ATE166154T1 - Vorrichtung zur bestimmung von materialeigenschaften - Google Patents

Vorrichtung zur bestimmung von materialeigenschaften

Info

Publication number
ATE166154T1
ATE166154T1 AT95924883T AT95924883T ATE166154T1 AT E166154 T1 ATE166154 T1 AT E166154T1 AT 95924883 T AT95924883 T AT 95924883T AT 95924883 T AT95924883 T AT 95924883T AT E166154 T1 ATE166154 T1 AT E166154T1
Authority
AT
Austria
Prior art keywords
pct
camera
infrared
material properties
sec
Prior art date
Application number
AT95924883T
Other languages
English (en)
Inventor
Hans-Richard Syre
Original Assignee
Honeywell Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Honeywell Ag filed Critical Honeywell Ag
Application granted granted Critical
Publication of ATE166154T1 publication Critical patent/ATE166154T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/34—Paper
    • G01N33/346—Paper sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
AT95924883T 1994-06-30 1995-06-20 Vorrichtung zur bestimmung von materialeigenschaften ATE166154T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE4422861A DE4422861C2 (de) 1994-06-30 1994-06-30 Vorrichtung zur Bestimmung von Materialeigenschaften von bewegtem blattförmigem Material

Publications (1)

Publication Number Publication Date
ATE166154T1 true ATE166154T1 (de) 1998-05-15

Family

ID=6521867

Family Applications (1)

Application Number Title Priority Date Filing Date
AT95924883T ATE166154T1 (de) 1994-06-30 1995-06-20 Vorrichtung zur bestimmung von materialeigenschaften

Country Status (6)

Country Link
US (1) US5822070A (de)
EP (1) EP0767904B1 (de)
AT (1) ATE166154T1 (de)
DE (2) DE4422861C2 (de)
FI (1) FI965245A7 (de)
WO (1) WO1996000894A1 (de)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19646888C1 (de) * 1996-11-13 1998-04-23 Schoeller Felix Jun Foto Vorrichtung zum Kalibrieren eines mit einem abtastenden Lichtstrahl arbeitenden Untersuchungssystems für bahnförmige Materialien
DE19826303A1 (de) * 1998-06-12 1999-12-16 Studiengesellschaft Kohle Mbh Verfahren zur kombinatorischen Materialentwicklung durch den Einsatz von Wärmedifferenzbildern
US6072898A (en) 1998-01-16 2000-06-06 Beaty; Elwin M. Method and apparatus for three dimensional inspection of electronic components
US6271520B1 (en) * 1998-03-23 2001-08-07 University Of Arkansas Item defect detection apparatus and method
DE19831612A1 (de) * 1998-07-14 2000-01-20 Voith Sulzer Papiermasch Gmbh Meßsystem
ATE355504T1 (de) * 1998-09-14 2006-03-15 Betr Forsch Inst Angew Forsch Verfahren zum messen der geometrie und planheit von bewegtem metallband
FI990159L (fi) * 1999-01-28 2000-07-29 Valmet Automation Inc Menetelmä kuiturainan laadun valvomiseksi
DE19912500A1 (de) * 1999-03-19 2000-09-21 Voith Sulzer Papiertech Patent Verfahren und Vorrichtung zum Bestimmen von Eigenschaften einer laufenden Materialbahn
US6452679B1 (en) * 1999-12-29 2002-09-17 Kimberly-Clark Worldwide, Inc. Method and apparatus for controlling the manufacturing quality of a moving web
FI111192B (fi) * 2000-03-31 2003-06-13 Oseir Oy Menetelmä kuvantavaan mittaukseen, kuvantava mittalaite ja mitatun informaation käyttö prosessin valvonnassa
DE10019486A1 (de) 2000-04-19 2001-10-31 Siemens Ag Anordnung zur Inspektion von Objektoberflächen
FI20001970A7 (fi) * 2000-09-06 2002-04-15 Metso Paper Automation Oy Paperin tai kartongin mittaus
EP1220596A1 (de) 2000-12-29 2002-07-03 Icos Vision Systems N.V. Verfahren und Einrichtung zur Lageerfassung der Anschlusskontakte elektronischer Bauelemente
US7101461B2 (en) * 2001-01-29 2006-09-05 Kimberly-Clark Worldwide, Inc. Method and apparatus for imaging a paper web
FI20010560L (fi) * 2001-03-20 2002-09-21 Aca Systems Oy Menetelmä rainamaisen materiaalin ominaisuuksien mittaamiseksi ja laitteisto menetelmän soveltamiseksi
DE10128643B4 (de) * 2001-06-15 2004-08-05 Igt Emus Gmbh Vorrichtung zur fotoelektrischen Prüfung des Leimungsgrades und der Saugfähigkeit
BE1014355A3 (fr) * 2001-08-30 2003-09-02 Ct Rech Metallurgiques Asbl Procede et dispositif pour la mesure de distances sur des bandes de metal brillant.
US6805899B2 (en) 2002-01-30 2004-10-19 Honeywell International Inc. Multi-measurement/sensor coating consolidation detection method and system
US20140204200A1 (en) * 2013-01-24 2014-07-24 Wipro Limited Methods and systems for speed calibration in spectral imaging systems
US20200371040A1 (en) * 2019-05-21 2020-11-26 Industrial Maintenance Engineering, Inc. d/b/a AIS Gauging Static full width measurement system

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2466615A (en) * 1946-11-12 1949-04-05 Ralph A Rusca Photoelectric apparatus for measuring lap uniformity having means to minimize tension on the lap
JPS5070076A (de) * 1972-04-10 1975-06-11
US3906232A (en) * 1973-10-31 1975-09-16 Butler Automatic Inc Web break detector
US4224513A (en) * 1978-04-06 1980-09-23 Measurex Corporation Apparatus for the on-line measurement of the opacity of a paper sheet
DE3641816A1 (de) * 1986-12-06 1988-06-16 Robert Prof Dr Ing Massen Verfahren und anordnung zur messung und/oder ueberwachung von eigenschaften von garnen und seilen
US5019710A (en) * 1989-03-30 1991-05-28 Measurex Corporation Optical system for detecting properties of traveling sheet materials
US5166755A (en) * 1990-05-23 1992-11-24 Nahum Gat Spectrometer apparatus
GB2249389A (en) * 1990-11-02 1992-05-06 Kodak Ltd Densitometers
US5071514A (en) * 1990-12-17 1991-12-10 Francis Systems, Inc. Paper weight sensor with stationary optical sensors calibrated by a scanning sensor
US5073712A (en) * 1991-04-11 1991-12-17 Abb Process Automation, Inc. Light scanner web profile measurement apparatus and method

Also Published As

Publication number Publication date
FI965245A0 (fi) 1996-12-30
EP0767904B1 (de) 1998-05-13
DE4422861C2 (de) 1996-05-09
FI965245L (fi) 1996-12-30
EP0767904A1 (de) 1997-04-16
DE59502182D1 (de) 1998-06-18
WO1996000894A1 (de) 1996-01-11
FI965245A7 (fi) 1996-12-30
DE4422861A1 (de) 1996-01-04
US5822070A (en) 1998-10-13

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Legal Events

Date Code Title Description
REN Ceased due to non-payment of the annual fee