ATE169768T1 - Speicherprüfsystem - Google Patents
SpeicherprüfsystemInfo
- Publication number
- ATE169768T1 ATE169768T1 AT95924417T AT95924417T ATE169768T1 AT E169768 T1 ATE169768 T1 AT E169768T1 AT 95924417 T AT95924417 T AT 95924417T AT 95924417 T AT95924417 T AT 95924417T AT E169768 T1 ATE169768 T1 AT E169768T1
- Authority
- AT
- Austria
- Prior art keywords
- memory device
- locations
- test system
- memory test
- memory
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/544—Marks applied to semiconductor devices or parts, e.g. registration marks, alignment structures, wafer maps
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/44—Indication or identification of errors, e.g. for repair
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/006—Identification
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
- H01L2223/544—Marks applied to semiconductor devices or parts
- H01L2223/54473—Marks applied to semiconductor devices or parts for use after dicing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB9411950A GB9411950D0 (en) | 1994-06-15 | 1994-06-15 | Memory test system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE169768T1 true ATE169768T1 (de) | 1998-08-15 |
Family
ID=10756736
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT95924417T ATE169768T1 (de) | 1994-06-15 | 1995-06-15 | Speicherprüfsystem |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US5721741A (de) |
| EP (1) | EP0765522B1 (de) |
| AT (1) | ATE169768T1 (de) |
| DE (1) | DE69504072T2 (de) |
| GB (1) | GB9411950D0 (de) |
| WO (1) | WO1995034897A1 (de) |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6009536A (en) * | 1996-09-20 | 1999-12-28 | Micron Electronics, Inc. | Method for using fuse identification codes for masking bad bits on memory modules |
| IT1290156B1 (it) * | 1996-12-18 | 1998-10-19 | Texas Instruments Italia Spa | Chip di memoria contenente un registro di memoria non volatile per la memorizzazione permanente di informazioni relative alla qualita' del |
| US6289292B1 (en) * | 1997-10-28 | 2001-09-11 | Micron Technology, Inc. | System for identifying a component with physical characterization |
| US6161052A (en) * | 1997-10-28 | 2000-12-12 | Micron Electronics, Inc. | Method for identifying a component with physical characterization |
| JP2000215688A (ja) * | 1999-01-25 | 2000-08-04 | Mitsubishi Electric Corp | 半導体試験装置及び半導体試験方法 |
| DE19951048C2 (de) * | 1999-10-22 | 2002-11-21 | Infineon Technologies Ag | Verfahren zur Identifizierung einer integrierten Schaltung |
| US6477095B2 (en) * | 2000-12-28 | 2002-11-05 | Infineon Technologies Richmond, Lp | Method for reading semiconductor die information in a parallel test and burn-in system |
| US6638778B1 (en) * | 2002-02-25 | 2003-10-28 | Advanced Micro Devices, Inc. | Method for determining, tracking and/or controlling processing based upon silicon characteristics |
| US7583833B2 (en) * | 2006-01-27 | 2009-09-01 | Advanced Micro Devices, Inc. | Method and apparatus for manufacturing data indexing |
| JP2008084423A (ja) * | 2006-09-27 | 2008-04-10 | Funai Electric Co Ltd | 光ディスク装置及びデータ補完方法 |
| US7953510B2 (en) * | 2007-09-13 | 2011-05-31 | International Business Machines Corporation | System and method for semiconductor identification chip read out |
| US9729439B2 (en) | 2014-09-26 | 2017-08-08 | 128 Technology, Inc. | Network packet flow controller |
| US9736184B2 (en) | 2015-03-17 | 2017-08-15 | 128 Technology, Inc. | Apparatus and method for using certificate data to route data |
| US9729682B2 (en) | 2015-05-18 | 2017-08-08 | 128 Technology, Inc. | Network device and method for processing a session using a packet signature |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5377152A (en) * | 1991-11-20 | 1994-12-27 | Kabushiki Kaisha Toshiba | Semiconductor memory and screening test method thereof |
| US5256578A (en) * | 1991-12-23 | 1993-10-26 | Motorola, Inc. | Integral semiconductor wafer map recording |
| US5461588A (en) * | 1994-11-15 | 1995-10-24 | Digital Equipment Corporation | Memory testing with preservation of in-use data |
-
1994
- 1994-06-15 GB GB9411950A patent/GB9411950D0/en active Pending
-
1995
- 1995-06-15 AT AT95924417T patent/ATE169768T1/de not_active IP Right Cessation
- 1995-06-15 DE DE69504072T patent/DE69504072T2/de not_active Expired - Fee Related
- 1995-06-15 WO PCT/GB1995/001392 patent/WO1995034897A1/en active IP Right Grant
- 1995-06-15 EP EP95924417A patent/EP0765522B1/de not_active Expired - Lifetime
-
1996
- 1996-12-16 US US08/767,393 patent/US5721741A/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| WO1995034897A1 (en) | 1995-12-21 |
| EP0765522A1 (de) | 1997-04-02 |
| DE69504072D1 (de) | 1998-09-17 |
| US5721741A (en) | 1998-02-24 |
| DE69504072T2 (de) | 1999-02-11 |
| EP0765522B1 (de) | 1998-08-12 |
| GB9411950D0 (en) | 1994-08-03 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |