ATE162622T1 - ''in-line''-spektrale referenzmethode für spektrometer - Google Patents

''in-line''-spektrale referenzmethode für spektrometer

Info

Publication number
ATE162622T1
ATE162622T1 AT91905638T AT91905638T ATE162622T1 AT E162622 T1 ATE162622 T1 AT E162622T1 AT 91905638 T AT91905638 T AT 91905638T AT 91905638 T AT91905638 T AT 91905638T AT E162622 T1 ATE162622 T1 AT E162622T1
Authority
AT
Austria
Prior art keywords
spectrometer
sample
spectral
spectrum
reference material
Prior art date
Application number
AT91905638T
Other languages
English (en)
Inventor
Isaac J Landa
Original Assignee
Isaac J Landa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Isaac J Landa filed Critical Isaac J Landa
Application granted granted Critical
Publication of ATE162622T1 publication Critical patent/ATE162622T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G01N21/276—Calibration, base line adjustment, drift correction with alternation of sample and standard in optical path

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
AT91905638T 1990-03-02 1991-02-27 ''in-line''-spektrale referenzmethode für spektrometer ATE162622T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/487,041 US5020909A (en) 1990-03-02 1990-03-02 "In-line" spectral reference method for spectrometers

Publications (1)

Publication Number Publication Date
ATE162622T1 true ATE162622T1 (de) 1998-02-15

Family

ID=23934165

Family Applications (1)

Application Number Title Priority Date Filing Date
AT91905638T ATE162622T1 (de) 1990-03-02 1991-02-27 ''in-line''-spektrale referenzmethode für spektrometer

Country Status (6)

Country Link
US (1) US5020909A (de)
EP (1) EP0517800B1 (de)
JP (1) JPH05505027A (de)
AT (1) ATE162622T1 (de)
DE (1) DE69128777D1 (de)
WO (1) WO1991013325A1 (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5125747A (en) * 1990-10-12 1992-06-30 Tytronics, Inc. Optical analytical instrument and method having improved calibration
US5251006A (en) * 1991-03-07 1993-10-05 Nirsystems Incorporated Automatic spectrophotometer calibration system
US5210590A (en) * 1992-02-18 1993-05-11 L. T. Industries, Inc. Rapid scanning spectrographic analyzer
US5489980A (en) * 1992-03-18 1996-02-06 Anthony; Michael Apparatus for rapid and accurate analysis of the composition of samples
US5652654A (en) * 1996-08-12 1997-07-29 Asimopoulos; George Dual beam spectrophotometer
US6064488A (en) * 1997-06-06 2000-05-16 Monitor Labs, Inc. Method and apparatus for in situ gas concentration measurement
DK199900492A (da) * 1999-04-14 2000-10-15 Foss Electric As Spektrometer
CN1329727C (zh) * 2002-10-01 2007-08-01 西南铝业（集团）有限责任公司 多元素铝光谱标准样品及其制备方法
US7295330B2 (en) * 2003-07-11 2007-11-13 Chow Peter P Film mapping system
WO2005114232A2 (en) * 2004-05-14 2005-12-01 Ihp Gmbh - Innovations For High Performance Microelectronics / Institut Für Innovative Mikroelektronik Method and apparatus for the determination of the concentration of impurities in a wafer
US20050287040A1 (en) * 2004-06-29 2005-12-29 Molecular Devices Corporation Fluorescence validation plate
US7502105B2 (en) * 2004-09-15 2009-03-10 General Electric Company Apparatus and method for producing a calibrated Raman spectrum
DE102011103253B4 (de) * 2011-05-31 2012-12-27 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Anordnung zur optischen Bestimmung einer Probe und entsprechendes Verfahren
CN103267732B (zh) * 2013-05-21 2016-12-28 浙江大学 基于移动光栅空间载频谱域oct全量程成像方法
US9182280B1 (en) * 2014-08-08 2015-11-10 Thermo Scientific Portable Analytical Instruments Inc. Method for reducing frequency of taking background/reference spectra in FTIR or FTIR-ATR spectroscopy and handheld measurement device embodying same

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3700331A (en) * 1969-12-29 1972-10-24 Trw Inc Spectrometer with rotary scanning disc and method of spectroscopic analysis
USRE27270E (en) * 1970-04-17 1972-01-11 Null type comparison eeflectometer wherein nulling is accomplished by moving the light detector
SE355073B (de) * 1970-04-30 1973-04-02 Aga Ab
US3861788A (en) * 1972-08-24 1975-01-21 Neotec Corp Optical analyzer for agricultural products
US3811776A (en) * 1973-02-26 1974-05-21 Environmental Res & Tech Gas analyzer
US3973849A (en) * 1975-06-16 1976-08-10 International Business Machines Corporation Self-calibratable spectrum analyzer
US4264205A (en) * 1977-08-16 1981-04-28 Neotec Corporation Rapid scan spectral analysis system utilizing higher order spectral reflections of holographic diffraction gratings
US4285596A (en) * 1977-08-16 1981-08-25 Neotec Corporation Holographic diffraction grating system for rapid scan spectral analysis
US4529308A (en) * 1982-05-28 1985-07-16 Hunter Associates Laboratory, Inc. Spectrophotometer apparatus and method including scale drift correction feature
US4838691A (en) * 1985-07-10 1989-06-13 Beckman Instruments, Inc. Method and apparatus for determining calibration accuracy of a scientific instrument
US4937448A (en) * 1988-05-26 1990-06-26 Spectra-Physics, Inc. Self-normalizing single-beam laser spectrometer

Also Published As

Publication number Publication date
WO1991013325A1 (en) 1991-09-05
EP0517800B1 (de) 1998-01-21
EP0517800A1 (de) 1992-12-16
EP0517800A4 (en) 1993-06-30
US5020909A (en) 1991-06-04
DE69128777D1 (de) 1998-02-26
JPH05505027A (ja) 1993-07-29

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Legal Events

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