati
DE19932849C2 (de) * 1999-07-14 2003-07-03 Herbert Amrhein Kontaktiereinrichtung zum Herstellen einer elektrisch leitfähigen Verbindung
DE19943388B4 (de) 1999-09-10 2010-04-08 Atg Luther & Maelzer Gmbh Vorrichtung zum Prüfen von Leiterplatten
US7587289B1 (en) * 2007-02-13 2009-09-08 American Megatrends, Inc. Data cable powered sensor fixture
US20080238461A1 (en) * 2007-04-02 2008-10-02 Ken Skala Multi-type test interface system and method
FR2935203B1 (fr) * 2008-08-20 2014-12-12 Centre Nat Etd Spatiales Dispositif de fils electriques et boitier de fils electriques
ITVI20110343A1 (it) * 2011-12-30 2013-07-01 St Microelectronics Srl Sistema e adattatore per testare chips con circuiti integrati in un package

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3911361A (en) * 1974-06-28 1975-10-07 Ibm Coaxial array space transformer
US3963986A (en) * 1975-02-10 1976-06-15 International Business Machines Corporation Programmable interface contactor structure
US4250536A (en) * 1978-12-26 1981-02-10 General Electric Company Interconnection arrangement for circuit boards
US4340858A (en) * 1979-08-13 1982-07-20 Philip M. Hinderstein Test fixture
DE2933862A1 (de) * 1979-08-21 1981-03-12 Paul Mang Vorrichtung zur elektronischen pruefung von leiterplatten.

Also Published As

Publication number Publication date
CA1221470A (en) 1987-05-05
DE3340179C1 (de) 1985-05-09
DE3461867D1 (en) 1987-02-05
EP0142119B1 (de) 1986-12-30
US4614386A (en) 1986-09-30
JPS60161569A (ja) 1985-08-23
JPH0519662B2 (cg-RX-API-DMAC7.html) 1993-03-17
EP0142119A1 (de) 1985-05-22

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Legal Events

Date Code Title Description
REN Ceased due to non-payment of the annual fee