AT303819B - Protection device for a field effect transistor with an insulated gate electrode - Google Patents

Protection device for a field effect transistor with an insulated gate electrode

Info

Publication number
AT303819B
AT303819B AT968469A AT968469A AT303819B AT 303819 B AT303819 B AT 303819B AT 968469 A AT968469 A AT 968469A AT 968469 A AT968469 A AT 968469A AT 303819 B AT303819 B AT 303819B
Authority
AT
Austria
Prior art keywords
gate electrode
field effect
effect transistor
protection device
insulated gate
Prior art date
Application number
AT968469A
Other languages
German (de)
Original Assignee
Siemens Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Ag filed Critical Siemens Ag
Application granted granted Critical
Publication of AT303819B publication Critical patent/AT303819B/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
    • H01L27/0203Particular design considerations for integrated circuits
    • H01L27/0248Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
    • H01L27/0251Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
    • H01L27/0203Particular design considerations for integrated circuits
    • H01L27/0248Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
    • H01L27/0251Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
    • H01L27/0255Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices using diodes as protective elements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof  ; Multistep manufacturing processes therefor
AT968469A 1968-10-16 1969-10-14 Protection device for a field effect transistor with an insulated gate electrode AT303819B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19681803392 DE1803392A1 (en) 1968-10-16 1968-10-16 Protection device for a field effect transistor

Publications (1)

Publication Number Publication Date
AT303819B true AT303819B (en) 1972-12-11

Family

ID=5710660

Family Applications (1)

Application Number Title Priority Date Filing Date
AT968469A AT303819B (en) 1968-10-16 1969-10-14 Protection device for a field effect transistor with an insulated gate electrode

Country Status (7)

Country Link
AT (1) AT303819B (en)
CH (1) CH497795A (en)
DE (1) DE1803392A1 (en)
FR (1) FR2020823A1 (en)
GB (1) GB1229385A (en)
NL (1) NL6913792A (en)
SE (1) SE343431B (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5910587B2 (en) * 1977-08-10 1984-03-09 株式会社日立製作所 Semiconductor device protection device
KR920007171A (en) * 1990-09-05 1992-04-28 김광호 High Reliability Semiconductor Device
DE102006052863B4 (en) 2006-11-09 2018-03-01 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Protective structure for semiconductor sensors and their use
US9514995B1 (en) 2015-05-21 2016-12-06 Globalfoundries Inc. Implant-free punch through doping layer formation for bulk FinFET structures

Also Published As

Publication number Publication date
CH497795A (en) 1970-10-15
SE343431B (en) 1972-03-06
FR2020823A1 (en) 1970-07-17
GB1229385A (en) 1971-04-21
NL6913792A (en) 1970-04-20
DE1803392A1 (en) 1970-06-18

Similar Documents

Publication Publication Date Title
CH535495A (en) Field effect memory transistor with an insulated gate electrode
AT320023B (en) Field effect transistor with insulated gate electrode
DK119016B (en) Field effect transistor with insulated gate.
MY7300388A (en) High voltage transient protection for an insulated gate field effect transistor
CH480735A (en) Field effect transistor with isolated gate electrodes
MY7300263A (en) Insulated gate field effect transistor
IL30180A (en) Gate structure for insulated gate field effect semi-conductor device
CH466872A (en) Field effect transistor with insulated gate electrode
CH475653A (en) Field effect transistor with at least one insulated gate electrode
NL146333B (en) SEMICONDUCTIVE FIELD EFFECT DEVICE WITH INSULATED GATE.
NL152708B (en) SEMICONDUCTOR DEVICE WITH A FIELD EFFECT TRANSISTOR WITH INSULATED GATE ELECTRODE.
CH470762A (en) Field effect transistor with insulated gate electrode
AT315240B (en) Field effect transistor with insulated gate electrode
AT303819B (en) Protection device for a field effect transistor with an insulated gate electrode
NL158324B (en) SEMI-CONDUCTOR DEVICE WITH A FIELD EFFECT TRANSISTOR TO BE PROTECTED AGAINST OVER VOLTAGES WITH INSULATED CONTROL ELECTRODE.
CH514937A (en) Semiconductor arrangement with a field effect transistor with an insulated gate electrode
NO126410C (en) CONNECTION DEVICE WITH A HIGH VOLTAGE TRANSISTOR
AT331859B (en) FIELD EFFECT TRANSISTOR WITH INSULATED GATE ELECTRODE
NL161621C (en) SEMICONDUCTOR DEVICE WITH FIELD EFFECT TRANSISTOR.
AT303818B (en) Field effect transistor
CH489914A (en) Field effect transistor
CH476399A (en) Field effect transistor with several isolated gate electrodes
NL143370B (en) FIELD EFFECT TRANSISTOR WITH INSULATED GATE ELECTRODE.
CH495632A (en) Field effect transistor
AT290622B (en) Field effect transistor with insulated gate electrode

Legal Events

Date Code Title Description
ELJ Ceased due to non-payment of the annual fee