ATE169768T1 - Speicherprüfsystem - Google Patents

Speicherprüfsystem

Info

Publication number
ATE169768T1
ATE169768T1 AT95924417T AT95924417T ATE169768T1 AT E169768 T1 ATE169768 T1 AT E169768T1 AT 95924417 T AT95924417 T AT 95924417T AT 95924417 T AT95924417 T AT 95924417T AT E169768 T1 ATE169768 T1 AT E169768T1
Authority
AT
Austria
Prior art keywords
memory device
locations
test system
memory test
memory
Prior art date
Application number
AT95924417T
Other languages
English (en)
Inventor
Alexander Roger Deas
Original Assignee
Alexander Roger Deas
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Alexander Roger Deas filed Critical Alexander Roger Deas
Application granted granted Critical
Publication of ATE169768T1 publication Critical patent/ATE169768T1/de

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W46/00—Marks applied to devices, e.g. for alignment or identification
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/44—Indication or identification of errors, e.g. for repair
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/006—Identification
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W46/00—Marks applied to devices, e.g. for alignment or identification
    • H10W46/601—Marks applied to devices, e.g. for alignment or identification for use after dicing

Landscapes

  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Debugging And Monitoring (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
AT95924417T 1994-06-15 1995-06-15 Speicherprüfsystem ATE169768T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB9411950A GB9411950D0 (en) 1994-06-15 1994-06-15 Memory test system

Publications (1)

Publication Number Publication Date
ATE169768T1 true ATE169768T1 (de) 1998-08-15

Family

ID=10756736

Family Applications (1)

Application Number Title Priority Date Filing Date
AT95924417T ATE169768T1 (de) 1994-06-15 1995-06-15 Speicherprüfsystem

Country Status (6)

Country Link
US (1) US5721741A (de)
EP (1) EP0765522B1 (de)
AT (1) ATE169768T1 (de)
DE (1) DE69504072T2 (de)
GB (1) GB9411950D0 (de)
WO (1) WO1995034897A1 (de)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6009536A (en) * 1996-09-20 1999-12-28 Micron Electronics, Inc. Method for using fuse identification codes for masking bad bits on memory modules
IT1290156B1 (it) * 1996-12-18 1998-10-19 Texas Instruments Italia Spa Chip di memoria contenente un registro di memoria non volatile per la memorizzazione permanente di informazioni relative alla qualita' del
US6161052A (en) * 1997-10-28 2000-12-12 Micron Electronics, Inc. Method for identifying a component with physical characterization
US6289292B1 (en) * 1997-10-28 2001-09-11 Micron Technology, Inc. System for identifying a component with physical characterization
JP2000215688A (ja) * 1999-01-25 2000-08-04 Mitsubishi Electric Corp 半導体試験装置及び半導体試験方法
DE19951048C2 (de) * 1999-10-22 2002-11-21 Infineon Technologies Ag Verfahren zur Identifizierung einer integrierten Schaltung
US6477095B2 (en) * 2000-12-28 2002-11-05 Infineon Technologies Richmond, Lp Method for reading semiconductor die information in a parallel test and burn-in system
US6638778B1 (en) * 2002-02-25 2003-10-28 Advanced Micro Devices, Inc. Method for determining, tracking and/or controlling processing based upon silicon characteristics
US7583833B2 (en) * 2006-01-27 2009-09-01 Advanced Micro Devices, Inc. Method and apparatus for manufacturing data indexing
JP2008084423A (ja) * 2006-09-27 2008-04-10 Funai Electric Co Ltd 光ディスク装置及びデータ補完方法
US7953510B2 (en) * 2007-09-13 2011-05-31 International Business Machines Corporation System and method for semiconductor identification chip read out
US9729439B2 (en) 2014-09-26 2017-08-08 128 Technology, Inc. Network packet flow controller
US9736184B2 (en) 2015-03-17 2017-08-15 128 Technology, Inc. Apparatus and method for using certificate data to route data
US9729682B2 (en) 2015-05-18 2017-08-08 128 Technology, Inc. Network device and method for processing a session using a packet signature

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5377152A (en) * 1991-11-20 1994-12-27 Kabushiki Kaisha Toshiba Semiconductor memory and screening test method thereof
US5256578A (en) * 1991-12-23 1993-10-26 Motorola, Inc. Integral semiconductor wafer map recording
US5461588A (en) * 1994-11-15 1995-10-24 Digital Equipment Corporation Memory testing with preservation of in-use data

Also Published As

Publication number Publication date
EP0765522A1 (de) 1997-04-02
DE69504072D1 (de) 1998-09-17
DE69504072T2 (de) 1999-02-11
GB9411950D0 (en) 1994-08-03
US5721741A (en) 1998-02-24
EP0765522B1 (de) 1998-08-12
WO1995034897A1 (en) 1995-12-21

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Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties