AT335769B - Verfahren zur bestimmung vollstandiger flachenpolfiguren von blechtexturen - Google Patents

Verfahren zur bestimmung vollstandiger flachenpolfiguren von blechtexturen

Info

Publication number
AT335769B
AT335769B AT55475A AT55475A AT335769B AT 335769 B AT335769 B AT 335769B AT 55475 A AT55475 A AT 55475A AT 55475 A AT55475 A AT 55475A AT 335769 B AT335769 B AT 335769B
Authority
AT
Austria
Prior art keywords
sheet metal
pole figures
flat pole
complete flat
determining complete
Prior art date
Application number
AT55475A
Other languages
English (en)
Other versions
ATA55475A (de
Inventor
Michael Dipl Ing Dr Techn Mayr
Original Assignee
Voest Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Voest Ag filed Critical Voest Ag
Priority to AT55475A priority Critical patent/AT335769B/de
Priority to DE19752549404 priority patent/DE2549404C3/de
Publication of ATA55475A publication Critical patent/ATA55475A/de
Application granted granted Critical
Publication of AT335769B publication Critical patent/AT335769B/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
AT55475A 1975-01-24 1975-01-24 Verfahren zur bestimmung vollstandiger flachenpolfiguren von blechtexturen AT335769B (de)

Priority Applications (2)

Application Number Priority Date Filing Date Title
AT55475A AT335769B (de) 1975-01-24 1975-01-24 Verfahren zur bestimmung vollstandiger flachenpolfiguren von blechtexturen
DE19752549404 DE2549404C3 (de) 1975-01-24 1975-11-04 Verfahren zur Bestimmung vollständiger Flächenpolfiguren von Blechtexturen

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
AT55475A AT335769B (de) 1975-01-24 1975-01-24 Verfahren zur bestimmung vollstandiger flachenpolfiguren von blechtexturen

Publications (2)

Publication Number Publication Date
ATA55475A ATA55475A (de) 1976-07-15
AT335769B true AT335769B (de) 1977-03-25

Family

ID=3493678

Family Applications (1)

Application Number Title Priority Date Filing Date
AT55475A AT335769B (de) 1975-01-24 1975-01-24 Verfahren zur bestimmung vollstandiger flachenpolfiguren von blechtexturen

Country Status (2)

Country Link
AT (1) AT335769B (de)
DE (1) DE2549404C3 (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0289742A3 (en) * 1987-03-16 1990-03-07 Siemens Aktiengesellschaft Process for vertically adjusting the apertures in the path of the rays of an x-ray diffractometer

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102009027940A1 (de) * 2009-07-22 2011-03-03 Bruker Nano Gmbh Verfahren und Anordnung zur Generierung von Darstellungen anisotroper Eigenschaften sowie ein entsprechendes Computerprogramm und ein entsprechendes computerlesbares Speichermedium

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0289742A3 (en) * 1987-03-16 1990-03-07 Siemens Aktiengesellschaft Process for vertically adjusting the apertures in the path of the rays of an x-ray diffractometer

Also Published As

Publication number Publication date
DE2549404A1 (de) 1976-07-29
ATA55475A (de) 1976-07-15
DE2549404C3 (de) 1978-05-24
DE2549404B2 (de) 1977-09-22

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Legal Events

Date Code Title Description
ELJ Ceased due to non-payment of the annual fee
UEP Publication of translation of european patent specification