ATE110845T1 - Tunnel-effekt-photosensor. - Google Patents

Tunnel-effekt-photosensor.

Info

Publication number
ATE110845T1
ATE110845T1 AT90300495T AT90300495T ATE110845T1 AT E110845 T1 ATE110845 T1 AT E110845T1 AT 90300495 T AT90300495 T AT 90300495T AT 90300495 T AT90300495 T AT 90300495T AT E110845 T1 ATE110845 T1 AT E110845T1
Authority
AT
Austria
Prior art keywords
tunnel effect
photosensor
effect photosensor
probe electrode
light
Prior art date
Application number
AT90300495T
Other languages
English (en)
Inventor
Ken Eguchi
Toshihiko Miyazaki
Kunihiro Sakai
Original Assignee
Canon Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Kk filed Critical Canon Kk
Application granted granted Critical
Publication of ATE110845T1 publication Critical patent/ATE110845T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Light Receiving Elements (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measurement Of Current Or Voltage (AREA)
AT90300495T 1989-01-20 1990-01-17 Tunnel-effekt-photosensor. ATE110845T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP992189 1989-01-20
JP1304879A JP2737017B2 (ja) 1989-01-20 1989-11-27 光検知装置及び光検知方法

Publications (1)

Publication Number Publication Date
ATE110845T1 true ATE110845T1 (de) 1994-09-15

Family

ID=26344733

Family Applications (1)

Application Number Title Priority Date Filing Date
AT90300495T ATE110845T1 (de) 1989-01-20 1990-01-17 Tunnel-effekt-photosensor.

Country Status (5)

Country Link
US (1) US5032713A (de)
EP (1) EP0384564B1 (de)
JP (1) JP2737017B2 (de)
AT (1) ATE110845T1 (de)
DE (1) DE69011899T2 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3126409B2 (ja) * 1991-06-05 2001-01-22 キヤノン株式会社 情報記録再生方法
JP3135753B2 (ja) * 1993-08-26 2001-02-19 キヤノン株式会社 プローブを用いた記録再生方法および装置
JP3034438B2 (ja) * 1994-03-31 2000-04-17 キヤノン株式会社 カラーフィルタの製造装置
JP2839133B2 (ja) * 1994-03-31 1998-12-16 キヤノン株式会社 カラーフィルタの製造方法及び製造装置及び液晶表示装置の製造方法及び液晶表示装置を備えた装置の製造方法
JP2013186195A (ja) * 2012-03-06 2013-09-19 Toshiba Tec Corp 画像形成装置、レンズアレイ及びその形成方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3731095A (en) * 1971-04-01 1973-05-01 Hitachi Ltd Electron gun device of field emission type
US4763002A (en) * 1979-03-22 1988-08-09 University Of Texas System Photon detector
CH643397A5 (de) * 1979-09-20 1984-05-30 Ibm Raster-tunnelmikroskop.
DE3242712A1 (de) * 1982-11-19 1984-05-24 Bayer Ag, 5090 Leverkusen Dotierte organische leiter
US4835587A (en) * 1984-09-19 1989-05-30 Fuji Electric Co., Ltd. Semiconductor device for detecting radiation
US4786810A (en) * 1985-04-23 1988-11-22 Bioscan, Inc. Solid state counting system for beta and gamma isotopes of all energies
US4829173A (en) * 1987-03-02 1989-05-09 Gte Laboratories Incorporated Radiation detecting apparatus
US4794438A (en) * 1987-03-16 1988-12-27 Gte Laboratories Incorporated Semiconductor radiation detecting device
EP0296262B1 (de) * 1987-06-22 1991-08-28 International Business Machines Corporation Verfahren zur Oberflächenuntersuchung mit Nanometer- und Pikosekundenauflösung sowie Laserabgetastetes Rastertunnelmikroskop zur Durchführung des Verfahrens

Also Published As

Publication number Publication date
EP0384564B1 (de) 1994-08-31
JP2737017B2 (ja) 1998-04-08
DE69011899D1 (de) 1994-10-06
EP0384564A1 (de) 1990-08-29
JPH02276925A (ja) 1990-11-13
US5032713A (en) 1991-07-16
DE69011899T2 (de) 1995-01-12

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Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties